7 article(s) from Rahe, Philipp
Advanced atomic force microscopy techniques V
- Philipp Rahe,
- Ilko Bald,
- Nadine Hauptmann,
- Regina Hoffmann-Vogel,
- Harry Mönig and
- Michael Reichling
Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6
Quantitative dynamic force microscopy with inclined tip oscillation
- Philipp Rahe,
- Daniel Heile,
- Reinhard Olbrich and
- Michael Reichling
Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53
![[Graphic 38]](/bjnano/content/inline/2190-4286-13-53-i79.svg?max-width=637&scale=1.18182)
and the axis w....
PTCDA adsorption on CaF2 thin films
- Philipp Rahe
Beilstein J. Nanotechnol. 2020, 11, 1615–1622, doi:10.3762/bjnano.11.144
Protruding hydrogen atoms as markers for the molecular orientation of a metallocene
- Linda Laflör,
- Michael Reichling and
- Philipp Rahe
Beilstein J. Nanotechnol. 2020, 11, 1432–1438, doi:10.3762/bjnano.11.127
![[Graphic 10]](/bjnano/content/inline/2190-4286-11-127-i10.svg?max-width=637&scale=1.18182)
row of FDCA molecules in geo 2. (a–c) Constant-height frequency-shi...
Noise in NC-AFM measurements with significant tip–sample interaction
- Jannis Lübbe,
- Matthias Temmen,
- Philipp Rahe and
- Michael Reichling
Beilstein J. Nanotechnol. 2016, 7, 1885–1904, doi:10.3762/bjnano.7.181
![[Graphic 32]](/bjnano/content/inline/2190-4286-7-181-i73.png?max-width=637&scale=1.18182)
wit...
![[Graphic 34]](/bjnano/content/inline/2190-4286-7-181-i75.png?max-width=637&scale=1.18182)
wit...
Determining cantilever stiffness from thermal noise
- Jannis Lübbe,
- Matthias Temmen,
- Philipp Rahe,
- Angelika Kühnle and
- Michael Reichling
Beilstein J. Nanotechnol. 2013, 4, 227–233, doi:10.3762/bjnano.4.23
![[Graphic 34]](/bjnano/content/inline/2190-4286-4-23-i40.png?max-width=637&scale=1.18182)
measured for the fundamental mode of cantilever V 4. Measureme...
![[Graphic 23]](/bjnano/content/inline/2190-4286-4-23-i29.png?max-width=637&scale=1.18182)
measured for cantilever V 4 (A0 = 16.8 nm, demodulator band...
Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy
- Jannis Lübbe,
- Matthias Temmen,
- Sebastian Rode,
- Philipp Rahe,
- Angelika Kühnle and
- Michael Reichling
Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4
![[Graphic 53]](/bjnano/content/inline/2190-4286-4-4-i64.png?max-width=637&scale=1.18182)
= ![[Graphic 32]](/bjnano/content/inline/2190-4286-4-4-i43.png?max-width=637&scale=1.18182)
f...
![[Graphic 56]](/bjnano/content/inline/2190-4286-4-4-i67.png?max-width=637&scale=1.18182)
using three diff...
Other Beilstein-Institut Open Science Activities
