Tailoring Ag–Pt nanoalloys through solid-state dewetting: structural and optical insights

• Marcin Łapiński,
• Piotr Okoczuk,
• Blaž Grobiša,
• Ewa Pawlikowska,
• Amelia Rozwadowska,
• Wojciech Sadowski and
• Barbara Kościelska

Beilstein J. Nanotechnol. 2026, 17, 748–759, doi:10.3762/bjnano.17.52

• plasmonic properties. Results and Discussion As-deposited thin Ag–Pt bilayers exhibit a granular morphology, as evidenced by atomic force microscopy (AFM) measurements shown in Figure 1. This granular character leads to instability of the layers at higher temperatures, causing cracking of the continuous

afspm: A framework for manufacturer-agnostic automation in scanning probe microscopy

• Nicholas J. Sullivan,
• Julio J. Valdés,
• Kirk H. Bevan and
• Peter Grutter

Beilstein J. Nanotechnol. 2026, 17, 653–667, doi:10.3762/bjnano.17.45

• interfaces types. An automated experiment was run to ensure overall running beyond integration testing. Keywords: atomic force microscopy; automation; manufacturer-agnostic; scanning probe microscopy; software framework; Introduction In scanning probe microscopy (SPM), an atomically sharp tip is scanned

• earlier sample script. In Figure 5, we see pseudocode (Figure 5a) and a system diagram (Figure 5b) for a script including experiment-specific parameters within it. In coupling the algorithmic logic and experiment-specific parameters, we force a new copy of the base script for each new experiment. Imagine

• directly from the computer hard drive, which simplifies the translator logic as it does not need to monitor data live (which is accessible for only some controllers). The exposed level of control assumes the user has pre-configured their “operating mode” (e.g., amplitude-modulated atomic force microscopy

Recent progress in enhancing built-in electric fields of perovskite solar cells via junction engineering

• Tong Xiao and
• Ke Xu

Beilstein J. Nanotechnol. 2026, 17, 602–621, doi:10.3762/bjnano.17.42

• , carriers migrate at the interface through diffusion and drift, gradually establishing a built-in electric field (BEF) that aligns the Fermi levels on both sides. This field is not only the primary driving force that sustains carrier separation but also a direct determinant of device photovoltaic conversion

• , characterized by band discontinuities or polarization barriers. Its primary role is to modulate the local potential distribution and establish a stable BEF. In materials such as perovskites, which are mixed ionic–electronic conductors, the junction not only determines the driving force for carrier separation

• continuous barrier-reducing channel across the film [15], a strategy that emphasizes longitudinal potential continuity and a “capacitive accumulation” effect, which maintains an effective driving force over a larger thickness and is often accompanied by improved crystallinity and stress release

Probing tribological evolution in atomically thin MoS₂ at different scales

• Xingzhong Zeng and
• Miao Zhang

Beilstein J. Nanotechnol. 2026, 17, 586–597, doi:10.3762/bjnano.17.40

• (MoS2) under controlled loads using a calibrated atomic force microscope (AFM), with a focus on quantifying the strengthening effect and sub-nanoscale stick–slip motion. Our results reveal that the nanoscale strengthening effect intensifies with increasing applied load but weakens as the number of MoS2

• nanoscale to sub-nanoscale, providing critical insights for designing low-friction coatings and high-performance micro/nanoelectromechanical systems (MEMS/NEMS). Keywords: atomic force microscopy; MoS2; strengthening effect; sub-nanoscale stick–slip motion; Introduction Nanoscale friction is a pivotal

• atomic lattice site until the lateral force overcomes interfacial interactions, followed by an instantaneous “slip” to the next stable site [9]. This stick–slip motion is widely regarded as the elementary mechanism of energy dissipation in nanoscale friction, underpinning efforts to understand energy

Defects and defect-mediated engineering of two-dimensional materials: challenges and open questions

• Arkady V. Krasheninnikov,
• Matthias Batzill,
• Anouar-Akacha Delenda,
• Marija Drndić,
• Chris Ewels,
• Katharina J. Franke,
• Mahdi Ghorbani-Asl,
• Alexander Holleitner,
• Ado Jorio,
• Ute Kaiser,
• Daria Kieczka,
• Hannu-Pekka Komsa,
• Jani Kotakoski,
• Manuel Längle,
• David Lamprecht,
• Yun Liu,
• Steven G. Louie,
• Janina Maultzsch,
• Thomas Michely,
• Katherine Milton,
• Anna Niggas,
• Hanako Okuno,
• Joshua A. Robinson,
• Marika Schleberger,
• Bruno Schuler,
• Alexander Shluger,
• Kazu Suenaga,
• Kristian S. Thygesen,
• Richard A. Wilhelm,
• E. Harriet Åhlgren and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2026, 17, 454–488, doi:10.3762/bjnano.17.31

• of defects, for example, TEM [80], STM [81], or atomic force microscopy (AFM) [82]; but, normally, only a small part of the sample can be probed [83][84][85]. Moreover, these techniques can create defects themselves, for example, when the energy of the electron beam exceeds the displacement threshold

• host vacancy clusters. The clusters are also size-limited, as clusters growing too large and into the bright areas would force Gr bonds to detach from the substrate. Therefore, vacancies diffusing around avoid attachment to large clusters and prefer to attach to smaller ones, making the size

Nanocarrier-integrated multilayer films produced by 3D printing for improved skin adhesion and curcumin photostability

• Thayse Viana de Oliveira,
• Ana Paula Farias Leão,
• Júlia Leão,
• Cesar Liberato Petzhold and
• Ruy Carlos Ruver Beck

Beilstein J. Nanotechnol. 2026, 17, 440–453, doi:10.3762/bjnano.17.30

• with absorbent paper. Skin samples were fixed to the equipment probe with instantaneous adhesive, while films were fixed to the equipment’s platform with double-sided tape. The equipment promoted contact between the skin sample and the film, with a force of 290 mN for 3 min. The probe holding the skin

• sample was then withdrawn from the surface of the film by the platform at a constant speed of 0.10 mm/s until total displacement was achieved. The work required to detach the skin sample from the 3D-printed films was calculated based on the peak force and maximum displacement after complete detachment

• requires a minimum applied stress to initiate flow (yield stress), which, in practical terms, corresponds to the force required to extrude the hydrogel through the syringe nozzle during printing. If the applied stress is below the yield stress, the hydrogel remains structurally intact inside the syringe

Ferroelectric nanodot reservoir for neuromorphic computing

• Anna Razumnaya,
• Yuri Tikhonov,
• Dmitrii Naidenko,
• Léo Boron,
• Valerii Vinokur and
• Igor Lukyanchuk

Beilstein J. Nanotechnol. 2026, 17, 352–364, doi:10.3762/bjnano.17.24

• interfaces. An alternative configuration is shown in Figure 7b, where atomic force microscopy or piezoresponse force microscopy are used for both input and output operations. Here, the localized tip of the microscope is used to inject or sense charges at specific positions in the ferroelectric array

• and readout realized via atomic or piezoresponse force microscopy. Funding This research was funded by the European Union HORIZON action MSCA-SE-3D-TOPO (project number 101236483). A.R. acknowledges the Slovenian Research Agency support (P1-0125). The work of V.V. was supported by Terra Quantum AG.

Calculation of the dynamic stiffness of a cantilever under torsional oscillation

• Keita Nishida,
• Yuuki Yasui and
• Yoshiaki Sugimoto

Beilstein J. Nanotechnol. 2026, 17, 303–308, doi:10.3762/bjnano.17.21

• Keita Nishida Yuuki Yasui Yoshiaki Sugimoto Department of Advanced Materials Science, The University of Tokyo, Chiba 277-8561, Japan 10.3762/bjnano.17.21 Abstract Atomic force microscopy using Si cantilevers provides an effective means for investigating both conservative and dissipative

• : atomic force microscopy; dynamic stiffness; energy dissipation; friction; torsional oscillation mode; Introduction Friction serves as a fundamental mechanism of energy dissipation [1]. While friction typically arises from direct mechanical contact between surfaces, energy dissipation can also occur even

• detailed mechanisms remain not fully understood [5]. Non-contact atomic force microscopy (nc-AFM) is widely employed to investigate non-contact friction through its dissipation channel. Common techniques include pendulum AFM, bimodal AFM, and quartz tuning fork AFM [6][7][8]. Pendulum AFM uses cantilevers

Fast vortex dynamics and relaxation times in NbRe-based heterostructures

• Francesco De Chiara,
• Zahra Makhdoumi Kakhaki,
• Francesco Avitabile,
• Francesco Colangelo,
• Abhishek Kumar,
• Carmine Attanasio and
• Carla Cirillo

Beilstein J. Nanotechnol. 2026, 17, 292–302, doi:10.3762/bjnano.17.20

• superconducting gap, Δ(T), quasiparticles diffuse into the surrounding superconducting region, reducing the number of excitations within the core. This process results in a shrinkage of the vortex followed by a decrease of the viscous drag force, fvd, and an increase in the vortex velocity v [9]. When v exceeds

• the critical value v*, the Lorentz force dominates the viscous drag force, leading to instabilities in vortex motion. The dependence of v* on T is given by: where Tc is the superconducting critical temperature, D is the quasiparticles diffusion coefficient, and ζ(x) is the Riemann zeta function. The

• larger experimental Bs measured for the NbRe/Au microbridge thus points to a more efficient edge barrier with respect to the case of NbRe/Py bilayer where the value of Bs is smaller. The latter also exhibits a higher Jc compared to NbRe/Au, indicating a stronger vortex pinning force in this range

Advancing nanolithography: a comprehensive review of materials for local anodic oxidation with AFM

• Matteo Lorenzoni

Beilstein J. Nanotechnol. 2026, 17, 275–291, doi:10.3762/bjnano.17.19

• technique for nanoscale patterning, leveraging the precision of scanning probe microscopy, relying specifically on atomic force microscopy. This review explores the materials utilized in LAO experiments, including semiconductors, metals, insulators, two-dimensional (2D) materials, and emerging

• oxide growth on a silicon surface during LAO, illustrating the formation of a protruding oxide feature and the corresponding buried oxide volume. Reproduced from [8], M. Lorenzoni and F. Pérez-Murano, “Conductive Atomic Force Microscopy for Nanolithography Based on Local Anodic Oxidation,” in Conductive

• Atomic Force Microscopy: Applications in Nanomaterials, with permission from John Wiley and Sons. Copyright © 2017 Wiley-VCH GmbH. This content is not subject to CC BY 4.0. (c) AFM images of square oxide patterns fabricated by LAO on SiC before and after wet etching. (d) Height profile of the top left

Development and in vitro evaluation of liposomes and immunoliposomes containing 5-fluorouracil and R-phycoerythrin as a potential phototheranostic system for colorectal cancer

• Raissa Rodrigues Camelo,
• Vivianne Cortez Sombra Vandesmet,
• Octavio Vital Baccallini,
• José de Brito Vieira Neto,
• Thais da Silva Moreira,
• Luzia Kalyne Almeida Moreira Leal,
• Claudia Pessoa,
• Daniel Giuliano Cerri,
• Maria Vitória Lopes Badra Bentley,
• Josimar O. Eloy,
• Ivanildo José da Silva Júnior and
• Raquel Petrilli

Beilstein J. Nanotechnol. 2026, 17, 97–121, doi:10.3762/bjnano.17.7

• force microscopy The topographical characterization of liposomal formulations was performed by using atomic force microscopy (AFM) with a Nanosurf® FlexAFM system. The samples analyzed included liposomes and immunoliposomes containing R-PE. Briefly, to avoid vesicle deformation or disruption, liposomes

• images were captured using the Nanosurf C3000i software and subsequently processed and analyzed with the Gwyddion v 2.66 software, which was used for image leveling, coloring, 3D visualization of the specimens, and roughness analysis [26]. 2.3.5.1 Atomic force microscopy roughness calculation. Roughness

• HSPC IM 07 formulation exhibits the most favorable characteristics for application in delivery systems, balancing nanoscale size, acceptable PDI, and high conjugation efficiency. 3.3 Atomic force microscopy assays Atomic force microscopy assays were used to characterize the surface topography of

Quantitative estimation of nanoparticle/substrate adhesion by atomic force microscopy

• Aydan Çiçek,
• Markus Kratzer,
• Christian Teichert and
• Christian Mitterer

Beilstein J. Nanotechnol. 2026, 17, 1–14, doi:10.3762/bjnano.17.1

• of copper nanoparticles to silicon substrates deposited under varying conditions using DC magnetron sputter inert gas condensation. Atomic force microscopy was utilized as a tool for the manipulation of the nanoparticles and to measure lateral forces for their displacement, with cantilever

• calibration achieved through wedge and diamagnetic lateral force calibrator methods. The work of adhesion was quantified by integrating the obtained lateral forces over the distance moved during manipulation, revealing a non-monotonic dependency on nanoparticle size with maximum adhesion observed for

• particles between 6 and 12 nm. In addition, an applied positive substrate bias voltage led to more energetic landing conditions and thus to increased adhesion forces. This study underscores the suitability of atomic force microscopy in characterizing adhesion on the nanoscale and offers insights into future

Chiral plasmonic nanostructures fabricated with circularly polarized light

• Tian Qiao and
• Ming Lee Tang

Beilstein J. Nanotechnol. 2025, 16, 2245–2264, doi:10.3762/bjnano.16.154

• ”. In the same paper, the authors attributed the formation of chiral AuNPs to the assembly of small NPs under the mechanical force of CPL. The spatial dissymmetry of hot carrier-induced chemical reactions was not discussed. While Figure 4a represents chiral metallic cPNSs synthesized in solution, Figure

• can lead to a significant displacement of the polymer backbone, with the degree of displacement being dependent on the strength of the electric field under CPL. Chiral topographic changes due to the polymer displacement were observed using atomic force microscopy (AFM). Similar observations were made

Ultrathin water layers on mannosylated gold nanoparticles

• Maiara A. Iriarte Alonso,
• Jorge H. Melillo,
• Silvina Cerveny,
• Yujin Tong and
• Alexander M. Bittner

Beilstein J. Nanotechnol. 2025, 16, 2183–2198, doi:10.3762/bjnano.16.151

• light scattering, and infrared spectroscopy. We probed particles adsorbed on hydrophilic and hydrophobic surfaces with atomic force microscopy (AFM) and vibrational sum frequency generation (VSFG) spectroscopy, both operated under variable air humidity. For AFM, we additionally tested hydrophilic and

• inorganic surfaces, usually modified with organic layers, and probed by Fourier-transform infrared spectroscopy (FTIR), vibrational sum frequency generation (VSFG), and atomic force microscopy (AFM). For VSFG and AFM, we systematically varied the relative air humidity (RH). DLS and ZP yield particle size

• (Keysight, Scientec, FR), in air in AC “noncontact” mode at 24 °C, at speeds between 0.8 and 1.2 lines/s. The scanning was performed in at least six replicates per condition for the PEG AuNPs and nine replicates for the dimanno-AuNPs. Silicon cantilevers (Multi 75, Budget Sensors) with a force constant k

Electron transport through nanoscale multilayer graphene and hexagonal boron nitride junctions

• Aleksandar Staykov and
• Takaya Fujisaki

Beilstein J. Nanotechnol. 2025, 16, 2132–2143, doi:10.3762/bjnano.16.147

• tunneling behavior. Current–voltage characteristics showed linear dependence at low bias and exponential growth at higher voltages. Conductive atomic force microscopy measurements revealed highly uniform, defect-free tunneling across atomically flat h-BN terraces, with breakdown fields near 1 GV·m−1. These

Rapid synthesis of highly monodisperse AgSbS₂ nanocrystals: unveiling multifaceted activities in cancer therapy, antibacterial strategies, and antioxidant defense

• Funda Ulusu,
• Adem Sarilmaz,
• Yakup Ulusu,
• Faruk Ozel and
• Mahmut Kus

Beilstein J. Nanotechnol. 2025, 16, 2105–2115, doi:10.3762/bjnano.16.145

• nanoparticles with bacterial cells and the production of ROS, which causes DNA damage and denaturation of proteins close to the bacterial membrane, causes cell membrane damage [37][38]. In addition, the electrostatic force generated between the bacterial cells and the synthesized NCs causes distraction of the

Toward clinical translation of carbon nanomaterials in anticancer drug delivery: the need for standardisation

• Michał Bartkowski,
• Francesco Calzaferri and
• Silvia Giordani

Beilstein J. Nanotechnol. 2025, 16, 2092–2104, doi:10.3762/bjnano.16.144

• atomic force microscopy. Surface charge plays a significant role in determining how CNMs interact with biological membranes and intracellular environments. It influences processes such as cellular uptake, cytotoxicity, and inflammatory signalling. For example, BSA-derived negatively charged CDs exhibited

Calibration of piezo actuators and systems by dynamic interferometry

• Knarik Khachatryan and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 2086–2091, doi:10.3762/bjnano.16.143

• Knarik Khachatryan Michael Reichling Institut für Physik, Universität Osnabrück, Barbarastr. 7, 49076 Osnabrück, Germany 10.3762/bjnano.16.143 Abstract To achieve precise measurements of small displacements in non-contact atomic force microscopy, it is crucial to control the position of moving

• oscillation amplitude calibration under conditions of various amounts of tube piezo contraction and extension. The merits and limits of accuracy for such type of calibration are discussed. Keywords: cantilever excitation; fiber interferometer; NC-AFM; piezo calibration; non-contact atomic force microscopy

• ; Introduction Interferometric displacement detection stands as a cornerstone in high-precision techniques employed in cantilever-based atomic force microscopy (AFM), since its early days [1][2][3][4][5][6]. This method of cantilever displacement detection is specifically well suited for non-contact atomic force

Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization

• Yanping Wei,
• Jiafeng Shen,
• Yirong Yao,
• Xuke Li,
• Ming Li and
• Peiling Ke

Beilstein J. Nanotechnol. 2025, 16, 2077–2085, doi:10.3762/bjnano.16.142

• Yanping Wei Jiafeng Shen Yirong Yao Xuke Li Ming Li Peiling Ke Public Technology Center, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China 10.3762/bjnano.16.142 Abstract This study introduces a multifrequency atomic force microscopy (AFM

• mappings obtained via the PeakForce tapping method. Furthermore, the technique’s dual capability, that is, quantitative mechanics via quasi-static force curves and qualitative material-sensitive information via eigenmode vibration signals, facilitates effective compositional differentiation in

• . Keywords: atomic force microscopy (AFM); high eigenmodes; multifrequency AFM; nanoscale material analysis; surface characterization; Introduction Atomic force microscopy (AFM) has become an indispensable tool for characterizing the morphology and surface properties of materials at the micro- and the

Molecular and mechanical insights into gecko seta adhesion: multiscale simulations combining molecular dynamics and the finite element method

• Yash Jain,
• Saeed Norouzi,
• Tobias Materzok,
• Stanislav N. Gorb and
• Florian Müller-Plathe

Beilstein J. Nanotechnol. 2025, 16, 2055–2076, doi:10.3762/bjnano.16.141

• detachment, thereby enhancing adhesion strength. The computed pull-off forces and observed mechanisms are consistent with atomic force microscopy measurements and previous simulations. These results align with existing experimental and computational studies. They also overcome scale and resolution

• scales involved. In previous research, we used molecular dynamics simulations to explore various aspects of gecko adhesion [10][11][12][13]. We found that humidity increases the force required to pull a spatula off from a substrate [10][12], a phenomenon also observed in high-humidity atomic force

• natural hierarchy of real gecko setae, which includes finer branches, varying cross sections, and region-specific material anisotropy. Real setae possess complex cross-sectional shapes and non-uniform branching angles, which could lead to variations in force distributions. Nonetheless, this idealized

Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis

• Thomas Mathias,
• Roland Bennewitz and
• Philip Egberts

Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136

• Contact resonance atomic force microscopy (CR-AFM) has been used in many studies to characterize variations in the elastic and viscoelastic constants of materials along a heterogeneous surface. In almost all experimental work, the quantitative modulus of the surface is calculated in reference to a known

• model, improved matching the cantilever/sample stiffness to obtain a larger variation in contact stiffness with frequency, or investigating the use of higher-order modes that may achieve this improved match. Keywords: atomic force microscopy; contact resonance; highly oriented pyrolytic graphite (HOPG

• ); mechanical property measurements; surface science; Introduction Atomic force microscopy (AFM) has become an indispensable tool for imaging the surface topography on a variety of surfaces [1]. Since the invention of the AFM [2], several other modes of AFM have been developed, including friction force

PEGylated lipids in lipid nanoparticle delivery dynamics and therapeutic innovation

• Peiyang Gao

Beilstein J. Nanotechnol. 2025, 16, 1914–1930, doi:10.3762/bjnano.16.133

• of motional freedom could correspond to a brush conformation signature, where adjacent PEG chains force them into a linear orientation. In contrast, PEG chains in mushroom conformation would exhibit restricted motion and thus broader peaks [13]. While direct investigations into PEG conformations on

Programmable soliton dynamics in all-Josephson-junction logic cells and networks

• Vsevolod I. Ruzhickiy,
• Anastasia A. Maksimovskaya,
• Sergey V. Bakurskiy,
• Andrey E. Schegolev,
• Maxim V. Tereshonok,
• Mikhail Yu. Kupriyanov,
• Nikolay V. Klenov and
• Igor I. Soloviev

Beilstein J. Nanotechnol. 2025, 16, 1883–1893, doi:10.3762/bjnano.16.131

• quasiparticle current () that flows as a junction switches. This larger current provides a stronger driving force to the next junction in the line, causing it to reach its critical threshold and switch more rapidly, thus increasing the overall propagation velocity of the soliton. The functionality of the KICK

Low-temperature AFM with a microwave cavity optomechanical transducer

• Ermes Scarano,
• Elisabet K. Arvidsson,
• August K. Roos,
• Erik Holmgren,
• Riccardo Borgani,
• Mats O. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2025, 16, 1873–1882, doi:10.3762/bjnano.16.130

• /bjnano.16.130 Abstract We demonstrate atomic force microscopy (AFM) imaging with a microcantilever force transducer where an integrated superconducting microwave resonant circuit detects cantilever deflection using the principles of cavity optomechanics. We discuss the detector responsivity and added

• noise, pointing to its crucial role in the context of force sensitivity. Through analysis of noise measurements we determine the effective temperature of the cantilever eigenmode and we determine the region of detector operation in which the sensor is thermal-noise-limited. Our analysis shows that the

• force-sensor design is a significant improvement over piezoelectric force sensors commonly used in low-temperature AFM. We discuss the potential for further improvement of the sensor design to achieve optimal detection at the standard quantum limit. We demonstrate AFM operation with surface-tracking

Piezoelectricity of layered double hydroxides: perspectives regarding piezocatalysis and nanogenerators

• Evgeniy S. Seliverstov,
• Evgeniya A. Tarasenko and
• Olga E. Lebedeva

Beilstein J. Nanotechnol. 2025, 16, 1812–1817, doi:10.3762/bjnano.16.124

• ultrasound exposure broke the inversion symmetry of Ni/Fe-LDH, causing positive and negative polarization charges to arise. The migration of created charges in opposite directions under external mechanical force caused an intrinsic electric field. The authors also hypothesized that LDHs, as some 2D layered