Fabrication of silver nanoisland films by pulsed laser deposition for surface-enhanced Raman spectroscopy

• Bogusław Budner,
• Mariusz Kuźma,
• Barbara Nasiłowska,
• Bartosz Bartosewicz,
• Malwina Liszewska and
• Bartłomiej J. Jankiewicz

Beilstein J. Nanotechnol. 2019, 10, 882–893, doi:10.3762/bjnano.10.89

• probe microscopy images. The thickness of the deposited reference silver layers was measured with an atomic force microscope (AFM, NT-MDT Company) in non-contact mode. To perform AFM measurements, the silver layers were removed in random places on the sample by scratching its surface with a sharp needle

Comparing a porphyrin- and a coumarin-based dye adsorbed on NiO(001)

• Sara Freund,
• Antoine Hinaut,
• Nathalie Marinakis,
• Edwin C. Constable,
• Ernst Meyer,
• Catherine E. Housecroft and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2019, 10, 874–881, doi:10.3762/bjnano.10.88

• at 80 °C. Scanning probe microscopy All measurements were carried out in dark using a custom-built atomic force microscope operating under UHV at RT. All AFM images were recorded in the non-contact mode, using silicon cantilevers (Nanosensors PPP-NCL, stiffness k = 20–30 N/m, resonance frequency f1

Self-assembly and wetting properties of gold nanorod–CTAB molecules on HOPG

• Imtiaz Ahmad,
• Floor Derkink,
• Tim Boulogne,
• Pantelis Bampoulis,
• Harold J. W. Zandvliet,
• Hidayat Ullah Khan,
• Rahim Jan and
• E. Stefan Kooij

Beilstein J. Nanotechnol. 2019, 10, 696–705, doi:10.3762/bjnano.10.69

• centrifuge tube. Characterization techniques Scanning electron microscopy (SEM) imaging of the samples was undertaken with a Zeiss 1550 system (optimum resolution ≈1 nm at 2 kV accelerating voltage). Tapping-mode AFM imaging was carried out with an Agilent 5100 atomic force microscope using HQ:NSC35/Al

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

• Aaron Mascaro,
• Yoichi Miyahara,
• Tyler Enright,
• Omur E. Dagdeviren and
• Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

• period of the cantilever and compare and contrast it with those previously established. Keywords: atomic force microscopy; electrostatic force microscopy; ionic transport; lithium ion batteries; nanotechnology; Introduction Since the inception of the atomic force microscope (AFM) a variety of

Advanced scanning probe lithography using anatase-to-rutile transition to create localized TiO₂ nanorods

• Julian Kalb,
• Vanessa Knittel and
• Lukas Schmidt-Mende

Beilstein J. Nanotechnol. 2019, 10, 412–418, doi:10.3762/bjnano.10.40

• atomic force microscope (AFM), was pulled across an anatase film. During this process, surface defects are created as well as dust that contains tiny anatase TiO2 nanoparticles. Due to the lattice mismatch between anatase and rutile, in general, rutile nanorods do not grow on anatase crystal facets. The

Sputtering of silicon nanopowders by an argon cluster ion beam

• Xiaomei Zeng,
• Vasiliy Pelenovich,
• Zhenguo Wang,
• Wenbin Zuo,
• Sergey Belykh,
• Alexander Tolstogouzov,
• Dejun Fu and
• Xiangheng Xiao

Beilstein J. Nanotechnol. 2019, 10, 135–143, doi:10.3762/bjnano.10.13

• atomic force microscope (AFM). As reference samples, we use a bulk single crystalline silicon. These samples before irradiation were etched in 10% HF solution to remove a surficial thin oxide layer. Both sets of the samples were irradiated with the cluster beam at a right angle to the plane of the

Threshold voltage decrease in a thermotropic nematic liquid crystal doped with graphene oxide flakes

• Mateusz Mrukiewicz,
• Krystian Kowiorski,
• Paweł Perkowski,
• Rafał Mazur and
• Małgorzata Djas

Beilstein J. Nanotechnol. 2019, 10, 71–78, doi:10.3762/bjnano.10.7

• μm while the standard deviation (SD) was equal to 0.543 μm (Figure 1b). The calculations were done using ImageJ software (V. 1.52a). The thickness of the GO flake samples was measured using a MFP 3D BIO (Asylum Research/Oxford Instruments) atomic force microscope (AFM) working in semi-contact regime

• (grant no. 1644/MOB/V/2017/0), Military University of Technology grant no. PBS 23-652, and the Institute of Electronic Materials Technology (Statutory Research 2018). The authors would like to thank Dr. Adrian Chlanda for the measurements using the atomic force microscope and Mr. Jerzy Dziaduszek for

Characterization and influence of hydroxyapatite nanopowders on living cells

• Przemyslaw Oberbek,
• Tomasz Bolek,
• Adrian Chlanda,
• Seishiro Hirano,
• Sylwia Kusnieruk,
• Julia Rogowska-Tylman,
• Ganna Nechyporenko,
• Viktor Zinchenko,
• Wojciech Swieszkowski and
• Tomasz Puzyn

Beilstein J. Nanotechnol. 2018, 9, 3079–3094, doi:10.3762/bjnano.9.286

• done taking into account at least 15 different agglomerates for each sample. Atomic force microscopy Atomic force microscope (AFM) was used for topography imaging, surface evaluation at the nanoscale and evaluation of the particle shapes [35]. The sample preparation protocol was as follows: A water

In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy

• Jesús S. Lacasa,
• Lisa Almonte and
• Jaime Colchero

Beilstein J. Nanotechnol. 2018, 9, 2925–2935, doi:10.3762/bjnano.9.271

• 46556, USA 10.3762/bjnano.9.271 Abstract Under ambient conditions, surfaces are rapidly modified and contaminated by absorbance of molecules and a variety of nanoparticles that drastically change their chemical and physical properties. The atomic force microscope tip–sample system can be considered a

Charged particle single nanometre manufacturing

• Philip D. Prewett,
• Cornelis W. Hagen,
• Claudia Lenk,
• Steve Lenk,
• Marcus Kaestner,
• Tzvetan Ivanov,
• Ahmad Ahmad,
• Ivo W. Rangelow,
• Xiaoqing Shi,
• Stuart A. Boden,
• Alex P. G. Robinson,
• Dongxu Yang,
• Sangeetha Hari,
• Marijke Scotuzzi and
• Ejaz Huq

Beilstein J. Nanotechnol. 2018, 9, 2855–2882, doi:10.3762/bjnano.9.266

• patterning as well as the inspection of the masks before and after etching was done in an FEI Nova Nano Lab 650 SEM. The lateral dimension of the structures was obtained from the SEM images, while the feature height was calculated from the profile of a Bruker Nanoscope V atomic force microscope (AFM). The

Biomimetic surface structures in steel fabricated with femtosecond laser pulses: influence of laser rescanning on morphology and wettability

• Camilo Florian Baron,
• Alexandros Mimidis,
• Daniel Puerto,
• Evangelos Skoulas,
• Emmanuel Stratakis,
• Javier Solis and
• Jan Siegel

Beilstein J. Nanotechnol. 2018, 9, 2802–2812, doi:10.3762/bjnano.9.262

• surfaces were polished obtaining mirror-like quality with an average roughness Ra < 2 nm measured by an atomic force microscope (AFM, Agilent 5100 AFM/SPM in tapping mode). In order to avoid environmental oxidation by humidity, the samples were stored in a desiccator at 30% relative humidity. Before and

Variation of the photoluminescence spectrum of InAs/GaAs heterostructures grown by ion-beam deposition

• Alexander S. Pashchenko,
• Leonid S. Lunin,
• Eleonora M. Danilina and
• Sergei N. Chebotarev

Beilstein J. Nanotechnol. 2018, 9, 2794–2801, doi:10.3762/bjnano.9.261

• monochromator entrance slit from the reflected harmonics of the exciting laser radiation was carried out by means a Y-1.4 optical filter (light yellow color). A study of the surface morphology of the grown heterostructures was carried out using a Solver HV atomic force microscope. The structural properties of

Optimization of Mo/Cr bilayer back contacts for thin-film solar cells

• Nima Khoshsirat,
• Fawad Ali,
• Vincent Tiing Tiong,
• Mojtaba Amjadipour,
• Hongxia Wang,
• Mahnaz Shafiei and
• Nunzio Motta

Beilstein J. Nanotechnol. 2018, 9, 2700–2707, doi:10.3762/bjnano.9.252

• tapping mode NT-MDT Solver-Pro atomic force microscope (AFM). A KeithLink four-point probe system was used to measure the sheet resistivity of the films. A Cary 5000 UV–vis–NIR spectrophotometer was also used for the optical properties measurements. The adhesion of the Mo layer was tested through ultra

Au–Si plasmonic platforms: synthesis, structure and FDTD simulations

• Anna Gapska,
• Marcin Łapiński,
• Paweł Syty,
• Wojciech Sadowski,
• Józef E. Sienkiewicz and
• Barbara Kościelska

Beilstein J. Nanotechnol. 2018, 9, 2599–2608, doi:10.3762/bjnano.9.241

• different temperatures (up to 600 °C) in air in a hot furnace. A scheme of the formation of the gold nanostructures is shown in Figure 1. To analyze the surface morphology of the samples, a FEI Quanta FEG 250 scanning electron microscope (SEM) operated at 10 kV and an atomic force microscope (AFM) Omicron

Non-agglomerated silicon–organic nanoparticles and their nanocomplexes with oligonucleotides: synthesis and properties

• Asya S. Levina,
• Marina N. Repkova,
• Nadezhda V. Shikina,
• Zinfer R. Ismagilov,
• Svetlana A. Yashnik,
• Dmitrii V. Semenov,
• Yulia I. Savinovskaya,
• Natalia A. Mazurkova,
• Inna A. Pyshnaya and
• Valentina F. Zarytova

Beilstein J. Nanotechnol. 2018, 9, 2516–2525, doi:10.3762/bjnano.9.234

• microscope. The results are presented in Figure 3. Atomic force microscopy (AFM) was performed on a Solver P47 Bio atomic force microscope (NT-МDT, Russia) in a tapping mode. The aqueous solution of the Si–NH2·ODN(1) sample (10 µL, 0.16 µM, NH2/p = 10) was applied to a freshly cleaved mica area of 25–30 mm2

Recent highlights in nanoscale and mesoscale friction

• Andrea Vanossi,
• Dirk Dietzel,
• Andre Schirmeisen,
• Ernst Meyer,
• Rémy Pawlak,
• Thilo Glatzel,
• Marcin Kisiel,
• Shigeki Kawai and
• Nicola Manini

Beilstein J. Nanotechnol. 2018, 9, 1995–2014, doi:10.3762/bjnano.9.190

• ultimately responsible for the microscopic processes governing friction. Major advances in experimental techniques, including the development and widespread adoption of scanning microscopes and particularly the atomic force microscope (AFM) [1], accompanied by new theoretical concepts and models, have

Toward the use of CVD-grown MoS₂ nanosheets as field-emission source

• Geetanjali Deokar,
• Nitul S. Rajput,
• Junjie Li,
• Francis Leonard Deepak,
• Wei Ou-Yang,
• Nicolas Reckinger,
• Carla Bittencourt,
• Jean-Francois Colomer and
• Mustapha Jouiad

Beilstein J. Nanotechnol. 2018, 9, 1686–1694, doi:10.3762/bjnano.9.160

• energy-dispersive spectroscopy (EDS) detector) operating at 200 kV for imaging and elemental characterization. Roughness and topography of the as-grown MoS2 NSs (before transfer) were examined by atomic force microscope (AFM). The AFM scans were recorded in resonant mode (AppNanoTM made cantilever with

Closed polymer containers based on phenylboronic esters of resorcinarenes

• Tatiana Yu. Sergeeva,
• Rezeda K. Mukhitova,
• Irek R. Nizameev,
• Marsil K. Kadirov,
• Polina D. Klypina,
• Albina Y. Ziganshina and
• Alexander I. Konovalov

Beilstein J. Nanotechnol. 2018, 9, 1594–1601, doi:10.3762/bjnano.9.151

• , reducing the pH value down to 3 results in the dissociation of p(SRA-B) and a rapid release of the dyes. A similar behavior was observed after the addition of glucose. Experimental Characterizations An atomic force microscope (AFM, Innova, Bruker) has been used to reveal the morphology of the nanoparticles

Induced smectic phase in binary mixtures of twist-bend nematogens

• Anamarija Knežević,
• Irena Dokli,
• Marin Sapunar,
• Suzana Šegota,
• Ute Baumeister and
• Andreja Lesac

Beilstein J. Nanotechnol. 2018, 9, 1297–1307, doi:10.3762/bjnano.9.122

• of BB by atomic force microscope (AFM). Three mixtures containing 8, 18 and 27 mol % BB were investigated by AFM at 55 °C. For all three mixtures, the presence of the NTB phase at 55 °C, was confirmed by characteristic texture measurements and additionally verified by the XRD measurement performed on

Artifacts in time-resolved Kelvin probe force microscopy

• Sascha Sadewasser,
• Nicoleta Nicoara and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2018, 9, 1272–1281, doi:10.3762/bjnano.9.119

• the critical frequencies should be avoided, and (ii) an FFT analysis of the total electrostatic driving force is recommended to avoid misinterpretation of experimental data. Experimental Experiments were performed in an ultra-high vacuum atomic force microscope (Omicron VT-SPM) at a base pressure

Atomistic modeling of tribological properties of Pd and Al nanoparticles on a graphene surface

• Alexei Khomenko,
• Miroslav Zakharov,
• Denis Boyko and
• Bo N. J. Persson

Beilstein J. Nanotechnol. 2018, 9, 1239–1246, doi:10.3762/bjnano.9.115

• considerable interest over the past four decades. This is due to the development of new experimental techniques, for example, atomic force microscope, dynamic friction force microscope, and owing to the continuous miniaturization of electronic and mechanical devices [1][2][3][4][5][6][7][8][9][10][11][12][13

A novel copper precursor for electron beam induced deposition

• Caspar Haverkamp,
• George Sarau,
• Mikhail N. Polyakov,
• Ivo Utke,
• Marcos V. Puydinger dos Santos,
• Silke Christiansen and
• Katja Höflich

Beilstein J. Nanotechnol. 2018, 9, 1220–1227, doi:10.3762/bjnano.9.113

• ratios of copper to oxygen and copper to carbon (d) Height of FEBID pads for different deposition times, written with a dwell time of 10 μs and a point distance of 3 nm. (e) Atomic force microscope line scans of the FEBID pad in (a) and (b). (a) Raman spectra of a FEBID pad, FEBID precursor and the

Heterostuctures of 4-(chloromethyl)phenyltrichlorosilane and 5,10,15,20-tetra(4-pyridyl)-21H,23H-porphine prepared on Si(111) using particle lithography: Nanoscale characterization of the main steps of nanopatterning

• Phillip C. Chambers and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2018, 9, 1211–1219, doi:10.3762/bjnano.9.112

• sonication step was repeated 4 times and then the samples were dried under nitrogen. Atomic force microscopy Samples were characterized using a model 5500 atomic force microscope (Keysight Technologies, Santa Rosa, CA). Images of samples were acquired using tapping-mode in ambient air. Silicon nitride tips

A simple extension of the commonly used fitting equation for oscillatory structural forces in case of silica nanoparticle suspensions

• Sebastian Schön and
• Regine von Klitzing

Beilstein J. Nanotechnol. 2018, 9, 1095–1107, doi:10.3762/bjnano.9.101

• instruments, e.g., surface force apparatus (SFA) [2][4][5][6], thin film pressure balance (TFPB) [7][8][9][10][11], total internal reflection microscope (TIRM) [12][13][14][15][16], optical tweezers [17] or colloidal probe atomic force microscope (CP-AFM) [18][19][20][21]. Oscillatory forces have been

Scanning speed phenomenon in contact-resonance atomic force microscopy

• Christopher C. Glover,
• Jason P. Killgore and
• Ryan C. Tung

Beilstein J. Nanotechnol. 2018, 9, 945–952, doi:10.3762/bjnano.9.87

• theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data. Keywords: atomic force microscope; contact resonance; liquid; phenomenon; scan speed; Introduction With the rise in popularity of simultaneous topographic imaging and material property