Cantilever signature of tip detachment during contact resonance AFM

• Devin Kalafut,
• Ryan Wagner,
• Maria Jose Cadena,
• Anil Bajaj and
• Arvind Raman

Beilstein J. Nanotechnol. 2021, 12, 1286–1296, doi:10.3762/bjnano.12.96

• connect the qualitative and quantitative behavior to experimental features. Keywords: atomic force microscopy (AFM); contact resonance; nonlinear normal mode (NNM); tip–sample detachment; photothermal excitation; Introduction Contact resonance atomic force microscopy (CR-AFM) [1][2], piezoresponse force

• microscopy (PFM) [3], and electrochemical strain microscopy (ESM) [4] are atomic force microscopy (AFM) [5] methods where the probe tip is held in contact with the sample at a constant average force while a small superimposed vibrational response is monitored. CR-AFM can measure the viscoelastic properties

A review on slip boundary conditions at the nanoscale: recent development and applications

• Ruifei Wang,
• Jin Chai,
• Bobo Luo,
• Xiong Liu,
• Jianting Zhang,
• Min Wu,
• Mingdan Wei and
• Zhuanyue Ma

Beilstein J. Nanotechnol. 2021, 12, 1237–1251, doi:10.3762/bjnano.12.91

• nanoscale systems [8][34][38][39]. For example, based on surface force apparatus (SFA) and atomic force microscopy (AFM) measurements, many researchers have investigated the slippage characteristics of nanoconfined liquid flows and derived the slip length according to its correlation with the hydrodynamic

Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• ; Introduction More than 30 years have passed since the introduction of atomic force microscopy (AFM) [1]. This technique has established itself as an indispensable tool for characterization not only in physics and chemistry, but also in related fields of research including medicine, biology, and materials

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

• Gheorghe Stan and
• Pradeep Namboodiri

Beilstein J. Nanotechnol. 2021, 12, 1115–1126, doi:10.3762/bjnano.12.83

• (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be analyzed a posteriori, modeled, and interpreted to include

A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

• Berkin Uluutku,
• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 1063–1077, doi:10.3762/bjnano.12.79

• at the micro- and the nanoscale is commonly performed with the aid of force–distance relationships acquired using atomic force microscopy (AFM). The general strategy for existing methods is to fit the observed material behavior to specific viscoelastic models, such as generalized viscoelastic models

• ; Introduction Atomic force microscopy (AFM) is a prominent technique for investigating material properties at the micro- and the nanoscale [1][2][3], within which a wide variety of instruments, probes, and analysis techniques have been developed to attempt meaningful material property extraction [4][5][6][7][8

Revealing the formation mechanism and band gap tuning of Sb₂S₃ nanoparticles

• Maximilian Joschko,
• Franck Yvan Fotue Wafo,
• Christina Malsi,
• Danilo Kisić,
• Ivana Validžić and
• Christina Graf

Beilstein J. Nanotechnol. 2021, 12, 1021–1033, doi:10.3762/bjnano.12.76

• . Atomic force microscopy (AFM) as an additional method of size determination was applied to confirm the TEM results of the sample obtained after 30 s reaction time. AFM enables imaging of the nanoparticles under milder conditions than TEM and at ambient conditions so that thermal damage of the

Molecular assemblies on surfaces: towards physical and electronic decoupling of organic molecules

• Sabine Maier and
• Meike Stöhr

Beilstein J. Nanotechnol. 2021, 12, 950–956, doi:10.3762/bjnano.12.71

• . To a lesser extent, metal oxides have also been used, for which defects and charging often pose additional challenges [44][45][46]. On electronically insulating surfaces, non-contact atomic force microscopy (AFM) is the method of choice to study molecular assemblies and individual molecules in real

Self-assembly of Eucalyptus gunnii wax tubules and pure ß-diketone on HOPG and glass

• Miriam Anna Huth,
• Axel Huth and
• Kerstin Koch

Beilstein J. Nanotechnol. 2021, 12, 939–949, doi:10.3762/bjnano.12.70

• is unknown. In this study, extracted wax of E. gunnii leaves and pure ß-diketone were recrystallized on two different artificial materials and analyzed by scanning electron microscopy (SEM) and atomic force microscopy (AFM) to study their formation process. Both the wax mixture and pure ß-diketone

• formation of the tubules [26]. Atomic force microscopy (AFM) investigations further showed that the elongation of secondary alcohol tubules is based on a helical growth mechanism [27]. Recrystallization experiments with nonacosan-10-ol on non-biological substrates showed that the chemical and physical

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• , convolutional neural networks, and how it is transforming the acquisition and analysis of scanning probe data. Keywords: atomic force microscopy (AFM); deep learning; machine learning; neural networks; scanning probe microscopy (SPM); Review Introduction: traditional machine learning vs deep learning Machine

Reducing molecular simulation time for AFM images based on super-resolution methods

• Zhipeng Dou,
• Jianqiang Qian,
• Yingzi Li,
• Rui Lin,
• Jianhai Wang,
• Peng Cheng and
• Zeyu Xu

Beilstein J. Nanotechnol. 2021, 12, 775–785, doi:10.3762/bjnano.12.61

• Zhipeng Dou Jianqiang Qian Yingzi Li Rui Lin Jianhai Wang Peng Cheng Zeyu Xu School of Physics, Beihang University, Beijing 100083, China 10.3762/bjnano.12.61 Abstract Atomic force microscopy (AFM) has been an important tool for nanoscale imaging and characterization with atomic and subatomic

9.1% efficient zinc oxide/silicon solar cells on a 50 μm thick Si absorber

• Rafal Pietruszka,
• Bartlomiej S. Witkowski,
• Monika Ozga,
• Katarzyna Gwozdz,
• Ewa Placzek-Popko and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 766–774, doi:10.3762/bjnano.12.60

• the tested PV cells, as measured with atomic force microscopy (AFM). The results for the photovoltaic cell modified with zinc oxide nanorods are shown in Figure 4a and Figure 4c. The results for the planar cell are shown in Figure 4b and Figure 4d. There are significant differences in the roughness

Physical constraints lead to parallel evolution of micro- and nanostructures of animal adhesive pads: a review

• Thies H. Büscher and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2021, 12, 725–743, doi:10.3762/bjnano.12.57

• CC BY 4.0). (D–G) Atomic force microscopy (AFM) height images of the footprint droplets of the beetle Coccinella septempunctata (D,F) and the fly Calliphora vicina (E,G). (D) and (E) share the same colour scale. Brighter pixels correspond to higher z values. (F,G) Three-dimensional impressions of the

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

Impact of GaAs(100) surface preparation on EQE of AZO/Al₂O₃/p-GaAs photovoltaic structures

• Piotr Caban,
• Rafał Pietruszka,
• Jarosław Kaszewski,
• Monika Ożga,
• Bartłomiej S. Witkowski,
• Krzysztof Kopalko,
• Piotr Kuźmiuk,
• Katarzyna Gwóźdź,
• Ewa Płaczek-Popko,
• Krystyna Lawniczak-Jablonska and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 578–592, doi:10.3762/bjnano.12.48

• /interface needs to be properly prepared. In the experiments described here we examined eight different paths of GaAs surface treatment (cleaning, etching, passivation) which resulted in different external quantum efficiency (EQE) values of the tested photovoltaic (PV) cells. Atomic force microscopy (AFM

Determining amplitude and tilt of a lateral force microscopy sensor

• Oliver Gretz,
• Alfred J. Weymouth,
• Thomas Holzmann,
• Korbinian Pürckhauer and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2021, 12, 517–524, doi:10.3762/bjnano.12.42

• atomic force microscopy (AFM) is a non-contact atomic force microscopy technique where the frequency shift (Δf) of an oscillating tip is detected [1]. The frequency shift is a measure of the total force gradient acting on the tip, which includes both long-range and short-range contributions. A typical

Boosting of photocatalytic hydrogen evolution via chlorine doping of polymeric carbon nitride

• Malgorzata Aleksandrzak,
• Michalina Kijaczko,
• Wojciech Kukulka,
• Daria Baranowska,
• Martyna Baca,
• Beata Zielinska and
• Ewa Mijowska

Beilstein J. Nanotechnol. 2021, 12, 473–484, doi:10.3762/bjnano.12.38

• , carbon, oxygen, and chlorine in Cl-PCN was performed and showed homogeneous distribution of all elements in the sample. As analyzed via atomic force microscopy (AFM, Figure 2a and Figure 2b) the as-prepared PCN aggregated as large sheets with thickness ranging from 1 to 4 nm (corresponding to 3–11 atomic

The nanomorphology of cell surfaces of adhered osteoblasts

• Christian Voelkner,
• Mirco Wendt,
• Regina Lange,
• Max Ulbrich,
• Martina Gruening,
• Susanne Staehlke,
• Barbara Nebe,
• Ingo Barke and
• Sylvia Speller

Beilstein J. Nanotechnol. 2021, 12, 242–256, doi:10.3762/bjnano.12.20

• signal is a force, pressure is applied to the sample. This is the case when using atomic force microscopy (AFM), giving rise to substantially depressed apparent heights on living and fixed cells [17]. Typically, mammalian cells exhibit Young's moduli in the range of 1 to 10 kPa while AFM probe pressures

Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

• Cameron H. Parvini,
• M. A. S. R. Saadi and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 137–138, doi:10.3762/bjnano.12.10

• Cameron H. Parvini M. A. S. R. Saadi Santiago D. Solares Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, 800 22nd St. NW, Suite 3000, Washington, DC 20052, United States 10.3762/bjnano.12.10 Keywords: atomic force

• microscopy (AFM); creep; force mapping; indentation; Kelvin–Voigt; static force spectroscopy (SFS); viscoelasticity; In the “Useful Viscoelastic Quantities” section of the original publication, it is stated that the storage modulus (E′) and storage compliance (J′) are inverses of one another (Equation 10

Fusion of purple membranes triggered by immobilization on carbon nanomembranes

• René Riedel,
• Natalie Frese,
• Fang Yang,
• Martin Wortmann,
• Raphael Dalpke,
• Daniel Rhinow,
• Norbert Hampp and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 93–101, doi:10.3762/bjnano.12.8

• histidine-tag at the extracellular side of a PM mutant (c-His PM). The functionalization and the resulting hybrid membrane were examined by atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), confocal laser scanning microscopy (CLSM), and infrared

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• of atomic force microscopy (AFM) is the measurement of physical properties at sub-micrometer resolution. Methods such as force–distance curves (FDCs) or dynamic variants (such as intermodulation AFM (ImAFM)) are able to measure mechanical properties (such as the local stiffness, kr) of nanoscopic

• determined. Keywords: AFM force spectroscopy; composites; principle component analysis; structure–property correlation; van der Waals forces; Introduction The mechanical properties of small volumes of materials can be measured using various atomic force microscopy (AFM) methods. The well-established force

Atomic layer deposited films of Al₂O₃ on fluorine-doped tin oxide electrodes: stability and barrier properties

• Hana Krýsová,
• Michael Neumann-Spallart,
• Hana Tarábková,
• Pavel Janda,
• Ladislav Kavan and
• Josef Krýsa

Beilstein J. Nanotechnol. 2021, 12, 24–34, doi:10.3762/bjnano.12.2

• 7.2). Chronoamperometric measurements were performed in buffered solution (pH 7.2) at −1.2 V (vs Ag/AgCl). The morphology of the films was characterized ex situ, under ambient conditions, by atomic force microscopy (AFM, Dimension Icon, Bruker, USA) in a semicontact (tapping) mode. A silicon

Nanomechanics of few-layer materials: do individual layers slide upon folding?

• Ronaldo J. C. Batista,
• Rafael F. Dias,
• Ana P. M. Barboza,
• Alan B. de Oliveira,
• Taise M. Manhabosco,
• Thiago R. Gomes-Silva,
• Matheus J. S. Matos,
• Andreij C. Gadelha,
• Cassiano Rabelo,
• Luiz G. L. Cançado,
• Ado Jorio,
• Hélio Chacham and
• Bernardo R. A. Neves

Beilstein J. Nanotechnol. 2020, 11, 1801–1808, doi:10.3762/bjnano.11.162

• methods; atomic force microscopy (AFM); molecular dynamics (MD); Raman spectroscopy; nanostructured materials; Introduction Layered materials such as graphite, talc, and transition metal dichalcogenides (TMDs), held together by strong covalent bonds within layers and relatively weak van der Waals

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

• Rosine Coq Germanicus,
• Peter De Wolf,
• Florent Lallemand,
• Catherine Bunel,
• Serge Bardy,
• Hugues Murray and
• Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

• complete parametric investigation, is performed with a dynamic spectroscopy method. The results emphasize the strong impact, in terms of distinction and location, of the applied bias on the local sMIM measurements for both FEOL and BEOL layers. Keywords: atomic force microscopy (AFM); DataCube; doping

• crucial to optimize and increase the device integration. In order to map the electrical properties of microelectronic materials with a high spatial resolution, scanning probe microscopy (SPM), based on atomic force microscopy (AFM), offers several modes based on the control of electrical conduction and on

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

• Tatsuya Yamamoto,
• Ryo Izumi,
• Kazushi Miki,
• Takahiro Yamasaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2020, 11, 1750–1756, doi:10.3762/bjnano.11.157

• between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16×2) reconstruction, which indeed has a complex structure. Keywords: atomic force microscopy (AFM); noncontact atomic force microscopy (NC-AFM); Si

• regarding the atomic structure of the reconstruction that includes both pentagons and step edges is insufficient. In this study, the Si(110)-(16×2) reconstruction will be investigated by atomic force microscopy (AFM) at 78 K to directly observe the atomic arrangement of the reconstruction. In this work, we

PEG/PEI-functionalized single-walled carbon nanotubes as delivery carriers for doxorubicin: synthesis, characterization, and in vitro evaluation

• Shuoye Yang,
• Zhenwei Wang,
• Yahong Ping,
• Yuying Miao,
• Yongmei Xiao,
• Lingbo Qu,
• Lu Zhang,
• Yuansen Hu and
• Jinshui Wang

Beilstein J. Nanotechnol. 2020, 11, 1728–1741, doi:10.3762/bjnano.11.155

• ). Fourier-transform infrared (FTIR) spectra in the range from 500 to 4000 cm−1 were recorded with a FTIR spectrometer (Nicolet IS10). X-ray diffraction (XRD) analysis was conducted using a BRUKER D8 X-ray diffractometer in the 2θ range of 0–100° at a scanning rate of 5°·min−1. For atomic force microscopy

• (AFM) measurements, different SWCNT dispersions (ethanol/ultrapure water = 1:1) with a concentration of 0.01% were dripped on freshly cleaved mica and observed using an AFM (Dimension Icon, Bruker AXS). Drug loading and encapsulation efficiency An amount of 50 mg of different SWCNT samples were