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Search for "atomic resolution" in Full Text gives 94 result(s) in Beilstein Journal of Nanotechnology.

Sub-monolayer film growth of a volatile lanthanide complex on metallic surfaces

  • Hironari Isshiki,
  • Jinjie Chen,
  • Kevin Edelmann and
  • Wulf Wulfhekel

Beilstein J. Nanotechnol. 2015, 6, 2412–2416, doi:10.3762/bjnano.6.248

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  • metal surfaces without decomposition. Results and Discussion Figure 2a–f shows STM topographies of Tb(thd)3 deposited on Cu(111), Ag(111) and Au(111), respectively. The imaging parameters are given in the caption. The white arrows indicate the direction, which was determined from images with atomic
  • resolution of each surface. We observed large molecular islands of Tb(thd)3 growing homogeneously on Cu(111) and Ag(111) and very few isolated molecules on these substrates (see Figure 2a,c). Thus, the deposited molecules diffuse at room temperature on the substrate, and eventually, nucleation of islands
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Published 16 Dec 2015

A simple method for the determination of qPlus sensor spring constants

  • John Melcher,
  • Julian Stirling and
  • Gordon A. Shaw

Beilstein J. Nanotechnol. 2015, 6, 1733–1742, doi:10.3762/bjnano.6.177

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  • technique opens up a broad materials spectrum to the possibility of atomic-scale analysis. This new capability has led to imaging with sub-atomic resolution [1], and chemical identification of surface atoms [2] and molecules [3], as well as dynamic force spectroscopy in a wet chemical environment [4
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Published 14 Aug 2015

Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials

  • Xiaoxing Ke,
  • Carla Bittencourt and
  • Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2015, 6, 1541–1557, doi:10.3762/bjnano.6.158

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  • , can now be carried out in unprecedented detail by aberration-corrected transmission electron microscopy (AC-TEM). This review discusses new possibilities and limits of AC-TEM at low voltage, including the structural imaging at atomic resolution, in three dimensions and spectroscopic investigation of
  • performance of electron microscopes. Therefore, the advances of the instruments have led to a dramatic improvement in imaging at low voltage. Atomic resolution has been achieved at low voltages of 60–80 kV or even as low as 20 kV [13], and energy resolution has been increased up to 0.1 eV [12]. These recent
  • -based nanomaterials are then reviewed, including structural imaging at atomic resolution and in three-dimensional (3D) reconstruction, spectroscopy of the chemistry at defects and interfaces, and in situ TEM under external stimuli along with dynamic TEM. 2 Basics of TEM: Lower the voltage 2.1 Aberration
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Published 16 Jul 2015

Heterometal nanoparticles from Ru-based molecular clusters covalently anchored onto functionalized carbon nanotubes and nanofibers

  • Deborah Vidick,
  • Xiaoxing Ke,
  • Michel Devillers,
  • Claude Poleunis,
  • Arnaud Delcorte,
  • Pietro Moggi,
  • Gustaaf Van Tendeloo and
  • Sophie Hermans

Beilstein J. Nanotechnol. 2015, 6, 1287–1297, doi:10.3762/bjnano.6.133

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  • agglomeration, and in particular, their characterization at atomic resolution to prove their bimetal nature within individual nanoparticles. In order to test their potential application in catalysis, the carbon-supported nanoparticles are evaluated in ammonia synthesis, as a reference reaction with mature
  • contrast features. As shown in Figure 5, metal nanoparticles appear as a white contrast at atomic resolution. In addition, free standing individual atoms are visible on the CNT surface as well, which is likely to be caused by cluster collapse. This finding is important as it is generally believed that
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Published 10 Jun 2015

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

  • Mykola Telychko,
  • Jan Berger,
  • Zsolt Majzik,
  • Pavel Jelínek and
  • Martin Švec

Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93

Graphical Abstract
  • specifically chosen for the conditions when the graphene contrast provided by the Δf is not giving atomic resolution in the attractive regime. Kelvin probe force measurements (KPFM) were also done in the constant-height mode, with a slow feedback between the measurement points, to compensate the tilt of the
  • graphene honeycomb structure modulated by the q-6 periodicity. The Δf signal shows the honeycomb structure and the q-6 modulation as well. In this case, the slow feedback control of the tip–sample distance allows us to stay in the repulsive regime, achieving atomic resolution. This would be otherwise
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Published 07 Apr 2015

Stick–slip behaviour on Au(111) with adsorption of copper and sulfate

  • Nikolay Podgaynyy,
  • Sabine Wezisla,
  • Christoph Molls,
  • Shahid Iqbal and
  • Helmut Baltruschat

Beilstein J. Nanotechnol. 2015, 6, 820–830, doi:10.3762/bjnano.6.85

Graphical Abstract
  • ; Introduction Atomic-scale friction processes constitute a fascinating field of research which has been opened by the invention of the atomic force microscope (AFM) [1]. The AFM allows us to determine the force necessary to move a cantilever tip laterally across the surface with atomic resolution. A theoretical
  • be obtained for this adlayer [12] Labuda et al. [16] found that atomic resolution on gold is most easily achieved at the potential of zero charge (pzc). They observed "blurred" resolution at higher potential where oxygen starts being adsorbed. Hausen et al. observed a stick–slip periodicity equal to
  • (111) in 0.05 M sulfuric acid solution + 1 mM CuSO4 the pzc is 0.22 V vs Cu/Cu2+ [20]. Labuda et al. [21] obtained atomic resolution of a copper sub-monolayer on gold(111) in perchloric acid solution. They found an increase in friction force after metal adsorption as compared to a clean gold surface
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Published 26 Mar 2015

Chains of carbon atoms: A vision or a new nanomaterial?

  • Florian Banhart

Beilstein J. Nanotechnol. 2015, 6, 559–569, doi:10.3762/bjnano.6.58

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  • difficulties in their synthesis and characterization. It is clear that only techniques allowing imaging with atomic resolution would give reliable information about the existence of carbon chains. A few years ago, the first electron microscopy images of carbon chains appeared [20][21][22]. This gave the field
  • scatterers), the vibration of the chain under the electron beam makes atomic resolution difficult. Therefore, the atoms in a chain could not be counted reliably until now; the measurement of the bond length and the question whether cumulene or polyyne has been observed is still unanswered although some
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Published 25 Feb 2015

Influence of size, shape and core–shell interface on surface plasmon resonance in Ag and Ag@MgO nanoparticle films deposited on Si/SiOx

  • Sergio D’Addato,
  • Daniele Pinotti,
  • Maria Chiara Spadaro,
  • Guido Paolicelli,
  • Vincenzo Grillo,
  • Sergio Valeri,
  • Luca Pasquali,
  • Luca Bergamini and
  • Stefano Corni

Beilstein J. Nanotechnol. 2015, 6, 404–413, doi:10.3762/bjnano.6.40

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  • caused by diffusion on the surface and agglomeration. Atomic resolution TEM gave evidence of the presence of crystalline multidomains in the NPs, which were due to aggregation and multitwinning occurring during NP growth in the nanocluster source. Co-deposition of Ag NPs and Mg atoms in an oxygen
  • ][30][31]. Figure 2b shows an atomic resolution TEM image of a single NP. The image corresponds to a McKay icosahedral geometry, where the icosahedron is assembled from single crystal tetrahedra with (111) faces [28][32] (see Figure 2c). This type of structure, as previously observed in other fcc metal
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Published 09 Feb 2015

Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM

  • Kfir Kuchuk and
  • Uri Sivan

Beilstein J. Nanotechnol. 2015, 6, 149–156, doi:10.3762/bjnano.6.14

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  • reconstruct short range forces more accurately than the fundamental harmonic when the oscillation amplitude is small compared with the interaction range. Keywords: atomic force spectroscopy; higher harmonic FM-AFM; Introduction AFM measurements are presently utilized to generate atomic resolution [1][2], 3D
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Published 13 Jan 2015

Dissipation signals due to lateral tip oscillations in FM-AFM

  • Michael Klocke and
  • Dietrich E. Wolf

Beilstein J. Nanotechnol. 2014, 5, 2048–2057, doi:10.3762/bjnano.5.213

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  • oscillation. Energy loss of the oscillation occurs not only due to mechanical damping of the cantilever, but also due to interaction between tip and surface, so that the damping signal can be used for imaging, even with atomic resolution [4]. There is a broad consensus, that the observed dissipation is due to
  • dissipation rates of the same order of magnitude. The strength of the dissipation depends on the absolute value of the lateral forces. One, therefore, expects high dissipation rates at step edges. If atomic resolution is achieved, this dissipation mechanism would show two maxima accompanying one maximum in
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Published 10 Nov 2014

Probing the electronic transport on the reconstructed Au/Ge(001) surface

  • Franciszek Krok,
  • Mark R. Kaspers,
  • Alexander M. Bernhart,
  • Marek Nikiel,
  • Benedykt R. Jany,
  • Paulina Indyka,
  • Mateusz Wojtaszek,
  • Rolf Möller and
  • Christian A. Bobisch

Beilstein J. Nanotechnol. 2014, 5, 1463–1471, doi:10.3762/bjnano.5.159

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  • . The mechanical stability and performance of the commercial STM setup was improved in order to provide atomic resolution, e.g., on the Si(111)-(7 × 7) surface or the Bi(111) surface [12]. During the scanning tunnelling potentiometry (STP) experiments, two tips contact the surface and drive a lateral
  • observations show that the excess amount of Au forms clusters of [110]-orientation, in agreement to previous STM studies of the same system by Wang et al. [20]. Also, HRTEM images with atomic resolution show that the Au clusters are crystalline. Apart from that, in Figure 4a, a thin layer exhibiting the
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Published 05 Sep 2014

Synthesis, characterization, and growth simulations of Cu–Pt bimetallic nanoclusters

  • Subarna Khanal,
  • Ana Spitale,
  • Nabraj Bhattarai,
  • Daniel Bahena,
  • J. Jesus Velazquez-Salazar,
  • Sergio Mejía-Rosales,
  • Marcelo M. Mariscal and
  • Miguel José-Yacaman

Beilstein J. Nanotechnol. 2014, 5, 1371–1379, doi:10.3762/bjnano.5.150

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  • bimetallic particles, under the assumption that the height of the atomic columns is fairly uniform, or that the differences in height are known, since the intensity signal depends strongly on the atomic number (Z). Figure 4a shows an atomic resolution STEM image of a Cu–Pt bimetallic nanoparticle oriented
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Published 27 Aug 2014

Surface topography and contact mechanics of dry and wet human skin

  • Alexander E. Kovalev,
  • Kirstin Dening,
  • Bo N. J. Persson and
  • Stanislav N. Gorb

Beilstein J. Nanotechnol. 2014, 5, 1341–1348, doi:10.3762/bjnano.5.147

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  • can be achieved only with an instrument having atomic resolution, such as AFM. Measurements based on the standard microscopy techniques, such as white light interferometry) have a resolution limited by the wavelength of the used light. Therefore, regions smaller than some fraction of the wavelength of
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Published 22 Aug 2014

Growth and characterization of CNT–TiO2 heterostructures

  • Yucheng Zhang,
  • Ivo Utke,
  • Johann Michler,
  • Gabriele Ilari,
  • Marta D. Rossell and
  • Rolf Erni

Beilstein J. Nanotechnol. 2014, 5, 946–955, doi:10.3762/bjnano.5.108

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  • nanomaterials To fundamentally understand the interface between CNTs and metal/metal oxides on the nanometer or even on the atomic level, TEM plays an irreplaceable role due to its high spatial resolution. With the development of spherical aberration correctors, atomic-resolution imaging at a sub-0.5 Å level
  • (EDX) analysis. The core-shell excitation process is localized around the atoms, and hence atomic-resolution chemical mappings can be achieved by using EELS core-loss signals combined with a sub-nanometer sized electron probe [43][44][45][46][47]. For example, by using EELS at a low acceleration
  • illustration of the principle in STEM-EELS: (a) the microscope configuration in the STEM mode; (b) the inelastic scattering processes in the TEM sample contributing to the low-loss and the core-loss EELS signals; (c) an atomic-resolution STEM-HAADF image of a GaN–Ge interface; (d) a EELS core-loss spectrum
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Published 02 Jul 2014

Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations

  • Jens Falter,
  • Marvin Stiefermann,
  • Gernot Langewisch,
  • Philipp Schurig,
  • Hendrik Hölscher,
  • Harald Fuchs and
  • André Schirmeisen

Beilstein J. Nanotechnol. 2014, 5, 507–516, doi:10.3762/bjnano.5.59

Graphical Abstract
  • ) allows the imaging of surfaces with true atomic resolution and the resolution of intra-molecular structures of molecules [1]. Furthermore, the non-contact AFM (nc-AFM) technique has the capability of quantifying the interaction forces acting between the probing tip and the sample site with atomic
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Published 23 Apr 2014

Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

  • Florian Pielmeier,
  • Daniel Meuer,
  • Daniel Schmid,
  • Christoph Strunk and
  • Franz J. Giessibl

Beilstein J. Nanotechnol. 2014, 5, 407–412, doi:10.3762/bjnano.5.48

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  • signal-to-noise ratio of quartz sensors, which showed that deflection detector noise decreases with decreasing beam thickness t [7]. While reducing simply t would lead to a decrease in k as well, the length L was also decreased to keep k in the optimal stiffness range for atomic resolution imaging [29
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Published 04 Apr 2014

Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

  • Adam Sweetman and
  • Andrew Stannard

Beilstein J. Nanotechnol. 2014, 5, 386–393, doi:10.3762/bjnano.5.45

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  • extrapolation method. Keywords: background subtraction; DFM; F(z); force; atomic resolution; NC-AFM; Si(111); STM; van der Waals; Introduction Non-contact atomic force microscopy (NC-AFM) is now the tool of choice for surface scientists wishing to investigate interatomic and intermolecular forces on surfaces
  • force between the very apex of the tip and the surface. In any atomic resolution experiment using a scanning probe, atomic contrast must arise from an interaction that decays on a distance comparable to the interatomic spacing, otherwise atomic resolution would not be readily obtained. Consequently, the
  • interactions. Results Figure 1A shows a constant Δf image of a C60 molecule adsorbed on the Si(111)-(7 × 7) surface. In order to obtain atomic resolution on the substrate, and image the molecule without perturbing it [15][22], the setpoint was changed halfway up the image (see figure caption). In this instance
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Published 01 Apr 2014

Noncontact atomic force microscopy II

  • Mehmet Z. Baykara and
  • Udo D. Schwarz

Beilstein J. Nanotechnol. 2014, 5, 289–290, doi:10.3762/bjnano.5.31

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  • (STM). While it is possible to obtain atomic-resolution images of material surfaces by using STM with relative ease, its basic operational principle depends on the phenomenon of quantum tunneling, rendering the technique applicable only to conductive and semi-conductive samples. The atomic force
  • , the operation of the AFM in its traditional form requires the establishment of a permanent – albeit light – contact between the probe tip and the sample surface, leading to a finite contact area, which prevents true atomic-resolution imaging. True atomic resolution imaging through AFM was finally
  • the sample surface to be investigated. Since actual contact with the sample is avoided, the probe tip retains its sharpness and atomic-resolution images may be obtained. Since its introduction two decades ago, NC-AFM has indeed been used to image a large number of conducting, semi-conducting, and
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Published 12 Mar 2014

Structural development and energy dissipation in simulated silicon apices

  • Samuel Paul Jarvis,
  • Lev Kantorovich and
  • Philip Moriarty

Beilstein J. Nanotechnol. 2013, 4, 941–948, doi:10.3762/bjnano.4.106

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  • turn leads to the observed hysteresis. This theoretical result is very similar to experimental observations on the Si(100) surface that recorded a dissipation of up to 0.5 eV/cycle [40] for a tip that demonstrated a “dimer-tip”-type atomic resolution [44]. It has also been shown [34] that very large
  • term D2a. A simple examination of the electron density plot reveals that the tip structure maintains a single prominent dangling bond orbital at its apex, which in principle should produce atomic resolution that is not significantly different from that to be expected from the initial tip structure
  • produce double-lobed surface features, doubling effects, or even fail to produce a well separated, understandable signal altogether. Such observations would depend on the surface under study, and on the separation of the surface atoms, which can be a particularly challenging problem when obtaining atomic
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Published 20 Dec 2013

Adsorption of the ionic liquid [BMP][TFSA] on Au(111) and Ag(111): substrate effects on the structure formation investigated by STM

  • Benedikt Uhl,
  • Florian Buchner,
  • Dorothea Alwast,
  • Nadja Wagner and
  • R. Jürgen Behm

Beilstein J. Nanotechnol. 2013, 4, 903–918, doi:10.3762/bjnano.4.102

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  • structure also follows the threefold geometry of the Ag(111) surface. Due to experimental reasons (adlayer imaging requires a large tunnel resistance while atomic resolution require low tunnel resistances) it was not possible to achieve atomic resolution of the surface near a boundary of a 2D crystalline
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Published 16 Dec 2013

Ni nanocrystals on HOPG(0001): A scanning tunnelling microscope study

  • Michael Marz,
  • Keisuke Sagisaka and
  • Daisuke Fujita

Beilstein J. Nanotechnol. 2013, 4, 406–417, doi:10.3762/bjnano.4.48

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  • nA), the inset shows atomic resolution (V = 0.3 V; I = 0.5 nA). (b–h) Evaporated Ni clusters on HOPG (V = 1 V; I = 0.2 nA). Evaporation parameters: (b) flux ≈50 nA, time = 30 s → Πf × t = 1.5 μAs; (c) ≈15 nA, 300 s, 4.5 μAs; (d) ≈100 nA, 50 s, 5.0 μAs; (e) ≈50 nA, 180 s, 9.0 μAs; (f) ≈100 nA, 100 s
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Published 28 Jun 2013

Optimal geometry for a quartz multipurpose SPM sensor

  • Julian Stirling

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

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  • atomic-resolution imaging the effective spring constant of the excited eigenmode should be low [13]. However, as the spring constant normal to the surface lowers, the risk of the probe snapping to contact with the surface increases. This produces a problem for combined AFM/LFM using the principal and
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Published 17 Jun 2013

High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

  • John Melcher,
  • David Martínez-Martín,
  • Miriam Jaafar,
  • Julio Gómez-Herrero and
  • Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

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  • Materia Condensada C-III, Universidad Autónoma de Madrid, 28049 Madrid, Spain School of Mechanical Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN 47907 10.3762/bjnano.4.15 Abstract The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM
  • forces can be remarkable similar. Furthermore, the reduction in noncontact forces and quality factors in liquids diminishes the role of feedback control in achieving high-resolution images. The theoretical findings are supported by atomic-resolution images of mica in water acquired with AM, FM and DAM
  • interrogating samples ranging from stiff inorganic materials to soft biological samples, with nanoscale resolution. Recently, the achievement of atomic-resolution imaging in liquids [2][3][4][5][6] has challenged the accepted belief that high quality factors, which are a hallmark of microcantilever probes in
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Published 27 Feb 2013

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

  • Jannis Lübbe,
  • Matthias Temmen,
  • Sebastian Rode,
  • Philipp Rahe,
  • Angelika Kühnle and
  • Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

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  • excellent demonstration of the potential of small amplitudes for atomic resolution measurements as it is known that the atomic contrast increases with reduced cantilever oscillation amplitude [11][14]. For a measurement with B−3dB = 385 Hz (red line, fc = 1 kHz, o = 5), one would choose an amplitude of 5 nm
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Published 17 Jan 2013

Characterization of the mechanical properties of qPlus sensors

  • Jan Berger,
  • Martin Švec,
  • Martin Müller,
  • Martin Ledinský,
  • Antonín Fejfar,
  • Pavel Jelínek and
  • Zsolt Majzik

Beilstein J. Nanotechnol. 2013, 4, 1–9, doi:10.3762/bjnano.4.1

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  • , including biology, chemistry and physics. In particular, noncontact atomic force microscopy [3] (nc-AFM) has developed into a powerful technique for imaging with true atomic resolution [4][5], chemical sensitivity [6][7][8] or for performing single atom manipulation [9][10][11] on all types of surfaces
  • simultaneous STM and AFM signals with atomic resolution on a metal surface [14]. At the same time F. J. Giessibl introduced so-called qPlus sensors [15], which allow simultaneous acquisition of the tunneling current and the forces with a small oscillation amplitude. This method increases substantially the
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Published 02 Jan 2013
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