Junction formation of Cu₃BiS₃ investigated by Kelvin probe force microscopy and surface photovoltage measurements

• Fredy Mesa,
• William Chamorro,
• William Vallejo,
• Robert Baier,
• Thomas Dittrich,
• Alexander Grimm,
• Martha C. Lux-Steiner and
• Sascha Sadewasser

Beilstein J. Nanotechnol. 2012, 3, 277–284, doi:10.3762/bjnano.3.31

• <10−10 mbar [25], by using the amplitude-modulation technique (AM mode). We used PtIr-coated cantilevers (Nanosensors) with a first resonance frequency of ~75 kHz, measuring the contact potential difference (CPD) using the second resonance mode at ~450 kHz and an ac voltage of 100 mV. For detection of

An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001)

• Antoine Hinaut,
• Adeline Pujol,
• Florian Chaumeton,
• David Martrou,
• André Gourdon and
• Sébastien Gauthier

Beilstein J. Nanotechnol. 2012, 3, 221–229, doi:10.3762/bjnano.3.25

• ], namely the frequency- and amplitude-modulation modes. In this work, we use the frequency-modulation mode. The voltage was modulated at 1 kHz with an amplitude of 2 V. The images were obtained in the constant Δf mode with an oscillation amplitude of A = 2 nm and small values of Δf, corresponding to

Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus

• Elena T. Herruzo and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2012, 3, 198–206, doi:10.3762/bjnano.3.22

• between observables and forces is difficult to deduce. Since the observable quantities in dynamic modes are averaged over many cycles of oscillation (amplitude and phase shift for amplitude modulation AFM (AM-AFM) [20][21], and frequency shift and dissipation for FM-AFM [22][23]), it is not

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

• Miriam Jaafar,
• Oscar Iglesias-Freire,
• Luis Serrano-Ramón,
• Manuel Ricardo Ibarra,
• Jose Maria de Teresa and
• Agustina Asenjo

Beilstein J. Nanotechnol. 2011, 2, 552–560, doi:10.3762/bjnano.2.59

• conservative interactions. In the amplitude modulation mode, the amplitude is the main feedback parameter and thus the movement of the piezoelectric is used to build the topography image. The frequency shift changes are recorded at a certain distance to build the magnetic image, thus the MFM images were

• proportional to the total force gradient (that can be composed of magnetic and/or electrostatic interactions). The experiments in the present work were performed in ambient conditions, in the non-contact dynamic mode (with low amplitude modulation) and with the PLL feedback activated. In addition, KPFM [17

Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

• Sergei Magonov and
• John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

• of their constituents. These differences are best reflected in phase images in the amplitude modulation (AM) mode, which are obtained at elevated forces. Although the phase contrast is efficient in differentiating the rubbery, glassy and inorganic components of polymer blends and composites, its