Role of oxygen in wetting of copper nanoparticles on silicon surfaces at elevated temperature

• Tapas Ghosh and
• Biswarup Satpati

Beilstein J. Nanotechnol. 2017, 8, 425–433, doi:10.3762/bjnano.8.45

• -sectional bright field TEM images and (c),(d) STEM-HAADF images of as-deposited and annealed at 500 °C in oxygen ambient copper nanoparticles on silicon substrates, respectively. The elemental mapping of Cu (1 and 4), Si (2 and 5), and the composite thereof (3 and 6) collected from the orange rectangular

• mm thick disk was cut from the tube and then mechanically thinned, dimpled, polished and finally ion-milled to make the sample electron transparent. Results and Discussion Copper deposited on silicon surfaces by the galvanic displacement reaction were extensively examined by TEM. The plan-view bright

• field TEM image in Figure 1a and the STEM-HAADF image in Figure 1b show the deposited copper nanoparticles on a silicon substrate. The elemental composition is presented by the EDX mapping. Figure 1e and Figure 1f show the silicon (yellow) and copper (blue) elemental mapping, respectively, collected

Performance of colloidal CdS sensitized solar cells with ZnO nanorods/nanoparticles

• Anurag Roy,
• Partha Pratim Das,
• Mukta Tathavadekar,
• Sumita Das and
• Parukuttyamma Sujatha Devi

Beilstein J. Nanotechnol. 2017, 8, 210–221, doi:10.3762/bjnano.8.23

• crystallites was calculated to be ≈5.2 nm using the Scherrer equation. The bright field image of the synthesized powder indicated the finer and porous nature of the synthesized CdS nanoparticles (Figure 1b). The high resolution TEM (HRTEM) image shows the (111) and (311) crystalline planes with d values of

• images of the sensitized films fabricated on ZnO-P and ZnO-R were monitored as depicted in Figure 4. The microstructural FESEM and TEM bright field images of the synthesized ZnO-R and ZnO-P are shown in Figure 4. The average nanoparticle size of the ZnO-P was calculated to be ≈12 nm from TEM. It is

• ) Bright field transmission electron microscope image of the NPs. (c) HRTEM image highlighting the inter-planar distance of the cubic crystal planes (Inset: corresponding FFT pattern). (d) SAED pattern from image in (b). (a) and (b) show the FT-IR and Raman spectrum, respectively, of the synthesized CdS

Influence of hydrofluoric acid treatment on electroless deposition of Au clusters

• Rachela G. Milazzo,
• Antonio M. Mio,
• Giuseppe D’Arrigo,
• Emanuele Smecca,
• Alessandra Alberti,
• Gabriele Fisichella,
• Filippo Giannazzo,
• Corrado Spinella and
• Emanuele Rimini

Beilstein J. Nanotechnol. 2017, 8, 183–189, doi:10.3762/bjnano.8.19

• uniformly assemble on the Si substrate with elongated and wide structures of a few tens of nanometers long. After 4 min in DHF (Figure 2b), they arrange as small particles of spherical shape with a radius of less than 10 nm. Although the images were taken in bright field mode, a huge mass contrast between

Structural and tribometric characterization of biomimetically inspired synthetic "insect adhesives"

• Matthias W. Speidel,
• Malte Kleemeier,
• Andreas Hartwig,
• Klaus Rischka,
• Angelika Ellermann,
• Rolf Daniels and
• Oliver Betz

Beilstein J. Nanotechnol. 2017, 8, 45–63, doi:10.3762/bjnano.8.6

• adhesives principles. In total, we prepared 12 synthetic "insect" emulsions that were structurally characterized by microscopic techniques such as bright field, fluorescence and cryo-scanning electron microscopy (cryo-SEM) and laser diffraction particle size analysis. Parameters of particular interest were

• structural parameters of each emulsion as revealed by bright field/fluorescence microscopy and cryo-scanning electron microscopy (SEM). In general, the droplet sizes determined by the various methods, such as bright field/fluorescence microscopy and cryo-SEM, were in good correspondence, except for the

• larger size range of droplets as shown by the bright field/fluorescence microscopic images in comparison with those by cryo-SEM. The microscopic analyses revealed that the first generation provided a broader droplet size range with extremely large individual droplets leading to platykurtic kurtosis

Ferromagnetic behaviour of ZnO: the role of grain boundaries

• Boris B. Straumal,
• Svetlana G. Protasova,
• Andrei A. Mazilkin,
• Eberhard Goering,
• Gisela Schütz,
• Petr B. Straumal and
• Brigitte Baretzky

Beilstein J. Nanotechnol. 2016, 7, 1936–1947, doi:10.3762/bjnano.7.185

• surfaces are also enriched by “magnetic atoms”, but the thickness of enriched surface layers is only half to about a third of that in GBs. Can we observe these layers directly, using TEM? Figure 10 shows the bright-field HREM micrographs for two zinc oxide films doped with 10 (Figure 10a) and 15 atom % Mn

• grain sizes. Replotted based on figures reproduced with permission from [46][47], copyright 2008, 2009 Elsevier Ltd. Bright-field HREM micrographs [48] for zinc oxide films doped with (a) 10 atom % Mn and (b) 15 atom % Mn. The insets show the Fourier transforms for amorphous and crystalline areas marked

“Sticky invasion” – the physical properties of Plantago lanceolata L. seed mucilage

• Agnieszka Kreitschitz,
• Alexander Kovalev and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2016, 7, 1918–1927, doi:10.3762/bjnano.7.183

• special type of the cell wall rich in pectins, which is loosely organized and easy accessible, this type of mucilage could also be considered as a model for further mechanical studies of such modified type of the cell wall. Mucilage composition. Bright field and fluorescence microscopy images of different

Facile fabrication of luminescent organic dots by thermolysis of citric acid in urea melt, and their use for cell staining and polyelectrolyte microcapsule labelling

• Nadezhda M. Zholobak,
• Anton L. Popov,
• Alexander B. Shcherbakov,
• Nelly R. Popova,
• Mykhailo M. Guzyk,
• Valeriy P. Antonovich,
• Alla V. Yegorova,
• Yuliya V. Scrypynets,
• Inna I. Leonenko,
• Alexander Ye. Baranchikov and
• Vladimir K. Ivanov

Beilstein J. Nanotechnol. 2016, 7, 1905–1917, doi:10.3762/bjnano.7.182

• cells. Bottom: Cells treated with hydrogen peroxide. Corresponding bright-field and confocal fluorescence (488 nm excitation) microscopy images with various magnifications are shown. LbL-microcapsules decorated with O-dots. (A–D) Luminescent microscopy images: A – ex. 365 nm/em. 445 nm; B – ex. 490 nm

Influence of hydrothermal synthesis parameters on the properties of hydroxyapatite nanoparticles

• Sylwia Kuśnieruk,
• Jacek Wojnarowicz,
• Agnieszka Chodara,
• Tadeusz Chudoba,
• Stanislaw Gierlotka and
• Witold Lojkowski

Beilstein J. Nanotechnol. 2016, 7, 1586–1601, doi:10.3762/bjnano.7.153

• hexagonal hydroxyapatite without the presence of foreign phases was observed. A microscope image of Type 1 HAp (Figure 6), taken with the bright field technique, shows elongated structures with similar diameters of ≈6.5 nm (ranging from 4 to 9 nm), but with outliers ranging from more than ten to several

• Type 3; d) HAp Type 4; e) HAp Type 5; f) HAp Type 6. SEM micrographs of HAp powders: (a, b) Type 1; (c, d) Type 2; (e, f) Type 3; (g, h) Type 4; (i, j) Type 5; (k, l) Type 6. The bright field TEM image of Type 1 HAp. a) A dark field TEM image of Type 2 HAp; b) a histogram of the particle size

Effect of triple junctions on deformation twinning in a nanostructured Cu–Zn alloy: A statistical study using transmission Kikuchi diffraction

• Silu Liu,
• Xiaolong Ma,
• Lingzhen Li,
• Liwen Zhang,
• Patrick W. Trimby,
• Xiaozhou Liao,
• Yusheng Li,
• Yonghao Zhao and
• Yuntian Zhu

Beilstein J. Nanotechnol. 2016, 7, 1501–1506, doi:10.3762/bjnano.7.143

• reveals that triple junctions could promote nucleation of deformation twins in a nanostructured Cu–Zn alloy. TKD has limitations in detecting thin twins and therefore becomes unreliable when the grain size is thinner than its step size. A typical bright-field TEM image of the HPT Cu–Zn alloy showing

Microwave synthesis of high-quality and uniform 4 nm ZnFe₂O₄ nanocrystals for application in energy storage and nanomagnetics

• Christian Suchomski,
• Ben Breitung,
• Ralf Witte,
• Michael Knapp,
• Sondes Bauer,
• Tilo Baumbach,
• Christian Reitz and
• Torsten Brezesinski

Beilstein J. Nanotechnol. 2016, 7, 1350–1360, doi:10.3762/bjnano.7.126

• in a Rh matrix. The center shifts are quoted relative to α-Fe foil at room temperature. The spectra were analyzed using the WinNORMOS software [24]. Transmission electron microscopy was performed on a Tecnai G2-F20ST microscope (FEI) operated at 200 keV. The bright-field images were analyzed using

• shape of the ZFO nanoparticles was investigated by means of transmission electron microscopy (TEM). The low-magnification bright-field TEM image in Figure 1a shows that they are spherical in shape with a narrow size distribution around 4 nm. Both high-resolution TEM (HRTEM, Figure 1b) and selected-area

• conclude that the particles are of good quality and thus hold promise for application in various fields of nanotechnology. Electron microscopy of as-prepared ZFO nanoparticles. (a) Bright-field TEM image. (b) HRTEM image and (c) SAED pattern demonstrating the crystallinity. Note that only the most intense

On the pathway of cellular uptake: new insight into the interaction between the cell membrane and very small nanoparticles

• Claudia Messerschmidt,
• Daniel Hofmann,
• Anja Kroeger,
• Katharina Landfester,
• Volker Mailänder and
• Ingo Lieberwirth

Beilstein J. Nanotechnol. 2016, 7, 1296–1311, doi:10.3762/bjnano.7.121

• . The particle diameters specified by the manufacturer were 7 nm, 12 nm and 22 nm and will be referred to as SiNP-7, SiNP-12 and SiNP-22, respectively. Figure 1 shows the measured size distributions and representative TEM bright field micrographs of the respective SiNPs. Table 1 gives the average radius

• tridiem image filter (Gatan Inc., USA) and an energy dispersive X-ray fluorescence (EDX) detector (EDAX Inc., USA) for analytical element measurements. Conventional bright field images were acquired using a Gatan US1000 slow scan CCD camera (Gatan Inc., USA). Inelastic dark field imaging for NP

• identification Since the contrast of the silica particles in bright field imaging was too low for unambiguous identification, we applied inelastic dark field imaging techniques for the visualization of silica nanoparticles. Inelastic dark field imaging was conducted using the image filter/electron energy loss

Straightforward and robust synthesis of monodisperse surface-functionalized gold nanoclusters

• Silvia Varela-Aramburu,
• Richard Wirth,
• Chian-Hui Lai,
• Guillermo Orts-Gil and
• Peter H. Seeberger

Beilstein J. Nanotechnol. 2016, 7, 1278–1283, doi:10.3762/bjnano.7.118

• bright-field image of Glc-NCs showing monodisperse nanoclusters, scale bar 2 nm; D) size distribution of 110 nanoclusters of Glc-NCs yielding diameters of 2.02 ± 0.18 nm. A) Functionalization of Glc-NCs by coupling trifluoroethanol to the carboxylic acid groups on the surface of the nanocluster to yield

Functional diversity of resilin in Arthropoda

• Jan Michels,
• Esther Appel and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2016, 7, 1241–1259, doi:10.3762/bjnano.7.115

Manufacturing and investigation of physical properties of polyacrylonitrile nanofibre composites with SiO₂, TiO₂ and Bi₂O₃ nanoparticles

• Tomasz Tański,
• Wiktor Matysiak and
• Barbara Hajduk

Beilstein J. Nanotechnol. 2016, 7, 1141–1155, doi:10.3762/bjnano.7.106

• taken in bright field and dark field mode and using an HAADF detector. The results of the diffraction studies, obtained using analytical electron microscopy in nanoareas in the STEM mode, confirmed the phase composition and the crystalline structure from the earlier X-ray study. The diffraction pattern

Improved biocompatibility and efficient labeling of neural stem cells with poly(L-lysine)-coated maghemite nanoparticles

• Igor M. Pongrac,
• Marina Dobrivojević,
• Lada Brkić Ahmed,
• Michal Babič,
• Miroslav Šlouf,
• Daniel Horák and
• Srećko Gajović

Beilstein J. Nanotechnol. 2016, 7, 926–936, doi:10.3762/bjnano.7.84

• surface of the carbon film. The particles were dried at room temperature for more than 1 h, and TEM micrographs were obtained at an accelerating voltage of 120 kV by Tecnai Spirit G2 (FEI, Brno, Czech Republic). Bright field imaging (BF) and selected area electron diffraction (SAED) were used to visualize

• counterstained with 0.1% Nuclear Fast Red (Sigma-Aldrich) for 1 min, mounted with HistoMount (Invitrogen) and covered using coverslip. After drying, the cells were analyzed under bright field using light microscope (ECLIPSE E200, Nikon Instruments, Japan). MTT cell viability assay After NSC labeling MTT (methyl

Templated green synthesis of plasmonic silver nanoparticles in onion epidermal cells suitable for surface-enhanced Raman and hyper-Raman scattering

• Marta Espina Palanco,
• Klaus Bo Mogensen,
• Marina Gühlke,
• Zsuzsanna Heiner,
• Janina Kneipp and
• Katrin Kneipp

Beilstein J. Nanotechnol. 2016, 7, 834–840, doi:10.3762/bjnano.7.75

• high non-linearity makes SEHRS a very sensitive method to probe spatial variations in local fields and to localize plasmonic nanostructures, surpassing also SERS. Here we compare SEHRS images and bright field microscopy of the onion cell layers. Additionally, our SERS and SEHRS experiments give

• bright field picture of the onion layer. The image displays the 1175 cm−1 SEHRS band (see spectrum in panel b). The color code represents the signal from lowest (blue) to highest (red). Acknowledgements We thank Harald Kneipp for support of the experiments and useful discussion. MG, ZH and JK

High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads

• Benjamin Grévin,
• Pierre-Olivier Schwartz,
• Laure Biniek,
• Martin Brinkmann,
• Nicolas Leclerc,
• Elena Zaborova and
• Stéphane Méry

Beilstein J. Nanotechnol. 2016, 7, 799–808, doi:10.3762/bjnano.7.71

• subsequent recovery on TEM copper grids. TEM was performed in bright field, high-resolution and diffraction modes using a CM12 Philips microscope equipped with a MVIII (Soft Imaging System) CCD camera. In order to avoid beam damage to the thin films, after focusing and correction of astigmatism, the electron

• domains. The first hypothesis is particularly supported by the existence of cross-hatch patterns in the TEM images (Figure 6b), clearly revealing that lamellae with different π-stacking directions overlap in some parts of the film. The TEM bright field images correspond to 2D projections of a 3D film

• , AVib = 14 nm). (b,c) nc-AFM topographic (b) and damping (c) images (1000 × 1000 nm) of the AD3 film on ITO/PEDOT:PSS (Δf = −20 Hz, AVib = 20 nm). (d) Bright field TEM image of an AD3 film. The area corresponding to some flat-on lamellae are highlighted by black contours in (a–d). (a) 300 × 300 nm nc

Assembling semiconducting molecules by covalent attachment to a lamellar crystalline polymer substrate

• Rainhard Machatschek,
• Patrick Ortmann,
• Renate Reiter,
• Stefan Mecking and
• Günter Reiter

Beilstein J. Nanotechnol. 2016, 7, 784–798, doi:10.3762/bjnano.7.70

Ultrastructural changes in methicillin-resistant Staphylococcus aureus induced by positively charged silver nanoparticles

• Dulce G. Romero-Urbina,
• Humberto H. Lara,
• J. Jesús Velázquez-Salazar,
• M. Josefina Arellano-Jiménez,
• Eduardo Larios,
• Anand Srinivasan,
• Jose L. Lopez-Ribot and
• Miguel José Yacamán

Beilstein J. Nanotechnol. 2015, 6, 2396–2405, doi:10.3762/bjnano.6.246

• emission transmission electron microscope operated at 200 kV. HAADF-STEM bacterial cell images were obtained using Cs-corrected JEOL JEM-ARM-200F microscope in both bright-field (BF) and dark-field (DF) modes. The microscope was operated at 200 kV using a convergence angle of 26 mrad and collection semi

Silica-coated upconversion lanthanide nanoparticles: The effect of crystal design on morphology, structure and optical properties

• Uliana Kostiv,
• Miroslav Šlouf,
• Hana Macková,
• Alexander Zhigunov,
• Hana Engstová,
• Katarína Smolková,
• Petr Ježek and
• Daniel Horák

Beilstein J. Nanotechnol. 2015, 6, 2290–2299, doi:10.3762/bjnano.6.235

• . Characterization of the nanoparticles The nanoparticles were visualized and analyzed on a Tecnai G2 Spirit Twin transmission electron microscope (TEM; FEI; Brno, Czech Republic) equipped with an energy dispersive spectrometer (EDX; Mahwah, NJ, USA). Bright field TEM imaging (BF), electron diffraction (ED) and

Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials

• Xiaoxing Ke,
• Carla Bittencourt and
• Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2015, 6, 1541–1557, doi:10.3762/bjnano.6.158

• the specimen. When the correction is used in bright-field imaging using a parallel beam the corrector is referred to as “image corrector”. When the Cs corrector is applied to the electron beam before interacting with the specimen, and forms a highly converged electron probe, it is referred to as

Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods

• Aleksandra Szkudlarek,
• Alfredo Rodrigues Vaz,
• Yucheng Zhang,
• Andrzej Rudkowski,
• Czesław Kapusta,
• Rolf Erni,
• Stanislav Moshkalev and
• Ivo Utke

Beilstein J. Nanotechnol. 2015, 6, 1508–1517, doi:10.3762/bjnano.6.156

• precipitate. The inset shows the SAD pattern of Cu fcc nanocrystals. TEM in situ annealing of FEBID rods grown from (hfac)Cu(VTMS). a) Dark field image of an as-deposited freestanding rod. Inset: rod apex with small Cu nanocrystals in carbonaceous matrix. b) Bright-field image of same rod after 270 °C

• annealing and continuous TEM observation (200 keV). Large Cu nanocrystals form inside the rod. c) Bright field image of another rod not observed during the same annealing process. Cu nanocrystals form at the outside surface of the rod. Calculated resistivity from the resistance measurement of a Cu–C line

Influence of the shape and surface oxidation in the magnetization reversal of thin iron nanowires grown by focused electron beam induced deposition

• Luis A. Rodríguez,
• Lorenz Deen,
• Rosa Córdoba,
• César Magén,
• Etienne Snoeck,
• Bert Koopmans and
• José M. De Teresa

Beilstein J. Nanotechnol. 2015, 6, 1319–1331, doi:10.3762/bjnano.6.136

• microstructure were determined by bright field (BF) TEM and high resolution TEM (HRTEM) imaging, and chemical composition of the sections was determined by combining high angle annular dark field (HAADF) imaging and electron energy loss spectroscopy (EELS) in scanning transmission electron microscopy (STEM) mode

Structural transitions in electron beam deposited Co–carbonyl suspended nanowires at high electrical current densities

• Gian Carlo Gazzadi and
• Stefano Frabboni

Beilstein J. Nanotechnol. 2015, 6, 1298–1305, doi:10.3762/bjnano.6.134

• measurements is reported in Figure 3. The bright-field image of SNW 1 is completely changed from the grainy structure observed after deposition. Now it has the typical appearance of a polycrystalline material, with regions of well-defined contrast extending for tens of nanometers along the wire, and separated

• structural transformation that was indeed confirmed by SEM analysis, in Figure 4c. The left-hand half of the wire looks brighter while the right-hand one has become transparent. To deeper investigate the nature of this transition we turned to TEM analysis. As shown by the bright-field image in Figure 5, the

• )–voltage(V) measurements on SNW 1. In the inset, the first I–V measurement taken on the wire as shown in Figure 1a is magnified; (b) SEM image (at 52° tilt angle) of SNW 1 after I–V 1. Bright-field TEM image of SNW 1 after electrical measurements. In the inset, the SAED pattern taken on the circled area

Addition of Zn during the phosphine-based synthesis of indium phospide quantum dots: doping and surface passivation

• Natalia E. Mordvinova,
• Alexander A. Vinokurov,
• Oleg I. Lebedev,
• Tatiana A. Kuznetsova and
• Sergey G. Dorofeev

Beilstein J. Nanotechnol. 2015, 6, 1237–1246, doi:10.3762/bjnano.6.127

• scattering region. This discrepancy can be explained by fact that the contrast in bright-field low-magnification TEM is a mass-thickness contrast, which arises from Rutherford elastic scattering of electrons, rather than a diffraction or an amplitude contrast in the case of dislocations and high resolution

• . In the low-magnification HAADF-STEM image (Figure 4a), the size of the QDs is close to that of the bright-field TEM images (Figure 3). However, upon close inspection using high resolution HAADF-STEM (Figure 4b–g), the core–shell structure of Zn/InP QDs can be clearly distinguished and confirmed. The

• InP QDs. Experimental X-ray powder diffractogram for synthesized InP QDs with different amounts of Zn dopant. (a) Bright-field low-magnification TEM image of non-doped InP QDs and its number-weighted size distribution (upper insert). Ring electron diffraction pattern (lower insert) confirming zinc