Influence of spurious resonances on the interaction force in dynamic AFM

• Luca Costa and
• Mario S. Rodrigues

Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

• its flexibility, amplitude modulation AFM (AM-AFM) [3] has become successful and widely employed to characterize surfaces at the nanoscale. It has continuously evolved in terms of achievable lateral resolution and scan speed, producing impressive results both at solid/gas interfaces under ambient

Nanometer-resolved mechanical properties around GaN crystal surface steps

• Jörg Buchwald,
• Marina Sarmanova,
• Bernd Rauschenbach and
• Stefan G. Mayr

Beilstein J. Nanotechnol. 2014, 5, 2164–2170, doi:10.3762/bjnano.5.225

• films were undertaken. CR-AFM is a technique for evaluating the mechanical properties of a broad range of materials while using one of the highest lateral resolution available, compared to other recent methods [1][2][22][23]. The investigated sample was an epitaxial c-plane GaN film grown on a 6H-SiC

Cathode lens spectromicroscopy: methodology and applications

• T. O. Menteş,
• G. Zamborlini,
• A. Sala and
• A. Locatelli

Beilstein J. Nanotechnol. 2014, 5, 1873–1886, doi:10.3762/bjnano.5.198

• aperture on the desired beam. The resulting real space image gives a direct map of the corresponding structure. No intensity is seen elsewhere, except that originating from the diffuse background of the primary diffracted beam. The lateral resolution is comparable to that of the bright field mode, and the

• an inverse Å. The lateral resolution is comparable to that of the normal XPEEM operation, well below the micrometer scale. Therefore, dark-field XPEEM makes it possible to probe the electronic structure of small features, which cannot be distinguished in the μ-ARPES mode. The SPELEEM at Elettra

• be about 150 meV. Lateral resolution. The SPELEEM spatial resolution is mainly determined by the spherical and chromatic aberrations of the objective lens. LEEM performs better compared to XPEEM. Low energy electron diffraction beams are generally much sharper than the broad photoelectron emission

In vitro interaction of colloidal nanoparticles with mammalian cells: What have we learned thus far?

• Moritz Nazarenus,
• Qian Zhang,
• Mahmoud G. Soliman,
• Pablo del Pino,
• Beatriz Pelaz,
• Susana Carregal-Romero,
• Joanna Rejman,
• Barbara Rothen-Rutishauser,
• Martin J. D. Clift,
• Reinhard Zellner,
• G. Ulrich Nienhaus,
• James B. Delehanty,
• Igor L. Medintz and
• Wolfgang J. Parak

Beilstein J. Nanotechnol. 2014, 5, 1477–1490, doi:10.3762/bjnano.5.161

• organelles are only of limited value if the fraction of NPs that resides in these organelles is not quantified. Quantification, however, is not as trivial as it seems, and there is a need for better quantitative techniques for the future. While TEM offers the lateral resolution to visualize individual NPs

• the limited lateral resolution of optical microscopy [70]. In addition, as mentioned before, NPs can be partly degraded after having been internalized [71][72] and thus, in case fluorescently labeled NPs are used, it is required to prove that the fluorescence (or any other) label is still attached to

• , labelled with different fluorophores (green and magenta)) after 24 h of incubation at a concentration of 1 µg/mL, which are located in individual vesicles. Nuclei are stained with DAPI (blue) and the cell membrane with Wheat Germ Agglutinin (red). Note that due to limited lateral resolution of optical

Probing the electronic transport on the reconstructed Au/Ge(001) surface

• Franciszek Krok,
• Mark R. Kaspers,
• Alexander M. Bernhart,
• Marek Nikiel,
• Benedykt R. Jany,
• Paulina Indyka,
• Mateusz Wojtaszek,
• Rolf Möller and
• Christian A. Bobisch

Beilstein J. Nanotechnol. 2014, 5, 1463–1471, doi:10.3762/bjnano.5.159

• transport phenomena of conducting surfaces at the limit of lateral resolution. By performing scanning tunnelling potentiometry (STP) [11] we tried to study the lateral variation of the electrochemical potential µec (called potential in the following) at the boundary between two rotated Au wire-like domains

Near-field photochemical and radiation-induced chemical fabrication of nanopatterns of a self-assembled silane monolayer

• Ulrich C. Fischer,
• Carsten Hentschel,
• Florian Fontein,
• Linda Stegemann,
• Christiane Hoeppener,
• Harald Fuchs and
• Stefanie Hoeppener

Beilstein J. Nanotechnol. 2014, 5, 1441–1449, doi:10.3762/bjnano.5.156

• fluorescein-stained APTES SAMs clearly reveal the typical periodicity of the expected pattern (Figure 4d). The fact that even the weak topographic features of the fluorescein-labeled APTES-SAM nanopattern can be detected with the AFM at high lateral resolution indicates, that the masks lead to a very strong

• nanopatterns as evidenced by the detection of even the topographic features at a lateral resolution of 30 nm formed by the fluorescein-labeled 0.22 µm pattern. The use of mechanically rather stable, chemically bound SAMs as substrates for the processes [27][28] facilitates the procedures for contacting and

Electron-beam induced deposition and autocatalytic decomposition of Co(CO)₃NO

• Florian Vollnhals,
• Martin Drost,
• Fan Tu,
• Esther Carrasco,
• Andreas Späth,
• Rainer H. Fink,
• Hans-Peter Steinrück and
• Hubertus Marbach

Beilstein J. Nanotechnol. 2014, 5, 1175–1185, doi:10.3762/bjnano.5.129

• interferometric control through the focal spot, while the transmitted photon intensity is recorded by using a photo multiplier tube. Near-edge X-ray absorption fine structure (NEXAFS) spectra were recorded by consecutive scanning of the investigated area with varying photon energy. The lateral resolution in

Energy dissipation in multifrequency atomic force microscopy

• Valentina Pukhova,
• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 494–500, doi:10.3762/bjnano.5.57

• ; wavelet transforms; Introduction Multifrequency dynamic atomic force microscopy [1] is a powerful technique to retrieve quantitative information on materials properties such as the elastic constants and the sample chemical environment with a lateral resolution in the nanometer range. In this context the

Constant-distance mode SECM as a tool to visualize local electrocatalytic activity of oxygen reduction catalysts

• Michaela Nebel,
• Thomas Erichsen and
• Wolfgang Schuhmann

Beilstein J. Nanotechnol. 2014, 5, 141–151, doi:10.3762/bjnano.5.14

• [29][30]. The current measurement is performed at the tip and a further increase of the lateral resolution by utilization of smaller electrodes is therefore possible [29]. In order to enable a precise positioning of small electrodes also for the RC mode, the detection scheme was integrated in the 4D

Noise performance of frequency modulation Kelvin force microscopy

• Heinrich Diesinger,
• Dominique Deresmes and
• Thierry Mélin

Beilstein J. Nanotechnol. 2014, 5, 1–18, doi:10.3762/bjnano.5.1

• favorable to minimize the tip–sample distance since it deteriorates the lateral resolution. Setpoint Δf and Vmod should be chosen such that the topography feedback is still dominated by van-der-Waals interaction. However, the tip–sample separation cannot be made infinitely small by hardening the topography

Peak forces and lateral resolution in amplitude modulation force microscopy in liquid

• Horacio V. Guzman and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2013, 4, 852–859, doi:10.3762/bjnano.4.96

• elastic deformation of the sample as a function of the imaging conditions for materials with a Young modulus between 25 MPa and 2 GPa. High lateral resolution images are predicted by using both small free amplitudes (less than 2 nm for soft materials) and high set-point amplitudes. Keywords: force

• microscopy; lateral resolution; nanomechanics; peak force; Introduction The high-resolution imaging of heterogeneous materials, in particular soft materials in liquid, by amplitude modulation atomic force microscopy (AM-AFM) is an active area of research in nanotechnology [1][2][3][4][5][6][7][8][9][10][11

• oscillation cycle. In fact, the ability of exerting small forces and imaging materials in a non-invasive manner can be jeopardized because of the effect of a static deflection component when Asp/A0 decreases. We have also studied the relationship among peak forces, lateral resolution and sample properties for

Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

• Sidney R. Cohen and
• Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

• should always recall that the simplified or even complex mechanical models are describing a substantially more complex molecular system. Dynamic AFM probe nanoindentation Boasting the advantage of wider bandwidth, smaller inertia of the system, better lateral resolution and more sensitive force detection

Site-selective growth of surface-anchored metal-organic frameworks on self-assembled monolayer patterns prepared by AFM nanografting

• Tatjana Ladnorg,
• Alexander Welle,
• Stefan Heißler,
• Christof Wöll and
• Hartmut Gliemann

Beilstein J. Nanotechnol. 2013, 4, 638–648, doi:10.3762/bjnano.4.71

• m/z 371 (Figure 4c) and the Au cluster ion of MPA [Au2SC3H5O2]− at m/z 499 (Figure 4d) were detected as characteristic peaks. While this spectrometry mode allows for an unambiguous chemical assignment, the lateral resolution of the analysis is limited due to a primary ion beam spot diameter of

• mass resolution secondary ion spectra with a moderate spot size of about 5 mm (bunched mode). Spectrometry was performed in static SIMS mode by limiting the primary ion dose to <1011 ions/cm2. High lateral resolution images were acquired in a primary ion source mode providing a lateral resolution of

Kelvin probe force microscopy of nanocrystalline TiO₂ photoelectrodes

• Alex Henning,
• Gino Günzburger,
• Res Jöhr,
• Yossi Rosenwaks,
• Biljana Bozic-Weber,
• Catherine E. Housecroft,
• Edwin C. Constable,
• Ernst Meyer and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2013, 4, 418–428, doi:10.3762/bjnano.4.49

• parameters, in particular the bandgap, Eg, the minority carrier diffusion length, Ln, and the flatband potential, Vfb [18]. SPV spectroscopy is usually performed with a macroscopic vibrating capacitor and is hence limited by its poor lateral resolution [19][20]. Bare and dye-sensitized nanocrystalline (nc

• using KPFM, which is not possible to achieve with a macroscopic KP. SPV spectra were taken on desired locations with a lateral resolution of 25 nm. Thus, the bandgap and time constants were obtained on the nanoscale. In this work, microscopic variations of the work function were observed for both

Ni nanocrystals on HOPG(0001): A scanning tunnelling microscope study

• Michael Marz,
• Keisuke Sagisaka and
• Daisuke Fujita

Beilstein J. Nanotechnol. 2013, 4, 406–417, doi:10.3762/bjnano.4.48

• . Nevertheless, the change in lateral resolution has no impact on the determination of the height of the cluster and for counting the number of clusters on the surface. We notice that the height is more affected than the width of the cluster by the annealing process. To discuss the effect of annealing on the

A highly pH-sensitive nanowire field-effect transistor based on silicon on insulator

• Denis E. Presnov,
• Sergey V. Amitonov,
• Pavel A. Krutitskii,
• Valentina V. Kolybasova,
• Igor A. Devyatov,
• Vladimir A. Krupenin and
• Igor I. Soloviev

Beilstein J. Nanotechnol. 2013, 4, 330–335, doi:10.3762/bjnano.4.38

• conventional FET and nanomechanical systems. This extremely high sensitivity gives an opportunity to construct local potential probes with nanoscale lateral resolution based on NW FET. In comparison with single-electron transistors [6], it is easy to fabricate a device operating at room temperature, which can

Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case

• Daniel Ebeling and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 198–207, doi:10.3762/bjnano.4.20

• note that the 2nd mode phase and frequency-shift images reveal a significantly improved lateral resolution in comparison to the height channels. Especially at locations where DNA strands lay close to each other the height contrast becomes ambiguous, not allowing for an identification of single strands

Functionalization of vertically aligned carbon nanotubes

• Eloise Van Hooijdonk,
• Carla Bittencourt,
• Rony Snyders and
• Jean-François Colomer

Beilstein J. Nanotechnol. 2013, 4, 129–152, doi:10.3762/bjnano.4.14

• aligned nanotubes can be obtained by using substrates patterned with catalyst dots. High lateral resolution in the patterning of the substrate for site-selective growth of VA-CNTs can be achieved by photolithography with the use of high-contrast films as photomasks with features on the microscale [55][56

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

• Christian Obermair,
• Marina Kress,
• Andreas Wagner and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2012, 3, 824–830, doi:10.3762/bjnano.3.92

• with the tip of an AFM [12]. In the semiconductor industry, mechano-electrochemical processes are frequently used in the form of mechano-electrochemical polishing. While this is only a macroscopic method with very poor lateral resolution, the tip of an AFM allows the site-selective control of

Polymer blend lithography: A versatile method to fabricate nanopatterned self-assembled monolayers

• Cheng Huang,
• Markus Moosmann,
• Jiehong Jin,
• Tobias Heiler,
• Stefan Walheim and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2012, 3, 620–628, doi:10.3762/bjnano.3.71

• -force-microscopy-based lithographic techniques allow the structuring and patterning of surfaces with a lateral resolution down to the nanometer scale [24][25][26][27][28][29][30]. The advantage of techniques such as electron beam lithography or SFM-based lithography is their high lateral resolution and

Focused electron beam induced deposition: A perspective

• Michael Huth,
• Fabrizio Porrati,
• Christian Schwalb,
• Marcel Winhold,
• Roland Sachser,
• Maja Dukic,
• Jonathan Adams and
• Georg Fantner

Beilstein J. Nanotechnol. 2012, 3, 597–619, doi:10.3762/bjnano.3.70

• large, the focal area diameter of the electron beam, convoluted by the surface-leaving secondary electrons, determines the lateral resolution of this method. Resolutions better than 3 nm in SEMs [1] and even below 1 nm in TEMs [2] have been shown to be feasible. Due to this excellent resolution, FEBID

Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

• Gregor Hlawacek,
• Vasilisa Veligura,
• Stefan Lorbek,
• Tijs F. Mocking,
• Antony George,
• Raoul van Gastel,
• Harold J. W. Zandvliet and
• Bene Poelsema

Beilstein J. Nanotechnol. 2012, 3, 507–512, doi:10.3762/bjnano.3.58

• build-up in the irradiated sample area [5]. Contrast in SE images is primarily based on differences in work function and the yield of SE generation in the region near the surface [6]. As a consequence, HIM has an unprecedented surface sensitivity in SE mode. Together with the high lateral resolution

• of SEs in carbon is 1 nm [6]. The high contrast between the different patches, and the high lateral resolution, are a result of this characteristic of the SEs in HIM. All the SEs contributing to the different contrast patches are generated under identical conditions, nearly exclusively within a thin

• are dominated by the ions stopped deep in the sample, a comparable relative change will occur closer to the surface for the helium particles that will eventually be backscattered. This will have a negative influence on the lateral resolution that can be achieved in BSHe images. SE images will not be

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

• Jianming Zhang,
• Zehra Parlak,
• Carleen M. Bowers,
• Terrence Oas and
• Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

• important role in a broad range of applications. Although force-modulation microscopy (FMM) is used to map the apparent elastic properties of such films with high lateral resolution in air, it has rarely been applied in aqueous media. In this letter we describe the use of FMM to map the apparent elastic

• lateral resolution is important for a broad range of applications in materials science [1][2][3][4][5][6][7][8][9][10] and in the life sciences [11][12][13][14][15][16][17][18][19][20]. The atomic force microscope (AFM) [21], due to its force sensitivity and ability to image surface topography with high

• lateral resolution, is ideally suited to map these properties. Intermittent AFM imaging modes, such as tapping mode [22][23][24], and pulsed-force mode [12][25][26][27][28], have been developed for soft, often biological, samples in liquid environments. Although these imaging modes reduce the lateral

Parallel- and serial-contact electrochemical metallization of monolayer nanopatterns: A versatile synthetic tool en route to bottom-up assembly of electric nanocircuits

• Jonathan Berson,
• Assaf Zeira,
• Rivka Maoz and
• Jacob Sagiv

Beilstein J. Nanotechnol. 2012, 3, 134–143, doi:10.3762/bjnano.3.14

• regions and the narrow lines of the same template feature, respectively. Because of the high density of nanoparticles in region A, the lateral resolution of individual particles in the topographic image of this region (left) is poor, particles widths being here obtained from the simultaneously recorded

Substrate-mediated effects in photothermal patterning of alkanethiol self-assembled monolayers with microfocused continuous-wave lasers

• Anja Schröter,
• Mark Kalus and
• Nils Hartmann

Beilstein J. Nanotechnol. 2012, 3, 65–74, doi:10.3762/bjnano.3.8

• continuous-wave lasers. The lateral resolution, generally, depends on both the type of the organic monolayer and the nature of the substrate. In previous studies we reported on photothermal patterning of distinct types of SAMs on Si supports. In this contribution, a systematic study on the impact of the

• patterning technique. Because of the strongly temperature-dependent thermal conductivity of Si, surface-temperature profiles on Au/Si substrates are very narrow ensuring a particularly high lateral resolution. At a 1/e spot diameter of 2 µm, fabrication of subwavelength structures with diameters of 300–400

• optical diffraction limit, laser nanofabrication encounters significant challenges. Typically, minimum structure sizes are not much smaller than the wavelength of the laser source [13]. A means to extend the lateral resolution of laser patterning techniques into the subwavelength range is to take