Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

• Sidney R. Cohen and
• Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

• limited to, optical tweezers [1], surface force apparatus [2][3], nanomanipulators [4], electron and other microscopy techniques. Two techniques which have made great advances in the studies of nanomechanics are instrumented nanoindentation and scanning probe microscopy. The versatility and utility of

• works [16][17][18][19] paved the way for two new point-probe nanomechanical testing devices which were developed in the 1980s – instrumented nanoindentation (INI, also known as depth-sensing instrumentation) [19][20] and atomic force microscopy (AFM, also known by the more general term of scanning probe

• microscopy, SPM) [21]. These developments facilitated the measurement of mechanical properties of very small volumes of materials, opening new avenues of research. Reducing dimensions to the nanoscale gave birth to new paradigms in mechanical measurements and interpretation: In addition to the increased

Site-selective growth of surface-anchored metal-organic frameworks on self-assembled monolayer patterns prepared by AFM nanografting

• Tatjana Ladnorg,
• Alexander Welle,
• Stefan Heißler,
• Christof Wöll and
• Hartmut Gliemann

Beilstein J. Nanotechnol. 2013, 4, 638–648, doi:10.3762/bjnano.4.71

• fabrication of structures within SAMs [26] of higher resolution can be obtained by nanoshaving and nanografting [27] or other methods based on scanning probe microscopy techniques, e.g., atomic force microscopy (AFM) [28][29]. Both lithography methods allow for lateral structuring with resolutions down to

Apertureless scanning near-field optical microscopy of sparsely labeled tobacco mosaic viruses and the intermediate filament desmin

• Alexander Harder,
• Mareike Dieding,
• Volker Walhorn,
• Sven Degenhard,
• Andreas Brodehl,
• Christina Wege,
• Hendrik Milting and
• Dario Anselmetti

Beilstein J. Nanotechnol. 2013, 4, 510–516, doi:10.3762/bjnano.4.60

• cantilever and surface distance control. The system is controlled by a commercially available scanning probe microscopy control system (Nanonis OC4, Specs, Zürich, Switzerland). The sample is evanescently illuminated by a laser diode (RLT6830MG, λ = 685 nm, 30mW, Roithner Lasertechnik, Vienna, Austria

• ). This still seems to be a conceptual issue of combined optical and scanning probe microscopy: The sample has to be accessible from top and bottom. Furthermore, high numerical aperture objectives constrict to the use of thin glass cover slips with a thickness of 150–170 µm as sample substrates

Optimal geometry for a quartz multipurpose SPM sensor

• Julian Stirling

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

• ; mechanical vibrations; scanning probe microscopy; scanning tunnelling microscopy; Introduction The heart of any scanning probe microscope (SPM) is its sensory probe. For a scanning tunnelling microscope (STM) this is simply an electrically conducting wire with an atomically sharp apex. For atomic force

A look underneath the SiO₂/4H-SiC interface after N₂O thermal treatments

• Patrick Fiorenza,
• Filippo Giannazzo,
• Lukas K. Swanson,
• Alessia Frazzetto,
• Simona Lorenti,
• Mario S. Alessandrino and
• Fabrizio Roccaforte

Beilstein J. Nanotechnol. 2013, 4, 249–254, doi:10.3762/bjnano.4.26

• Scanning Probe Microscopy (SPM) measurements were carried out by using a Digital Instrument D3100 equipped with the Nanoscope® V controller. Local resistance measurements were carried out by using the scanning spreading resistance module (SSRM) [18][19], and cross-sectional local active-doping profiling

Micro- and nanoscale electrical characterization of large-area graphene transferred to functional substrates

• Gabriele Fisichella,
• Salvatore Di Franco,
• Patrick Fiorenza,
• Raffaella Lo Nigro,
• Fabrizio Roccaforte,
• Cristina Tudisco,
• Guido G. Condorelli,
• Nicolò Piluso,
• Noemi Spartà,
• Stella Lo Verso,
• Corrado Accardi,
• Cristina Tringali,
• Sebastiano Ravesi and
• Filippo Giannazzo

Beilstein J. Nanotechnol. 2013, 4, 234–242, doi:10.3762/bjnano.4.24

• connected to the tip. In this way, TRCAFM combines the high resolution of dynamic scanning probe microscopy for morphological mapping with the ability for nanoscale-resolution current mapping of CAFM. This operation mode has been demonstrated to be particularly useful to perform high-resolution morphology

Advanced atomic force microscopy techniques

• Thilo Glatzel,
• Hendrik Hölscher,
• Thomas Schimmel,
• Mehmet Z. Baykara,
• Udo D. Schwarz and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2012, 3, 893–894, doi:10.3762/bjnano.3.99

• fields, and the imaging and discrimination of individual chemical bonds. The development of advanced techniques is the focus of this Thematic Series, following the Thematic Series “Scanning probe microscopy and related techniques” edited by Ernst Meyer and the Thematic Series “Noncontact atomic force

Pure hydrogen low-temperature plasma exposure of HOPG and graphene: Graphane formation?

• Baran Eren,
• Dorothée Hug,
• Laurent Marot,
• Rémy Pawlak,
• Marcin Kisiel,
• Roland Steiner,
• Dominik M. Zumbühl and
• Ernst Meyer

Beilstein J. Nanotechnol. 2012, 3, 852–859, doi:10.3762/bjnano.3.96

• graphite (HOPG) were exposed to a pure hydrogen low-temperature plasma (LTP). Characterizations include various experimental techniques such as photoelectron spectroscopy, Raman spectroscopy and scanning probe microscopy. Our photoemission measurement shows that hydrogen LTP exposed HOPG has a diamond-like

• peak to G peak ratio is over 4, associated with hydrogenation on both sides. A very low defect density was observed in the scanning probe microscopy measurements, which enables a reverse transformation to graphene. Hydrogen-LTP-exposed HOPG possesses a high thermal stability, and therefore, this

• of HOPG. Conclusion (1) Hydrogen-LTP-exposed HOPG and graphene are characterized with various techniques including photoelectron spectroscopy, Raman spectroscopy and scanning probe microscopy. The hydrogen-LTP-exposed HOPG surface consists of various atomic-scale STM patterns, which may be due to

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

• Christian Obermair,
• Marina Kress,
• Andreas Wagner and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2012, 3, 824–830, doi:10.3762/bjnano.3.92

• successfully demonstrated on the nanometer scale. Keywords: atomic force microscopy; electrochemical deposition; electrochemistry; nanoelectronics; nanofabrication; nanolithography; nanotechnology; MEMS and NEMS; reversible processes; scanning probe microscopy and lithography; Introduction The

Pinch-off mechanism in double-lateral-gate junctionless transistors fabricated by scanning probe microscope based lithography

• Farhad Larki,
• Arash Dehzangi,
• Alam Abedini,
• Ahmad Makarimi Abdullah,
• Elias Saion,
• Sabar D. Hutagalung,
• Mohd N. Hamidon and
• Jumiah Hassan

Beilstein J. Nanotechnol. 2012, 3, 817–823, doi:10.3762/bjnano.3.91

• .3.91 Abstract A double-lateral-gate p-type junctionless transistor is fabricated on a low-doped (1015) silicon-on-insulator wafer by a lithography technique based on scanning probe microscopy and two steps of wet chemical etching. The experimental transfer characteristics are obtained and compared with

Spring constant of a tuning-fork sensor for dynamic force microscopy

• Dennis van Vörden,
• Manfred Lange,
• Merlin Schmuck,
• Nico Schmidt and
• Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

• taking account of the real geometry including the glue that is used to mount the tuning fork. Keywords: atomic force microscopy; finite element method; spring constant; thermal fluctuation; tuning fork; Introduction Quartz tuning forks provide excellent self-sensing probes in scanning probe microscopy

The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

• César Moreno,
• Carmen Munuera,
• Xavier Obradors and
• Carmen Ocal

Beilstein J. Nanotechnol. 2012, 3, 722–730, doi:10.3762/bjnano.3.82

• switching; scanning probe microscopy; Introduction The current knowledge-based society requires a new, more-powerful memory technology for the development of any field concerning human activity, such as biomedicine, space research, meteorological predictions, simulation in basic research science, and

• we have shown the full capabilities of electrical scanning probe microscopy modes to modify and characterize memristive LSMO thin films on the nanoscale. Hard switching with long retention times and fast switching process are consistent with the nonuniform-drift model used here. We have proposed a

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

• Mehmet Z. Baykara,
• Omur E. Dagdeviren,
• Todd C. Schwendemann,
• Harry Mönig,
• Eric I. Altman and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

• the second part applies the findings to determine the optimum strategies for extracting reliable information on atomic-scale chemical and physical properties of sample surfaces. Part I: Artifacts in force-field spectroscopy measurements Drift Virtually all atomic-scale scanning probe microscopy (SPM

Nanostructures for sensors, electronics, energy and environment

• Nunzio Motta

Beilstein J. Nanotechnol. 2012, 3, 351–352, doi:10.3762/bjnano.3.40

• these incredible aggregation forms of materials with atomic resolution is mainly due to the developments in scanning probe microscopy [6][7] that have occurred over the last 20 years. The Beilstein Journal of Nanotechnology recently hosted the series “Scanning probe microscopy and related methods

Combining nanoscale manipulation with macroscale relocation of single quantum dots

• Francesca Paola Quacquarelli,
• Richard A. J. Woolley,
• Martin Humphry,
• Jasbiner Chauhan,
• Philip J. Moriarty and
• Ashley Cadby

Beilstein J. Nanotechnol. 2012, 3, 324–328, doi:10.3762/bjnano.3.36

• Techniques such as scanning probe microscopy and transmission electron microscopy have been used extensively to provide crucial high-resolution structural and morphological information on nanoscale systems. Measurement of the optical properties of a nanostructured material or nanoscale device with a

Junction formation of Cu₃BiS₃ investigated by Kelvin probe force microscopy and surface photovoltage measurements

• Fredy Mesa,
• William Chamorro,
• William Vallejo,
• Robert Baier,
• Thomas Dittrich,
• Alexander Grimm,
• Martha C. Lux-Steiner and
• Sascha Sadewasser

Beilstein J. Nanotechnol. 2012, 3, 277–284, doi:10.3762/bjnano.3.31

• ). Scanning probe microscopy experiments have provided significant insight into the physics of grain boundaries on these materials [10]. Specifically, recent experiments provided evidence for the benign properties of the GBs [11][12], in agreement with previous theoretical work [13][14]. Also the influence of

Direct monitoring of opto-mechanical switching of self-assembled monolayer films containing the azobenzene group

• Einat Tirosh,
• Enrico Benassi,
• Silvio Pipolo,
• Marcel Mayor,
• Michal Valášek,
• Veronica Frydman,
• Stefano Corni and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2011, 2, 834–844, doi:10.3762/bjnano.2.93

• 15 min of irradiation (Figure 9). The azobenzene SAMs were irradiated with UV light (λ = 365 nm, I = 25 mW/cm2) for 2 h and with visible light (λ = 450 nm, I = 5 mW/cm2) for 1 h. Scanning probe microscopy AFM topographies were measured before and after SAM adsorption to check the monolayer quality

Towards multiple readout application of plasmonic arrays

• Dana Cialla,
• Karina Weber,
• René Böhme,
• Uwe Hübner,
• Henrik Schneidewind,
• Matthias Zeisberger,
• Roland Mattheis,
• Robert Möller and
• Jürgen Popp

Beilstein J. Nanotechnol. 2011, 2, 501–508, doi:10.3762/bjnano.2.54

• , the signal enhancement in SERS and SEF is characterized by different dependencies on the distance between the analyte and metal surface. In order to establish rules for an analyte–metal-surface, distance dependent, signal enhancement, scanning probe microscopy (SPM)-based measurements in combination

Nanophotonics, nano-optics and nanospectroscopy

• Alfred J. Meixner

Beilstein J. Nanotechnol. 2011, 2, 499–500, doi:10.3762/bjnano.2.53

• nanophotonics, nano-optics and nanospectroscopy, and covers the field where nanoscience meets photonics, optics and spectroscopy. Since the pioneering days of scanning near-field optical microscopy [1][2], one of the main goals has been to combine scanning probe microscopy techniques with the spectroscopic

Nanoscaled alloy formation from self-assembled elemental Co nanoparticles on top of Pt films

• Luyang Han,
• Ulf Wiedwald,
• Johannes Biskupek,
• Kai Fauth,
• Ute Kaiser and
• Paul Ziemann

Beilstein J. Nanotechnol. 2011, 2, 473–485, doi:10.3762/bjnano.2.51

• probe microscopy techniques [5], one is left with processes relying on the self-assembly of colloids or micelles [6][7][8]. In the context of magnetic NPs, two prominent examples, both dealing with the preparation of magnetically attractive FePt NPs, which successfully demonstrated fulfillment of the

• additionally their deposition onto a specific substrate in the form of ordered arrays over reasonably large areas is required, then the number of applicable fabrication recipes dramatically decreases. Focusing on NP sizes below 15 nm and excluding purely sequential procedures such as those based on scanning

Infrared receptors in pyrophilous (“fire loving”) insects as model for new un-cooled infrared sensors

• David Klocke,
• Anke Schmitz,
• Helmut Soltner,
• Herbert Bousack and
• Helmut Schmitz

Beilstein J. Nanotechnol. 2011, 2, 186–197, doi:10.3762/bjnano.2.22

• . Experimental Morphological methods used are all based on well established light and electron microscopical procedures. Mechanical tests were conducted in a nanomechanical test system capable of normal loading as well as in situ scanning probe microscopy (SPM) (TriboScope; Hysitron, Minneapolis, USA

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• have been measured simultaneously. The colors indicate different tip-sample distances. Note that the displacement of 4.5 Å has been chosen arbitrarily, since absolute values are generally unknown in scanning probe microscopy. b) The oscillation amplitude is constant during scan process. This excludes

Scanning probe microscopy and related methods

• Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

• . Scanning probe microscopy (SPM) uses probing tips to map properties, such as topography, local adhesive forces, elasticity, friction or magnetic properties. In the emerging fields of nanoscience and nanotechnology these types of microscopes help to characterize the nanoworld. In addition, local probes can

• the colleagues for their excellent contributions. Ernst Meyer Basel, December 2010 Scanning probe microscopy: A large familiy of microscopes, which have in common that they use local probes to characterize surfaces. AFM: Atomic Force MicroscopySTM: Scanning Tunneling Microscopy, PDM: Phase Detection