Modeling noncontact atomic force microscopy resolution on corrugated surfaces

• Kristen M. Burson,
• Mahito Yamamoto and
• William G. Cullen

Beilstein J. Nanotechnol. 2012, 3, 230–237, doi:10.3762/bjnano.3.26

• air to the proper size then quickly transferred into the ultrahigh-vacuum JEOL AFM system (4500A, Nanonis controller). SiO2 samples were baked at 130 °C for cleaning. In order to replicate the experimental substrate preparation often used for graphene exfoliation, no additional cleaning procedures

Surface functionalization of aluminosilicate nanotubes with organic molecules

• Wei Ma,
• Weng On Yah,
• Hideyuki Otsuka and
• Atsushi Takahara

Beilstein J. Nanotechnol. 2012, 3, 82–100, doi:10.3762/bjnano.3.10

• diffractions at 2.25 and 1.62 nm suggest the presence of imogolite bundles. On the other hand, however, the intensity of the diffractions at 2.25 and 1.62 nm significantly decreased compared with those of the pure imogolite, indicating the exfoliation of the imogolite bundles. Imogolite cylinders may interact