Molecular assemblies on surfaces: towards physical and electronic decoupling of organic molecules

• Sabine Maier and
• Meike Stöhr

Beilstein J. Nanotechnol. 2021, 12, 950–956, doi:10.3762/bjnano.12.71

• . To a lesser extent, metal oxides have also been used, for which defects and charging often pose additional challenges [44][45][46]. On electronically insulating surfaces, non-contact atomic force microscopy (AFM) is the method of choice to study molecular assemblies and individual molecules in real

Self-assembly of Eucalyptus gunnii wax tubules and pure ß-diketone on HOPG and glass

• Miriam Anna Huth,
• Axel Huth and
• Kerstin Koch

Beilstein J. Nanotechnol. 2021, 12, 939–949, doi:10.3762/bjnano.12.70

• is unknown. In this study, extracted wax of E. gunnii leaves and pure ß-diketone were recrystallized on two different artificial materials and analyzed by scanning electron microscopy (SEM) and atomic force microscopy (AFM) to study their formation process. Both the wax mixture and pure ß-diketone

• formation of the tubules [26]. Atomic force microscopy (AFM) investigations further showed that the elongation of secondary alcohol tubules is based on a helical growth mechanism [27]. Recrystallization experiments with nonacosan-10-ol on non-biological substrates showed that the chemical and physical

• morphologically different type of wax tubules is unknown. On Eucalyptus gunnii leaves mainly the characteristic ß-diketone tubules are present (Figure 1), but helically wound ribbons and a transitional form between both shapes are also present. Atomic force microscopy investigations of tubule formation on living

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• , convolutional neural networks, and how it is transforming the acquisition and analysis of scanning probe data. Keywords: atomic force microscopy (AFM); deep learning; machine learning; neural networks; scanning probe microscopy (SPM); Review Introduction: traditional machine learning vs deep learning Machine

• conditions for band-excitation piezoresponse force microscopy (PFM) [134]. Band excitation collects a band of frequencies around the contact resonance frequency of the tip–sample system, which is modeled by a simple harmonic oscillator equation. This allows for the determination of several physical

• analysis gave the best result. The authors suggest that using data obtained before from neural network analysis as input to model fitting could be extended to other modalities of SPM, such as magnetic force microscopy and Kelvin probe force microscopy. Another recent example of application to a non

Reducing molecular simulation time for AFM images based on super-resolution methods

• Zhipeng Dou,
• Jianqiang Qian,
• Yingzi Li,
• Rui Lin,
• Jianhai Wang,
• Peng Cheng and
• Zeyu Xu

Beilstein J. Nanotechnol. 2021, 12, 775–785, doi:10.3762/bjnano.12.61

• Zhipeng Dou Jianqiang Qian Yingzi Li Rui Lin Jianhai Wang Peng Cheng Zeyu Xu School of Physics, Beihang University, Beijing 100083, China 10.3762/bjnano.12.61 Abstract Atomic force microscopy (AFM) has been an important tool for nanoscale imaging and characterization with atomic and subatomic

• can be used to speed up the generation of training data and vary simulation resolution for AFM machine learning. Keywords: atomic force microscopy; Bayesian compressed sensing; convolutional neural network; molecular dynamics simulation; super resolution; Introduction Atomic force microscopy methods

9.1% efficient zinc oxide/silicon solar cells on a 50 μm thick Si absorber

• Rafal Pietruszka,
• Bartlomiej S. Witkowski,
• Monika Ozga,
• Katarzyna Gwozdz,
• Ewa Placzek-Popko and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 766–774, doi:10.3762/bjnano.12.60

• the tested PV cells, as measured with atomic force microscopy (AFM). The results for the photovoltaic cell modified with zinc oxide nanorods are shown in Figure 4a and Figure 4c. The results for the planar cell are shown in Figure 4b and Figure 4d. There are significant differences in the roughness

Physical constraints lead to parallel evolution of micro- and nanostructures of animal adhesive pads: a review

• Thies H. Büscher and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2021, 12, 725–743, doi:10.3762/bjnano.12.57

• CC BY 4.0). (D–G) Atomic force microscopy (AFM) height images of the footprint droplets of the beetle Coccinella septempunctata (D,F) and the fly Calliphora vicina (E,G). (D) and (E) share the same colour scale. Brighter pixels correspond to higher z values. (F,G) Three-dimensional impressions of the

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

Impact of GaAs(100) surface preparation on EQE of AZO/Al₂O₃/p-GaAs photovoltaic structures

• Piotr Caban,
• Rafał Pietruszka,
• Jarosław Kaszewski,
• Monika Ożga,
• Bartłomiej S. Witkowski,
• Krzysztof Kopalko,
• Piotr Kuźmiuk,
• Katarzyna Gwóźdź,
• Ewa Płaczek-Popko,
• Krystyna Lawniczak-Jablonska and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 578–592, doi:10.3762/bjnano.12.48

• /interface needs to be properly prepared. In the experiments described here we examined eight different paths of GaAs surface treatment (cleaning, etching, passivation) which resulted in different external quantum efficiency (EQE) values of the tested photovoltaic (PV) cells. Atomic force microscopy (AFM

Local stiffness and work function variations of hexagonal boron nitride on Cu(111)

• Abhishek Grewal,
• Yuqi Wang,
• Matthias Münks,
• Klaus Kern and
• Markus Ternes

Beilstein J. Nanotechnol. 2021, 12, 559–565, doi:10.3762/bjnano.12.46

• , CH-1015 Lausanne, Switzerland II. Institute of Physics, RWTH Aachen University, D-52074 Aachen, Germany 10.3762/bjnano.12.46 Abstract Combined scanning tunnelling and atomic force microscopy using a qPlus sensor enables the measurement of electronic and mechanic properties of two-dimensional

• the contact potential difference measured by Kelvin probe force microscopy. Using 3D force profiles of the same area we determine the relative stiffness of the Moiré region allowing us to analyse both electronic and mechanical properties of the 2D layer simultaneously. We obtain a sheet stiffness of

• non-contact atomic force microscopy (nc-AFM) to study h-BN on Cu(111). This template has interesting properties because the dielectric layer is only very weakly bound to the metal and shows an electronically induced Moiré superstructure [25][26]. First STM studies on this system pointed to only a

On the stability of microwave-fabricated SERS substrates – chemical and morphological considerations

• Limin Wang,
• Aisha Adebola Womiloju,
• Christiane Höppener,
• Ulrich S. Schubert and
• Stephanie Hoeppener

Beilstein J. Nanotechnol. 2021, 12, 541–551, doi:10.3762/bjnano.12.44

• glass capillaries or on scanning force microscopy tips) in a very economic and fast (less than five minutes) coating process. The formed substrates, which are coated with a monolayer of silver nanoparticles, have been demonstrated to be highly reproducible and to perform very well in the detection of

Determining amplitude and tilt of a lateral force microscopy sensor

• Oliver Gretz,
• Alfred J. Weymouth,
• Thomas Holzmann,
• Korbinian Pürckhauer and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2021, 12, 517–524, doi:10.3762/bjnano.12.42

• Oliver Gretz Alfred J. Weymouth Thomas Holzmann Korbinian Purckhauer Franz J. Giessibl Institute of Experimental and Applied Physics, Department of Physics, University of Regensburg, 93053 Regensburg, Germany 10.3762/bjnano.12.42 Abstract In lateral force microscopy (LFM), implemented as

• frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on

• for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation. Keywords: frequency-modulation atomic force microscopy; lateral force microscopy; amplitude calibration; tilt estimation; Introduction Frequency-modulation

Boosting of photocatalytic hydrogen evolution via chlorine doping of polymeric carbon nitride

• Malgorzata Aleksandrzak,
• Michalina Kijaczko,
• Wojciech Kukulka,
• Daria Baranowska,
• Martyna Baca,
• Beata Zielinska and
• Ewa Mijowska

Beilstein J. Nanotechnol. 2021, 12, 473–484, doi:10.3762/bjnano.12.38

• , carbon, oxygen, and chlorine in Cl-PCN was performed and showed homogeneous distribution of all elements in the sample. As analyzed via atomic force microscopy (AFM, Figure 2a and Figure 2b) the as-prepared PCN aggregated as large sheets with thickness ranging from 1 to 4 nm (corresponding to 3–11 atomic

Reconstruction of a 2D layer of KBr on Ir(111) and electromechanical alteration by graphene

• Zhao Liu,
• Antoine Hinaut,
• Stefan Peeters,
• Sebastian Scherb,
• Ernst Meyer,
• Maria Clelia Righi and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2021, 12, 432–439, doi:10.3762/bjnano.12.35

• reconstruction of a two-dimensional layer of KBr on an Ir(111) surface is observed by high-resolution noncontact atomic force microscopy and verified by density functional theory (DFT). The observed KBr structure is oriented along the main directions of the Ir(111) surface, but forms a characteristic double-line

• pattern. Comprehensive calculations by DFT, taking into account the observed periodicities, resulted in a new low-energy reconstruction. However, it is fully relaxed into a common cubic structure when a monolayer of graphene is located between substrate and KBr. By using Kelvin probe force microscopy, the

• with unconventional stoichiometries have been observed indirectly on graphene surfaces [37]. Here, we report on the formation of irregularly shaped KBr islands with corrugated stripe structures, observed on the (111) surface of Ir and analyzed by non-contact atomic force microscopy (nc-AFM) at room

The nanomorphology of cell surfaces of adhered osteoblasts

• Christian Voelkner,
• Mirco Wendt,
• Regina Lange,
• Max Ulbrich,
• Martina Gruening,
• Susanne Staehlke,
• Barbara Nebe,
• Ingo Barke and
• Sylvia Speller

Beilstein J. Nanotechnol. 2021, 12, 242–256, doi:10.3762/bjnano.12.20

• signal is a force, pressure is applied to the sample. This is the case when using atomic force microscopy (AFM), giving rise to substantially depressed apparent heights on living and fixed cells [17]. Typically, mammalian cells exhibit Young's moduli in the range of 1 to 10 kPa while AFM probe pressures

Mapping the local dielectric constant of a biological nanostructured system

• Wescley Walison Valeriano,
• Rodrigo Ribeiro Andrade,
• Juan Pablo Vasco,
• Angelo Malachias,
• Bernardo Ruegger Almeida Neves,
• Paulo Sergio Soares Guimarães and
• Wagner Nunes Rodrigues

Beilstein J. Nanotechnol. 2021, 12, 139–150, doi:10.3762/bjnano.12.11

• work is to determine the varying dielectric constant of a biological nanostructured system via electrostatic force microscopy (EFM) and to show how this method is useful to study natural photonic crystals. We mapped the dielectric constant of the cross section of the posterior wing of the damselfly

• ; electrostatic force microscopy (EFM); natural photonic crystals; relative permittivity; structural colors; Introduction The dielectric constant, or relative permittivity, is a fundamental physical property that is crucial for describing various biological, chemical, or physical phenomena. It is a material

• Riedel et al. [16] developed several techniques of electrostatic force microscopy (EFM) to extract the relative permittivity at the nanoscale, allowing for new fields to be explored. Here we use EFM to map the relative permittivity of nanostructures within the wings of the Chalcopteryx rutilans damselfly

Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

• Cameron H. Parvini,
• M. A. S. R. Saadi and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 137–138, doi:10.3762/bjnano.12.10

• Cameron H. Parvini M. A. S. R. Saadi Santiago D. Solares Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, 800 22nd St. NW, Suite 3000, Washington, DC 20052, United States 10.3762/bjnano.12.10 Keywords: atomic force

• microscopy (AFM); creep; force mapping; indentation; Kelvin–Voigt; static force spectroscopy (SFS); viscoelasticity; In the “Useful Viscoelastic Quantities” section of the original publication, it is stated that the storage modulus (E′) and storage compliance (J′) are inverses of one another (Equation 10

Fusion of purple membranes triggered by immobilization on carbon nanomembranes

• René Riedel,
• Natalie Frese,
• Fang Yang,
• Martin Wortmann,
• Raphael Dalpke,
• Daniel Rhinow,
• Norbert Hampp and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 93–101, doi:10.3762/bjnano.12.8

• histidine-tag at the extracellular side of a PM mutant (c-His PM). The functionalization and the resulting hybrid membrane were examined by atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), confocal laser scanning microscopy (CLSM), and infrared

• was used for topographical pictures with a smaller field of view as well as for electrostatic measurements. For PeakForce Kelvin probe force microscopy (PF-KPFM), a line is first scanned in PeakForce mode. In a second scan the same line is scanned with an adjustable height offset and using the

Numerical analysis of vibration modes of a qPlus sensor with a long tip

• Kebei Chen,
• Zhenghui Liu,
• Yuchen Xie,
• Chunyu Zhang,
• Gengzhao Xu,
• Wentao Song and
• Ke Xu

Beilstein J. Nanotechnol. 2021, 12, 82–92, doi:10.3762/bjnano.12.7

• the optimal diameter was found to be 0.1 mm. Keywords: finite element method; long tilted tip; noncontact atomic force microscopy; qPlus sensor; quartz tuning fork; simulations; Introduction Quartz tuning forks are widely used in the watch industry because of their low frequency offset over a wide

• and fq in the in-phase mode (Figure 3 and Figure 6). We found a 0.05 mm tip has the best performance when the tip length is 0.65 mm in the anti-phase mode. However, Ax/Az in the anti-phase mode is 2.36, that is, φ is 23°. In frequency modulation-atomic force microscopy (FM-AFM), the frequency shift Δf

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• of atomic force microscopy (AFM) is the measurement of physical properties at sub-micrometer resolution. Methods such as force–distance curves (FDCs) or dynamic variants (such as intermodulation AFM (ImAFM)) are able to measure mechanical properties (such as the local stiffness, kr) of nanoscopic

• determined. Keywords: AFM force spectroscopy; composites; principle component analysis; structure–property correlation; van der Waals forces; Introduction The mechanical properties of small volumes of materials can be measured using various atomic force microscopy (AFM) methods. The well-established force

• Kelvin probe force microscopy (KPM) [27] which were developed to identify local chemical or structural specificities in the samples. All the methods mentioned above are, to different degrees, advanced techniques which require additional equipment and expertise. TERS and AFM-IR are hybrid setups which

Atomic layer deposited films of Al₂O₃ on fluorine-doped tin oxide electrodes: stability and barrier properties

• Hana Krýsová,
• Michael Neumann-Spallart,
• Hana Tarábková,
• Pavel Janda,
• Ladislav Kavan and
• Josef Krýsa

Beilstein J. Nanotechnol. 2021, 12, 24–34, doi:10.3762/bjnano.12.2

• 7.2). Chronoamperometric measurements were performed in buffered solution (pH 7.2) at −1.2 V (vs Ag/AgCl). The morphology of the films was characterized ex situ, under ambient conditions, by atomic force microscopy (AFM, Dimension Icon, Bruker, USA) in a semicontact (tapping) mode. A silicon

Nanomechanics of few-layer materials: do individual layers slide upon folding?

• Ronaldo J. C. Batista,
• Rafael F. Dias,
• Ana P. M. Barboza,
• Alan B. de Oliveira,
• Taise M. Manhabosco,
• Thiago R. Gomes-Silva,
• Matheus J. S. Matos,
• Andreij C. Gadelha,
• Cassiano Rabelo,
• Luiz G. L. Cançado,
• Ado Jorio,
• Hélio Chacham and
• Bernardo R. A. Neves

Beilstein J. Nanotechnol. 2020, 11, 1801–1808, doi:10.3762/bjnano.11.162

• methods; atomic force microscopy (AFM); molecular dynamics (MD); Raman spectroscopy; nanostructured materials; Introduction Layered materials such as graphite, talc, and transition metal dichalcogenides (TMDs), held together by strong covalent bonds within layers and relatively weak van der Waals

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

• Rosine Coq Germanicus,
• Peter De Wolf,
• Florent Lallemand,
• Catherine Bunel,
• Serge Bardy,
• Hugues Murray and
• Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

• ) (doped semiconducting layers) and “back end of line” (BEOL) layers (metallization, trench dielectric, and isolation) of highly integrated microelectronic devices. Based on atomic force microscopy, an electromagnetically shielded and electrically conductive tip is used in scanning microwave impedance

• complete parametric investigation, is performed with a dynamic spectroscopy method. The results emphasize the strong impact, in terms of distinction and location, of the applied bias on the local sMIM measurements for both FEOL and BEOL layers. Keywords: atomic force microscopy (AFM); DataCube; doping

• crucial to optimize and increase the device integration. In order to map the electrical properties of microelectronic materials with a high spatial resolution, scanning probe microscopy (SPM), based on atomic force microscopy (AFM), offers several modes based on the control of electrical conduction and on

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

• Tatsuya Yamamoto,
• Ryo Izumi,
• Kazushi Miki,
• Takahiro Yamasaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2020, 11, 1750–1756, doi:10.3762/bjnano.11.157

• , Himeji, Hyogo 671-2280, Japan Institute for Nanoscience Design, Osaka University, 1-2 Machikaneyama, Toyonaka, Osaka 560-0043, Japan 10.3762/bjnano.11.157 Abstract The atomic arrangement of the Si(110)-(16×2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K

• between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16×2) reconstruction, which indeed has a complex structure. Keywords: atomic force microscopy (AFM); noncontact atomic force microscopy (NC-AFM); Si

• regarding the atomic structure of the reconstruction that includes both pentagons and step edges is insufficient. In this study, the Si(110)-(16×2) reconstruction will be investigated by atomic force microscopy (AFM) at 78 K to directly observe the atomic arrangement of the reconstruction. In this work, we

PEG/PEI-functionalized single-walled carbon nanotubes as delivery carriers for doxorubicin: synthesis, characterization, and in vitro evaluation

• Shuoye Yang,
• Zhenwei Wang,
• Yahong Ping,
• Yuying Miao,
• Yongmei Xiao,
• Lingbo Qu,
• Lu Zhang,
• Yuansen Hu and
• Jinshui Wang

Beilstein J. Nanotechnol. 2020, 11, 1728–1741, doi:10.3762/bjnano.11.155

• ). Fourier-transform infrared (FTIR) spectra in the range from 500 to 4000 cm−1 were recorded with a FTIR spectrometer (Nicolet IS10). X-ray diffraction (XRD) analysis was conducted using a BRUKER D8 X-ray diffractometer in the 2θ range of 0–100° at a scanning rate of 5°·min−1. For atomic force microscopy

Application of contact-resonance AFM methods to polymer samples

• Sebastian Friedrich and
• Brunero Cappella

Beilstein J. Nanotechnol. 2020, 11, 1714–1727, doi:10.3762/bjnano.11.154

• . Keywords: atomic force microscopy; contact resonance; mechanical properties; polymers; wear; Introduction The development of new materials for applications on the nanoscale, such as thin polymer films, demands a reliable determination of their mechanical properties. Atomic force microscopy (AFM) is a very

• obtained sample thickness could be varied. Films with a thickness larger than 400 nm are considered as bulk, since the substrate does not influence the mechanical properties of the sample [31]. Contact-resonance mode AFM Contact-resonance atomic force microscopy (CR-AFM) measurements have been performed