Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

• Sergei Magonov and
• John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

• contact regime. In other words, imaging at the set-point amplitude (Asp) below its transition value will insure a profiling of surface topography, and at higher Asp the imaging will proceed in the non-contact mode when the probe experiences long-range forces such as electrostatic forces. This is

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• makes atomic resolution on conductors [7] as well as on insulators [8] possible. In addition to investigations on the surface topography, site specific spectroscopy measurements can be performed [8]. The whole setup is placed in a sound absorber cabin and is carried on a wooden frame, which, in turn, is

Tip-sample interactions on graphite studied using the wavelet transform

• Giovanna Malegori and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2010, 1, 172–181, doi:10.3762/bjnano.1.21

• microscopy (NC-AFM) is a powerful tool to study not only the surface topography, but also the mechanical and chemical characteristics of the sample at the nanoscale [1][2][3]. The tip of an excited cantilever is sensitive to both forces and force gradients, when approaching the sample surface. The response

Precursor concentration and temperature controlled formation of polyvinyl alcohol-capped CdSe-quantum dots

• Chetan P. Shah,
• Madhabchandra Rath,
• Manmohan Kumar and
• Parma N. Bajaj

Beilstein J. Nanotechnol. 2010, 1, 119–127, doi:10.3762/bjnano.1.14

• -section of Cd and Se, indicate the stoichiometry of the cadmium selenide quantum dots formed as 1:1, i.e., Cd1Se1. TEM and AFM studies Transmission electron microscopy and atomic force microscopy are very important techniques for providing information about particle size, shape, surface topography, etc

Sensing surface PEGylation with microcantilevers

• Natalija Backmann,
• Natascha Kappeler,
• Thomas Braun,
• François Huber,
• Hans-Peter Lang,
• Christoph Gerber and
• Roderick Y. H. Lim

Beilstein J. Nanotechnol. 2010, 1, 3–13, doi:10.3762/bjnano.1.2

• polymer brush are less likely obtained by the “grafting to” approach [42]. AFM images of the PEGylated Au surface taken under different solvent conditions reinforce the interpretation that a brush-like layer has formed. In PBS buffer (good solvent), we find that the surface topography is strongly

• surface structure (Figure 6). In contrast, the Au surface topography does not change regardless of the scanning force used in 20% 2-propanol (poor solvent). This is due to the collapsed conformation of tethered PEG chains that offers minimal resistance against the AFM tip. The influence of solvent quality