Three-dimensional solvation structure of ethanol on carbonate minerals

• Hagen Söngen,
• Ygor Morais Jaques,
• Peter Spijker,
• Christoph Marutschke,
• Stefanie Klassen,
• Ilka Hermes,
• Ralf Bechstein,
• Lidija Zivanovic,
• John Tracey,
• Adam S. Foster and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2020, 11, 891–898, doi:10.3762/bjnano.11.74

• surfaces interact with a large variety of organic molecules, which can result in surface restructuring. This process is decisive for the formation of biominerals. With the development of 3D atomic force microscopy (AFM) it is now possible to image solid–liquid interfaces with unprecedented molecular

• resolution. However, the majority of 3D AFM studies have been focused on the arrangement of water at carbonate surfaces. Here, we present an analysis of the assembly of ethanol – an organic molecule with a single hydroxy group – at the calcite and magnesite (10.4) surfaces by using high-resolution 3D AFM and

• molecular dynamics (MD) simulations. Within a single AFM data set we are able to resolve both the first laterally ordered solvation layer of ethanol on the calcite surface as well as the following solvation layers that show no lateral order. Our experimental results are in excellent agreement with MD

Templating effect of single-layer graphene supported by an insulating substrate on the molecular orientation of lead phthalocyanine

• K. Priya Madhuri,
• Abhay A. Sagade,
• Pralay K. Santra and
• Neena S. John

Beilstein J. Nanotechnol. 2020, 11, 814–820, doi:10.3762/bjnano.11.66

• specific device applications. Keywords: conducting atomic force microscopy (C-AFM); lead phthalocyanine (PbPc); molecular orientation; single-layer graphene; substrate effect; two-dimensional grazing incidence X-ray diffraction (2D-GIXRD); Introduction Organic semiconductors have been extensively used in

• molecules with monoclinic and triclinic fractions on the surface of SLG/SiO2/Si is inferred in Figure 4. The topography of the PbPc layer was studied using atomic force microscopy (AFM, Figure 5). Figure 5a and the inset show that the film consists of granular PbPc crystallites deposited uniformly on the

• electrical studies using conducting-AFM (C-AFM). Figure 6a,b shows the topography and the corresponding current map of the film. The current response map shows an average current value of about 1 nA across the surface with highly conducting grains, which exhibit current values as high as 8–9 nA (Figure 6c

Light–matter interactions in two-dimensional layered WSe₂ for gauging evolution of phonon dynamics

• Avra S. Bandyopadhyay,
• Chandan Biswas and
• Anupama B. Kaul

Beilstein J. Nanotechnol. 2020, 11, 782–797, doi:10.3762/bjnano.11.63

Hexagonal boron nitride: a review of the emerging material platform for single-photon sources and the spin–photon interface

• Stefania Castelletto,
• Faraz A. Inam,
• Shin-ichiro Sato and
• Alberto Boretti

Beilstein J. Nanotechnol. 2020, 11, 740–769, doi:10.3762/bjnano.11.61

Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

• Nicholas Chan,
• Carrie Lin,
• Tevis Jacobs,
• Robert W. Carpick and
• Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

• frequency-modulated atomic force microscopy (AFM). Furthermore, this technique can be extended to the experimental verification of potential forms for any given material pair. Specifically, interaction forces are determined between an AFM tip apex and a nominally flat substrate using dynamic force

• then compared to experimental results. The method is demonstrated here using a silicon AFM probe with its native oxide and a diamond sample. Assuming the 6-12 Lennard-Jones potential form, best-fit values for the work of adhesion (Wadh) and range of adhesion (z0) parameters were determined to be 80

• AFM; interaction potential; Lennard-Jones; surfaces; Introduction Knowledge of material interface interaction behavior is crucial to the design of nanometer-scale devices and processes, such as high-density hard disk storage [1], digital light processing (DLP) projectors [2][3], atomic force

Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

• Edgar Cruz Valeriano,
• José Juan Gervacio Arciniega,
• Christian Iván Enriquez Flores,
• Susana Meraz Dávila,
• Joel Moreno Palmerin,
• Martín Adelaido Hernández Landaverde,
• Yuri Lizbeth Chipatecua Godoy,
• Aime Margarita Gutiérrez Peralta,
• Rafael Ramírez Bon and
• José Martín Yañez Limón

Beilstein J. Nanotechnol. 2020, 11, 703–716, doi:10.3762/bjnano.11.58

• –sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to the deflection signal that comes from the photodiodes of the atomic force microscopy (AFM) equipment. This approach allows for the measurement of several vibrational modes in a single step with high

• frequency resolution, with less computational cost and at a faster speed than other similar techniques. This technique is referred to as stochastic atomic force acoustic microscopy (S-AFAM), and the frequency shifts of the free resonance frequencies of an AFM cantilever are used to determine the mechanical

• properties of a material. S-AFAM is implemented and compared with a conventional technique (resonance tracking-atomic force acoustic microscopy, RT-AFAM). A sample of a graphite film on a glass substrate is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation requirements

Structural optical and electrical properties of a transparent conductive ITO/Al–Ag/ITO multilayer contact

• Aliyu Kabiru Isiyaku,
• Ahmad Hadi Ali and
• Nafarizal Nayan

Beilstein J. Nanotechnol. 2020, 11, 695–702, doi:10.3762/bjnano.11.57

• fraction of Sn is low because it is the dopant element in ITO. The low content of Al is attributed to the very thin layer. The EDXS spectra of the films before and after annealing are shown in Figure 2. The surface morphology of the IAAI and ITO films was studied using atomic force microscopy (AFM) of an

• this annealing temperature. The films surface roughness results obtained from FESEM and AFM are in good agreement. The optical characteristics of the as-deposited and annealed IAAI and ITO films measured by UV–vis spectrophotometry are shown in Figure 5. It can be seen, that the annealed IAAI and ITO

• , OXFORD X-MAX, Energy 200 premium was used. Morphological analyses by atomic force microscopic An AFM Standard Operation AFM5010 Hitachi model in tapping mode was used to examine the surface morphology of the films. Root mean square Rrms and average Ra roughness plus morphological grain size analyses were

Exfoliation in a low boiling point solvent and electrochemical applications of MoO₃

• Matangi Sricharan,
• Bikesh Gupta,
• Sreejesh Moolayadukkam and
• H. S. S. Ramakrishna Matte

Beilstein J. Nanotechnol. 2020, 11, 662–670, doi:10.3762/bjnano.11.52

• (AFM; Agilent 5500). Samples for FESEM and AFM were prepared by dripping 10 µL of MoO3 dispersion (diluted 100 times) onto a Si/SiO2 (300 nm) substrate while samples for TEM were prepared by dripping 10 µL of the diluted dispersion on a 300 mesh lacey carbon grid. Raman spectra (Horiba LABRam HR) of

• retention of the orthorhombic phase of exfoliated MoO3 nanosheets are evident from XRD (Figure S4, Supporting Information File 1). The HRTEM micrograph in Figure 2b shows a d-spacing of 0.38 nm corresponding to the (110) planes of orthorhombic MoO3 (indexed with JCPDS file No. 05-0506). The AFM micrograph

• ; (b) HRTEM micrograph of MoO3 nanosheets; (c) AFM micrograph of MoO3 nanosheets; (d) photograph of MoO3 dispersions in 2-butanone, IPA and IPA/H2O mixture; (e) Raman spectra of bulk and exfoliated MoO3 in different solvents; (f) zeta potential of MoO3 dispersions in 2-butanone. (a) CV measurement of

Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

• Matthias Simolka,
• Hanno Kaess and
• Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

• , Institute of Building Energetics, Thermal Engineering and Energy Storage (IGTE), Pfaffenwaldring 31, 70569 Stuttgart, Germany 10.3762/bjnano.11.46 Abstract Electrochemical strain microscopy (ESM) is a powerful atomic force microscopy (AFM) mode for the investigation of ion dynamics and activities in energy

• ionic concentration in the material volume under the AFM tip. The ageing of the cathode is found to be governed by a decrease of the electrochemical activity and the loss of available lithium for cycling, which can be stored in the cathode. Keywords: activity; ageing; cathode; electrochemical strain

• (FIB) SEM and X-ray absorption near edge structure (XANES) [6][7][8][9][10][11][12][13]. Another technique for post-mortem analysis is atomic force microscopy (AFM). In its basic form, it provides information on the topography of the sample. More advanced AFM modes extract in addition to the topography

Examination of the relationship between viscoelastic properties and the invasion of ovarian cancer cells by atomic force microscopy

• Mengdan Chen,
• Jinshu Zeng,
• Weiwei Ruan,
• Zhenghong Zhang,
• Yuhua Wang,
• Shusen Xie,
• Zhengchao Wang and
• Hongqin Yang

Beilstein J. Nanotechnol. 2020, 11, 568–582, doi:10.3762/bjnano.11.45

• The mechanical properties of cells could serve as an indicator for disease progression and early cancer diagnosis. This study utilized atomic force microscopy (AFM) to measure the viscoelastic properties of ovarian cancer cells and then examined the association with the invasion of ovarian cancer at

• light on the biomechanical changes for early diagnosis of tumor transformation and progression at single-cell level. Keywords: atomic force microscopy (AFM); cancer invasion; cancer migration; ovarian cancer cells; viscoelasticity; Introduction Ovarian cancer is a lethal gynecological malignancy with

• cells could be detected biomechanically. At present, a variety of research technologies, such as optical tweezers, micropipette aspiration, magnetic twisting cytometry and atomic force microscopy (AFM), have been developed to characterize the mechanical properties of biological samples [7][8][9][10

Multilayer capsules made of weak polyelectrolytes: a review on the preparation, functionalization and applications in drug delivery

• Varsha Sharma and
• Anandhakumar Sundaramurthy

Beilstein J. Nanotechnol. 2020, 11, 508–532, doi:10.3762/bjnano.11.41

• force [13] using confocal laser scanning microscopy (CLSM), atomic force microscopy (AFM), and reflection interference contrast microscopy (RICM). Fabrication conditions such as the type of polymer (e.g., thicker layers are formed by PEs having lower charge density) [14], concentration of the polymer

• extended to weak PE assemblies [26]. The dissolution of a SiO2 core in a poly(allylamine hydrochloride) (PAH)/poly(methacrylic acid) (PMA) assembly with ammonium fluoride (NH4F) at a suitable pH contributed to both multilayer stability and colloidal stability as shown in the AFM images in Figure 2a–d [24

• synthesis of NPs in the shell itself via the polyol reduction method has proved to be effective as it results in a dense and homogenous distribution of the NPs within the capsules [74]. Figure 5a,b shows TEM and AFM images of the successful incorporation and distribution of in situ synthesized silver NPs

Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

• Berkin Uluutku and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

• Berkin Uluutku Santiago D. Solares The George Washington University, Department of Mechanical and Aerospace Engineering, 800 22nd St. NW, Suite 3000, Washington, DC 20052, USA 10.3762/bjnano.11.37 Abstract Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale

• discuss a possible approach to develop an intermittent-contact conductive AFM mode based on Fourier analysis, whereby the measured current response consists of higher harmonics of the cantilever oscillation frequency. Such an approach may enable the characterization of soft samples with less damage than

• contact-mode imaging. To explore its feasibility, we derive the analytical form of the tip–sample current that would be obtained for attractive (noncontact) and repulsive (intermittent-contact) dynamic AFM characterization, and compare it with results obtained from numerical simulations. Although

Atomic-resolution imaging of rutile TiO₂(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy

• Daiki Katsube,
• Shoki Ojima,
• Eiichi Inami and
• Masayuki Abe

Beilstein J. Nanotechnol. 2020, 11, 443–449, doi:10.3762/bjnano.11.35

• characterize the surface. Ti2O3 rows appeared as bright spots in both NC-AFM and STM images observed in the same area. High-resolution NC-AFM images revealed that the rutile TiO2(110)-(1 × 2) reconstructed surface is composed of two domains with different types of asymmetric rows. Keywords: non-contact atomic

• clean surface is relatively easy. A well-known rutile TiO2(110) surface is the (1 × 1) structure [2]. The (1 × 1) surface has been studied using low-energy electron diffraction (LEED) [3][4], surface X-ray diffraction [5], non-contact atomic force microscopy (NC-AFM) [6][7][8][9], scanning tunneling

• using LEED and STM has revealed that the (1 × 2) LEED pattern was observed even if the (1 × 2) structure is formed only partially as shown in Figure 1c [20]. This indicates that real-space imaging with atomic resolution, i.e., STM and NC-AFM, would be helpful for a careful determination of the surface

Electrochemically derived functionalized graphene for bulk production of hydrogen peroxide

• Munaiah Yeddala,
• Pallavi Thakur,
• Anugraha A and
• Tharangattu N. Narayanan

Beilstein J. Nanotechnol. 2020, 11, 432–442, doi:10.3762/bjnano.11.34

• its layered nature (Supporting Information File 1, Figure S2). Here the thickness variation is confirmed using atomic force microscopy (AFM), and the results are given in Figure S3. This indicates that with an increase in the concentration of the electrolyte, the thickness is increased from 40 nm to

• 140 nm (Figure S3), which corresponds with the TEM analysis [43] and BET-based surface area data. Hence from the TEM, BET, and AFM analysis, it can be concluded that the electrolyte concentration is important for the electrochemical exfoliation assisted synthesis of ultrathin graphene layers, and the

• analyzer. AFM was used to study the thickness of the exfoliated layers. Electrochemical experiments All of the electrochemical ORR experiments were carried out in a conventional three-electrode system with a catalyst ink modified GCE as a working electrode, Hg/Hg2Cl2 and platinum foil (results were cross

High dynamic resistance elements based on a Josephson junction array

• Konstantin Yu. Arutyunov and
• Janne S. Lehtinen

Beilstein J. Nanotechnol. 2020, 11, 417–420, doi:10.3762/bjnano.11.32

• microscopy (AFM). Transport measurements were made inside a 3He4He dilution refrigerator at temperatures below 400 mK, corresponding to the superconducting transition of Ti QPSJs [10][12]. All input/output lines were carefully filtered [13] to reduce the impact of the noisy electromagnetic environment. When

Formation of nanoripples on ZnO flat substrates and nanorods by gas cluster ion bombardment

• Xiaomei Zeng,
• Vasiliy Pelenovich,
• Bin Xing,
• Rakhim Rakhimov,
• Wenbin Zuo,
• Alexander Tolstogouzov,
• Chuansheng Liu,
• Dejun Fu and
• Xiangheng Xiao

Beilstein J. Nanotechnol. 2020, 11, 383–390, doi:10.3762/bjnano.11.29

• bombardment, the modified surface morphology of the flat substrates and nanorods was studied with a scanning electron microscope (SEM) Zeiss Sigma, operated at 20 kV accelerating voltage. An atomic force microscope (AFM) Shimadzu SPM-9500J3 was used to study the ripple formation on the flat ZnO substrates

• . The AFM was operated in tapping mode with measuring areas of 2 × 2 and 5 × 5 µm. Results and Discussion Single crystal ZnO substrates First, we studied the influence of GCIB irradiation on flat ZnO single crystal samples. Their large flat surface allows to determine the main dependencies of ripple

• formation on the GCIB parameters (incidence angle, accelerating voltage, and fluence). SEM and AFM images shown in Figure 2 and Figure 3, respectively, present the surface morphology of the substrates before and after Ar cluster bombardment at different incidence angles, θ = 0–80°. The acceleration voltage

Implementation of data-cube pump–probe KPFM on organic solar cells

• Benjamin Grévin,
• Olivier Bardagot and
• Renaud Demadrille

Beilstein J. Nanotechnol. 2020, 11, 323–337, doi:10.3762/bjnano.11.24

• the chosen approach for pp-KPFM are finally discussed. pp-KPFM Implementation The experiments were performed on the basis of noncontact AFM (nc-AFM) under ultrahigh vacuum (UHV) with a beam deflection setup operated in frequency-modulation (FM) mode at room temperature. In the following, we only

• reported for samples processed under similar conditions [37][38]. The nc-AFM topographic images (Figure 7a) display a rather uniform contrast indicating that the donor and acceptor species have been finely mixed. However, specific contrasts in the KPFM potential images recorded in the dark (Figure 7b

• -based devices, hybrid perovskite thin films and single crystals as well as type-II van der Waals heterojunctions based on transition metal dichalcogenides. Experimental Nc-AFM and pp-KPFM Noncontact-AFM (nc-AFM) experiments were performed with a ScientaOmicron VT-AFM setup in UHV at room temperature (RT

Nonclassical dynamic modeling of nano/microparticles during nanomanipulation processes

• Moharam Habibnejad Korayem,
• Ali Asghar Farid and
• Rouzbeh Nouhi Hefzabad

Beilstein J. Nanotechnol. 2020, 11, 147–166, doi:10.3762/bjnano.11.13

• ; nanoparticle modeling; size effects; Introduction It is not possible to simultaneously observe and manipulate a nanoparticle using atomic force microscopy (AFM) as the imaging and manipulation tools are combined. As a result, dynamic modeling and simulation are essential in this field of research. For the

• model. They studied the effect of dimensionless load and the transition parameter on the contact area. They emphasized the importance of the MD model that covers a large area of AFM surveys [5]. Owing to the importance of the AFM cantilever spring constant and its use in calculation of the rupture force

• of protein bonds and Young’s modulus of nanoparticles, Clifford and Seah determined the AFM cantilever normal spring constant [6]. Korayem and Zakeri studied the effects of different parameters on the times and forces in a 2D manipulation. Using their proposed algorithm, the location of the

Molecular architectonics of DNA for functional nanoarchitectures

• Debasis Ghosh,
• Lakshmi P. Datta and
• Thimmaiah Govindaraju

Beilstein J. Nanotechnol. 2020, 11, 124–140, doi:10.3762/bjnano.11.11

• dT20–(APA)20–dT20, extended end-to-end through aromatic interactions, was visualized by AFM (Figure 4c). The left-handedness of the double-helical assembly dT20–(APA)20–dT20 observed in AFM correlated with the CD data. The stimuli-responsiveness of the SFM-supported chirality-imprinted double-helical

• conductometric measurement-based data provided subnanomolar detection of mercury (≥0.1 nM, 0.02 ppb), which was 100 times lower than the permitted maximum quantity of mercury in water (≈10 nM, ≈2 ppb), as per the United States Environmental Protection Agency (USEPA). The AFM-based measurement also showed

• porphyrin units were positioned at the terminal of a helical bundle that improved the directional insertion of the nanobarrel across the bilayer. AFM images showed that the assembled morphology of the hexagonally packed nanobarrels was made up of porphyrin-tethered DNA (Figure 8b). Stulz and co-workers

A review of demodulation techniques for multifrequency atomic force microscopy

• David M. Harcombe,
• Michael G. Ruppert and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2020, 11, 76–91, doi:10.3762/bjnano.11.8

• the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging. Keywords: atomic force microscopy (AFM); multifrequency; demodulation

• ; Kalman filter; Lyapunov filter; digital signal processing; field-programmable gate array (FPGA); Introduction Atomic force microscopy (AFM) [1] has enabled innovation in nanoscale engineering since it was invented in 1986 by Binnig and co-workers. Atomic-scale topographical resolution is achieved by

• , which establishes the requirement for demodulation in AFM. In intermittent-contact constant-amplitude AFM [5], a constant cantilever oscillation amplitude is maintained by feeding back the demodulated fundamental amplitude of the deflection signal. The imaging of delicate biological samples [6][7][8] is

Simple synthesis of nanosheets of rGO and nitrogenated rGO

• Pallellappa Chithaiah,
• Madhan Mohan Raju,
• Giridhar U. Kulkarni and
• C. N. R. Rao

Beilstein J. Nanotechnol. 2020, 11, 68–75, doi:10.3762/bjnano.11.7

• a hexagonal pattern suggesting the crystalline nature of the synthesized N-rGO sheets. AFM height images of as-prepared rGO and N-rGO nanosheets are displayed in Figure 6a and Figure 6b, respectively. The rGO and N-rGO nanosheets are flat with an average thickness of about 3 nm and 3.5 nm

• force microscopy (AFM), X-ray diffraction (XRD) and thermogravimetric analysis (TGA). X-ray diffraction patterns of the samples were collected in the range of 10–70° (2θ) using a Bruker D8 diffractometer with a Cu Kα source (λ = 0.154178 nm). The morphology of the samples was examined using a Tescan

• °C·min−1 using a Mettler-Toledo-TG-850 apparatus. AFM measurements were performed using a CP2 atomic force microscope. Electrode preparation and electrochemical characterization The catalyst inks of as-synthesized rGO and reduced graphene oxide H-rGO were prepared by ultrasonication separately. A mixture

The effect of heat treatment on the morphology and mobility of Au nanoparticles

• Sven Oras,
• Sergei Vlassov,
• Simon Vigonski,
• Boris Polyakov,
• Mikk Antsov,
• Vahur Zadin,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2020, 11, 61–67, doi:10.3762/bjnano.11.6

• manipulated on a silica substrate with an atomic force microscope (AFM) in tapping mode. Initially, the NPs were immovable by AFM energy dissipation. However, annealed NPs became movable, and less energy was required to displace the NPs annealed at higher temperature. However, after annealing at 800 °C, the

• particles became immovable again. This effect was attributed to the diffusion of Au into the Si substrate and to the growth of the SiO2 layer. Keywords: annealing; atomic force microscopy (AFM); Au nanoparticles; manipulation; melting; nanotribology; Introduction Gold is one of the most prominent

• atomic force microscope (AFM) in order to study the effect of annealing on their tribological behavior. Experimental Nanoparticle synthesis A colloidal suspension of Au NPs was produced by reducing an aqueous solution of HAuCl4·H2O. The procedure consisted of adding 3 mL of 1% aqueous HAuCl4 (Sigma

The different ways to chitosan/hyaluronic acid nanoparticles: templated vs direct complexation. Influence of particle preparation on morphology, cell uptake and silencing efficiency

• Arianna Gennari,
• Julio M. Rios de la Rosa,
• Erwin Hohn,
• Maria Pelliccia,
• Enrique Lallana,
• Roberto Donno,
• Annalisa Tirella and
• Nicola Tirelli

Beilstein J. Nanotechnol. 2019, 10, 2594–2608, doi:10.3762/bjnano.10.250

• Synergy2 Biotek plate reader. Atomic force microscopy (AFM). Drops (ca. 35 µL) of the chitosan/HA nanoparticle suspensions were deposited on a clean mica surface and left to dry overnight in Petri dishes at room temperature. A molecular force probe 3D AFM (MFP-3D, Asylum Research, Oxford Instruments

• , Abingdon, UK) equipped with an OTESPA-R3 cantilever (Bruker, Camarillo, CA, USA) was used to acquire AFM images in air at room temperature in tapping mode. Igor-Pro AFM software (Oxford Instrument, UK) was used to analyse the images. Nuclease protection assay. The protection effect against nuclease

• irreversible [29]. It is therefore important to assess whether in the same formulation HA nanoparticles are present together with unbound HA, which could potentially reduce binding and efficacy of the payload-carrying nanoparticles. Using AFM, we have shown that dialysis through membranes with a large MWCO

Antimony deposition onto Au(111) and insertion of Mg

• Lingxing Zan,
• Da Xing,
• Abdelaziz Ali Abd-El-Latif and
• Helmut Baltruschat

Beilstein J. Nanotechnol. 2019, 10, 2541–2552, doi:10.3762/bjnano.10.245

• available STM scanner (Molecular Imaging/Agilent Technologies) fitted with a so-called STM/AFM electrochemical cell as previously described [24]. Pt and Au wires were used as a quasi-reference electrode (EPt/PtO = 0.9 V vs RHE) and a counter electrode, respectively. The reference electrode was immersed in a

Evaluation of click chemistry microarrays for immunosensing of alpha-fetoprotein (AFP)

• Seyed Mohammad Mahdi Dadfar,
• Sylwia Sekula-Neuner,
• Vanessa Trouillet,
• Hui-Yu Liu,
• Ravi Kumar,
• Annie K. Powell and
• Michael Hirtz

Beilstein J. Nanotechnol. 2019, 10, 2505–2515, doi:10.3762/bjnano.10.241

• successful implementation and a thorough comparison of their properties. Characterization of the surfaces by XPS and AFM All steps of the immobilization reactions were monitored by X-ray photoelectron spectroscopy (XPS) to validate the expected chemical reactions taking place (Figure 2). The

• occurring in the spectra at 400.0 eV also result from the successful reactions. To confirm the quality of the functionalized layers, after each step of the functionalization process, the roughness of the samples was monitored by atomic force microscopy (AFM). The results are shown in Supporting Information

• bare and functionalized glasses was characterized using surface-sensitive techniques, including atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). To map the surface roughness, AFM in tapping mode was conducted with a Dimension Icon (Bruker, Germany) device with HQ:NSC15/Al BS