Cytotoxic and proinflammatory effects of PVP-coated silver nanoparticles after intratracheal instillation in rats

• Nadine Haberl,
• Stephanie Hirn,
• Alexander Wenk,
• Jörg Diendorf,
• Matthias Epple,
• Blair D. Johnston,
• Fritz Krombach,
• Wolfgang G. Kreyling and
• Carsten Schleh

Beilstein J. Nanotechnol. 2013, 4, 933–940, doi:10.3762/bjnano.4.105

• (ultrasound bath). Scanning electron microscopy (SEM) was performed with an ESEM Quanta 400 instrument with gold/palladium-sputtered samples. Transmission electron microscopic (TEM) was carried out with a CM200 FEG-Instrument (Philips) with a Supertwin lens, operated at an accelerating voltage of 200 keV. The

Synthesis of boron nitride nanotubes from unprocessed colemanite

• Saban Kalay,
• Zehra Yilmaz and
• Mustafa Çulha

Beilstein J. Nanotechnol. 2013, 4, 843–851, doi:10.3762/bjnano.4.95

• coated with a few nm thick gold-layers by using a Baltec SDC 005 sputter-coater. Scanning electron microscopy (SEM) images were obtained by using a Carl Zeis Evo-40 instrument under high vacuum with an accelerating voltage of 10 kV. Raman spectroscopy All Raman Spectroscopic measurements were performed

AFM as an analysis tool for high-capacity sulfur cathodes for Li–S batteries

• Renate Hiesgen,
• Seniz Sörgel,
• Rémi Costa,
• Linus Carlé,
• Ines Galm,
• Natalia Cañas,
• Brigitta Pascucci and
• K. Andreas Friedrich

Beilstein J. Nanotechnol. 2013, 4, 611–624, doi:10.3762/bjnano.4.68

• Gemini (Zeiss) and AFM with a Multimode 8 Bruker system. XRD measurement of Li2S in air X-ray diffractograms (Figure 3) were measured in reflection mode with an X-ray diffractometer (D8 Discover GADDS) equipped with a VÅNTEC-2000 areal detector. Exposures were made with an accelerating voltage of 45 kV

Ferromagnetic behaviour of Fe-doped ZnO nanograined films

• Boris B. Straumal,
• Svetlana G. Protasova,
• Andrei A. Mazilkin,
• Thomas Tietze,
• Eberhard Goering,
• Gisela Schütz,
• Petr B. Straumal and
• Brigitte Baretzky

Beilstein J. Nanotechnol. 2013, 4, 361–369, doi:10.3762/bjnano.4.42

• -on transmission electron microscopy (TEM) and EPMA. TEM investigations were carried out on a Jeol JEM–4000FX microscope at an accelerating voltage of 400 kV. X-ray diffraction (XRD) data were obtained on a Siemens diffractometer (Cu Kα radiation). Evaluation of the grain size D from the X-ray peak

Guided immobilisation of single gold nanoparticles by chemical electron beam lithography

• Patrick A. Schaal and
• Ulrich Simon

Beilstein J. Nanotechnol. 2013, 4, 336–344, doi:10.3762/bjnano.4.39

• scanning electron microscope (Zeiss LEO Supra 35-VP) equipped with an Elphy Plus pattern generator (RAITH, software Elphy Plus version 4). Patterns were exposed at an accelerating voltage of 2 kV and basic electron doses of 10 μC·cm−2 and 50 μC·cm−2, respectively. Synthesis and deposition of AuNP AuNPs

Mechanical and thermal properties of bacterial-cellulose-fibre-reinforced Mater-Bi^® bionanocomposite

• Hamonangan Nainggolan,
• Saharman Gea,
• Emiliano Bilotti,
• Ton Peijs and
• Sabar D. Hutagalung

Beilstein J. Nanotechnol. 2013, 4, 325–329, doi:10.3762/bjnano.4.37

• field emission scanning electron microscope was used to observe the morphology at an accelerating voltage of 10 kV. The crystallinity (Tc) and melting temperature (Tm) were measured by DSC. Results showed a significant improvement in mechanical and thermal properties in accordance with the addition of

• electron microscope (FE-SEM) was used to observe the morphology of the FBC/Mater-Bi composites. All samples were coated with gold and observed by using an accelerating voltage of 10 kV. Differential scanning calorimetric (DSC) experiments were carried out by using a Perkin Elmer Pyris DSC-7 calorimeter

Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM

• Xiaoxing Ke,
• Carla Bittencourt,
• Sara Bals and
• Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2013, 4, 77–86, doi:10.3762/bjnano.4.9

• amount of amorphous carbon due to the fragmentation of the organo-metal [(CH3)3Pt(CpCH3)], used as precursor for Pt deposition, can be reduced by using electron-beam irradiation with a low accelerating voltage as a post-deposition treatment. Results and Discussion 3D distribution of Pt nanoclusters

• decomposition and further deposition is induced by interaction between electrons and materials, deposition can be tailored by tuning the accelerating voltage of the electron beam to control their transmission through a fixed thickness of target so as to realize the deposition on one or more facets. Stripe

• is studied by changing the beam accelerating voltage (primary energy, PE) and dwell time, whereas the beam current is not varied in the current study. Figure 6 summarizes the deposition of Pt for an increasing PE of 1 kV, 3 kV, 5 kV, 10 kV, 15 kV and 30 kV in each row. For each PE, different dwell

Functionalised zinc oxide nanowire gas sensors: Enhanced NO₂ gas sensor response by chemical modification of nanowire surfaces

• Eric R. Waclawik,
• Jin Chang,
• Andrea Ponzoni,
• Isabella Concina,
• Dario Zappa,
• Elisabetta Comini,
• Nunzio Motta,
• Guido Faglia and
• Giorgio Sberveglieri

Beilstein J. Nanotechnol. 2012, 3, 368–377, doi:10.3762/bjnano.3.43

• determined by transmission electron microscope (TEM, JEOL-2100) with an accelerating voltage of 200 kV. For TEM experiments, the specimens were prepared by deposition of a dilute solution of the colloid onto a carbon-coated copper grid and drying at room temperature. Thermogravimetric (TG) measurements were

Mesoporous MgTa₂O₆ thin films with enhanced photocatalytic activity: On the interplay between crystallinity and mesostructure

• Jin-Ming Wu,
• Igor Djerdj,
• Till von Graberg and
• Bernd M. Smarsly

Beilstein J. Nanotechnol. 2012, 3, 123–133, doi:10.3762/bjnano.3.13

• diffraction (XRD) measurements were performed in a Bruker D8 diffractometer with an accelerating voltage of 40 kV and a current of 40 mA, with Cu Kα radiation. The 2-D-SAXS measurements were carried out by using a Nonius rotating anode setup (Cu Kα radiation with λ = 0.154 nm) featuring a three-pinhole