Directed growth of quinacridone chains on the vicinal Ag(35 1 1) surface

• Niklas Humberg,
• Lukas Grönwoldt and
• Moritz Sokolowski

Beilstein J. Nanotechnol. 2024, 15, 556–568, doi:10.3762/bjnano.15.48

• the vicinal Ag(35 1 1) surface was investigated by scanning tunneling microscopy and low-energy electron diffraction. The focus was on the influence of the steps on the QA structures and their preferential azimuthal orientations with the aim of achieving a selective orientation. After deposition at a

Cholesterol nanoarchaeosomes for alendronate targeted delivery as an anti-endothelial dysfunction agent

• Horacio Emanuel Jerez,
• Yamila Roxana Simioni,
• Kajal Ghosal,
• Maria Jose Morilla and
• Eder Lilia Romero

Beilstein J. Nanotechnol. 2024, 15, 517–534, doi:10.3762/bjnano.15.46

• 30 min at 37 °C. Then, cells were washed with PBS, and the fluorescence intensity of whole cells was measured using a Cytation™ 5 instrument at λex = 490 nm and λem = 520 nm. Confocal microscopy was performed to study the morphology of HUVECs. Briefly, after incubation, cell monolayers were washed

• . Morphological changes induced by LPS on HUVECs. (A) Representative fluorescence confocal microscopy images of HUVECs from the mild inflammation model. Cells were labelled with CytoPainter Phalloidin-iFluor 488 (actin) and Hoechst 33342 (nucleus). Scale bar: 100 µm. (B) Elliptical form factor (EFF). The EFF was

Electron-induced deposition using Fe(CO)₄MA and Fe(CO)₅ – effect of MA ligand and process conditions

• Hannah Boeckers,
• Atul Chaudhary,
• Petra Martinović,
• Amy V. Walker,
• Lisa McElwee-White and
• Petra Swiderek

Beilstein J. Nanotechnol. 2024, 15, 500–516, doi:10.3762/bjnano.15.45

• nanostructures produced by FEBID are of interest for diverse applications including magnetic data storage devices [4][5][6], tips for magnetic force microscopy [4][7], or sensors [4][8]. The same applies to cobalt nanostructures, which can be prepared with high purity and shape fidelity using, in particular, the

Aero-ZnS prepared by physical vapor transport on three-dimensional networks of sacrificial ZnO microtetrapods

• Veaceslav Ursaki,
• Tudor Braniste,
• Victor Zalamai,
• Emil Rusu,
• Vladimir Ciobanu,
• Vadim Morari,
• Daniel Podgornii,
• Pier Carlo Ricci,
• Rainer Adelung and
• Ion Tiginyanu

Beilstein J. Nanotechnol. 2024, 15, 490–499, doi:10.3762/bjnano.15.44

• produced material is investigated by scanning electron microscopy (SEM), while its crystalline and optical qualities are assessed by X-ray diffraction (XRD) analysis and photoluminescence (PL) spectroscopy, respectively. We demonstrate possibilities for controlling the composition and the crystallographic

• sensor applications. Keywords: aeromaterial; crystallographic structure; luminescence; physical vapor transport; scanning electron microscopy (SEM); X-ray diffraction (XRD); Introduction Porous materials represent a class of solid-state networks widely used in adsorptive and photocatalytic removal of

Photocatalytic degradation of methylene blue under visible light by cobalt ferrite nanoparticles/graphene quantum dots

• Vo Chau Ngoc Anh,
• Le Thi Thanh Nhi,
• Le Thi Kim Dung,
• Dang Thi Ngoc Hoa,
• Nguyen Truong Son,
• Nguyen Thi Thao Uyen,
• Nguyen Ngoc Uyen Thu,
• Le Van Thanh Son,
• Le Trung Hieu,
• Tran Ngoc Tuyen and
• Dinh Quang Khieu

Beilstein J. Nanotechnol. 2024, 15, 475–489, doi:10.3762/bjnano.15.43

• electron microscopy, transmission electron microscopy, ultraviolet–visible diffuse reflectance spectroscopy, Fourier-transform infrared spectroscopy, photoluminescence spectroscopy, vibrating-sample magnetometry, and nitrogen adsorption/desorption isotherms. Cobalt ferrite crystals of around 8–10 nm and

• Tristar-3030 system (Micromeritics, USA). The magnetic properties were measured on a Micro Sense vibrating-sample magnetometer (VSM) at room temperature. Scanning electron microscopy (SEM) observations and energy-dispersive X-ray elemental mapping (EDX mapping) were carried out on a Hitachi S-4800 FESEM

• (Japan). High-resolution transmission electron microscopy (HR-TEM) observation was performed with a JEM 1010. The intermediates in the MB degradation were determined by using an Agilent 1100 LC/MS-MS system with an electron spray ionization source combined with an ion trap. Synthesis of CoFe2O4, CoFe2O4

Fabrication of nanocrystal forms of ᴅ-cycloserine and their application for transdermal and enteric drug delivery systems

• Hsuan-Ang Tsai,
• Tsai-Miao Shih,
• Theodore Tsai,
• Jhe-Wei Hu,
• Yi-An Lai,
• Jui-Fu Hsiao and
• Guochuan Emil Tsai

Beilstein J. Nanotechnol. 2024, 15, 465–474, doi:10.3762/bjnano.15.42

• improve the bioavailability. In this study, for the first time, DCS, a highly water-soluble compound, has formed nanocrystals and this was confirmed by scanning electronic microscopy and X-ray powder diffraction. Furthermore, DCS nanocrystals were applied to several formulations to test their stability

• ., Ltd.) for 10 min. The collection was vacuum-dried to obtain DCS nanocrystals. Characterization of DCS nanocrystals The DCS nanocrystals were analyzed via scanning electronic microscopy (SEM, JEOL Ltd.) and X-ray powder diffraction (XRPD, Bruker AXS GmbH). For SEM, commercial DCS was spreaded onto a

• formulation in the transdermal delivery system. Scanning electron microscopy images of commercial DCS (A) and DCS nanocrystals (B). The X-ray powder diffraction spectra of DCD nanocrystal and commercial DCS. The pH stability test of DCS in neutral (pH 7.4) and acidic (pH 1.2) environments (p < 0.01). In vitro

Sidewall angle tuning in focused electron beam-induced processing

• Sangeetha Hari,
• Willem F. van Dorp,
• Johannes J. L. Mulders,
• Piet H. F. Trompenaars,
• Pieter Kruit and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 447–456, doi:10.3762/bjnano.15.40

• by etching with water and it is shown, using transmission electron microscopy imaging, that the sidewall angle can be tuned from outward to inward by controlling the etch position on the sidewall. A surprising under-etching due to the emission of secondary electrons from the deposit was observed

Heat-induced morphological changes in silver nanowires deposited on a patterned silicon substrate

• Elyad Damerchi,
• Sven Oras,
• Edgars Butanovs,
• Allar Liivlaid,
• Mikk Antsov,
• Boris Polyakov,
• Annamarija Trausa,
• Veronika Zadin,
• Andreas Kyritsakis,
• Loïc Vidal,
• Karine Mougin,
• Siim Pikker and
• Sergei Vlassov

Beilstein J. Nanotechnol. 2024, 15, 435–446, doi:10.3762/bjnano.15.39

• process, fragmentation in either adhered or suspended parts can dominate. Experiments were supported by finite element method and molecular dynamics simulations. Keywords: diffusion; finite element method; heat treatment; molecular dynamics simulations; morphological changes; scanning electron microscopy

• the results from the scheme 1. Approximately one hour waiting time between cycles was chosen to give enough time for taking series of scanning electron microscopy (SEM, FEI, Nanosem 450) images after each heating cycle. Additionally, a separate series of transmission electron microscopy (TEM

Unveiling the nature of atomic defects in graphene on a metal surface

• Karl Rothe,
• Nicolas Néel and
• Jörg Kröger

Beilstein J. Nanotechnol. 2024, 15, 416–425, doi:10.3762/bjnano.15.37

• bond with the microscope probe is reflected by the strongest attraction at the vacancy center as well as by hysteresis effects in force traces recorded for tip approach to and retraction from the Pauli repulsion range of vertical distances. Keywords: atomic force microscopy and spectroscopy; graphene

• ; scanning tunneling microscopy and spectroscopy; Introduction Defects in lattices of two-dimensional (2D) materials are considered as promising building blocks for tailoring electronic and phononic band structures, magnetic texture, photon emission, and charge carrier concentration [1]. In addition

• frequency shift [39][40]. Topographic STM and AFM data were processed using WSxM [41]. Results and Discussion Scanning tunneling microscopy and spectroscopy findings After gentle Ar+ ion bombardment, graphene-covered Ir(111) gives rise to STM images as depicted in Figure 1a. The periodic superstructure of

Insect attachment on waxy plant surfaces: the effect of pad contamination by different waxes

• Elena V. Gorb and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2024, 15, 385–395, doi:10.3762/bjnano.15.35

• ) were tested. Scanning electron microscopy To visualize the waxy plant surfaces and attachment devices in the C. fastuosa male beetle in both clean and contaminated conditions, scanning electron microscopy was employed. For plant surfaces, small (ca. 1 cm2) pieces of plant organs were used. In the case

• , experiments with all waxy plant surfaces (d.f. = 44) and (2) data obtained from five test insects on each plant surface separately (d.f. = 4). Scanning electron microscopy (SEM) micrographs of waxy plant surfaces in the young stem of Acer negundo (a) and adaxial (upper) leaf sides of Aloe vera (b), Aquilegia

Investigating ripple pattern formation and damage profiles in Si and Ge induced by 100 keV Ar⁺ ion beam: a comparative study

• Indra Sulania,
• Harpreet Sondhi,
• Tanuj Kumar,
• Sunil Ojha,
• G R Umapathy,
• Ambuj Mishra,
• Ambuj Tripathi,
• Richa Krishna,
• Devesh Kumar Avasthi and
• Yogendra Kumar Mishra

Beilstein J. Nanotechnol. 2024, 15, 367–375, doi:10.3762/bjnano.15.33

• using atomic force microscopy, and induced damage profiles inside Si and Ge by Rutherford backscattering spectrometry and transmission electron microscopy. The ripple wavelength was found to scale with ion fluence, and energetic ions created more defects inside Si as compared to that of Ge. Although

• clustering of defects leads to a subsequent increase of the damage peak in irradiated samples (for an ion fluence of ≈9 × 1017 ions/cm2) compared to that in unirradiated samples. Keywords: atomic force microscopy; ion beam; nanopatterns; radiation damage; Rutherford backscattering spectrometry; transmission

• electron microscopy; Introduction Scientific research varying from electronics to photonics, homeland security, high-resolution parallel patterning of magnetic media, biotechnology, and medicine are based upon nanotechnology. These applications require nanopatterning techniques to fabricate devices or

Modulated critical currents of spin-transfer torque-induced resistance changes in NiCu/Cu multilayered nanowires

• Mengqi Fu,
• Roman Hartmann,
• Julian Braun,
• Sergej Andreev,
• Torsten Pietsch and
• Elke Scheer

Beilstein J. Nanotechnol. 2024, 15, 360–366, doi:10.3762/bjnano.15.32

• device fabrication, and scanning electron microscopy (SEM) images of the devices during the fabrication process are presented in Supporting Information File 1. In most reported works, the nanowires were deposited in all pores of the AAO templates [18][19][20][21]. Additional etching steps or coating

Controllable physicochemical properties of WO_x thin films grown under glancing angle

• Rupam Mandal,
• Aparajita Mandal,
• Alapan Dutta,
• Rengasamy Sivakumar,
• Sanjeev Kumar Srivastava and
• Tapobrata Som

Beilstein J. Nanotechnol. 2024, 15, 350–359, doi:10.3762/bjnano.15.31

• uniformity. WSxM software was used to carry out AFM image analysis. Kelvin probe force microscopy (KPFM) was used to study the local work function of the WOx films. WOx samples were removed from the high-vacuum environment right before the KPFM measurements to avoid any contamination in air. For KPFM

Comparative electron microscopy particle sizing of TiO₂ pigments: sample preparation and measurement

• Ralf Theissmann,
• Christopher Drury,
• Markus Rohe,
• Thomas Koch,
• Jochen Winkler and
• Petr Pikal

Beilstein J. Nanotechnol. 2024, 15, 317–332, doi:10.3762/bjnano.15.29

• regulatory classification for some of the samples tested. The electron microscopy results published here are supported by results from other complementary methods including surface area measurements. It is the intention of this publication to contribute to an ongoing discussion on size measurements of TiO2

• pigments and other particulate materials and advance the development of widely acceptable, precise, and reproducible measurement protocols for measuring the number-based PSDs of particulate products in the size range of TiO2 pigments. Keywords: electron microscopy; nanomaterials definition; number-based

• critical. Among the methods used to determine particle size distributions, the evaluation of particle sizes from electron microscopy (EM) images is considered as a confirmatory method for correct classification [3]. In the case of monomodal particle distributions, this method is straightforward [4

Determining by Raman spectroscopy the average thickness and N-layer-specific surface coverages of MoS₂ thin films with domains much smaller than the laser spot size

• Felipe Wasem Klein,
• Jean-Roch Huntzinger,
• Vincent Astié,
• Damien Voiry,
• Romain Parret,
• Houssine Makhlouf,
• Sandrine Juillaguet,
• Jean-Manuel Decams,
• Sylvie Contreras,
• Périne Landois,
• Ahmed-Azmi Zahab,
• Jean-Louis Sauvajol and
• Matthieu Paillet

Beilstein J. Nanotechnol. 2024, 15, 279–296, doi:10.3762/bjnano.15.26

• . However, atomic force microscopy revealed that they are constituted of nanoflakes (with a lateral size of typically 50 nm) with possibly a distribution of thicknesses. Furthermore, depending on the synthesis conditions, the MoS2 surface coverage can be incomplete, and the thin film average thickness can

• samples is to have a limited number of defects. Note also that all exfoliated flakes have a lateral size (few micrometers at minimum) significantly larger than the diameter of the laser spot. In such flakes, the exact number of layers, N, is determined by combining optical microscopy, spectral

• , black symbols) and standard CVD MoS2 flakes (Figure 4a, red symbols) for N ≤ 4. As previously, the exact number of layers is obtained by combining optical microscopy, spectral reflectivity, and number and frequencies of LB and S modes. For both kinds of MoS2 flakes, ΔωA−E increases monotonously with N

Ultrasensitive and ultrastretchable metal crack strain sensor based on helical polydimethylsiloxane

• Shangbi Chen,
• Dewen Liu,
• Weiwei Chen,
• Huajiang Chen,
• Jiawei Li and
• Jinfang Wang

Beilstein J. Nanotechnol. 2024, 15, 270–278, doi:10.3762/bjnano.15.25

• with PDMS. Parts of the experimental procedure are shown in Figure S6 (Supporting Information File 1). Characterization The surface morphology of the samples prepared in this study was examined through the utilization of scanning electron microscopy (SEM) (TESCAN MIRA3, Czech Republic) and an optical

Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications

• August K. Roos,
• Ermes Scarano,
• Elisabet K. Arvidsson,
• Erik Holmgren and
• David B. Haviland

Beilstein J. Nanotechnol. 2024, 15, 242–255, doi:10.3762/bjnano.15.23

• microscopy based on electromechanical coupling due to a strain-dependent kinetic inductance of a superconducting nanowire. The force sensor is a bending triangular plate (cantilever) whose deflection is measured via a shift in the resonant frequency of a high-Q superconducting microwave resonator at 4.5 GHz

• -induced deposition of platinum. Finally, we present measurements that characterize the spread of mechanical resonant frequency, the temperature dependence of the microwave resonance, and the sensor’s operation as an electromechanical transducer of force. Keywords: atomic force microscopy; force sensing

• (KIMEC) sensors. A force sensor designed specifically for scanning probe microscopy must have a sharp tip that is readily positioned and scanned over a surface. We operate the sensor near a mechanical resonance with a high quality factor Q for enhanced responsivity to force. The mechanical resonator is a

Quantitative wear evaluation of tips based on sharp structures

• Ke Xu and
• Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

• Ke Xu Houwen Leng School of Electrical & Control Engineering, Shenyang Jianzhu University, Shenyang 110168, China 10.3762/bjnano.15.22 Abstract To comprehensively study the influence of atomic force microscopy (AFM) scanning parameters on tip wear, a tip wear assessment method based on sharp

• scanning frequency and free amplitude, and a set point of approximately 0.2, resulting in clear, high-quality AFM images. Keywords: atomic force microscopy; estimated tip diameter; scanning parameter; tip reconstruction; tip wear; Introduction AFM is a commonly used multifunctional technology in

• nanotechnology [1][2][3][4][5]. Compared to optical and electron microscopy, AFM enables three-dimensional (3D) measurements of nanostructures in air and liquid environments [6]. The interaction between the tip and sample influences the measurement results of AFM by convoluting the tip topography with the sample

Ion beam processing of DNA origami nanostructures

• Leo Sala,
• Agnes Zerolová,
• Violaine Vizcaino,
• Alain Mery,
• Alicja Domaracka,
• Hermann Rothard,
• Philippe Boduch,
• Dominik Pinkas and
• Jaroslav Kocišek

Beilstein J. Nanotechnol. 2024, 15, 207–214, doi:10.3762/bjnano.15.20

• , ENSICAEN, UNICAEN, CEA, CNRS, CIMAP, Boulevard Henri Becquerel, BP 5133, 14070, Caen cedex 5, France Electron Microscopy Center, Institute of Molecular Genetics of the CAS, Vídenská 1083, 142 20, Prague, Czech Republic 10.3762/bjnano.15.20 Abstract DNA origami nanostructures are emerging as a bottom-up

• supported by the Czech Science Foundation, Project No. 21-26601X. We also acknowledge the Electron Microscopy Core Facility, IMG ASCR - Prague supported by the MEYS CR (LM2018129 Czech-BioImaging) and ERDF (No. CZ.02.1.01/0.0/0.0/16_013/0001775) for the use of the FIB-SEM. L.S. finally acknowledges support

Exploring disorder correlations in superconducting systems: spectroscopic insights and matrix element effects

• Vyacheslav D. Neverov,
• Alexander E. Lukyanov,
• Andrey V. Krasavin,
• Alexei Vagov,
• Boris G. Lvov and
• Mihail D. Croitoru

Beilstein J. Nanotechnol. 2024, 15, 199–206, doi:10.3762/bjnano.15.19

• kind of X-ray microscopy and has come to the conclusion that such fractal structures boost superconductivity. In particular, the work demonstrates that this material has a small number of very highly ordered regions and larger numbers of disordered regions, with a power-law distribution describing them

Graphene removal by water-assisted focused electron-beam-induced etching – unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO₂ substrates

• Aleksandra Szkudlarek,
• Jan M. Michalik,
• Inés Serrano-Esparza,
• Zdeněk Nováček,
• Veronika Novotná,
• Piotr Ozga,
• Czesław Kapusta and
• José María De Teresa

Beilstein J. Nanotechnol. 2024, 15, 190–198, doi:10.3762/bjnano.15.18

• provides information about the degree of damage caused by this method. Atomic force microscopy (AFM) measurements reveal important aspects of topographical changes induced in the substrate and help to establish optimized conditions for the etching process. Results The fundamentals of water-assisted FEBIE

• studies: A) optical microscopy, B) scanning electron microscopy (SEM), C) AFM, and D) correlative probe and electron microscopy (CPEM). The optical contrast of graphene placed onto SiO2/Si allows us to easily distinguish between its mono-, bi-, triple, and thicker flakes layers. The values (approx. 2.5 nm

• that with certain precautions water-assisted FEBIE can be applied for such a nanopatterning process. The experimental data obtained with scanning Raman spectroscopy, correlative probe and electron microscopy, and in situ AFM measurements provide a comprehensive image of FEBIE etch profiles. In addition

Nanocarrier systems loaded with IR780, iron oxide nanoparticles and chlorambucil for cancer theragnostics

• Phuong-Thao Dang-Luong,
• Hong-Phuc Nguyen,
• Loc Le-Tuan,
• Xuan-Thang Cao,
• Vy Tran-Anh and
• Hieu Vu Quang

Beilstein J. Nanotechnol. 2024, 15, 180–189, doi:10.3762/bjnano.15.17

• were performed in both 0.1× PBS (13.7 mM of NaCl, 0.27 mM of KCl, 1 mM of Na2HPO4, and 0.18 mM of KH2PO4, pH 7.4) and animal cell culture media containing DMEM and 10% FBS. Scanning electron microscopy For scanning electron microscopy (SEM) experiments, 10 μL of F127-folate@NP was loaded on the silica

Modification of graphene oxide and its effect on properties of natural rubber/graphene oxide nanocomposites

• Nghiem Thi Thuong,
• Le Dinh Quang,
• Vu Quoc Cuong,
• Cao Hong Ha,
• Nguyen Ba Lam and
• Seiichi Kawahara

Beilstein J. Nanotechnol. 2024, 15, 168–179, doi:10.3762/bjnano.15.16

• characterized by X-ray diffraction (XRD), Fourier-transform infrared spectroscopy, contact angle, thermal gravimetric analysis, and scanning electron microscopy. The XRD results showed the appearance of an amorphous region of silica particles at a diffraction angle of 22°. The formation of silica was

• gravimetric analysis (TGA) of the samples was performed on a TA Q500 instrument. The temperature was increased at a heating rate of 10 °C /min from room temperature to 900 °C in air atmosphere. The morphology of the DPNR/GO-VTES was observed with field-emission scanning electron microscopy (FE-SEM) performed

• efficiently attached to GO, and the attachment was more efficient in basic conditions rather than acidic conditions. Scanning electron microscopy images Figure 8 shows SEM images for GO-VTES(a) and GO-VTES(b). As can be seen, silica was produced with a size of approx. 50 nm for GO-VTES(a) and GO-VTES(b). It

CdSe/ZnS quantum dots as a booster in the active layer of distributed ternary organic photovoltaics

• Gabriela Lewińska,
• Piotr Jeleń,
• Zofia Kucia,
• Maciej Sitarz,
• Łukasz Walczak,
• Bartłomiej Szafraniak,
• Jerzy Sanetra and
• Konstanty W. Marszalek

Beilstein J. Nanotechnol. 2024, 15, 144–156, doi:10.3762/bjnano.15.14

• relations of refractive indices and extinction coefficient were investigated. The morphologies of the thin films were studied with atomic force microscopy. The chemical boundaries of the ternary layers were determined by Raman spectroscopy. Based on UPS studies, the energy diagram of the potential devices

• observed in our study. Atomic force microscopy Surface examinations of the sample mixtures were performed. Figure 7 illustrates the surface morphology in a two-dimensional format. Three-dimensional images of the surface are in Supporting Information File 1, Figure S1. The roughness profile parameters for

Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

• Mustafa Kangül,
• Navid Asmari,
• Santiago H. Andany,
• Marcos Penedo and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

• Mustafa Kangul Navid Asmari Santiago H. Andany Marcos Penedo Georg E. Fantner Laboratory for Bio- and Nano-Instrumentation, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne CH-1015, Switzerland 10.3762/bjnano.15.13 Abstract Dynamic atomic force microscopy (AFM) modes that operate

• rate and therefore enables higher scan rates while refining the mechanical property mapping. Keywords: atomic force microscopy (AFM); feedback control; off-resonance tapping (ORT); pulsed-force mode; Introduction Constant force mode, a widely used AFM imaging mode, utilizes a feedback controller that