Characterization of ion track-etched conical nanopores in thermal and PECVD SiO₂ using small angle X-ray scattering

• Shankar Dutt,
• Rudradeep Chakraborty,
• Christian Notthoff,
• Pablo Mota-Santiago,
• Christina Trautmann and
• Patrick Kluth

Beilstein J. Nanotechnol. 2025, 16, 899–909, doi:10.3762/bjnano.16.68

• nanopores in thermal and plasma-enhanced chemical vapor-deposited (PECVD) SiO2 using synchrotron-based small-angle X-ray scattering (SAXS). The nanopores were fabricated by irradiating the samples with 89 MeV, 185 MeV, and 1.6 GeV Au ions, followed by hydrofluoric acid etching. We present a new approach for

• nanopores in different materials, which is essential for optimizing membrane performance in applications that require precise pore geometry. Keywords: etched ion tracks; SiO2; small angle X-ray scattering (SAXS); swift heavy ion irradiation; track-etched nanopores; Introduction Solid-state nanopores have

• , including selectivity, throughput, and molecular capture. Small-angle X-ray scattering (SAXS) has proven to be an invaluable tool for characterizing nanopore membranes, offering nondestructive analytical capabilities that yield statistical information of more than 106 pores [6][13][29][40]. With a beam size

Heat-induced transformation of nickel-coated polycrystalline diamond film studied in situ by XPS and NEXAFS

• Olga V. Sedelnikova,
• Yuliya V. Fedoseeva,
• Dmitriy V. Gorodetskiy,
• Yuri N. Palyanov,
• Elena V. Shlyakhova,
• Eugene A. Maksimovskiy,
• Anna A. Makarova,
• Lyubov G. Bulusheva and
• Aleksandr V. Okotrub

Beilstein J. Nanotechnol. 2025, 16, 887–898, doi:10.3762/bjnano.16.67

• thin nickel film deposited by thermal evaporation. The graphitization of diamond with and without a nickel coating as a result of high-vacuum annealing at a temperature of about 1100 °C was studied in situ using synchrotron-based X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption

• . Keywords: graphitization; near-edge X-ray absorption fine structure spectroscopy; nickel coating; polycrystalline diamond film; single-crystal diamond; X-ray photoelectron spectroscopy; Introduction Diamond and graphite, both composed entirely of carbon atoms, exhibit vastly different properties due to

• requires a detailed study. HRTEM has proven very useful for investigating the graphite–diamond interface [19][24]. However, it provides information about local morphology and ordering of diamond surface and graphite layers. X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine

Ar⁺ implantation-induced tailoring of RF-sputtered ZnO films: structural, morphological, and optical properties

• Manu Bura,
• Divya Gupta,
• Arun Kumar and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 872–886, doi:10.3762/bjnano.16.66

• in grazing incidence angle X-ray diffraction patterns. Atomic force microscopy images show grain size reduction and a fall in the surface roughness value of films after implantation. The implantation-induced structural modifications are further correlated with the variation in diffuse reflectance

• crystalline structure is studied using a Bruker AXS D8 Advance X-ray diffractometer operating in grazing incidence geometry using Cu Kα radiation (λ = 1.5406 Å). The scans are obtained at an incidence angle of 0.5°. The Raman spectra of ZnO films before and after implantation are recorded at room temperature

• studied using field-emission scanning electron microscopy (FESEM) along with energy dispersive X-ray spectroscopy (EDS). Cross-sectional images are also obtained to evaluate the thickness of ZnO film. The optical properties of pristine and implanted ZnO films are investigated using a Shimadzu UV–visible

Insights into the electronic and atomic structures of cerium oxide-based ultrathin films and nanostructures using high-brilliance light sources

• Paola Luches and
• Federico Boscherini

Beilstein J. Nanotechnol. 2025, 16, 860–871, doi:10.3762/bjnano.16.65

• light sources, such as synchrotrons and free-electron lasers, allow researchers to probe the structural, electronic, and dynamic properties of functional materials at an unprecedented level of detail. Techniques like X-ray photoelectron spectroscopy and X-ray absorption spectroscopy, can reveal atomic

• applications, examining the application of high-brilliance light sources on model systems such as supported thin films and epitaxial nanostructures. We review selected studies exploiting the high energy resolution and sensitivity of synchrotron radiation-based X-ray photoelectron spectroscopy and X-ray

• perspectives offered by the ultrahigh brilliance and ultrashort free-electron laser pulses for dynamic studies of the processes that take place upon photoexcitation are discussed. Keywords: cerium oxide; free-electron lasers; thin films; X-ray absorption spectroscopy; X-ray photoelectron spectroscopy

Synchrotron X-ray photoelectron spectroscopy study of sodium adsorption on vertically arranged MoS₂ layers coated with pyrolytic carbon

• Alexander V. Okotrub,
• Anastasiya D. Fedorenko,
• Anna A. Makarova,
• Veronica S. Sulyaeva,
• Yuliya V. Fedoseeva and
• Lyubov G. Bulusheva

Beilstein J. Nanotechnol. 2025, 16, 847–859, doi:10.3762/bjnano.16.64

• . In this work, to reveal the effect of carbon coating on the interaction of sodium with the MoS2 layers located vertically relative to the substrate, model experiments were carried out using synchrotron-radiation-induced X-ray photoelectron spectroscopy (XPS). Sodium vapor obtained by heating a sodium

• surface correspond to Pt nanoparticles, the presence of which is confirmed by energy-dispersive X-ray (EDX) spectroscopy (Supporting Information File 1, Figure S1). These nanoparticles have a uniform size and are densely distributed on the sample surface, in contrast to the polysulfide particles of

Facile one-step radio frequency magnetron sputtering of Ni/NiO on stainless steel for an efficient electrode for hydrogen evolution reaction

• Ha Huu Do,
• Khac Binh Nguyen,
• Phuong N. Nguyen and
• Hoai Phuong Pham

Beilstein J. Nanotechnol. 2025, 16, 837–846, doi:10.3762/bjnano.16.63

• potential regarding industrial application. Results and Discussion Crystal structure and phase of the as-synthesized electrodes were verified by X-ray diffraction (XRD) measurements with 2θ ranging from 20° to 80°. Figure 1 displays the XRD patterns of SS, Ni/NiO/SS-5, Ni/NiO/SS-10, Ni/NiO/SS-15, and Ni/NiO

• is increased, determined by energy-dispersive X-ray spectroscopy (EDX), as shown in Table 1. Ni/NiO/SS-5 displayed the lowest O content (4.69 wt %). In contrast, Ni/NiO/SS-20 showed the highest O content (22.69 wt %), attributed to the highest O2 flow rate in the sputtering process. Ni/NiO/SS-10

• distribution of the primary elements (Ni, O) in the Ni/NiO/SS-10 sample. This outcome revealed that catalytic sites were also uniformly distributed on the electrode’s surface. Figure 5a exhibits the X-ray photoelectron spectroscopy (XPS) survey of the Ni/NiO/SS-10 sample. It can be seen that Ni/NiO/SS gives Ni

Synthesis and magnetic transitions of rare-earth-free Fe–Mn–Ni–Si-based compositionally complex alloys at bulk and nanoscale

• Shabbir Tahir,
• Tatiana Smoliarova,
• Carlos Doñate-Buendía,
• Michael Farle,
• Natalia Shkodich and
• Bilal Gökce

Beilstein J. Nanotechnol. 2025, 16, 823–836, doi:10.3762/bjnano.16.62

• ground, polished, and analyzed by SEM (JEOL JSM-7600 F, Japan). The chemical composition was determined using energy-dispersive X-ray spectroscopy (EDX) with an Oxford Inca spectrometer. The crystal structure of bulk CCAs was characterized by X-ray diffraction (XRD) using a DRON-4–07 diffractometer with

• chamber. (a, c) SEM (SE) and EDX elemental maps of Mn, Fe, Ni, Ge, and Si obtained for bulk the Ge-based CCA and Mn, Fe, Ni, Al, and Si, obtained for bulk Ge-based CCA. (b, d) X-ray diffraction (XRD) patterns of the bulk Ge-based CCA and the bulk Al-based CCA, showing the presence of side phases. Particle

Supramolecular hydration structure of graphene-based hydrogels: density functional theory, green chemistry and interface application

• Hon Nhien Le,
• Duy Khanh Nguyen,
• Minh Triet Dang,
• Huyen Trinh Nguyen,
• Thi Bang Tam Dao,
• Trung Do Nguyen,
• Chi Nhan Ha Thuc and
• Van Hieu Le

Beilstein J. Nanotechnol. 2025, 16, 806–822, doi:10.3762/bjnano.16.61

• GO-SG-ZH powder. The graphene-based nanocomposites in hydrogel form and in powder form were comparatively characterized using moisture analysis, scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), and aqueous dispersibility. Brush coating of graphene oxide–nanosilica–zinc

• microscopy and energy-dispersive X-ray spectroscopy were performed using a JSM-IT200 system (JEOL). Samples were coated with Pt before the SEM-EDS analysis. X-ray diffraction was performed on a D8 Advance instrument (Bruker). Fourier-transform infrared spectroscopy (FTIR) was characterized with a FT/IR-6600

Morphology and properties of pyrite nanoparticles obtained by pulsed laser ablation in liquid and thin films for photodetection

• Akshana Parameswaran Sreekala,
• Bindu Krishnan,
• Rene Fabian Cienfuegos Pelaes,
• David Avellaneda Avellaneda,
• Josué Amílcar Aguilar-Martínez and
• Sadasivan Shaji

Beilstein J. Nanotechnol. 2025, 16, 785–805, doi:10.3762/bjnano.16.60

• microscopy, scanning electron microscopy, X-ray photoelectron spectroscopy, and ultraviolet–visible spectroscopy. The morphology of the NPs in different solvents varied from spherical, rice-like to rod-like particles which demonstrates the effect of the solvent on the morphology/composition of NPs

• crystalline structure of the films was characterized by X-ray diffraction (XRD). The UV–vis–NIR photodetection properties of p-n junction-based thin films composed of FeS2 nanoparticles are reported. Additionally, the results of various light-sensing parameters evaluated in these photodetectors are also

• SEM analysis of pyrite thin films was performed using a Hitachi Model SU 8020. The NPs were deposited on carbon-coated copper grids for TEM analysis and on silicon substrates for SEM analysis. Using monochromatic Al Kα radiation with an energy of 1486.68 eV, X-ray photoelectron spectroscopy (XPS

Changes of structural, magnetic and spectroscopic properties of microencapsulated iron sucrose nanoparticles in saline

• Sabina Lewińska,
• Pavlo Aleshkevych,
• Roman Minikayev,
• Anna Bajorek,
• Mateusz Dulski,
• Krystian Prusik,
• Tomasz Wojciechowski and
• Anna Ślawska-Waniewska

Beilstein J. Nanotechnol. 2025, 16, 762–784, doi:10.3762/bjnano.16.59

• AC) performed on the undissolved sample revealed the presence of a low temperature blocking process ( ≈ 10 K), and confirmed its superparamagnetic state between 70– 250 K. X-ray photoelectron spectroscopy and Raman studies showed a varied composition of the undissolved sample in which organic

• discrepancies are mainly a consequence of difficulties with analysis of structural and morphological measurement results (e.g., signal obtained in X-ray diffraction (XRD) experiments is dominated by the carbohydrate). This results in very broad, hard to interpret, or even uninterpretable lines (see XRD patterns

• , the question of the iron phase present in the FS0 sample appears to be unresolved based on the TEM results; however, the presence of the iron oxyhydroxide is highly probable. The energy-dispersive X-ray spectroscopy (EDS) spectrum (Figure 3f) of the FS0 sample collected from the area visible in Figure

Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study

• Shafaq Kazim,
• Rahul Parmar,
• Maryam Azizinia,
• Matteo Amati,
• Muhammad Rauf,
• Andrea Di Cicco,
• Seyed Javid Rezvani,
• Dario Mastrippolito,
• Luca Ottaviano,
• Tomasz Klimczuk,
• Luca Gregoratti and
• Roberto Gunnella

Beilstein J. Nanotechnol. 2025, 16, 749–761, doi:10.3762/bjnano.16.58

• effect) [19][20][21]. A well-known and suitable technique to investigate the electronic structure of surfaces is X-ray photoemission spectro-microscopy [22][6]; in order to obtain the necessary spatial resolution, the beam size must be reduced to tens of nanometers. The Electron Spectroscopy for Chemical

• silicon oxide substrate would help the determination of flakes thickness, we used also a more conductive substrate to measure photoemission under X-ray irradiation, that is, 1 nm thick native oxide Si substrates. Another convenient substrate for SPEM was 190 nm thick indium-doped tin oxide on glass

Nanostructured materials characterized by scanning photoelectron spectromicroscopy

• Matteo Amati,
• Alexey S. Shkvarin,
• Alexander I. Merentsov,
• Alexander N. Titov,
• María Taeño,
• David Maestre,
• Sarah R. McKibbin,
• Zygmunt Milosz,
• Ana Cremades,
• Rainer Timm and
• Luca Gregoratti

Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54

• , environmental reliability, and operando capabilities. Scanning photoelectron spectromicroscopy (SPEM) is one of the characterization tools that combine high spectral resolution X-ray photoelectron spectroscopy with submicron spatial resolution. In particular, the SPEM equipment hosted at the ESCA microscopy

• enhanced sensitivities are examples of capabilities that modern techniques of characterization in nanotechnology must possess. X-ray photoelectron spectroscopy (XPS) is still one of the fundamental tools for chemical and electronic characterization of surfaces and subsurface layers. In the last three to

• several improvements have been developed at synchrotron light facilities where unique properties of X-ray radiation can be found. Scanning photoelectron microscopy (SPEM) combines XPS analysis with lateral resolution; chemical imaging as well as XPS spectroscopy at nanoscale sized areas can be performed

High-temperature epitaxial growth of tantalum nitride thin films on MgO: structural evolution and potential for SQUID applications

• Michelle Cedillo Rosillo,
• Oscar Contreras López,
• Jesús Antonio Díaz,
• Agustín Conde Gallardo and
• Harvi A. Castillo Cuero

Beilstein J. Nanotechnol. 2025, 16, 690–699, doi:10.3762/bjnano.16.53

• using pulsed laser deposition (PLD). This research investigates the influence of varying deposition parameters, including substrate temperature and ambient gas composition, on the structural, morphological, and superconducting properties of the films. X-ray photoelectron spectroscopy, X-ray diffraction

• dynamics and superconducting characteristics of the films. X-ray diffraction (XRD) analysis revealed that the TaN thin films exhibited excellent crystallinity, with sharp diffraction peaks indicating well-defined structural phases. The deposition process was optimized by systematically adjusting substrate

• nitrogen pressure between 10 and 90 mTorr. The experiment was performed in a laser ablation system “RIBER LDM 32”. It consists of three stainless steel ultrahigh-vacuum (UHV) chambers for sample introduction, PLD deposition, and X-ray photoelectron spectroscopy (XPS) analysis, isolated by UHV gate valves

Colloidal few layered graphene–tannic acid preserves the biocompatibility of periodontal ligament cells

• Teissir Ben Ammar,
• Naji Kharouf,
• Dominique Vautier,
• Housseinou Ba,
• Nivedita Sudheer,
• Philippe Lavalle and
• Vincent Ball

Beilstein J. Nanotechnol. 2025, 16, 664–677, doi:10.3762/bjnano.16.51

• to the FLG–TA colloid were analyzed using X-ray photoelectron spectroscopy (XPS), and the antioxidant properties of FLG–TA were evaluated using the DPPH free radical scavenging assay. XPS analysis (Figure 2 and Table S1, Supporting Information File 1) shows a significant increase in the O-to-C ratio

Aprepitant-loaded solid lipid nanoparticles: a novel approach to enhance oral bioavailability

• Mazhar Hussain,
• Muhammad Farooq,
• Muhammad Asad Saeed,
• Muhammad Ijaz,
• Sherjeel Adnan,
• Zeeshan Masood,
• Muhammad Waqas,
• Wafa Ishaq and
• Nabeela Ameer

Beilstein J. Nanotechnol. 2025, 16, 652–663, doi:10.3762/bjnano.16.50

• microscopy (SEM), X-ray diffraction (XRD), differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA), in vitro drug release in 0.1 M HCl (pH 1.2) and phosphate-buffered saline (PBS, pH 7.4), and pharmacokinetic studies. The optimal formulation (APT-CD-NP4) containing the highest

• , and zeta potential measurements. Also Fourier-transform infrared (FTIR) spectroscopy, X-ray diffraction (XRD), solubility, in vitro dissolution, and in vivo and stability studies were carried out. Result and Discussion Physicochemical evaluation The solubility of APT in the SLNs was 24-fold higher

• polymers [19]. X-ray diffraction studies APT, β-CD, poloxamer 407, APT-CD-NP4, and APT-PX-NP8 were evaluated using X-ray diffraction. APT exhibited sharp and intense peaks at diffraction angles (2θ) of 8.98°, 10.64°, 12.47°, 14.67°, 15.42°, 17.13°, 18.89°, 19.48°, 20.81°, 22.78°, and 27.10° (Figure 4b

Retrieval of B1 phase from high-pressure B2 phase for CdO nanoparticles by electronic excitations in Cd_xZn_1−xO composite thin films

• Arkaprava Das,
• Marcin Zając and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2025, 16, 551–560, doi:10.3762/bjnano.16.43

• pressure exerted by the Zn2SiO4 phase on CdO nanoparticles during oxygen ion irradiation leads to the coexistence of both B1 and B2 phases. X-ray absorption near-edge spectra (XANES) reveal minimal changes in the intensity of the spike-like Zn L3,2 pre-edge feature associated with the Zn2SiO4 phase under

• oxygen ion irradiation, while it entirely disappears with silver ion irradiation, confirming the amorphization of the Zn2SiO4 phase. Complementary observations from X-ray photoelectron spectroscopy (XPS), specifically O 1s and Si 2p peaks in XPS spectra, support these findings. Additionally, the track

• diverse characterization techniques, demonstrating the potential reversibility of the B1 to B2 phase transformation induced by ion irradiation. Keywords: irradiation; phase transformation; thermal spike; track diameter; X-ray absorption near edge spectroscopy; X-ray photoelectron spectroscopy

Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

• Chinmai Sai Jureddy,
• Krzysztof Maćkosz,
• Aleksandra Butrymowicz-Kubiak,
• Iwona B. Szymańska,
• Patrik Hoffmann and
• Ivo Utke

Beilstein J. Nanotechnol. 2025, 16, 530–539, doi:10.3762/bjnano.16.41

• effective dwell time with a 600 nm FWHM of the electron beam), and 2000 cycles. For deposit morphology observation, a high-resolution Hitachi S4800 FESEM was used. The chemical composition of the deposits was confirmed through energy-dispersive X-ray spectroscopy (EDX) using a silicon drift detector from

• of the thin focused electron beam (FEB) deposit containing Pd, C, and O without substrate interference (native silicon oxide and silicon), the SAMx Stratagem thin film correction software, based on the work by Pouchou and Pichoir [43] was employed. Stratagem needs k-ratios (i.e., the ratio of X-ray

Zeolite materials with Ni and Co: synthesis and catalytic potential in the selective hydrogenation of citral

• Inocente Rodríguez-Iznaga,
• Yailen Costa Marrero,
• Tania Farias Piñeira,
• Céline Fontaine,
• Lexane Paget,
• Beatriz Concepción Rosabal,
• Arbelio Penton Madrigal,
• Vitalii Petranovskii and
• Gwendoline Lafaye

Beilstein J. Nanotechnol. 2025, 16, 520–529, doi:10.3762/bjnano.16.40

• being mixed. After 24 h, the solid phases were separated, lightly washed with distilled water, and oven-dried at 110 °C. Characterization The elemental composition of ZSA and the modified materials from both treatments was determined using X-ray fluorescence analysis, performed with a ZETIUM PANalytical

• nitrogen adsorption at 77 K. The initial natural zeolite samples were also examined via powder X-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD patterns were recorded using a PW 1218 diffractometer (Philips, Almelo, Netherlands) equipped with a curved graphite monochromator and Cu Kα

• Andrés deposit. Some HEU crystals are indicated by a, b, and c, where a and b exhibit tabular characteristics while c has slat morphology. Mordenite crystals, marked by d, e, and f, show acicular to fibrous shapes. Elemental composition determined by X-ray fluorescence of the materials obtained by IE and

N₂⁺-implantation-induced tailoring of structural, morphological, optical, and electrical characteristics of sputtered molybdenum thin films

• Usha Rani,
• Kafi Devi,
• Divya Gupta and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 495–509, doi:10.3762/bjnano.16.38

• the same nominal film thickness after implantation. Keywords: atomic force microscopy; grazing angle X-ray diffractometer; Keithley parametric analyzer; Mo thin films; RF sputtering; spectroscopic ellipsometry; Introduction Molybdenum thin films have garnered significant attention in diverse

• thicknesses were implanted with 1 × 1017 N2+·cm−2 at 30 keV using a current density of 4 µA·cm−2. The structural properties of the deposited Mo thin films were investigated using a GXRD Bruker AXS GmbH D8 Advance X-ray diffractometer in grazing incidence geometry, employing Cu Kα radiation with a wavelength

• of 1.5405 Å. Measurements were conducted with a fixed incident angle of 0.5°, and the X-ray tube was operated at 40 kV and 40 mA. The surface morphology was analyzed using a Bruker Multimode-8 atomic force microscopy (AFM). The optical characteristics of the molybdenum thin films were analyzed using

Quantification of lead through rod-shaped silver-doped zinc oxide nanoparticles using an electrochemical approach

• Ravinder Lamba,
• Gaurav Bhanjana,
• Neeraj Dilbaghi,
• Vivek Gupta and
• Sandeep Kumar

Beilstein J. Nanotechnol. 2025, 16, 422–434, doi:10.3762/bjnano.16.33

• sensitivity among all. Results and Discussion X-ray diffraction of as-synthesized Ag@ZnO nanorods The Ag@ZnO NRs were analyzed for their crystal phases by evaluating the X-ray diffraction pattern. Figure 1a displays the diffraction pattern of the Ag@ZnO NRs that were formed. It was observed that this pattern

• expressed as is 0.001275. The total broadening of the peak (βT) caused by the crystalline size and strain in the lattice is given by: where βD is broadening of the peak due to crystal size and βε is broadening due to lattice strain. For analyzing stress and strain resulting from X-ray diffraction

• with XRD results of secondary phase formations [22][23][24]. X-ray photoelectron spectroscopy study of Ag@ZnO nanorods The physical state and chemical compositions of Ag@ZnO NRs were analyzed using X-ray photoelectron spectroscopy (XPS). Figure 7a represents the scan results of the binding energy. The

Size control of nanoparticles synthesized by pulsed laser ablation in liquids using donut-shaped beams

• Abdel Rahman Altakroury,
• Oleksandr Gatsa,
• Farbod Riahi,
• Zongwen Fu,
• Miroslava Flimelová,
• Andrei Samokhvalov,
• Stephan Barcikowski,
• Carlos Doñate-Buendía,
• Alexander V. Bulgakov and
• Bilal Gökce

Beilstein J. Nanotechnol. 2025, 16, 407–417, doi:10.3762/bjnano.16.31

• crystal structure of the HEA NPs was determined by X-ray diffraction (XRD) using a Smartlab diffractometer (Rigaku, Japan). SEM was used to characterize the nanoparticle size distribution and to determine the beam shape influence while maintaining comparable PLAL parameters for both beams to minimize the

Engineered PEG–PCL nanoparticles enable sensitive and selective detection of sodium dodecyl sulfate: a qualitative and quantitative analysis

• Soni Prajapati and
• Ranjana Singh

Beilstein J. Nanotechnol. 2025, 16, 385–396, doi:10.3762/bjnano.16.29

• size. The imaging was performed using TEM at 120 kV (Jeol JEM1400, Germany). The surface elements and their composition in the nanoparticle were analyzed using X-ray photoelectron spectroscopy (PHI 5000 Versa Probe II, FEI Inc) regarding their binding energy. The fixed transmission mode was utilized

• larger estimate than the dry measurements obtained from TEM and SEM [32]. X-ray photoelectron spectroscopy, also known as electron spectroscopy for chemical analysis (ESCA), was used to analyze the surface chemistry of the PEG–PCL NPs. XPS is a powerful surface-sensitive technique that provides detailed

Pulsed laser in liquid grafting of gold nanoparticle–carbon support composites

• Madeleine K. Wilsey,
• Teona Taseska,
• Qishen Lyu,
• Connor P. Cox and
• Astrid M. Müller

Beilstein J. Nanotechnol. 2025, 16, 349–361, doi:10.3762/bjnano.16.26

• scattering by the carbon fibers. The pulsed laser-grafted gold nanoparticles exhibited cauliflower morphology with approximately 200 nm diameter and no detectable carbonaceous shells (Figure 2B and cf. X-ray photoelectron spectroscopy (XPS) data below). Assembly of gold nanoparticles by nanosecond laser

• gold nanoparticles) spectral signatures were not observable here. Pulsed laser grafting created nonequilibrium gold nanoparticle–carbon fiber paper composites, evident from powder X-ray diffraction (XRD) data (Figure 5A). We normalized the XRD patterns to the (111) peak and found that the (200) or (311

• scanning electron microscope with a Schottky field-emission emitter was operated at 20.00 kV with a working distance of 4.9 mm. Energy-dispersive X-ray (EDX) spectroscopy data were collected using an SEM-integrated EDAX Octane elect plus spectrometer with a with silicon drift detector. Double sided carbon

Tailoring of physical properties of RF-sputtered ZnTe films: role of substrate temperature

• Kafi Devi,
• Usha Rani,
• Arun Kumar,
• Divya Gupta and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 333–348, doi:10.3762/bjnano.16.25

• °C, and 600 °C using RF sputtering. The thickness of the films has been found to decrease from 940 nm at room temperature to 200 nm at 600 °C with increasing substrate temperature. The structural investigation using grazing incidence angle X-ray diffraction revealed that films deposited at room

• ± 0.30 nm for the films deposited at room temperature, 300 °C, 400 °C, 500 °C, and 600 °C, respectively. The structural aspects of the ZnTe/Qz films were analysed using grazing incidence X-ray diffraction (GXRD) on a Bruker AXS D8 Advance with Cu Kα radiation (λ = 1.5406 Å) available at Ion Beam Centre

• energy-dispersive X-ray spectroscopy (EDS) operated at 10 keV. The current–voltage (I–V) characteristics of the films were measured in the voltage range from −1 V to 1 V using a two-probe Keithley 4200 A-SCS parametric analyser available at Ion Beam Centre, Kurukshetra University. Results and Discussion

Graphene oxide–chloroquine conjugate induces DNA damage in A549 lung cancer cells through autophagy modulation

• Braham Dutt Arya,
• Sandeep Mittal,
• Prachi Joshi,
• Alok Kumar Pandey,
• Jaime E. Ramirez-Vick,
• Govind Gupta and
• Surinder P. Singh

Beilstein J. Nanotechnol. 2025, 16, 316–332, doi:10.3762/bjnano.16.24

• , the decrease in ID/IG corroborates with the bathochromic shift of the π–π* electronic transition in GO–Chl due to the preservation of a sp2 carbon framework. Furthermore, the chemical states/structures of GO, Chl, and GO–Chl were investigated through X-ray photoelectron spectroscopy. Figure 2a–c

• created by the authors using Avogadro: an open-source molecular builder and visualization tool. Version 1.0.2n http://avogadro.cc/) [40]. X-ray photoelectron spectroscopy analysis. C 1s core level spectra for GO (a), Chl (b), and GO–Chl (c), respectively. Experimental (black line), fitted data (red line