Graphene oxide–chloroquine conjugate induces DNA damage in A549 lung cancer cells through autophagy modulation

• Braham Dutt Arya,
• Sandeep Mittal,
• Prachi Joshi,
• Alok Kumar Pandey,
• Jaime E. Ramirez-Vick,
• Govind Gupta and
• Surinder P. Singh

Beilstein J. Nanotechnol. 2025, 16, 316–332, doi:10.3762/bjnano.16.24

• -resolution transmission electron microscope (Technai G2 F30 STWIN, Japan), field emission scanning electron microscope (FEI, Quanta FEG 450, USA), and atomic force microscope (Nanoscope, Veeco V, USA) [28][29][30]. Cell culture A549 cells from the American Type Culture Collection (ATCC, Manassas, VA, USA

Strain-induced bandgap engineering in 2D ψ-graphene materials: a first-principles study

• Kamal Kumar,
• Nora H. de Leeuw,
• Jost Adam and
• Abhishek Kumar Mishra

Beilstein J. Nanotechnol. 2024, 15, 1440–1452, doi:10.3762/bjnano.15.116

• graphene to a piezoelectric substrate, by shrinking or elongating the substrate by applying a bias voltage, or by using the tip of an atomic force microscope (AFM) to push graphene over a hole created in the substrate [29]. A wealth of literature on strain engineering of graphene and other 2D materials

Signal generation in dynamic interferometric displacement detection

• Knarik Khachatryan,
• Simon Anter,
• Michael Reichling and
• Alexander von Schmidsfeld

Beilstein J. Nanotechnol. 2024, 15, 1070–1076, doi:10.3762/bjnano.15.87

• . In a non-contact atomic force microscope (NC-AFM), it facilitates the force measurement by recording the periodic displacement of an oscillating microcantilever. To understand signal generation in a NC-AFM-based Michelson-type interferometer, we evaluate the non-linear response of the interferometer

Elastic modulus of β-Ga₂O₃ nanowires measured by resonance and three-point bending techniques

• Annamarija Trausa,
• Sven Oras,
• Sergei Vlassov,
• Mikk Antsov,
• Tauno Tiirats,
• Andreas Kyritsakis,
• Boris Polyakov and
• Edgars Butanovs

Beilstein J. Nanotechnol. 2024, 15, 704–712, doi:10.3762/bjnano.15.58

• for studying the mechanical properties of NWs, such as nanoindentation [15], three-point bending tests using an atomic force microscope (AFM) [16], and in-situ scanning electron microscope (SEM) resonance [17]. However, challenges of obtaining consistent and comparable elastic modulus values across

Gold nanomakura: nanoarchitectonics and their photothermal response in association with carrageenan hydrogels

• Nabojit Das,
• Vikas,
• Akash Kumar,
• Sanjeev Soni and
• Raja Gopal Rayavarapu

Beilstein J. Nanotechnol. 2024, 15, 678–693, doi:10.3762/bjnano.15.56

• instrument was run for the zeta potential measurement. The actual size, morphology, and aspect ratio calculation of the synthesized nanoparticles were observed under a transmission electron microscope (120 kV, Tecnai, FEI, The Netherlands) at multiple regions. An atomic force microscope (Witec Alpha 300RA

Unveiling the nature of atomic defects in graphene on a metal surface

• Karl Rothe,
• Nicolas Néel and
• Jörg Kröger

Beilstein J. Nanotechnol. 2024, 15, 416–425, doi:10.3762/bjnano.15.37

• smallest defects appear as a depression without discernible interior structure suggesting the presence of vacancy sites in the graphene lattice. With an atomic force microscope, however, only one kind can be identified as a vacancy defect with four missing carbon atoms, while the other kind reveals an

• ) topographies have been claimed to be in accordance with, for example, single-C vacancy sites. However, clear-cut evidence for a missing C atom in the graphene lattice has remained elusive. Therefore, in addition to an STM, an atomic force microscope (AFM) has been used in the present study to unveil the

Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications

• August K. Roos,
• Ermes Scarano,
• Elisabet K. Arvidsson,
• Erik Holmgren and
• David B. Haviland

Beilstein J. Nanotechnol. 2024, 15, 242–255, doi:10.3762/bjnano.15.23

• , gravitational waves acting on a 40 kg mirror in LIGO [3], or atomic-scale tip–surface forces acting on a 40 pg cantilever in an atomic force microscope (AFM). For AFM cantilevers operating at room temperature close to their fundamental resonant frequency in the kilohertz-to-megahertz range, optical

CdSe/ZnS quantum dots as a booster in the active layer of distributed ternary organic photovoltaics

• Gabriela Lewińska,
• Piotr Jeleń,
• Zofia Kucia,
• Maciej Sitarz,
• Łukasz Walczak,
• Bartłomiej Szafraniak,
• Jerzy Sanetra and
• Konstanty W. Marszalek

Beilstein J. Nanotechnol. 2024, 15, 144–156, doi:10.3762/bjnano.15.14

• carried out for three incidence angles (65°, 70°, and 75°). A Bruker atomic force microscope (AFM) MULTIMODE 8 was used in the measurements in the ScanAsyst in Air mode, using silicon nitride probes (with a nominal tip radius of 2 nm and a spring constant equal to 0.4 N/m). The substrate was

Dual-heterodyne Kelvin probe force microscopy

• Benjamin Grévin,
• Fatima Husainy,
• Dmitry Aldakov and
• Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

• time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force microscope. The modulus and phase coefficients are probed by exploiting a double heterodyne frequency mixing effect between the mechanical oscillation of the cantilever, modulated

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• ® and UHMWPE [9][10][11][12][13]. Here we extend this technique to Technora® by notching individual fibers (Figure 1b), gently opening them along shear planes to expose internal surfaces, and then scanning across those surfaces using an atomic force microscope (AFM) (Figure 1c). AFM scans yield internal

• investigated the processing and properties of high-performance terpolymer fibers, much remains to be understood about the internal nano- and microstructures of these fibers, and how these morphologies relate to fiber properties. Here we use a focused ion beam notch technique and multifrequency atomic force

• microscope mapping to characterize the internal structure and local mechanical properties within Technora® fibers. We find a highly fibrillated structure that appears to connect with both the fiber’s molecular chemistry and full-fiber mechanical properties. In addition, through detailed comparisons with

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

• Mattia da Lisca,
• José Alvarez,
• James P. Connolly,
• Nicolas Vaissiere,
• Karim Mekhazni,
• Jean Decobert and
• Jean-Paul Kleider

Beilstein J. Nanotechnol. 2023, 14, 725–737, doi:10.3762/bjnano.14.59

• of the atomic force microscope (AFM) for the evaluation of the surface potential with nanometric resolution. KPFM is a valuable investigative approach for the study of work functions via the measurement of the contact potential difference VCPD, that is, the difference between the electrostatic

A graphene quantum dots–glassy carbon electrode-based electrochemical sensor for monitoring malathion

• Sanju Tanwar,
• Aditi Sharma and
• Dhirendra Mathur

Beilstein J. Nanotechnol. 2023, 14, 701–710, doi:10.3762/bjnano.14.56

• obtained from a Bruker AFM analyzer atomic force microscope and a FEI Tecnai G2 20 S-TWIN transmission electron microscope. Electrochemical measurements GQDs/GCE, Ag/AgCl, and a platinum wire were used as working, reference, and counter electrode, respectively, in all electrochemical experiments, conducted

SERS performance of GaN/Ag substrates fabricated by Ag coating of GaN platforms

• Magdalena A. Zając,
• Bogusław Budner,
• Malwina Liszewska,
• Bartosz Bartosewicz,
• Łukasz Gutowski,
• Jan L. Weyher and
• Bartłomiej J. Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 552–564, doi:10.3762/bjnano.14.46

• atomic force microscope (AFM) (NT-MDT, Moscow, Russia) in non-contact mode using the approach described previously [37]. The silver layers were removed randomly on the sample to form a sharp edge for measurement of height (layer thickness). AFM measurements were carried out in three different areas on

Molecular nanoarchitectonics: unification of nanotechnology and molecular/materials science

• Katsuhiko Ariga

Beilstein J. Nanotechnol. 2023, 14, 434–453, doi:10.3762/bjnano.14.35

• oligomeric chains were significantly elongated. High-resolution scanning tunneling microscope (STM) topography shows alternating bright twin spots, which correspond to phenylene and tetrafluorophenylene, respectively. A high-resolution atomic force microscope (AFM) image of an entirely elongated fine

Characterisation of a micrometer-scale active plasmonic element by means of complementary computational and experimental methods

• Ciarán Barron,
• Giulia Di Fazio,
• Samuel Kenny,
• Silas O’Toole,
• Robin O’Reilly and
• Dominic Zerulla

Beilstein J. Nanotechnol. 2023, 14, 110–122, doi:10.3762/bjnano.14.12

• optical and thermal data are used to inform detailed finite element method simulations for verification and to predict system responses allowing for enhanced design choices to maximise modulation depth and localisation. Keywords: active plasmonics; atomic force microscope; scanning Joule expansion

Gap-directed chemical lift-off lithographic nanoarchitectonics for arbitrary sub-micrometer patterning

• Chang-Ming Wang,
• Hong-Sheng Chan,
• Chia-Li Liao,
• Che-Wei Chang and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2023, 14, 34–44, doi:10.3762/bjnano.14.4

• ) Schematic illustration of the post lift-off wet etching process. (B) Bright field optical microscope and atomic force microscope topography images (inset) of Au structures fabricated by gap-directed CLL using collapse-free (left) and self-collapsing (middle and right) stamps rendering triangular pillars

Electrical and optical enhancement of ITO/Mo bilayer thin films via laser annealing

• Abdelbaki Hacini,
• Ahmad Hadi Ali,
• Nurul Nadia Adnan and
• Nafarizal Nayan

Beilstein J. Nanotechnol. 2022, 13, 1589–1595, doi:10.3762/bjnano.13.133

• roughness of the bilayer structure were studied utilizing an atomic force microscope (AFM, Bruker Dimension Edge) and the Gwyddion software. The optical transmission was measured using an UV–vis spectrophotometer (UV-3600i Plus, SHIMADZU) in the range of λ = 300–800 nm. Finally, the electrical properties

Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy

• Nobuyuki Ishida

Beilstein J. Nanotechnol. 2022, 13, 1558–1563, doi:10.3762/bjnano.13.129

• measurement The KPFM measurements were performed at room temperature using a commercial atomic force microscope (Park Systems, NX10) placed in an Ar flow glove box (O2: <1 ppm, H2O: <1 ppm). We used Cr/Pt-coated Si cantilevers (Budget Sensors, Multi75E-G) with a nominal resonance frequency of 75 kHz and a

Induced electric conductivity in organic polymers

• Konstantin Y. Arutyunov,
• Anatoli S. Gurski,
• Vladimir V. Artemov,
• Alexander L. Vasiliev,
• Azat R. Yusupov,
• Danfis D. Karamov and
• Alexei N. Lachinov

Beilstein J. Nanotechnol. 2022, 13, 1551–1557, doi:10.3762/bjnano.13.128

• strip and the whole sandwich itself. (b) Atomic force microscope scan of a PDP film 0.1 wt % on Si substrate. The plot at the bottom illustrates the roughness of the surface along the indicated line. (c) Side view of a Pb–PDP–Pb structure on glass with solitary defect (lead shortcut) obtained by

Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• Ke Xu Yuzhe Liu School of Electrical & Control Engineering, Shenyang Jianzhu University, Shenyang 110168, China 10.3762/bjnano.13.104 Abstract As a tool that can test insulators' surface morphology and properties, the performance index of atomic force microscope (AFM) probes is the most critical

Design of a biomimetic, small-scale artificial leaf surface for the study of environmental interactions

• Miriam Anna Huth,
• Axel Huth,
• Lukas Schreiber and
• Kerstin Koch

Beilstein J. Nanotechnol. 2022, 13, 944–957, doi:10.3762/bjnano.13.83

• secondary electron detector. The working distance was 4–7 mm. Atomic force microscopy analysis of recrystallized structures The thickness of the wax coating on glass (1400 µg) was examined with an atomic force microscope (AFM, NanoWizard II, JPK instruments, Berlin, Germany). For this purpose, the

Optimizing PMMA solutions to suppress contamination in the transfer of CVD graphene for batch production

• Chun-Da Liao,
• Andrea Capasso,
• Tiago Queirós,
• Telma Domingues,
• Fatima Cerqueira,
• Nicoleta Nicoara,
• Jérôme Borme,
• Paulo Freitas and
• Pedro Alpuim

Beilstein J. Nanotechnol. 2022, 13, 796–806, doi:10.3762/bjnano.13.70

• analyzer had a pass energy of 20 eV. Atomic force microscopy The surface topographies of graphene were investigated by a Bruker Dimension Icon atomic force microscope (AFM), using PPP-NCH (NanosensorsTM) cantilevers with a tip radius smaller than 20 nm, a force constant of 42 N/m, and 250 kHz resonance

Revealing local structural properties of an atomically thin MoSe₂ surface using optical microscopy

• Lin Pan,
• Peng Miao,
• Anke Horneber,
• Alfred J. Meixner,
• Pierre-Michel Adam and
• Dai Zhang

Beilstein J. Nanotechnol. 2022, 13, 572–581, doi:10.3762/bjnano.13.49

• images of CuPc/MoSe2. The topographic images of CuPc/MoSe2 are obtained with an atomic force microscope (Multimode 8-HR, Bruker) operated in peak force tapping mode using a SCANASYST-AIR probe (silicon tip on nitride lever, Bruker). Optical properties of a triangular MoSe2 flake covered with a thin film

Relationship between corrosion and nanoscale friction on a metallic glass

• Haoran Ma and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2022, 13, 236–244, doi:10.3762/bjnano.13.18

• corrosive solution was added. For these experiments, we used an electrochemical atomic force microscope (ECAFM, Agilent 5500) and the oxidized tip (radius of ca. 30 nm) of a single-crystalline Si cantilever (PPP-CONT, NanoSensors, Germany). We adopted the beam geometry method to calibrate the force

Nanoscale friction and wear of a polymer coated with graphene

• Robin Vacher and
• Astrid S. de Wijn

Beilstein J. Nanotechnol. 2022, 13, 63–73, doi:10.3762/bjnano.13.4

• different mechanisms at play in such systems. During the last few decades, with the development of the atomic force microscope [8] and increases in computing power, it has become possible to investigate more deeply and develop an understanding of the mechanisms that play a role in the friction of graphene