Beilstein J. Nanotechnol.2025,16, 944–950, doi:10.3762/bjnano.16.72
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Keywords: atomic resolution imaging; calciumfluoridesurface; interaction force; non-contact atomic force microscopy (NC-AFM); tip change; Introduction
Non-contact atomic force microscopy (NC-AFM) [1] is a surface science tool that has been used to atomically resolve surfaces of semiconductor and
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Figure 1:
Distance-dependent contrast formation on CaF2(111) for positively and negatively terminated tips (v...