Advanced atomic force microscopy techniques V

• Philipp Rahe,
• Ilko Bald,
• Nadine Hauptmann,
• Regina Hoffmann-Vogel,
• Harry Mönig and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6

• . Khachartryan et al. highlight the strength of cantilever displacement detection with a Michelson-type fibre interferometer and provide a model for interferometric signal generation [4]. The interferometer response is slightly nonlinear under typical NC-AFM working conditions, while a large cantilever

Signal generation in dynamic interferometric displacement detection

• Knarik Khachatryan,
• Simon Anter,
• Michael Reichling and
• Alexander von Schmidsfeld

Beilstein J. Nanotechnol. 2024, 15, 1070–1076, doi:10.3762/bjnano.15.87

• . Keywords: amplitude calibration; displacement detection; force microscopy; interferometer signal; NC-AFM; Introduction Optical interferometry is a reliable technique utilizing light waves to measure distance and displacement with high precision [1][2]. With the light wavelength as the length standard, a

• curve, where the slope of IM(d) is a maximum. Such an adjustment facilitates a most sensitive displacement detection. Note, that it is not possible to adjust the interferometer to d0 with a small number m because of limitations in positioning the fiber end face parallel to the cantilever surface. Upon

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• measured using the displacement detection system was controlled by an automatic gain control (AGC) circuit to keep the cantilever vibration amplitude A constant, and the frequency shift Δf of the cantilever was measured using a phase-locked loop (PLL) circuit (SPECS GmbH: Nanonis OC4). AFM measurements

Understanding interferometry for micro-cantilever displacement detection

• Alexander von Schmidsfeld,
• Tobias Nörenberg,
• Matthias Temmen and
• Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

• Alexander von Schmidsfeld Tobias Norenberg Matthias Temmen Michael Reichling Fachbereich Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany 10.3762/bjnano.7.76 Abstract Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM

• effects; Introduction A common method for measuring the displacement of a micro-cantilever or another micro-mechanical device is interferometric displacement detection. The most basic interferometer setup is the Michelson interferometer using two mirrors for the superposition of two light beams [1][2]. A

• measurement makes the interferometer a suitable system for displacement detection in a cantilever based non-contact atomic force microscope (NC-AFM) [7]. In contrast to a classical interferometer, the setup commonly involving a fiber end and a cantilever is characterized by a significant beam divergence and a