A low-kiloelectronvolt focused ion beam strategy for processing low-thermal-conductance materials with nanoampere currents

• Annalena Wolff,
• Nico Klingner,
• William Thompson,
• Yinghong Zhou,
• Jinying Lin and
• Yin Xiao

Beilstein J. Nanotechnol. 2024, 15, 1197–1207, doi:10.3762/bjnano.15.97

• Xiamen Medical College, Fujian, China School of Medicine and Dentistry, Griffith University, Gold Coast QLD 4222, Australia 10.3762/bjnano.15.97 Abstract Ion beam-induced heat damage in thermally low conductive specimens such as biological samples is gaining increased interest within the scientific

• acceleration voltage) on inducing increases in sample temperature and potential heat damage in thermally low conductive materials such as polymers and biological samples. The ion beam-induced heat for different ion beam currents at low acceleration voltages is calculated using Fourier’s law of heat transfer

• milling speed but reduced heat damage. Keywords: biological sample; COMSOL; focused ion beam; forward time–centered space (FTCS); heat damage; SRIM; Introduction FIB-SEMs combine a scanning electron microscope (SEM) and a focused ion beam (FIB) in a single instrument and are increasingly used to prepare

Straight roads into nowhere – obvious and not-so-obvious biological models for ferrophobic surfaces

• Wilfried Konrad,
• Christoph Neinhuis and
• Anita Roth-Nebelsick

Beilstein J. Nanotechnol. 2022, 13, 1345–1360, doi:10.3762/bjnano.13.111

• tuyère’s water cooling system and to prevent heat damage to the tuyère. Since the heat conductivity of gas layers is about five orders of magnitude lower than that of copper, gas layers trapped in structured tuyère surfaces should substantially reduce the overall heat flow into the tuyère, and its outer

The patterning toolbox FIB-o-mat: Exploiting the full potential of focused helium ions for nanofabrication

• Victor Deinhart,
• Lisa-Marie Kern,
• Jan N. Kirchhof,
• Sabrina Juergensen,
• Joris Sturm,
• Enno Krauss,
• Thorsten Feichtner,
• Sviatoslav Kovalchuk,
• Michael Schneider,
• Dieter Engel,
• Bastian Pfau,
• Bert Hecht,
• Kirill I. Bolotin,
• Stephanie Reich and
• Katja Höflich

Beilstein J. Nanotechnol. 2021, 12, 304–318, doi:10.3762/bjnano.12.25

• unwanted side effects, such as carbonized edges that may change local material properties. Furthermore, locally varying sputter rates and increased minimum doses for sufficient material removal and increased heat damage may occur. All samples that are inert under oxidizing atmosphere should be cleaned in

• in Figure 7c. As in the example above, the beam path was optimized regarding reduced heat damage and redeposition. However, the gap distance was defined by a single path between the monomers. Most importantly, this resulted reliably in gap sizes between 3 and 4 nm when the gold surface was free of