Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy

• Pascal N. Rohrbeck,
• Lukas D. Cavar,
• Franjo Weber,
• Peter G. Reichel,
• Mara Niebling and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 637–651, doi:10.3762/bjnano.16.49

• nanoscale systems across materials science, biology, and nanotechnology, complementing established methods in the field. Keywords: atomic force microscopy; capacitance gradients; dielectric constant; dielectric spectroscopy; heterodyne frequency mixing; Kelvin probe force microscopy; multifrequency AFM

Advanced atomic force microscopy techniques V

• Philipp Rahe,
• Ilko Bald,
• Nadine Hauptmann,
• Regina Hoffmann-Vogel,
• Harry Mönig and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6

• . Grévin et al. further push the boundaries of the detection by implementing an open-loop variant of KPFM which accesses the spectrum of a time-periodic surface potential [5]. By exploiting a double heterodyne frequency mixing effect, they can selectively transfer each harmonic component to the second

Dual-heterodyne Kelvin probe force microscopy

• Benjamin Grévin,
• Fatima Husainy,
• Dmitry Aldakov and
• Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

• time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force microscope. The modulus and phase coefficients are probed by exploiting a double heterodyne frequency mixing effect between the mechanical oscillation of the cantilever, modulated

• AFM under ultra-high vacuum in a slightly different way. We demonstrate that the Fourier spectrum (modulus and phase coefficients) of the time-periodic electrostatic surface potential generated under optical (or electrical) pumping can be probed, by exploiting a double heterodyne frequency mixing