Recent advances in photothermal nanomaterials for ophthalmic applications

• Jiayuan Zhuang,
• Linhui Jia,
• Chenghao Li,
• Rui Yang,
• Jiapeng Wang,
• Wen-an Wang,
• Heng Zhou and
• Xiangxia Luo

Beilstein J. Nanotechnol. 2025, 16, 195–215, doi:10.3762/bjnano.16.16

• example, blood flow, oxygen saturation, oxygenated and deoxygenated hemoglobin, oxygen metabolism, and melanin concentration [187][188]. The main limitations of PAI are the slower imaging speed and the decreasing resolution as the depth of imaging is increased [189]. The use of contrast agents can improve

Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

• Mustafa Kangül,
• Navid Asmari,
• Santiago H. Andany,
• Marcos Penedo and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

• limits the topography tracking quality and hence the imaging speed. The closed-loop controller in conventional ORT restricts the sampling rate to the ORT rate and introduces a large closed-loop delay. We present an alternative ORT control method in which the closed-loop controller samples and tracks the

• imaging speed, since enough time must elapse between snap-off and subsequent contact with the sample so that the cantilever ringing diminishes. Many attempts have been made on the design of actuators and sensors to speed up ORT techniques. However, the utilized controllers still have the same core scheme

• as in the early works [6][29] where only the maximum force is sampled and fed into the feedback controller, and the full potential of ORT is not exploited. Echols-Jones et al. [30] have shown that increasing the imaging speed in ORT modes is possible by implementing a control algorithm that takes

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• labels in transmitted-light images of unlabeled biological samples. ISL can predict labels for nuclei, cell type, and cell state [116]. Image restoration and de-noising: In fluorescence microscopy, imaging speed, spatial resolution, light exposure, and imaging depth are all limited by the optics of the

• tracking. On the topic of enhancing imaging speed, we briefly mention a publication which, although it did not make use of a CNN, used machine learning to distinguish properties of AFM images. Here, the authors sought an automated way to distinguish between healthy and cancerous cells. Thus, images were

Adsorption and self-assembly of porphyrins on ultrathin CoO films on Ir(100)

• Feifei Xiang,
• Tobias Schmitt,
• Marco Raschmann and
• M. Alexander Schneider

Beilstein J. Nanotechnol. 2020, 11, 1516–1524, doi:10.3762/bjnano.11.134

• pinned. Only if molecules come close to each other or are trapped by a defect does the former dumbbell shape reappear proving that no change of the molecular structure has taken place (Figure 5b). Hence, the round appearance of the molecules is due to a rotational motion much faster than the imaging

• speed of the STM, which is in the millisecond regime. The STM images, therefore, represent time averages of the motion of the molecule. The positions where the ring is imaged brighter corresponds to positions that the molecule is more likely to be found in. Such a rotation around a central axis

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

• Santiago H. Andany,
• Gregor Hlawacek,
• Stefan Hummel,
• Charlène Brillard,
• Mustafa Kangül and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

• for the combination of AFM and HIM. While much progress has been made towards increasing the imaging speed of AFM [46][47][48][49][50], most of this progress has been limited to imaging in liquid, due to the inherent bandwidth limitation of cantilevers when using them in dynamic mode in vacuum. Recent

• signs of progress in cantilever materials have shown the potential to increase the imaging speed of AFM also in ambient air or vacuum [51][52][53]. These approaches could also be implemented for the combined AFM–HIM instrument, thereby holding promise for interactive use of AFM and HIM at similar size

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

• Nahid Hosseini,
• Matthias Neuenschwander,
• Oliver Peric,
• Santiago H. Andany,
• Jonathan D. Adams and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

• Abstract Employing polymer cantilevers has shown to outperform using their silicon or silicon nitride analogues concerning the imaging speed of atomic force microscopy (AFM) in tapping mode (intermittent contact mode with amplitude modulation) by up to one order of magnitude. However, tips of the

• any photo-processable polymer cantilever. Keywords: Atomic force microscopy (AFM); durability; imaging speed; polymer cantilever; silicon nitride tip; Introduction Atomic force microscopy (AFM) cantilevers have been developed for numerous applications since the invention of scanning probe microscopy

• a high imaging speed due to the high material bandwidth product, which mainly results from the high intrinsic damping properties of the polymer. Such cantilevers have high resonance frequencies and low Q-factors for a given size and stiffness [23]. However, SU8 tips wear down quickly and become

Nitrogen-vacancy centers in diamond for nanoscale magnetic resonance imaging applications

• Alberto Boretti,
• Lorenzo Rosa,
• Jonathan Blackledge and
• Stefania Castelletto

Beilstein J. Nanotechnol. 2019, 10, 2128–2151, doi:10.3762/bjnano.10.207

• NV centers and employed to image thin ferromagnetic films. The accuracy obtained is sub-micrometer over surfaces as wide as 100 × 100 µm2 and the imaging speed is fast enough to obtain a real-time video of the evolution of stray magnetic patterns. It is not necessary to supply a microwave signal to

Quantitative comparison of wideband low-latency phase-locked loop circuit designs for high-speed frequency modulation atomic force microscopy

• Kazuki Miyata and
• Takeshi Fukuma

Beilstein J. Nanotechnol. 2018, 9, 1844–1855, doi:10.3762/bjnano.9.176

• loop (PLL) circuit is the central component of frequency modulation atomic force microscopy (FM-AFM). However, its response speed is often insufficient, and limits the FM-AFM imaging speed. To overcome this issue, we propose a PLL design that enables high-speed FM-AFM. We discuss the main problems with

• enables atomic-scale measurements to be performed in vacuum and in liquids, its imaging speed is relatively slow (ca. 1 min/frame). High-speed amplitude modulation AFM has been developed [23] and employed to visualize the dynamic behavior of biomolecules in liquids at 10–100 ms/frame [24]. However, its

• to the dissolution at the step edge. In spite of the high imaging speed, atomic-scale contrast is clearly evident even near the step edge, demonstrating that the developed S-PLL is capable of high-speed and true atomic-resolution imaging in liquids at an imaging speed faster than 1 s/frame. Figure 9b

High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

• Juan Ren and
• Qingze Zou

Beilstein J. Nanotechnol. 2017, 8, 1563–1570, doi:10.3762/bjnano.8.158

• control mechanism applied [4][6]. Due to the time delay inevitably induced into the feedback loop for maintaining the RMS tapping amplitude during imaging, errors in tracking the sample topography can quickly result in loss of the tip–sample contact and annihilation of the probe tapping when the imaging

• speed increases [3][6]. This is because the tapping amplitude is sensitive and highly nonlinear with respect to the tip–sample distance [10][11]. The speed of TM-imaging might be increased through either hardware [12][13][14] or software (algorithms) improvement [6][8][15][16]. However, the existing

A review of demodulation techniques for amplitude-modulation atomic force microscopy

• Michael G. Ruppert,
• David M. Harcombe,
• Michael R. P. Ragazzon,
• S. O. Reza Moheimani and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2017, 8, 1407–1426, doi:10.3762/bjnano.8.142

Advanced atomic force microscopy techniques III

• Thilo Glatzel and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2016, 7, 1052–1054, doi:10.3762/bjnano.7.98

• developed an advanced microscope capable of obtaining nanoscale topography as well as mechanical properties by multifrequency AFM at high speed. They combined recent progress in increased imaging speed and photothermal actuation in a unique and versatile AFM head using ultrasmall cantilevers [18]. Single

High-frequency multimodal atomic force microscopy

• Adrian P. Nievergelt,
• Jonathan D. Adams,
• Pascal D. Odermatt and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

• has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale