Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy

• Pascal N. Rohrbeck,
• Lukas D. Cavar,
• Franjo Weber,
• Peter G. Reichel,
• Mara Niebling and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 637–651, doi:10.3762/bjnano.16.49

• ; quantitative force spectroscopy; scanning capacitance force microscopy; Introduction Technological progress in fields including electronics, energy storage, photonics, and biomedical devices would not have been possible without the development of new materials. Progress in these areas requires a detailed

Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

• Omur E. Dagdeviren and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70

• -simplification for quantitative force spectroscopy [36], inducing a systematic error in such measurements. We also established that the more k and f0 depart from the values without wire connection, the smaller Δf f0/k tends to be as k usually increases faster than f0 and that asymmetric wire connections may

Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations

• Jens Falter,
• Marvin Stiefermann,
• Gernot Langewisch,
• Philipp Schurig,
• Hendrik Hölscher,
• Harald Fuchs and
• André Schirmeisen

Beilstein J. Nanotechnol. 2014, 5, 507–516, doi:10.3762/bjnano.5.59

• error of about 50% remains, which is mainly due to angular misalignment effects during the tip wire fixation to the free prong. For more precise spring constant determination, as required for quantitative force spectroscopy experiments, individual calibration of the used tuning fork sensors after the nc