Local work function on graphene nanoribbons

• Daniel Rothhardt,
• Amina Kimouche,
• Tillmann Klamroth and
• Regina Hoffmann-Vogel

Beilstein J. Nanotechnol. 2024, 15, 1125–1131, doi:10.3762/bjnano.15.91

• surfaces, all related to charge differences; for a review, see [14]. Kelvin probe force microscopy (KPFM), a method derived from scanning force microscopy (SFM), allows one to study the local work function difference of a sample with great accuracy and with atomic resolution [15][16][17][18][19][20]. In

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

Relationship between corrosion and nanoscale friction on a metallic glass

• Haoran Ma and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2022, 13, 236–244, doi:10.3762/bjnano.13.18

• . Future studies can exploit the lateral resolution of scanning force microscopy to detect dissolution and precipitation on selected areas of interest such as different phases, grains, and inclusions [46]. Materials and Methods Zr63Ni22Ti15 (ZrNiTi) MG ribbons were produced by the single-roller melt

On the stability of microwave-fabricated SERS substrates – chemical and morphological considerations

• Limin Wang,
• Aisha Adebola Womiloju,
• Christiane Höppener,
• Ulrich S. Schubert and
• Stephanie Hoeppener

Beilstein J. Nanotechnol. 2021, 12, 541–551, doi:10.3762/bjnano.12.44

• glass capillaries or on scanning force microscopy tips) in a very economic and fast (less than five minutes) coating process. The formed substrates, which are coated with a monolayer of silver nanoparticles, have been demonstrated to be highly reproducible and to perform very well in the detection of

Scanning probe microscopy for energy-related materials

• Rüdiger Berger,
• Benjamin Grévin,
• Philippe Leclère and
• Yi Zhang

Beilstein J. Nanotechnol. 2019, 10, 132–134, doi:10.3762/bjnano.10.12

• , Shanghai, PR of China 10.3762/bjnano.10.12 Keywords: energy conversion and storage, in-operando, Scanning Probe Microscopy, Scanning Force Microscopy; In order to stimulate, bundle and strengthen the activities in the field of scanning probe microscopy for energy applications, we have organized a

• beyond the scope of solar cells. Katherine Atamanuk and co-workers impressively demonstrate that SPM methods can also be used to perform tomography [7]. They apply photoconducting scanning force microscopy for mapping the open-circuit voltage of cadmium telluride (CdTe) polycrystalline thin film solar

Noncontact atomic force microscopy III

• Mehmet Z. Baykara and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2016, 7, 946–947, doi:10.3762/bjnano.7.86

• Interface Structures and Phenomena (CRISP), Yale University, P.O. Box 208284, New Haven, CT 06520-8284, USA 10.3762/bjnano.7.86 Keywords: atomic force microscopy, scanning force microscopy; Intense interest in nanoscale science and technology has been the main driving force behind a large number of

Correlative infrared nanospectroscopic and nanomechanical imaging of block copolymer microdomains

• Benjamin Pollard and
• Markus B. Raschke

Beilstein J. Nanotechnol. 2016, 7, 605–612, doi:10.3762/bjnano.7.53

• case due to the long chain lengths. We measure the nanomechanical properties of the copolymer film using several modes of scanning force microscopy. We use intermittent contact mode under ambient conditions to map the ordering of block copolymer domains [19]. This modality, especially its phase images

A nanometric cushion for enhancing scratch and wear resistance of hard films

• Katya Gotlib-Vainshtein,
• Olga Girshevitz,
• Chaim N. Sukenik,
• David Barlam and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2014, 5, 1005–1015, doi:10.3762/bjnano.5.114

• control the scratch resistance of oxide surfaces. Titania films of several nm thickness are coated onto substrates of silicon, kapton, polycarbonate, and polydimethylsiloxane (PDMS). The scratch resistance measured by scanning force microscopy is found to be substrate dependent, diminishing in the order

Noncontact atomic force microscopy II

• Mehmet Z. Baykara and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2014, 5, 289–290, doi:10.3762/bjnano.5.31

• Interface Structures and Phenomena (CRISP), Yale University, P.O. Box 208284, New Haven, CT 06520-8284, USA 10.3762/bjnano.5.31 Keywords: atomic force microscopy, scanning force microscopy; In order to visualize the atomic structure of materials in real space, a microscope with sub-nanometer resolution is

Physics, chemistry and biology of functional nanostructures

• Paul Ziemann and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2012, 3, 843–845, doi:10.3762/bjnano.3.94

• properties. With respect to tools, immediate examples are the continuous improvements of scanning-probe measurements such as scanning tunneling or scanning force microscopy (STM, AFM) [2] and their numerous variants often combined with scanning electron microscopy (SEM) or scanning helium ion microscopy

The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

• César Moreno,
• Carmen Munuera,
• Xavier Obradors and
• Carmen Ocal

Beilstein J. Nanotechnol. 2012, 3, 722–730, doi:10.3762/bjnano.3.82

• We report on the use of scanning force microscopy as a versatile tool for the electrical characterization of nanoscale memristors fabricated on ultrathin La0.7Sr0.3MnO3 (LSMO) films. Combining conventional conductive imaging and nanoscale lithography, reversible switching between low-resistive (ON

• ] and therefore the characterization of the local electrical properties becomes more and more important. In this work we have combined conductive scanning force microscopy imaging and single-point current–voltage spectroscopy, with more advanced spectroscopy measurements (3-D modes) to characterize the

• effect, of nanoscale memristors, by a combination of contact C-SFM modes, which reveal the technique as an ideal tool for the research and development of memristive systems on a nanometre scale. Results and Discussion Resistive-switching procedure Conductive scanning force microscopy was used either to

Polymer blend lithography: A versatile method to fabricate nanopatterned self-assembled monolayers

• Cheng Huang,
• Markus Moosmann,
• Jiehong Jin,
• Tobias Heiler,
• Stefan Walheim and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2012, 3, 620–628, doi:10.3762/bjnano.3.71

• scanning force microscopy (SFM) techniques allow not only the imaging of the topography of surfaces but also the spatially resolved study of surface properties, such as the electrical, elastic, tribological and wear properties [11][12][13][14][15][16][17][18][19][20][21][22][23]. At the same time, scanning

• -force-microscopy-based lithographic techniques allow the structuring and patterning of surfaces with a lateral resolution down to the nanometer scale [24][25][26][27][28][29][30]. The advantage of techniques such as electron beam lithography or SFM-based lithography is their high lateral resolution and

Molecular-resolution imaging of pentacene on KCl(001)

• Julia L. Neff,
• Jan Götzen,
• Enhui Li,
• Michael Marz and
• Regina Hoffmann-Vogel

Beilstein J. Nanotechnol. 2012, 3, 186–191, doi:10.3762/bjnano.3.20

• National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki, Japan 10.3762/bjnano.3.20 Abstract The growth of pentacene on KCl(001) at submonolayer coverage was studied by dynamic scanning force microscopy. At coverages below one monolayer pentacene was found to arrange in islands with

• ; pentacene; scanning force microscopy; self-assembly; Introduction To understand the functionalization of surfaces with molecular building blocks, an important step is to study the self-assembly of molecules. Scanning tunneling microscopy (STM) enables such studies on conductive surfaces [1][2]. On metallic

Surface functionalization of aluminosilicate nanotubes with organic molecules

• Wei Ma,
• Weng On Yah,
• Hideyuki Otsuka and
• Atsushi Takahara

Beilstein J. Nanotechnol. 2012, 3, 82–100, doi:10.3762/bjnano.3.10

• in organic solvents, such as THF, chloroform, and toluene. As shown in Figure 13d the homogenous dispersion of PMMA-g-imogolite in THF with a concentration of 10 mg mL−1 was stable for more than two months. Morphology of PMMA grafted imogolite nanotubes was observed with scanning force microscopy

Surface induced self-organization of comb-like macromolecules

• Konstantin I. Popov,
• Vladimir V. Palyulin,
• Martin Möller,
• Alexei R. Khokhlov and
• Igor I. Potemkin

Beilstein J. Nanotechnol. 2011, 2, 569–584, doi:10.3762/bjnano.2.61

• -vinylpyridine)-block-poly(ethylene oxide) (P2VP-b-PEO) diblock copolymer by proton transfer at different degrees of neutralization. Then scanning force microscopy (SFM) and X-ray studies were applied to assess the morphology. The agreement was found to be especially good for the diameters of cylindrical domains

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

• Miriam Jaafar,
• Oscar Iglesias-Freire,
• Luis Serrano-Ramón,
• Manuel Ricardo Ibarra,
• Jose Maria de Teresa and
• Agustina Asenjo

Beilstein J. Nanotechnol. 2011, 2, 552–560, doi:10.3762/bjnano.2.59

• , Spain 10.3762/bjnano.2.59 Abstract The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials

• ; Kelvin probe force microscopy; magnetic force microscopy; magnetic nanostructures; Introduction The most valuable asset of scanning force microscopy (SFM) is its versatility for studying a variety of interactions between the tip and the sample surface [1][2][3]. The SFM techniques can be used to detect