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Cite the Following Article
Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis
Thomas Mathias, Roland Bennewitz and Philip Egberts
Beilstein J. Nanotechnol. 2025, 16, 1952–1962.
https://doi.org/10.3762/bjnano.16.136
How to Cite
Mathias, T.; Bennewitz, R.; Egberts, P. Beilstein J. Nanotechnol. 2025, 16, 1952–1962. doi:10.3762/bjnano.16.136
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