Effect of lubricants on the rotational transmission between solid-state gears

• Huang-Hsiang Lin,
• Jonathan Heinze,
• Alexander Croy,
• Rafael Gutiérrez and
• Gianaurelio Cuniberti

Beilstein J. Nanotechnol. 2022, 13, 54–62, doi:10.3762/bjnano.13.3

• situation becomes very different since a continuum description of the materials might not be sufficient. The development of the atomic force microscope (AFM) [19] and the scanning tunneling microscope (STM) [20][21] has allowed for visualization and manipulation of nanoscale gears [22]. Those gears can be

Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• advantages. Frequency modulation [35][37][38] or Q-Control [39][40] will be more effective in that case. Conclusion In this paper, we summarized the experience of using the two AFM scanning modes, namely vertical mode and dissipation mode. The measurements were carried out on a SmartSPM atomic force

• microscope manufactured by AIST-NT (currently produced by HORIBA Scientific) under the control of a modified imaging software that allows for the programming of new procedures and controls. The operation of modern AFMs is based on a digital feedback loop, which provides greater flexibility in the development

Self-assembly of Eucalyptus gunnii wax tubules and pure ß-diketone on HOPG and glass

• Miriam Anna Huth,
• Axel Huth and
• Kerstin Koch

Beilstein J. Nanotechnol. 2021, 12, 939–949, doi:10.3762/bjnano.12.70

• investigated by SEM (In-lense detector, 5 kV, WD: 7.9–9.1 mm). The procedure was repeated three times per substrate. Atomic force microscopy Real-time observations of recrystallization were performed by consecutive image recording with an atomic force microscope (NanoWizard II, JPK instruments, Berlin, Germany

Modification of a SERS-active Ag surface to promote adsorption of charged analytes: effect of Cu²⁺ ions

• Bahdan V. Ranishenka,
• Andrei Yu. Panarin,
• Irina A. Chelnokova,
• Sergei N. Terekhov,
• Peter Mojzes and
• Vadim V. Shmanai

Beilstein J. Nanotechnol. 2021, 12, 902–912, doi:10.3762/bjnano.12.67

• microscopy (SEM) images were recorded using a Zeiss LEO SUPRA 25 (Germany). Transmitting electron microscopy (TEM) images were recorded using a Zeiss LEO 906E (Germany). SEM and TEM images were treated using ImageJ 1.51k freeware. AFM images were scanned in air using a BioScopeResolve (Bruker) atomic force

• microscope in PeakForceQNM mode with recording the adhesion force maps and topographic images. SERS measurements were carried out by using a scanning probe Raman microscope “NanoFlex” (Solar LS, Belarus). The source of excitation at 488.0 nm was an argon ion laser (Melles Griot, USA). Excitation and

Impact of GaAs(100) surface preparation on EQE of AZO/Al₂O₃/p-GaAs photovoltaic structures

• Piotr Caban,
• Rafał Pietruszka,
• Jarosław Kaszewski,
• Monika Ożga,
• Bartłomiej S. Witkowski,
• Krzysztof Kopalko,
• Piotr Kuźmiuk,
• Katarzyna Gwóźdź,
• Ewa Płaczek-Popko,
• Krystyna Lawniczak-Jablonska and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 578–592, doi:10.3762/bjnano.12.48

• analyzed using a scanning electron microscope (Hitachi SU-70) with a secondary electron detector operating at 15 kV. The topography of the surface of the layers was analyzed using an atomic force microscope (Bruker Dimension Icon) working in peak-force tapping mode using a ScanAsyst algorithm. A ScanAsyst

Influence of electrospray deposition on C₆₀ molecular assemblies

• Antoine Hinaut,
• Sebastian Scherb,
• Sara Freund,
• Zhao Liu,
• Thilo Glatzel and
• Ernst Meyer

Beilstein J. Nanotechnol. 2021, 12, 552–558, doi:10.3762/bjnano.12.45

• were obtained. Room-temperature AFM Room-temperature nc-AFM measurements were performed with a custom-built non-contact atomic force microscope with Nanonis electronics RC5. PPP-NCL cantilevers (Nanosensor) were used as sensor (typical resonance frequency of f1 = 170 kHz, oscillation amplitude A1 = 2–5

• the first molecules studied in HV-ESD experiments [5][30]. Here, we present a comparison between TE and HV-ESD regarding the adsorption and structure formation of C60 molecules on surfaces at low coverages, that is, below one monolayer down to single molecules. We used a non-contact atomic force

• microscope (nc-AFM) working at room temperature to study formation and shape of C60 islands on three substrates with different intrinsic properties. These are, first, Au(111), a metal surface widely used in SPM studies, second, KBr(001), a bulk insulator allowing for the decoupling of molecular species and

Mapping the local dielectric constant of a biological nanostructured system

• Wescley Walison Valeriano,
• Rodrigo Ribeiro Andrade,
• Juan Pablo Vasco,
• Angelo Malachias,
• Bernardo Ruegger Almeida Neves,
• Paulo Sergio Soares Guimarães and
• Wagner Nunes Rodrigues

Beilstein J. Nanotechnol. 2021, 12, 139–150, doi:10.3762/bjnano.12.11

• the coefficient α For the experiments we use an atomic force microscope in the EFM mode, which measures the frequency shift for each bias voltage at each position of the sample. We varied the bias voltage from −10 V to +10 V, in steps of 1 V. Plotting the frequency shift as a function of the bias

Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

• Cameron H. Parvini,
• M. A. S. R. Saadi and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 137–138, doi:10.3762/bjnano.12.10

Design of V-shaped cantilevers for enhanced multifrequency AFM measurements

• Mehrnoosh Damircheli and
• Babak Eslami

Beilstein J. Nanotechnol. 2020, 11, 1525–1541, doi:10.3762/bjnano.11.135

• a phase contrast similar to that of the optimum rectangular cantilever. These three cantilevers were used in an experimental bimodal AFM study. An Asylum Research MFP3D Origin atomic force microscope equipped with an ARC2 controller is used to perform the experiments. There are two sets of

• , dynamic, and vibrational parameters of higher bending modes and multifrequency atomic force microscope have been investigated. The parameters considered are cantilever length, based width, leg width and thickness. The ranges for each parameter are found by studying commercially available cantilevers. In

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

• Santiago H. Andany,
• Gregor Hlawacek,
• Stefan Hummel,
• Charlène Brillard,
• Mustafa Kangül and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

• -Zentrum Dresden-Rossendorf, Dresden 01328, Germany GETec Microscopy GmbH, Vienna 1220, Austria 10.3762/bjnano.11.111 Abstract In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and

• integration. Keywords: atomic force microscopy (AFM); combined setup; correlative microscopy; helium ion microscopy (HIM); self-sensing cantilevers; Introduction Shortly after the invention of the atomic force microscope (AFM) in 1986 [1], efforts were made towards combining this scanning probe microscopy

• - and time-scales. Conclusion We have demonstrated the integration of an atomic force microscope into a helium ion microscope. Correlative measurements of AFM topography with He ion imaging and modification demonstrate the feasibility of this integration. The complementarity of the two methods in terms

Gas-sensing features of nanostructured tellurium thin films

• Dumitru Tsiulyanu

Beilstein J. Nanotechnol. 2020, 11, 1010–1018, doi:10.3762/bjnano.11.85

• (PhotoniTech Pte Ltd., Singapore) atomic force microscope. The surface morphology of the films was investigated using either a TESLA BS 340 or a VEGA TESCAN TS 5130 MM (TESCAN, Czech Republic) scanning electron microscope (SEM). To investigate the structural features of the grown films, X-ray analysis was

Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

• Cameron H. Parvini,
• M. A. S. R. Saadi and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 922–937, doi:10.3762/bjnano.11.77

Three-dimensional solvation structure of ethanol on carbonate minerals

• Hagen Söngen,
• Ygor Morais Jaques,
• Peter Spijker,
• Christoph Marutschke,
• Stefanie Klassen,
• Ilka Hermes,
• Ralf Bechstein,
• Lidija Zivanovic,
• John Tracey,
• Adam S. Foster and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2020, 11, 891–898, doi:10.3762/bjnano.11.74

• nature. Experimental and Theoretical Methods Atomic force microscopy For the AFM experiments we used a modified commercial atomic force microscope [22] with custom photothermal cantilever excitation [23] and a custom three-dimensional scanning and data acquisition mode [24] in the frequency-modulation

Hexagonal boron nitride: a review of the emerging material platform for single-photon sources and the spin–photon interface

• Stefania Castelletto,
• Faraz A. Inam,
• Shin-ichiro Sato and
• Alberto Boretti

Beilstein J. Nanotechnol. 2020, 11, 740–769, doi:10.3762/bjnano.11.61

Formation of nanoripples on ZnO flat substrates and nanorods by gas cluster ion bombardment

• Xiaomei Zeng,
• Vasiliy Pelenovich,
• Bin Xing,
• Rakhim Rakhimov,
• Wenbin Zuo,
• Alexander Tolstogouzov,
• Chuansheng Liu,
• Dejun Fu and
• Xiangheng Xiao

Beilstein J. Nanotechnol. 2020, 11, 383–390, doi:10.3762/bjnano.11.29

• bombardment, the modified surface morphology of the flat substrates and nanorods was studied with a scanning electron microscope (SEM) Zeiss Sigma, operated at 20 kV accelerating voltage. An atomic force microscope (AFM) Shimadzu SPM-9500J3 was used to study the ripple formation on the flat ZnO substrates

Simple synthesis of nanosheets of rGO and nitrogenated rGO

• Pallellappa Chithaiah,
• Madhan Mohan Raju,
• Giridhar U. Kulkarni and
• C. N. R. Rao

Beilstein J. Nanotechnol. 2020, 11, 68–75, doi:10.3762/bjnano.11.7

• °C·min−1 using a Mettler-Toledo-TG-850 apparatus. AFM measurements were performed using a CP2 atomic force microscope. Electrode preparation and electrochemical characterization The catalyst inks of as-synthesized rGO and reduced graphene oxide H-rGO were prepared by ultrasonication separately. A mixture

The effect of heat treatment on the morphology and mobility of Au nanoparticles

• Sven Oras,
• Sergei Vlassov,
• Simon Vigonski,
• Boris Polyakov,
• Mikk Antsov,
• Vahur Zadin,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2020, 11, 61–67, doi:10.3762/bjnano.11.6

• manipulated on a silica substrate with an atomic force microscope (AFM) in tapping mode. Initially, the NPs were immovable by AFM energy dissipation. However, annealed NPs became movable, and less energy was required to displace the NPs annealed at higher temperature. However, after annealing at 800 °C, the

• atomic force microscope (AFM) in order to study the effect of annealing on their tribological behavior. Experimental Nanoparticle synthesis A colloidal suspension of Au NPs was produced by reducing an aqueous solution of HAuCl4·H2O. The procedure consisted of adding 3 mL of 1% aqueous HAuCl4 (Sigma

Abrupt elastic-to-plastic transition in pentagonal nanowires under bending

• Sergei Vlassov,
• Magnus Mets,
• Boris Polyakov,
• Jianjun Bian,
• Leonid Dorogin and
• Vahur Zadin

Beilstein J. Nanotechnol. 2019, 10, 2468–2476, doi:10.3762/bjnano.10.237

• -bending configuration in a similar manner as described in [33][34]. The NWs were bent in-plane with a substrate by an atomic force microscope (AFM) probe (ATEC−CONT cantilevers, Nanosensor, Neuchatel, Switzerland, C = 0.2 N·m−1) attached to a micromanipulator (MM3AEM, Kleindiek, Germany). FEM simulations

Mobility of charge carriers in self-assembled monolayers

• Zhihua Fu,
• Tatjana Ladnorg,
• Hartmut Gliemann,
• Alexander Welle,
• Asif Bashir,
• Michael Rohwerder,
• Qiang Zhang,
• Björn Schüpbach,
• Andreas Terfort and
• Christof Wöll

Beilstein J. Nanotechnol. 2019, 10, 2449–2458, doi:10.3762/bjnano.10.235

• vertical charge transport through individual molecules of aromatic SAMs by using conductive atomic force microscope (c-AFM) [12][13][14][15] and scanning tunneling microscope (STM) techniques [16][17]. Using these methods, current–voltage (I–V-) curves on the SAM-forming organothiolates has been determined

Nitrogen-vacancy centers in diamond for nanoscale magnetic resonance imaging applications

• Alberto Boretti,
• Lorenzo Rosa,
• Jonathan Blackledge and
• Stefania Castelletto

Beilstein J. Nanotechnol. 2019, 10, 2128–2151, doi:10.3762/bjnano.10.207

• attaching it to the tip of an atomic force microscope (AFM). This can also be achieved by mounting a high-purity diamond nanopillar on an AFM with an NV center placed 10 nm from its end, achieving a sensitivity of 56 nT·Hz−1/2, as reported in [37]. Nanodiamond scanning tips currently suffer from a

Nanoarchitectonics meets cell surface engineering: shape recognition of human cells by halloysite-doped silica cell imprints

• Elvira Rozhina,
• Ilnur Ishmukhametov,
• Svetlana Batasheva,
• Farida Akhatova and
• Rawil Fakhrullin

Beilstein J. Nanotechnol. 2019, 10, 1818–1825, doi:10.3762/bjnano.10.176

• . Characterisation Scanning electron microscopy (SEM) imaging of samples sputter-coated with gold was performed with a Hitachi SU8000 microscope equipped with energy-dispersive X-ray (EDX) spectrometer. The interaction of cells with inorganic shapes was also recorded with an atomic-force microscope (Dimension Icon

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

• Petr Knotek,
• Tomáš Plecháček,
• Jan Smolík,
• Petr Kutálek,
• Filip Dvořák,
• Milan Vlček,
• Jiří Navrátil and
• Čestmír Drašar

Beilstein J. Nanotechnol. 2019, 10, 1401–1411, doi:10.3762/bjnano.10.138

• revealed that long-time exposure (tens of seconds) to the electrical field leads to deep oxidation and the formation of perturbations greater than 1 µm in height, which hinder the I–V measurements. Keywords: Kelvin probe atomic force microscope; nanoinclusion; Schottky barrier; thermoelectric materials

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

• Alexander Krivcov,
• Jasmin Ehrler,
• Marc Fuhrmann,
• Tanja Junkers and
• Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

• Bruker Dimension Icon atomic force microscope. The topography of the samples was measured in tapping mode and the phase images in interleave mode at a certain lift height. The changes in amplitude indicate the topography changes in tapping mode. The amplitude of the tip oscillation is 50 nm in order to

Revisiting semicontinuous silver films as surface-enhanced Raman spectroscopy substrates

• Malwina Liszewska,
• Bogusław Budner,
• Małgorzata Norek,
• Bartłomiej J. Jankiewicz and
• Piotr Nyga

Beilstein J. Nanotechnol. 2019, 10, 1048–1055, doi:10.3762/bjnano.10.105

• . Absorption was calculated assuming the sum of transmittance, reflectance, and absorption is 100%. The morphology of the fabricated structures was measured using a Quanta 3D FEG Dual Beam scanning electron microscope (SEM) and an atomic force microscope (AFM). The SEM images of SSFs were converted to black

• and white and metal coverage was calculated. The AFM maps were collected using an NTEGRA atomic force microscope from NT-MDT company. The surface topography measurements were made in semi-contact mode. We used HA_NC ETALON (NT-MDT) probe with 140 kHz ± 10% resonant frequency, force constant of 3.5 N/m

In situ AFM visualization of Li–O₂ battery discharge products during redox cycling in an atmospherically controlled sample cell

• Kumar Virwani,
• Younes Ansari,
• Khanh Nguyen,
• Francisco José Alía Moreno-Ortiz,
• Jangwoo Kim,
• Maxwell J. Giammona,
• Ho-Cheol Kim and
• Young-Hye La

Beilstein J. Nanotechnol. 2019, 10, 930–940, doi:10.3762/bjnano.10.94

• and oxygen) in a controlled environment proves a need for such complimentary analyses, as understanding redox interactions is inherently complex. Experimental A Cypher atomic force microscope (AFM) with an environmental scanner from Oxford Instruments operating inside of an mBraun glove box was used