Carbon nanotube-wrapped Fe₂O₃ anode with improved performance for lithium-ion batteries

• Guoliang Gao,
• Yan Jin,
• Qun Zeng,
• Deyu Wang and
• Cai Shen

Beilstein J. Nanotechnol. 2017, 8, 649–656, doi:10.3762/bjnano.8.69

• ) Discharge–charge profiles of COOH-MWCNT at a current density of 500 mA·g−1; (b) discharge–charge profiles of Fe2O3/COOH-MWCNT composites at a current density of 500 mA·g−1; (c) cyclic voltammograms of COOH-MWCNT at a scan speed of 0.05 mV·s−1; (d) cyclic voltammograms of Fe2O3/COOH-MWCNT at a scan speed of

Noise in NC-AFM measurements with significant tip–sample interaction

• Jannis Lübbe,
• Matthias Temmen,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 1885–1904, doi:10.3762/bjnano.7.181

• always the experimental task defining the desired spatial resolution λ that is, for instance, a fraction of the atomic periodicity in atomic resolution imaging, and the available time for the measurement expressed by the scan speed vscan. Assuming perfectly band-limited output signals, the sampling

• theorem requires the product of scan speed and inverse spatial resolution to be smaller than half of the detection bandwidth ΔfBW, or This often requires a compromise as using the optimum bandwidth defined by operation at the thermal noise limit [11] may impose a scan speed that is not practical

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

• Hannes Beyer,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

• topography of a KBr surface and c) corresponding height profile along the red line in b). The step height is 315 pm. Scan parameters: A = 1.1 nm, Δf = +0.15 Hz, scan speed 10 μm/s. Smoothed frequency-shift (black) versus distance curve on HOPG and tip–sample force Fts (red) calculated from the Sader–Jarvis

• algorithm. The grey curve corresponds to the frequency shift raw data. A = 1.1 nm. Topography (a) of HOPG after rinsing with Milli-Q water and height profiles (b) along the lines indicated in a) showing the periodic patterns of three domains. A = 1.1 nm, Δf = +0.2 Hz, scan speed 977 nm/s. High-resolution

• detuning image of HOPG in quasi-constant height mode. Inset: 3-fold symmetrised drift-compensated correlation average with overlaid honeycomb structure. A = 220 pm, scan speed 58.6 nm/s. Acknowledgements The authors thank Patrick Reissner for stimulating discussions, Blerim Veselaj for technical support

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

• Michael G. Ruppert and
• S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

• , while the LDPE regions have elastic modulus numbers around 0.1 GPa making it a widely used standard to image material contrast. The scan speed was set to 20 μm/s at an area of 10 μm × 10 μm. Approach curves Approach and retract curves have been performed on the (stiff) TGZ1 calibration grating where the

Self-organization of gold nanoparticles on silanated surfaces

• Htet H. Kyaw,
• Salim H. Al-Harthi,
• Azzouz Sellai and
• Joydeep Dutta

Beilstein J. Nanotechnol. 2015, 6, 2345–2353, doi:10.3762/bjnano.6.242

• n-type antimony doped Si tips (TAP 525, Bruker) with a resonance frequency of 375–675 kHz at 0.5 Hz scan speed. For static contact angle measurements, the “sessile droplet” method was used to determine the surface wetting nature of APTES-functionalized glass surfaces using ThetaLite attention

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

• Tino Wagner,
• Hannes Beyer,
• Patrick Reissner,
• Philipp Mensch,
• Heike Riel,
• Bernd Gotsmann and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

• can happen on highly structured surfaces when the bandwidth of the topography feedback is insufficient for the scan speed. By monitoring the deflection power spectral density near the driving frequency, an upper frequency bound of the remaining kts modulations can be determined. In order to avoid

Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods

• Aleksandra Szkudlarek,
• Alfredo Rodrigues Vaz,
• Yucheng Zhang,
• Andrzej Rudkowski,
• Czesław Kapusta,
• Rolf Erni,
• Stanislav Moshkalev and
• Ivo Utke

Beilstein J. Nanotechnol. 2015, 6, 1508–1517, doi:10.3762/bjnano.6.156

• views of a periodic three dimensional line deposit obtained from (hfac)Cu(DMB). Such periodicity can arise when the vertical deposition rate is comparable to the scan speed of the focused electron beam. For the annealing experiments this is not of importance (for more details we refer to Bret et al. [43

Scanning reflection ion microscopy in a helium ion microscope

• Yuri V. Petrov and
• Oleg F. Vyvenko

Beilstein J. Nanotechnol. 2015, 6, 1125–1137, doi:10.3762/bjnano.6.114

• compensation by an electron flood gun. Imaging with a flood gun requires accurate adjustment of the flood gun parameters and ion beam parameters to neutralize the surface charge. The scan speed decreases when line-by-line charge compensation is used. The reflected ions are less sensitive to surface charge than

Synergic combination of the sol–gel method with dip coating for plasmonic devices

• Cristiana Figus,
• Maddalena Patrini,
• Francesco Floris,
• Lucia Fornasari,
• Paola Pellacani,
• Gerardo Marchesini,
• Andrea Valsesia,
• Flavia Artizzu,
• Daniela Marongiu,
• Michele Saba,
• Franco Marabelli,
• Andrea Mura,
• Giovanni Bongiovanni and
• Francesco Quochi

Beilstein J. Nanotechnol. 2015, 6, 500–507, doi:10.3762/bjnano.6.52

• (Nadetech Innovations) was used for the deposition of all silica films. An NT-MDT Solver-Pro AFM was used to analyze the topography and to estimate the thickness of the films. The measurements were performed at a scan speed of 0.5–1 Hz in semi-contact mode. In order to evaluate the film thickness using AFM

A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

• Tobias Meier,
• Alexander Förste,
• Ali Tavassolizadeh,
• Karsten Rott,
• Dirk Meyners,
• Roland Gröger,
• Günter Reiss,
• Eckhard Quandt,
• Thomas Schimmel and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46

• × 1024 pixels. Imaging was done in the intermittent contact mode of the AFM with a setpoint of 89% of the free amplitude of the cantilever. Due to the large step heights of up to 2 μm on the surface of the chip, and the corresponding high demands on the z-feedback loop the scan speed was set to 30 μm/s

Influence of spurious resonances on the interaction force in dynamic AFM

• Luca Costa and
• Mario S. Rodrigues

Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

• its flexibility, amplitude modulation AFM (AM-AFM) [3] has become successful and widely employed to characterize surfaces at the nanoscale. It has continuously evolved in terms of achievable lateral resolution and scan speed, producing impressive results both at solid/gas interfaces under ambient

Controlling the dispersion of supported polyoxometalate heterogeneous catalysts: impact of hybridization and the role of hydrophilicity–hydrophobicity balance and supramolecularity

• Gijo Raj,
• Colas Swalus,
• Eglantine Arendt,
• Pierre Eloy,
• Michel Devillers and
• Eric M. Gaigneaux

Beilstein J. Nanotechnol. 2014, 5, 1749–1759, doi:10.3762/bjnano.5.185

• piezoelectric scanner. The ratio of the set-point amplitude to the free amplitude was kept at 0.9 in order to apply minimal forces (“light tapping” conditions) so as to prevent sample deformation. Images were acquired at a resolution of 512 samples per line with a scan speed of 0.5 lines/s. Raw images were

Extracellular biosynthesis of gadolinium oxide (Gd₂O₃) nanoparticles, their biodistribution and bioconjugation with the chemically modified anticancer drug taxol

• Shadab Ali Khan,
• Sanjay Gambhir and
• Absar Ahmad

Beilstein J. Nanotechnol. 2014, 5, 249–257, doi:10.3762/bjnano.5.27

• -1601 PC) operated at a resolution of 1 nm. Fluorescence microscopy Fluorescence measurements of Gd2O3–taxol bioconjugate were carried out by using a Perkin Elmer LS-50B spectrofluorimeter with a slit width of 7 nm for both monochromators and a scan speed of 100 nm/min. Purification of Gd2O3–taxol

Site-selective growth of surface-anchored metal-organic frameworks on self-assembled monolayer patterns prepared by AFM nanografting

• Tatjana Ladnorg,
• Alexander Welle,
• Stefan Heißler,
• Christof Wöll and
• Hartmut Gliemann

Beilstein J. Nanotechnol. 2013, 4, 638–648, doi:10.3762/bjnano.4.71

• parameters for the nanografting process (vertical force applied by the AFM tip to the substrate, scan speed, etc.) were optimized. HKUST-1 SURMOF on MPA nanografted structures To obtain a patterned deposition of HKUST-1, nanografting was first carried out within a SAM matrix made of 1-decanethiol (DT). A

High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

• John Melcher,
• David Martínez-Martín,
• Miriam Jaafar,
• Julio Gómez-Herrero and
• Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

• can be limited by the bandwidth of the amplitude and phase measurements, or the transient response, or the response of the oscillating probe. Drift in dAFM, for example arising from the piezo actuators controlling the image raster, imposes a minimum scan speed and corresponding detection bandwidth

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

• Jeffrey C. Williams and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

• on the horizontal scan speed of the cantilever and the number of taps that take place at every pixel, the tip may contact the surface at different heights during successive impacts, as illustrated in Figure 4. Due to the simplicity of the SLS model, analytical expressions exist for various aspects of

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

• Jannis Lübbe,
• Matthias Temmen,
• Sebastian Rode,
• Philipp Rahe,
• Angelika Kühnle and
• Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

• properties (k = 2.5 N/m, Q0 = 100000) are added to the signal. The inset schematically illustrates how scanning the tip over the sample having a spatial periodicity as with a scan speed of vt yields a modulation at frequency fm = vt/as. The surface corrugation Δz yields a modulation amplitude Δfm where the

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

• Maximilian Schneiderbauer,
• Daniel Wastl and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 174–178, doi:10.3762/bjnano.3.18

• compensated for the contact potential difference (CPD) in both paths. We determined the CPD by taking Kelvin parabolas over the sample surface; typical values are 250 mV. The Nanonis Multipass configuration also allows us to vary the scan speed on different paths. For the second path, in which the frequency

• shift is detected, we lowered the scan speed to half of the value used for topography imaging, thus reducing the detection bandwidth. As already mentioned, the oscillation amplitude should always be adapted to the interaction of interest. Thus, the lift-mode technique could be improved by programming a

• systems [19] and low-temperature systems [12][20][21]. For this sensor setup, see inset in Figure 3a, we found an amplitude of 25 nm in both paths and a lift height of 35 nm to be a good choice. The first-pass topography data set shows the expected surface structure (Figure 3a). The scan speed again had

Direct-write polymer nanolithography in ultra-high vacuum

• Woo-Kyung Lee,
• Minchul Yang,
• Arnaldo R. Laracuente,
• William P. King,
• Lloyd J. Whitman and
• Paul E. Sheehan

Beilstein J. Nanotechnol. 2012, 3, 52–56, doi:10.3762/bjnano.3.6

• decrease as the inverse square root of the scan speed. The widths of the deposited structures decrease monotonically with the scan speed but do not show a clear power law relationship. When patterning under ambient conditions, dimensional control may be achieved by varying the tip temperature; however, the

Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle–substrate chemistry and morphology, and of operating conditions

• Samer Darwich,
• Karine Mougin,
• Akshata Rao,
• Enrico Gnecco,
• Shrisudersan Jayaraman and
• Hamidou Haidara

Beilstein J. Nanotechnol. 2011, 2, 85–98, doi:10.3762/bjnano.2.10

• operating environment conditions (relative humidity RH% and temperature T), as well as the tip scan velocity. The dissipated power during manipulation was quantified under various operating conditions (RH%, T, tip scan speed). Our experiments show that the velocity dependence of the dissipated power at

• the tip scan speed. Substrates: circles: SiO2 silicon wafer; squares: NH2-coated silicon wafer (hydrophilic substrate); triangles: CH3-coated silicon wafer (hydrophobic substrate). (a) 35 nm diameter Au NPs, (b) 60 nm diameter Au NPs. 400 nm × 400 nm TEM image of 25 nm diameter gold nanoparticles