A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

• François Piquemal,
• Khaled Kaja,
• Pascal Chrétien,
• José Morán-Meza,
• Frédéric Houzé,
• Christian Ulysse and
• Abdelmounaim Harouri

Beilstein J. Nanotechnol. 2023, 14, 1141–1148, doi:10.3762/bjnano.14.94

• work, we demonstrate the development of a multi-resistance reference sample for calibrating resistance measurements in conductive probe atomic force microscopy (C-AFM) covering the range from 100 Ω to 100 GΩ. We present a comprehensive protocol for in situ calibration of the whole measurement circuit

• encompassing the tip, the current sensing device, and the system controller. Furthermore, we show that our developed resistance reference enables the calibration of C-AFM with a combined relative uncertainty (given at one standard deviation) lower than 2.5% over an extended range from 10 kΩ to 100 GΩ and lower

• than 1% for a reduced range from 1 MΩ to 50 GΩ. Our findings break through the long-standing bottleneck in C-AFM measurements, providing a universal means for adopting calibrated resistance measurements at the nanoscale in the industrial and academic research and development sectors. Keywords

Dual-heterodyne Kelvin probe force microscopy

• Benjamin Grévin,
• Fatima Husainy,
• Dmitry Aldakov and
• Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

• ; intermodulation; KPFM; nc-AFM; surface photovoltage; time-resolved measurements; Introduction Kelvin probe force microscopy (KPFM) is a well-known variant of AFM that allows probing at the nanoscale the electrostatic landscape on the surface of a sample by measuring the so-called contact potential difference

• (CPD). If one considers a simple junction formed by a metallic AFM tip and a metallic sample, the CPD originates from the tip–sample work function difference. More generally, the CPD stems from the existence of electric charges and/or dipoles in the system under consideration. As a result, the

• illumination chain. This is for instance the case of intensity-modulated KPFM [7][8][9], pump-probe KPFM [4][10][11], or G-mode KPFM [12], to name a few (we refer the readers to review articles for a more comprehensive introduction to AFM-based time-resolved potentiometric and electrostatic modes [13][14

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

• Zeinab Eftekhari,
• Nasim Rezaei,
• Hidde Stokkel,
• Jian-Yao Zheng,
• Andrea Cerreta,
• Ilka Hermes,
• Minh Nguyen,
• Guus Rijnders and
• Rebecca Saive

Beilstein J. Nanotechnol. 2023, 14, 1059–1067, doi:10.3762/bjnano.14.87

• mechanical oscillation of the piezoelectric membrane with vertical atomic resolution in real-time. This technique offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale. Furthermore, time-dependent atomic force microscopy (AFM) was employed to

• ); time-dependent AFM; Introduction Light has been recognized as a versatile external energy source to actuate micro/nanorobots with outstanding merits of wireless, remote, and precise controllability [1][2][3][4]. Light-driven micro/nanorobots convert light into mechanical motion and are able to perform

• ]. However, the working principle of these techniques is based on optical interferometry mapping which can be challenging for light-sensitive devices. Furthermore, it can be advantageous to employ a method that also allows for mechanical contact and manipulation. Atomic force microscopy (AFM) [11][12][13][14

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• ® and UHMWPE [9][10][11][12][13]. Here we extend this technique to Technora® by notching individual fibers (Figure 1b), gently opening them along shear planes to expose internal surfaces, and then scanning across those surfaces using an atomic force microscope (AFM) (Figure 1c). AFM scans yield internal

• development of future classes of high-performance fibers. Results AFM characterizations of Technora® AFM maps enable direct characterization of both fiber nano- and microstructures in real space. Large-scale maps span across the fiber diameter to highlight prominent microstructural features. For Technora

• expect that these features resulted from the way this particular fiber split open after FIB notching. Likewise, the lone drop in stiffness makes sense, as the AFM probe experiences a local reduction in tip–substrate contact area. However, similar topography and stiffness jumps forming a compliant band

Upscaling the urea method synthesis of CoAl layered double hydroxides

• Camilo Jaramillo-Hernández,
• Víctor Oestreicher,
• Martín Mizrahi and
• Gonzalo Abellán

Beilstein J. Nanotechnol. 2023, 14, 927–938, doi:10.3762/bjnano.14.76

• CoAl-LDH synthesis method. We thoroughly study the effects of the mass scale-up (25-fold: up to 375 mM) and the volumetric scale-up (20-fold: up to 2 L). For this, we use a combination of several structural (XRD, TGA, and N2 and CO2 isotherms), microscopic (SEM, TEM, and AFM), magnetic (SQUID), and

• CoAl-based LDH synthesis through an ARR method had been demonstrated, morphological aspects were addressed by means of scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atomic force microscopy (AFM) (Figure 4 and Figure 5). For reference x1, well-defined hexagonal single

• experimental conditions extracted from SEM analysis. Besides slight differences in size and morphology (sharpness of the edges), the AFM comparison of single hexagonal platelets of reference x1 and sample x20V shows a similar thickness of around 85 nm (Figure 5A,B and Supporting Information File 1, Figure S15

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

• Mattia da Lisca,
• José Alvarez,
• James P. Connolly,
• Nicolas Vaissiere,
• Karim Mekhazni,
• Jean Decobert and
• Jean-Paul Kleider

Beilstein J. Nanotechnol. 2023, 14, 725–737, doi:10.3762/bjnano.14.59

• of the atomic force microscope (AFM) for the evaluation of the surface potential with nanometric resolution. KPFM is a valuable investigative approach for the study of work functions via the measurement of the contact potential difference VCPD, that is, the difference between the electrostatic

• misleading VCPD value [14]. Kelvin probe force microscopy The following KPFM experimental procedures closely follow those described in [12]. KPFM evaluates the contact potential difference (VCPD) between the surface of metallic and semiconductive samples and a conductive AFM tip, which at equilibrium can be

• crosstalk [17]. The laser beam deflection system in our AFM employs a laser wavelength of 1310 nm, which is well below the bandgap of our sample; therefore, the parasitic laser absorption, which may interfere with the KPFM measurement, is reduced to negligible levels [13]. Highly doped n+-Si ARROW EFM tips

A graphene quantum dots–glassy carbon electrode-based electrochemical sensor for monitoring malathion

• Sanju Tanwar,
• Aditi Sharma and
• Dhirendra Mathur

Beilstein J. Nanotechnol. 2023, 14, 701–710, doi:10.3762/bjnano.14.56

• obtained from a Bruker AFM analyzer atomic force microscope and a FEI Tecnai G2 20 S-TWIN transmission electron microscope. Electrochemical measurements GQDs/GCE, Ag/AgCl, and a platinum wire were used as working, reference, and counter electrode, respectively, in all electrochemical experiments, conducted

• significantly. Therefore, it can be inferred that not only quantum size effects, but also defects on the surface, contribute to the PL in GQDs. Size and morphology of GQDs were characterized using TEM and AFM. The TEM micrographs shown in Figure 3a confirm the formation of evenly dispersed GQDs with almost

• GQDs in Figure 3c shows their crystalline structure. The lattice spacing obtained is 0.34 nm, which can be related to the (002) crystal planes of GQDs. Figure 3d shows an AFM image of the synthesized GQDs. The x axis and the y axis in the inset of the AFM image show the horizontal distance and vertical

Humidity-dependent electrical performance of CuO nanowire networks studied by electrochemical impedance spectroscopy

• Jelena Kosmaca,
• Juris Katkevics,
• Jana Andzane,
• Raitis Sondors,
• Liga Jasulaneca,
• Raimonds Meija,
• Kiryl Niherysh,
• Yelyzaveta Rublova and
• Donats Erts

Beilstein J. Nanotechnol. 2023, 14, 683–691, doi:10.3762/bjnano.14.54

• electron microscopy (SEM, Hitachi S4800) and atomic force microscopy (AFM, Asylum Research MFP-3D). Electrochemical impedance measurements were performed under various atmospheric conditions in a custom-made system described elsewhere [28]. The main system parameters were RH from 4% to 97%, gas flow from

SERS performance of GaN/Ag substrates fabricated by Ag coating of GaN platforms

• Magdalena A. Zając,
• Bogusław Budner,
• Malwina Liszewska,
• Bartosz Bartosewicz,
• Łukasz Gutowski,
• Jan L. Weyher and
• Bartłomiej J. Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 552–564, doi:10.3762/bjnano.14.46

• substrates fabricated using both methods, we attempted to prepare substrates with a comparable amount of deposited Ag, which was examined and controlled using atomic force microscopy (AFM). For this purpose, additional Ag layers were deposited on flat Si substrates. Based on the measured thickness of the Ag

• atomic force microscope (AFM) (NT-MDT, Moscow, Russia) in non-contact mode using the approach described previously [37]. The silver layers were removed randomly on the sample to form a sharp edge for measurement of height (layer thickness). AFM measurements were carried out in three different areas on

• the surface of each sample. Ten AFM cross sections from different scanning areas were made and averaged for each sample, from which the average layer thickness and the standard deviation of thickness were determined. To measure the thickness of Ag layers deposited by MS, Ag was deposited in the same

Carbon nanotube-cellulose ink for rapid solvent identification

• Tiago Amarante,
• Thiago H. R. Cunha,
• Claudio Laudares,
• Ana P. M. Barboza,
• Ana Carolina dos Santos,
• Cíntia L. Pereira,
• Vinicius Ornelas,
• Bernardo R. A. Neves,
• André S. Ferlauto and
• Rodrigo G. Lacerda

Beilstein J. Nanotechnol. 2023, 14, 535–543, doi:10.3762/bjnano.14.44

• length of 5 μm were produced at CTNano/UFMG [59][60][61]. Morphological analysis was carried out by scanning electron microscopy (SEM) in a Quanta 200 FEG, using secondary electrons between 2 and 10 kV. Atomic force microscopy (AFM) was carried out on a Bruker MultiMode8 SPM using the intermittent

• and MFC are distributed within the ink, AFM measurements were performed on the isolated materials (MFC and MWCNTs) and on the MFC/MWCNT composite (see Figure 1d–f). Pure MFC fibers form bundles (ca. 250 nm thick), and the functionalized tubes also form small bundles. Interestingly, Figure 1f shows

• based on an easily up-scalable MFC/MWCNT composite manufactured by printing techniques. AFM measurements show that the composite coating consists of an insulating MFC matrix decorated with a conductive CNT network. The sensor response to different liquids and solvents is fast (40 s) and highly

On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets

• Keith R. Paton,
• Konstantinos Despotelis,
• Naresh Kumar,
• Piers Turner and
• Andrew J. Pollard

Beilstein J. Nanotechnol. 2023, 14, 509–521, doi:10.3762/bjnano.14.42

• widely used characterization tool for GR2Ms [8]. A search of Web of Science showed that of 97,532 articles published in the last five years with “Graphene” in the abstract, 9.3% also mentioned “Raman”. This is compared with atomic force microscopy (AFM) (2.4%), scanning electron microscopy (SEM) (11.4

• diluted by a factor of 10 in fresh NMP. 10 μL of the diluted dispersion was then drop-cast on a Si/SiO2 wafer at a temperature of 200 °C. To remove residual NMP, the sample was dried overnight in a vacuum oven at 60 °C. AFM measurements of the deposited flakes were carried out using Cypher AFM (Asylum

• Research, Oxford Instruments, UK). AFM images were recorded using Si AFM probes (MikroMasch HQ:NSC15, 40 N/m, 325 kHz, MikroMasch, Bulgaria) in tapping-mode feedback. AFM images were measured in square areas between 6 μm × 6 μm and 8 μm × 8 μm using 1024 × 1024 pixels with a scan speed below 20 μm·s−1. To

Molecular nanoarchitectonics: unification of nanotechnology and molecular/materials science

• Katsuhiko Ariga

Beilstein J. Nanotechnol. 2023, 14, 434–453, doi:10.3762/bjnano.14.35

• oligomeric chains were significantly elongated. High-resolution scanning tunneling microscope (STM) topography shows alternating bright twin spots, which correspond to phenylene and tetrafluorophenylene, respectively. A high-resolution atomic force microscope (AFM) image of an entirely elongated fine

The steep road to nonviral nanomedicines: Frequent challenges and culprits in designing nanoparticles for gene therapy

• Yao Yao,
• Yeongun Ko,
• Grant Grasman,
• Jeffery E. Raymond and
• Joerg Lahann

Beilstein J. Nanotechnol. 2023, 14, 351–361, doi:10.3762/bjnano.14.30

• E2859-11 for AFM analysis, and ISO 21363:2020 for substrate-supported TEM analysis. When at all possible, obtaining the distribution of sizes from these methods with extension to obtain geometric properties (aspect ratio, minimum diameter, circularity, roundness, or sphericity) will allow for the

• comparison within different batches, formulations, particle types, and standards. For particle systems that do not exist in a solid state, cryo-TEM or submersion AFM can offer alternative routes. These measurements will provide high-resolution particle distributions for in-solvent particles, though they may

• ultracentrifugation provide ensemble detection of size distributions with their own issues and complexities (e.g., gradient-induced aggregation and pressure-induced particle reconfiguration) [65]. Determination of size on a per-particle basis, such as that obtained from NTA or the aforementioned cryo-TEM/solution AFM

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• known as a method that can measure the contact potential difference (CPD) between a tip and a sample with high spatial resolution [4][5]. KPFM is based on the detection of the electrostatic force between a tip and a sample using atomic force microscopy (AFM) [6][7][8]. CPD and topographic measurements

• with respect to the cutoff frequency fc of carrier transport between the bulk and interface states and measuring the difference in CPD by KPFM. In high–low KPFM, frequency modulation (FM) KPFM (FM-KPFM) combined with FM-AFM is used to detect the tip–sample interaction force. FM-KPFM has several

• advantages, namely high sensitivity to the electrostatic force gradient, high detection sensitivity using a cantilever with a weak spring constant at the first resonance, ease of implementation in adding FM-AFM, and no need to enhance the bandwidth of the cantilever deflection sensor. FM-KPFM is used to

Structural, optical, and bioimaging characterization of carbon quantum dots solvothermally synthesized from o-phenylenediamine

• Zoran M. Marković,
• Milica D. Budimir,
• Martin Danko,
• Dušan D. Milivojević,
• Pavel Kubat,
• Danica Z. Zmejkoski,
• Vladimir B. Pavlović,
• Marija M. Mojsin,
• Milena J. Stevanović and
• Biljana M. Todorović Marković

Beilstein J. Nanotechnol. 2023, 14, 165–174, doi:10.3762/bjnano.14.17

• characterization methods (AFM, TEM, EDS, FTIR, photoluminescence, and EPR) indicate the significant influence of the precursor on structural, chemical, and optical properties. Antibacterial and cytotoxicity tests showed that these dots did not have any antibacterial potential, because of the low extent of reactive

• cytotoxic properties of CQDs and CQD/polyurethane composites. Results and Discussion Surface morphology Figure S1 (Supporting Information File 1) presents the surface morphology of the CQD samples. Figure S1a shows a TEM micrograph of CQDs. The average diameter of these dots is 4 ± 1 nm. A top-view AFM

• image of CQDs is presented in Figure S1b (Supporting Information File 1). TEM and AFM images show that the CQDs are spherical. Statistical analysis conducted on more than 20 AFM images in Gwyddion software showed that more than 80% of the CQDs had a diameter between 2 and 5 nm while their height was 2.6

Intermodal coupling spectroscopy of mechanical modes in microcantilevers

• Ioan Ignat,
• Bernhard Schuster,
• Jonas Hafner,
• MinHee Kwon,
• Daniel Platz and
• Ulrich Schmid

Beilstein J. Nanotechnol. 2023, 14, 123–132, doi:10.3762/bjnano.14.13

• Ioan Ignat Bernhard Schuster Jonas Hafner MinHee Kwon Daniel Platz Ulrich Schmid Institute of Sensor and Actuator Systems, TU Wien, Gußhaustraße 27–29, 1040 Vienna, Austria 10.3762/bjnano.14.13 Abstract Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries

• , these improvements have yet to find a practical way to AFM. As a solution, we investigate here a mechanism in which individual mechanical eigenmodes of a microcantilever couple to one another, mimicking optomechanical techniques to reduce thermal noise. We have a look at the most commonly used modes in

• AFM, starting with the first two flexural modes of cantilevers and asses the impact of an amplified coupling between them. In the following, we expand our investigation to the sea of eigenmodes available in the same structure and find a maximum coupling of 9.38 × 103 Hz/nm between two torsional modes

Characterisation of a micrometer-scale active plasmonic element by means of complementary computational and experimental methods

• Ciarán Barron,
• Giulia Di Fazio,
• Samuel Kenny,
• Silas O’Toole,
• Robin O’Reilly and
• Dominic Zerulla

Beilstein J. Nanotechnol. 2023, 14, 110–122, doi:10.3762/bjnano.14.12

• distribution is investigated by means of scanning Joule expansion microscopy (SJEM) [32]. The technique provides a method to obtain the relative temperature distribution at the nanoscale starting from the measurement of induced thermal expansion, which can be directly mapped in a standard AFM-based image using

• on a sapphire substrate via physical vapour deposition (PVD). After this, two separate AFMs are used to machine channels in the silver film to create the desired constriction, which in this case measures 10 μm. The tip of the AFM is held at a set loading force in contact with the thin metal film and

• temperature distribution surrounding the active element through SJEM mapping the thermal expansion of the metallic surface using an AFM. Both methods are further reinforced through the use of three-dimensional simulations. A description of the experimental methods of both investigations is detailed below as

Liquid phase exfoliation of talc: effect of the medium on flake size and shape

• Samuel M. Sousa,
• Helane L. O. Morais,
• Joyce C. C. Santos,
• Ana Paula M. Barboza,
• Bernardo R. A. Neves,
• Elisângela S. Pinto and
• Mariana C. Prado

Beilstein J. Nanotechnol. 2023, 14, 68–78, doi:10.3762/bjnano.14.8

• boiling point, butanone leaves less residues when exfoliated flakes are deposited onto substrates for atomic force microscopy (AFM) measurements. Table 1 summarizes the solutions tested here, and details of the sample preparation can be found in the Experimental section. Liquid exfoliation of talc Talc

• . Thick flakes (>100 nm) must be removed to implement a semi-automated analysis of thousands of flakes based on AFM images that provide a robust statistical representation of the sample [24][25]. At the same time, the removal of flakes that are few to tens of nanometers thick would make the effect of

• Figure 2 shows the results obtained for each exfoliation medium. Figure 2a–d shows AFM topographical images of samples exfoliated in butanone, SC1, SC6, and Triton-X100, respectively. A single vertical scale was chosen to facilitate the visualization of flakes of different thicknesses in all samples. The

Gap-directed chemical lift-off lithographic nanoarchitectonics for arbitrary sub-micrometer patterning

• Chang-Ming Wang,
• Hong-Sheng Chan,
• Chia-Li Liao,
• Che-Wei Chang and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2023, 14, 34–44, doi:10.3762/bjnano.14.4

• Schottky Field Emission Scanning Electron Microscope, Tokyo, Japan) is used, but for sub-100 nm features AFM is employed to avoid the heavy influence of high-energy electron beams on molecular patterns in imaging. The straightness of the obtained lines is also assessed by calculating the linear regression

• of pattern edges. Coordinates of 10 evenly spaced points on edges of line features are extracted and a regression line is obtained. The R2 values are calculated to be at least 0.9858 for all line borders shown in the AFM images of Figure 4, indicating the straight pattern edges and faithful transfers

• characterized by SEM for feature line width of (B) 150 nm and by AFM for feature line widths (C) 80 nm (D) 50 nm (E) 35 nm, and (F) 5 nm. Scale bar is 2 μm (B) and (C), and 100 nm (D–F). Illustration of the gap-directed chemical lift-off lithography process. (A) The selective removal of alkanethiols from an Au

Electrical and optical enhancement of ITO/Mo bilayer thin films via laser annealing

• Abdelbaki Hacini,
• Ahmad Hadi Ali,
• Nurul Nadia Adnan and
• Nafarizal Nayan

Beilstein J. Nanotechnol. 2022, 13, 1589–1595, doi:10.3762/bjnano.13.133

• AFM analysis shows that grain size and RMS roughness increased from 16.02 to 36.19 nm and 0.4 to 2.6 nm, respectively, when the laser energy was increased to 120 mJ. The as-deposited sample has an optical transmittance of nearly 80% in the 300–800 nm range. The laser annealing yielded a higher

• roughness of the bilayer structure were studied utilizing an atomic force microscope (AFM, Bruker Dimension Edge) and the Gwyddion software. The optical transmission was measured using an UV–vis spectrophotometer (UV-3600i Plus, SHIMADZU) in the range of λ = 300–800 nm. Finally, the electrical properties

• 3.21 × 1014 lines/m2. Figure 2 displays the surface morphology in 3D images of ITO/Mo for the as-deposited and annealed samples. These images were scanned over an area of 1.0 × 1.0 µm using AFM. Figure 2 shows the different morphologies for as-deposited and annealed samples using a laser for different

From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111)

• Alfred J. Weymouth,
• Emily Roche and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2022, 13, 1572–1577, doi:10.3762/bjnano.13.131

• of one-dimensional quantum wells, our analysis shows that this state does not act as a free electron gas and that the features are instead localized above individual PTCDA molecules. Keywords: AFM; copper phthalocyanine; dI/dV; PTCDA; STM; Introduction Organic semiconductor devices typically

• -precision STM and atomic force microscopy (AFM) scanning. Third, CuPc and PTCDA are known to form commensurate phases on flat metal surfaces. In particular, they have been well studied at different stoichiometries on Ag(111) [16]. Henneke and co-workers showed that more than 0.15 ML of PTCDA in addition to

• to CuPc within each unit cell, called the P2C phase [16]. A STM and AFM investigation of single CuPc and PTCDA molecules on a thin insulating layer interestingly showed little change of the dI/dV spectra (features shifted, but were preserved) or of the corresponding dI/dV images when the two

Induced electric conductivity in organic polymers

• Konstantin Y. Arutyunov,
• Anatoli S. Gurski,
• Vladimir V. Artemov,
• Alexander L. Vasiliev,
• Azat R. Yusupov,
• Danfis D. Karamov and
• Alexei N. Lachinov

Beilstein J. Nanotechnol. 2022, 13, 1551–1557, doi:10.3762/bjnano.13.128

• microscopy (AFM) using an earlier described methodology [5]. The study of the film morphology showed that they are homogeneous, and within the entire thickness range from 3 nm to 1 µm the films are solid, without significant defects and/or pin holes. The observation confirms the good film-forming properties

Frequency-dependent nanomechanical profiling for medical diagnosis

• Santiago D. Solares and
• Alexander X. Cartagena-Rivera

Beilstein J. Nanotechnol. 2022, 13, 1483–1489, doi:10.3762/bjnano.13.122

• Bioengineering, National Institutes of Health, Bethesda, Maryland, USA 10.3762/bjnano.13.122 Abstract Atomic force microscopy (AFM), developed in the early 1980s, has become a powerful characterization tool in micro- and nanoscale science. In the early 1990s, its relevance within biology and medicine research

• healthcare strategies that link routine AFM measurements with computer analysis, real-time communication with healthcare providers, and medical databases. This approach would be appropriate for diseases such as cancer, lupus, arteriosclerosis and arthritis, among others, which bring about significant

• mechanical changes in the affected tissues. Keywords: atomic force microscopy; healthcare; mechanical properties; mechanobiology; medical diagnosis; Introduction Since its invention in the early 1980s, atomic force microscopy (AFM) has been extensively used for topographical, mechanical, electrical, and

Laser-processed antiadhesive bionic combs for handling nanofibers inspired by nanostructures on the legs of cribellate spiders

• Sebastian Lifka,
• Kristóf Harsányi,
• Erich Baumgartner,
• Lukas Pichler,
• Dariya Baiko,
• Karsten Wasmuth,
• Johannes Heitz,
• Marco Meyer,
• Anna-Christin Joel,
• Jörn Bonse and
• Werner Baumgartner

Beilstein J. Nanotechnol. 2022, 13, 1268–1283, doi:10.3762/bjnano.13.105

• Microsoft Excel. Details are presented in Table S2 in Supporting Information File 1. To investigate the effects of the surface texture on the measured peel-off force in more detail, the surfaces of the Al alloy and the Ti alloy samples were investigated by means of atomic force microscopy (AFM). The

• arithmetic average roughness (Ra), the quadratic average roughness (Rq) and the maximum height (Ry) were measured; the results are shown in Table 3. The results of the AFM measurements revealed that the LIPSS covering the Al alloy surface are rather flat. Ry, which represents basically double the amplitude a

• alloy samples, as well as the LIPSS-covered Al alloy sample were investigated by means of AFM on a Nanosurf Mobile S device (Nanosurf AG, Liestal, Switzerland). The investigated area had a size of 30 µm × 30 µm. The measurements were performed in contact mode with a Contr10 (Nanoworld, Neuchatel

Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• Ke Xu Yuzhe Liu School of Electrical & Control Engineering, Shenyang Jianzhu University, Shenyang 110168, China 10.3762/bjnano.13.104 Abstract As a tool that can test insulators' surface morphology and properties, the performance index of atomic force microscope (AFM) probes is the most critical

• and disadvantages of the improved probes compared with ordinary probes by comparing the differences in spatial resolution, sensitivity, imaging, and other performance aspects, and finally provides an outlook on the future development of AFM probes. This paper promotes the development of AFM probes in

• the direction of new probes and further promotes the broader and deeper application of scanning probe microscope (SPM). Keywords: AFM; carbon nanotube probe; colloid probe; metal probe; Introduction AFM represents a well-established technique for the investigation of the nanosurface morphology