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Search for "force microscopy" in Full Text gives 620 result(s) in Beilstein Journal of Nanotechnology. Showing first 200.

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH3)2Cl]2

  • Elif Bilgilisoy,
  • Ali Kamali,
  • Thomas Xaver Gentner,
  • Gerd Ballmann,
  • Sjoerd Harder,
  • Hans-Peter Steinrück,
  • Hubertus Marbach and
  • Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

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  • three experiments. The FEBID structures were investigated by SEM and noncontact atomic force microscopy (AFM). Figure 3a shows the SEM images of the deposits along with the respective deposition parameters. Magnified sections from these SEM images are shown in Figure 3b. Auger electron spectroscopy was
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Published 06 Dec 2023

Spatial variations of conductivity of self-assembled monolayers of dodecanethiol on Au/mica and Au/Si substrates

  • Julian Skolaut,
  • Jędrzej Tepper,
  • Federica Galli,
  • Wulf Wulfhekel and
  • Jan M. van Ruitenbeek

Beilstein J. Nanotechnol. 2023, 14, 1169–1177, doi:10.3762/bjnano.14.97

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  • electronics. A common test bed for fundamental investigations on how to acquire this conductivity are alkanethiol layers on gold substrates. A widely used approach in measuring the conductivity of a molecular layer is conductive atomic force microscopy. Using this method, we investigate the influence of a
  • /Si; conductive atomic force microscopy; dodecanethiol; self-assembled monolayers; Introduction For decades, the need for miniaturization of electronics has pushed the research field into the direction of bottom-up, rather than top-down, approaches. In this research field, molecular electronics [1][2
  • applied method uses conductive atomic force microscopy (CAFM). In this technique, a conductive probe is used in an AFM, which allows for imaging the surface topography (and other characteristics such as adhesion and stiffness) with lateral resolution while simultaneously being able to measure current
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Published 05 Dec 2023

Hierarchically patterned polyurethane microgrooves featuring nanopillars or nanoholes for neurite elongation and alignment

  • Lester Uy Vinzons,
  • Guo-Chung Dong and
  • Shu-Ping Lin

Beilstein J. Nanotechnol. 2023, 14, 1157–1168, doi:10.3762/bjnano.14.96

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  • uncrosslinked PDMS monomers (Supporting Information File 1, Figure S3C). Atomic force microscopy (AFM) scans of the samples (Figure 1F–H) show that the nanopillars and nanoholes have sub-micrometer feature sizes and a periodicity of around 1.2 µm. Due to AFM measurement artifacts, especially for lateral
  • ) Cross-sectional profile of the flat (F), nanopillar (G), and nanohole (H) PU surface from atomic force microscopy scans, showing the dimensions of the nanostructures (G, H). (Dimensions in parentheses were obtained from SEM images in Supporting Information File 1, Figure S4.) (I) Water contact angles on
  • microgroove (C), pillar–groove (D), and hole–groove (E) substrates, with corresponding high-magnification images (insets). (F–H) Cross-sectional profile of the microgroove (F), pillar–groove (G), and hole–groove (H) PU surface from atomic force microscopy scans, showing the dimensions of the structures. (I, J
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Published 29 Nov 2023

Elasticity, an often-overseen parameter in the development of nanoscale drug delivery systems

  • Agnes-Valencia Weiss and
  • Marc Schneider

Beilstein J. Nanotechnol. 2023, 14, 1149–1156, doi:10.3762/bjnano.14.95

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  • article, we discuss examples highlighting the influence of elasticity in nanoscale biological interactions focusing on mucosal delivery and on tumor targeting. Besides this, we discuss the influence of different measurement settings using atomic force microscopy for the determination of mechanical
  • properties of drug carriers. Keywords: atomic force microscopy; drug delivery; elasticity; mechanical properties; nanomedicine; nanoparticles; stiffness measurement; tissue/body distribution; Introduction Drug delivery systems are developed with the aim to transport a given drug to the site of action
  • determine mechanical properties of nanoparticles (or their corresponding bulk materials) highlighting quartz crystal microbalance, rheology, and atomic force microscopy (AFM) are summarized by Li et al. [18]. Another often reported method is particle deformability, being extrusion a possibility for
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Published 23 Nov 2023

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

  • François Piquemal,
  • Khaled Kaja,
  • Pascal Chrétien,
  • José Morán-Meza,
  • Frédéric Houzé,
  • Christian Ulysse and
  • Abdelmounaim Harouri

Beilstein J. Nanotechnol. 2023, 14, 1141–1148, doi:10.3762/bjnano.14.94

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  • work, we demonstrate the development of a multi-resistance reference sample for calibrating resistance measurements in conductive probe atomic force microscopy (C-AFM) covering the range from 100 Ω to 100 GΩ. We present a comprehensive protocol for in situ calibration of the whole measurement circuit
  • : calibration; conductive probe atomic force microscopy; measurement protocol; nanoscale; resistance reference; Introduction Since its introduction thirty years ago by Murrell et al. [1], conductive probe atomic force microscopy (C-AFM) has evolved into a unique and powerful technique for measuring local
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Published 22 Nov 2023

Dual-heterodyne Kelvin probe force microscopy

  • Benjamin Grévin,
  • Fatima Husainy,
  • Dmitry Aldakov and
  • Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

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  • Benjamin Grevin Fatima Husainy Dmitry Aldakov Cyril Aumaitre Univ. Grenoble Alpes, CNRS, CEA, IRIG-SyMMES, 38000 Grenoble, France 10.3762/bjnano.14.88 Abstract We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the
  • ; intermodulation; KPFM; nc-AFM; surface photovoltage; time-resolved measurements; Introduction Kelvin probe force microscopy (KPFM) is a well-known variant of AFM that allows probing at the nanoscale the electrostatic landscape on the surface of a sample by measuring the so-called contact potential difference
  • optoelectronic interfaces formed between caesium lead bromide perovskite nanosheets and highly oriented pyrolytic graphite. Kelvin Probe Force Microscopy Background, Amplitude-Modulated Heterodyne KPFM Many KPFM modes rely on the detection of a modulated component of the electrostatic force proportional to the
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Published 07 Nov 2023

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

  • Zeinab Eftekhari,
  • Nasim Rezaei,
  • Hidde Stokkel,
  • Jian-Yao Zheng,
  • Andrea Cerreta,
  • Ilka Hermes,
  • Minh Nguyen,
  • Guus Rijnders and
  • Rebecca Saive

Beilstein J. Nanotechnol. 2023, 14, 1059–1067, doi:10.3762/bjnano.14.87

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  • In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated by the photodiode as well as the resulting
  • mechanical oscillation of the piezoelectric membrane with vertical atomic resolution in real-time. This technique offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale. Furthermore, time-dependent atomic force microscopy (AFM) was employed to
  • spatially map voltage-induced oscillation of various sizes of piezoelectric membranes without the photodiode to investigate their position- and size-dependent displacement. Keywords: Kelvin probe force microscopy (KPFM); light-driven micro/nano systems; piezoelectric membrane; surface photovoltage (SPV
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Published 06 Nov 2023

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

  • Michael R. Roenbeck and
  • Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

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  • Kevlar® K29 fibers, we find remarkable differences between the internal structures of the two fibers, and posit connections between our measurements and multifunctional performance studies from the literature. Keywords: atomic force microscopy; correlative characterization; high-performance fibers
  • , overcutting leads to transverse failures near the notches without producing an internal shear plane. Multifrequency atomic force microscopy scanning The exposed internal surfaces of FIB-notched fibers were scanned using a Cypher AFM with an ARC2 controller (Asylum Research). Olympus AC200TS cantilevers (k ≈ 9
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Published 05 Oct 2023

Upscaling the urea method synthesis of CoAl layered double hydroxides

  • Camilo Jaramillo-Hernández,
  • Víctor Oestreicher,
  • Martín Mizrahi and
  • Gonzalo Abellán

Beilstein J. Nanotechnol. 2023, 14, 927–938, doi:10.3762/bjnano.14.76

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  • CoAl-based LDH synthesis through an ARR method had been demonstrated, morphological aspects were addressed by means of scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atomic force microscopy (AFM) (Figure 4 and Figure 5). For reference x1, well-defined hexagonal single
  • microscope at an accelerating voltage of 20 kV. Atomic force microscopy (AFM) AFM was carried out with a Bruker Dimension Icon microscope in scan-assist-mode. A Bruker Scanasyst-Air silicon tip with a diameter of around 10 nm was used to obtain images with a resolution of 512 × 512 or 1024 × 1024 pixels. The
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Published 11 Sep 2023

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

  • Mattia da Lisca,
  • José Alvarez,
  • James P. Connolly,
  • Nicolas Vaissiere,
  • Karim Mekhazni,
  • Jean Decobert and
  • Jean-Paul Kleider

Beilstein J. Nanotechnol. 2023, 14, 725–737, doi:10.3762/bjnano.14.59

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  • consisting of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. In this work, we apply frequency-modulated Kelvin probe force microscopy under ambient conditions to investigate the capability of this
  • photogenerated carrier distributions. The analysis of the KPFM data was assisted by means of theoretical modelling simulating the energy bands profile and KPFM measurements. Keywords: FM-KPFM; frequency-modulated Kelvin probe force microscopy; III–V multilayer stack; Kelvin probe modelling; KP modelling; SPV
  • measurements based on scanning probe microscopy (SPM) allow for the analysis of two-dimensional (2D) features at the surface and along a physical cross section of nanoscale semiconductor structures. Among the wide variety of SPM techniques available [3], Kelvin probe force microscopy (KPFM) is an application
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Published 14 Jun 2023

A graphene quantum dots–glassy carbon electrode-based electrochemical sensor for monitoring malathion

  • Sanju Tanwar,
  • Aditi Sharma and
  • Dhirendra Mathur

Beilstein J. Nanotechnol. 2023, 14, 701–710, doi:10.3762/bjnano.14.56

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  • hydrothermal process with glucose as a precursor undergoing carbonization. Different spectroscopic techniques were used to analyze the optical characteristics of GQDs, including UV–visible, photoluminescence, FTIR, and Raman spectroscopy. Atomic force microscopy, transmission electron microscopy, and X-ray
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Published 09 Jun 2023

Humidity-dependent electrical performance of CuO nanowire networks studied by electrochemical impedance spectroscopy

  • Jelena Kosmaca,
  • Juris Katkevics,
  • Jana Andzane,
  • Raitis Sondors,
  • Liga Jasulaneca,
  • Raimonds Meija,
  • Kiryl Niherysh,
  • Yelyzaveta Rublova and
  • Donats Erts

Beilstein J. Nanotechnol. 2023, 14, 683–691, doi:10.3762/bjnano.14.54

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  • electron microscopy (SEM, Hitachi S4800) and atomic force microscopy (AFM, Asylum Research MFP-3D). Electrochemical impedance measurements were performed under various atmospheric conditions in a custom-made system described elsewhere [28]. The main system parameters were RH from 4% to 97%, gas flow from
  • . Atomic force microscopy: (g) a bundle of CuO nanowires between microelectrodes and (h) a height profile scan across the bundle. Impedance spectra measured for the system of CuO nanowire networks on microelectrodes at fixed T (30 °C) and various RH (5%, 20%, 50%, 73%, and 95%). Dotted lines connect
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Published 05 Jun 2023

Suspension feeding in Copepoda (Crustacea) – a numerical model of setae acting in concert

  • Alexander E. Filippov,
  • Wencke Krings and
  • Stanislav N. Gorb

Beilstein J. Nanotechnol. 2023, 14, 603–615, doi:10.3762/bjnano.14.50

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  • -resolution CLSM imaging or atomic force microscopy. As it was visualized by CLSM [55][56][57], the basal parts of some short and long setae appear to be relatively soft and seem to contain resilin or other proteins. This should influence the mobility of the rotating setae. To account for this in the
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Published 17 May 2023

SERS performance of GaN/Ag substrates fabricated by Ag coating of GaN platforms

  • Magdalena A. Zając,
  • Bogusław Budner,
  • Malwina Liszewska,
  • Bartosz Bartosewicz,
  • Łukasz Gutowski,
  • Jan L. Weyher and
  • Bartłomiej J. Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 552–564, doi:10.3762/bjnano.14.46

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  • substrates fabricated using both methods, we attempted to prepare substrates with a comparable amount of deposited Ag, which was examined and controlled using atomic force microscopy (AFM). For this purpose, additional Ag layers were deposited on flat Si substrates. Based on the measured thickness of the Ag
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Published 03 May 2023

Carbon nanotube-cellulose ink for rapid solvent identification

  • Tiago Amarante,
  • Thiago H. R. Cunha,
  • Claudio Laudares,
  • Ana P. M. Barboza,
  • Ana Carolina dos Santos,
  • Cíntia L. Pereira,
  • Vinicius Ornelas,
  • Bernardo R. A. Neves,
  • André S. Ferlauto and
  • Rodrigo G. Lacerda

Beilstein J. Nanotechnol. 2023, 14, 535–543, doi:10.3762/bjnano.14.44

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  • length of 5 μm were produced at CTNano/UFMG [59][60][61]. Morphological analysis was carried out by scanning electron microscopy (SEM) in a Quanta 200 FEG, using secondary electrons between 2 and 10 kV. Atomic force microscopy (AFM) was carried out on a Bruker MultiMode8 SPM using the intermittent
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Published 26 Apr 2023

On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets

  • Keith R. Paton,
  • Konstantinos Despotelis,
  • Naresh Kumar,
  • Piers Turner and
  • Andrew J. Pollard

Beilstein J. Nanotechnol. 2023, 14, 509–521, doi:10.3762/bjnano.14.42

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  • widely used characterization tool for GR2Ms [8]. A search of Web of Science showed that of 97,532 articles published in the last five years with “Graphene” in the abstract, 9.3% also mentioned “Raman”. This is compared with atomic force microscopy (AFM) (2.4%), scanning electron microscopy (SEM) (11.4
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Published 24 Apr 2023

High–low Kelvin probe force spectroscopy for measuring the interface state density

  • Ryo Izumi,
  • Masato Miyazaki,
  • Yan Jun Li and
  • Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

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  • Ryo Izumi Masato Miyazaki Yan Jun Li Yasuhiro Sugawara Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan 10.3762/bjnano.14.18 Abstract The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation
  • surfaces to confirm the dependence of the electrostatic force on the frequency of the AC bias voltage and obtain the interface state density. Keywords: high–low Kelvin probe force microscopy; high–low Kelvin probe force spectroscopy; interface state density; Kelvin probe force microscopy; Kelvin probe
  • [1][2][3]. Therefore, direct observation of semiconductor surfaces with nanoscale spatial resolution will become even more important for understanding and controlling the effects of these properties on devices and for evaluating semiconductor device operation. Kelvin probe force microscopy (KPFM) is
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Published 31 Jan 2023

Structural, optical, and bioimaging characterization of carbon quantum dots solvothermally synthesized from o-phenylenediamine

  • Zoran M. Marković,
  • Milica D. Budimir,
  • Martin Danko,
  • Dušan D. Milivojević,
  • Pavel Kubat,
  • Danica Z. Zmejkoski,
  • Vladimir B. Pavlović,
  • Marija M. Mojsin,
  • Milena J. Stevanović and
  • Biljana M. Todorović Marković

Beilstein J. Nanotechnol. 2023, 14, 165–174, doi:10.3762/bjnano.14.17

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  • 2.2 mg/mL. These specimens were designated as CQDs/PU. For bioimaging studies, toluene was evaporated, and a thin film of CQDs was redissolved in water and filtered. The prepared QCD samples were characterized by transmission electron microscopy (TEM), atomic force microscopy (AFM), Fourier
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Published 30 Jan 2023

Intermodal coupling spectroscopy of mechanical modes in microcantilevers

  • Ioan Ignat,
  • Bernhard Schuster,
  • Jonas Hafner,
  • MinHee Kwon,
  • Daniel Platz and
  • Ulrich Schmid

Beilstein J. Nanotechnol. 2023, 14, 123–132, doi:10.3762/bjnano.14.13

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  • Ioan Ignat Bernhard Schuster Jonas Hafner MinHee Kwon Daniel Platz Ulrich Schmid Institute of Sensor and Actuator Systems, TU Wien, Gußhaustraße 27–29, 1040 Vienna, Austria 10.3762/bjnano.14.13 Abstract Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries
  • . Through such findings we aim to expand the field of multifrequency AFM with innumerable possibilities leading to improved signal-to-noise ratios, all accessible with no additional hardware. Keywords: atomic force microscopy; intermodal coupling; nonlinear mechanics; optomechanics; sideband cooling
  • ; Introduction Atomic force microscopy has established itself as one of the most powerful tools in nanotechnology. With meticulous setups amassing techniques such as ultra high vacuum, cryogenic temperatures, and CO-terminated tips, it is able to create a wonderful vista of surfaces, not missing the atoms for
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Published 19 Jan 2023

Liquid phase exfoliation of talc: effect of the medium on flake size and shape

  • Samuel M. Sousa,
  • Helane L. O. Morais,
  • Joyce C. C. Santos,
  • Ana Paula M. Barboza,
  • Bernardo R. A. Neves,
  • Elisângela S. Pinto and
  • Mariana C. Prado

Beilstein J. Nanotechnol. 2023, 14, 68–78, doi:10.3762/bjnano.14.8

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  • based on atomic force microscopy images of thousands of flakes, the shape and size distribution of nanotalc obtained using the four different media are compared. This comparison highlights the strengths and weaknesses of the media tested and hopefully will facilitate the choice of the medium for
  • applications that have specific requirements. Keywords: 2D materials; atomic force microscopy; liquid phase exfoliation; nanomaterials; talc; Introduction Two-dimensional (2D) materials have attracted a lot of interest due to their outstanding properties [1]. However, large-scale production is still a
  • solution, and butanone. The mechanical energy necessary to delaminate the mineral was provided by an ultrasonic bath. We report a statistical analysis of the dimensions (measured by atomic force microscopy) of the nanoflakes obtained employing the four routes, evidencing that the exfoliation medium has an
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Published 09 Jan 2023

Gap-directed chemical lift-off lithographic nanoarchitectonics for arbitrary sub-micrometer patterning

  • Chang-Ming Wang,
  • Hong-Sheng Chan,
  • Chia-Li Liao,
  • Che-Wei Chang and
  • Wei-Ssu Liao

Beilstein J. Nanotechnol. 2023, 14, 34–44, doi:10.3762/bjnano.14.4

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  • force microscopy (Dimension Fastscan, Bruker Nano Surfaces, Hsinchu, Taiwan). Results and Discussion The results of selective SAM removal are visualized by backfilling biotinylated alkanethiol (BAT) molecules into the post lift-off regions followed by conjugating streptavidin and FITC-labeled anti
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Published 04 Jan 2023

From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111)

  • Alfred J. Weymouth,
  • Emily Roche and
  • Franz J. Giessibl

Beilstein J. Nanotechnol. 2022, 13, 1572–1577, doi:10.3762/bjnano.13.131

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  • -precision STM and atomic force microscopy (AFM) scanning. Third, CuPc and PTCDA are known to form commensurate phases on flat metal surfaces. In particular, they have been well studied at different stoichiometries on Ag(111) [16]. Henneke and co-workers showed that more than 0.15 ML of PTCDA in addition to
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Published 22 Dec 2022

Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy

  • Nobuyuki Ishida

Beilstein J. Nanotechnol. 2022, 13, 1558–1563, doi:10.3762/bjnano.13.129

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  • electrodes. In Kelvin probe force microscopy (KPFM) measurements on electrochemical cells, the surface potential is generally measured relative to electrical ground instead of a stable reference. Here, we show that the changes in the surface potential, measured using KPFM relative to the surface potential in
  • . Keywords: electrochemistry; Kelvin probe force microscopy (KPFM); reference electrode; solid electrolyte; Introduction Kelvin probe force microscopy (KPFM) is a scanning probe technique for imaging surface potentials on the nanometer scale [1][2][3][4]. Its operating principle is based on detecting the
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Published 19 Dec 2022

Induced electric conductivity in organic polymers

  • Konstantin Y. Arutyunov,
  • Anatoli S. Gurski,
  • Vladimir V. Artemov,
  • Alexander L. Vasiliev,
  • Azat R. Yusupov,
  • Danfis D. Karamov and
  • Alexei N. Lachinov

Beilstein J. Nanotechnol. 2022, 13, 1551–1557, doi:10.3762/bjnano.13.128

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  • atomic force microscopy. In some cases, it was possible to observe regions with surface macromolecular (quasicrystalline) ordering [7]. The remarkable property of PDP is that, depending on the length of certain atomic bonds, its molecule can exist in several spatial configurations. Under normal
  • , associates of macromolecules are formed in the solution, and the influence of adhesion processes decreases, but the cohesive forces increase. In the entire thickness range from 3 nm to 1 µm, the films are solid, without significant defects and/or pin holes. The polymer films were studied by atomic force
  • microscopy (AFM) using an earlier described methodology [5]. The study of the film morphology showed that they are homogeneous, and within the entire thickness range from 3 nm to 1 µm the films are solid, without significant defects and/or pin holes. The observation confirms the good film-forming properties
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Published 19 Dec 2022

Frequency-dependent nanomechanical profiling for medical diagnosis

  • Santiago D. Solares and
  • Alexander X. Cartagena-Rivera

Beilstein J. Nanotechnol. 2022, 13, 1483–1489, doi:10.3762/bjnano.13.122

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  • Bioengineering, National Institutes of Health, Bethesda, Maryland, USA 10.3762/bjnano.13.122 Abstract Atomic force microscopy (AFM), developed in the early 1980s, has become a powerful characterization tool in micro- and nanoscale science. In the early 1990s, its relevance within biology and medicine research
  • mechanical changes in the affected tissues. Keywords: atomic force microscopy; healthcare; mechanical properties; mechanobiology; medical diagnosis; Introduction Since its invention in the early 1980s, atomic force microscopy (AFM) has been extensively used for topographical, mechanical, electrical, and
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Published 09 Dec 2022
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