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Search for "ion beam" in Full Text gives 222 result(s) in Beilstein Journal of Nanotechnology. Showing first 200.

Effect of localized helium ion irradiation on the performance of synthetic monolayer MoS2 field-effect transistors

  • Jakub Jadwiszczak,
  • Pierce Maguire,
  • Conor P. Cullen,
  • Georg S. Duesberg and
  • Hongzhou Zhang

Beilstein J. Nanotechnol. 2020, 11, 1329–1335, doi:10.3762/bjnano.11.117

Graphical Abstract
  • study of the electrical performance of chemically synthesized monolayer molybdenum disulfide (MoS2) field-effect transistors irradiated with a focused helium ion beam as a function of increasing areal irradiation coverage. We determine an optimal coverage range of approx. 10%, which allows for the
  • improvement of both the carrier mobility in the transistor channel and the electrical conductance of the MoS2, due to doping with ion beam-created sulfur vacancies. Larger areal irradiations introduce a higher concentration of scattering centers, hampering the electrical performance of the device. In addition
  • , we find that irradiating the electrode–channel interface has a deleterious impact on charge transport when contrasted with irradiations confined only to the transistor channel. Keywords: 2D materials; contacts; defect engineering; helium ion microscope; ion beam doping; vacancies; two-dimensional
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Published 04 Sep 2020

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

  • Santiago H. Andany,
  • Gregor Hlawacek,
  • Stefan Hummel,
  • Charlène Brillard,
  • Mustafa Kangül and
  • Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

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  • Santiago H. Andany Gregor Hlawacek Stefan Hummel Charlene Brillard Mustafa Kangul Georg E. Fantner Laboratory for Bio- and Nano-Instrumentation, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne CH-1015, Switzerland Institute of Ion Beam Physics and Materials Research, Helmholtz
  • for nanomechanical property mapping, as well as for electrical and magnetic characterization of the sample after focused ion beam materials modification with the HIM. The experimental setup is described and evaluated through a series of correlative experiments, demonstrating the feasibility of the
  • technique with electron beam and ion beam techniques for correlative nanoscale characterization and nanoscale fabrication. The motivation was driven by the new opportunity to investigate and transform features in situ with complementary techniques, thus revealing maximum information without breaking the
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Published 26 Aug 2020

3D superconducting hollow nanowires with tailored diameters grown by focused He+ beam direct writing

  • Rosa Córdoba,
  • Alfonso Ibarra,
  • Dominique Mailly,
  • Isabel Guillamón,
  • Hermann Suderow and
  • José María De Teresa

Beilstein J. Nanotechnol. 2020, 11, 1198–1206, doi:10.3762/bjnano.11.104

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  • tungsten carbide nanowires with tailored diameters by tuning two key growth parameters, namely current and dose of the ion beam. Our results show the control of geometry in 3D hollow nanowires, with outer and inner diameters ranging from 36 to 142 nm and from 5 to 28 nm, respectively; and lengths from 0.5
  • nano-antennas and sensors, based on 3D superconducting architectures. Keywords: electron tomography; focused ion beam induced deposition (FIBID); helium ion microscope; magneto-transport measurements; nano-superconductors; tungsten carbide (WC); Introduction Superconductors are dissipationless
  • dramatically, mostly due to the complex fabrication and characterization. A technique successfully utilized for fabricating 3D nano-objects is direct writing by a focused beam of positively charged particles, the so-called focused-ion-beam induced deposition (FIBID) [20]. A very promising development of FIBID
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Published 11 Aug 2020

A Josephson junction based on a highly disordered superconductor/low-resistivity normal metal bilayer

  • Pavel M. Marychev and
  • Denis Yu. Vodolazov

Beilstein J. Nanotechnol. 2020, 11, 858–865, doi:10.3762/bjnano.11.71

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  • -thickness SN-N-SN bilayer in which the superconducting layer is partially (or entirely) etched by means of a focused ion beam. A sufficiently thick normal metal layer act as a good thermal bath, which yields a nonhysteretic current–voltage characteristic even at low temperatures. However, the increase of
  • about 5 nm, which is smaller than ξc in NbN, with the help of helium ion beam lithography. The successful implementation of this method could lead to the creation of low-temperature nanoscale Josephson junctions and arrays of them. For example, SN-S-SN junctions can be promising to use in programmable
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Published 02 Jun 2020

A set of empirical equations describing the observed colours of metal–anodic aluminium oxide–Al nanostructures

  • Cristina V. Manzano,
  • Jakob J. Schwiedrzik,
  • Gerhard Bürki,
  • Laszlo Pethö,
  • Johann Michler and
  • Laetitia Philippe

Beilstein J. Nanotechnol. 2020, 11, 798–806, doi:10.3762/bjnano.11.64

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  • (yielding to the same porosity), changing only the second anodization time (from 120 to 600 s) to obtain different film thicknesses (from 209 ± 12 nm to 380 ± 15 nm). Focused ion beam (FIB) milling and field-emission scanning electron microscopy (FESEM) imaging were used to accurately determine the
  • focused ion beam (FIB) instrument (TESCAN Lyra, Brno, Czech Republic) with a gallium source at 30 kV and 180–400 pA. 2 µm of platinum was deposited to protect the surface prior to FIB cutting. FESEM images were taken in three different areas of the films and three different measurements were carried out
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Published 13 May 2020

Hexagonal boron nitride: a review of the emerging material platform for single-photon sources and the spin–photon interface

  • Stefania Castelletto,
  • Faraz A. Inam,
  • Shin-ichiro Sato and
  • Alberto Boretti

Beilstein J. Nanotechnol. 2020, 11, 740–769, doi:10.3762/bjnano.11.61

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  • the BNNTs, the PL is photostable, althougt the SPE purity is still not exceptional. In [118] SPE in a ball-like 0D BN allotrope with dimensions ≈1–100 nm, known as nanococoon BNNC, is shown. The density of the SPEs was increased by dual-beam focused ion beam and SEM to selectively irradiate the sample
  • controlled formation and properties. Random generation in the material using bubble strain-induced SPEs is also demonstrated in [125]. Focused ion beam irradiation was used to mill holes in the h-BN to achieve array-like SPEs around the perimeter of the holes [126]. This method yield is very high compared to
  • grown on copper, nickel and iron substrates, with a high density of SPEs of ≈100−200 per 10 × 10 µm2 with more defined ZPLs at (580 ± 10) nm. The most promising approaches seem to be the strain-induced methods and the focused ion beam method, possibly combined with low-pressure CVD for more controlled
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Review
Published 08 May 2020

Electromigration-induced directional steps towards the formation of single atomic Ag contacts

  • Atasi Chatterjee,
  • Christoph Tegenkamp and
  • Herbert Pfnür

Beilstein J. Nanotechnol. 2020, 11, 680–687, doi:10.3762/bjnano.11.55

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  • shell effects, can be discriminated. Although the directional motion of atoms during EM leads to specific properties such as the instabilities mentioned, similarities to mechanically opened contacts with respect to cross-sectional stability were found. Keywords: electromigration; focussed ion beam
  • could not be identified visually nor be reproducibly generated. This contrasts with experiments where the smallest constriction was reduced by one order of magnitude down to about 15 nm using a focused ion beam (FIB), i.e., far below the average grain size in the Ag film, in which complex morphological
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Published 22 Apr 2020

Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

  • Matthias Simolka,
  • Hanno Kaess and
  • Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

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  • spectroscopy (EDS or EDX) it adds chemical information on the elemental distribution to the structural analysis. Further methods that have been applied to study ageing in LFP are X-ray photoelectron spectroscopy (XPS), inductively coupled plasma (ICP), transmission electron microscopy (TEM), focused ion beam
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Published 07 Apr 2020

Formation of nanoripples on ZnO flat substrates and nanorods by gas cluster ion bombardment

  • Xiaomei Zeng,
  • Vasiliy Pelenovich,
  • Bin Xing,
  • Rakhim Rakhimov,
  • Wenbin Zuo,
  • Alexander Tolstogouzov,
  • Chuansheng Liu,
  • Dejun Fu and
  • Xiangheng Xiao

Beilstein J. Nanotechnol. 2020, 11, 383–390, doi:10.3762/bjnano.11.29

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  • Ion Beam Application, School of Physics and Technology, Wuhan University, Wuhan 430072, China School of Power & Mechanical Engineering, Wuhan University, Wuhan 430072, China Ryazan State Radio Engineering University, Gagarin Str. 59/1, Ryazan 390005, Russian Federation Centre for Physics and
  • parallel steps or ribs. The more ordered ripple formation on nanorods can be associated with the confinement of the nanorod facets in comparison with the quasi-infinite surface of the flat substrates. Keywords: cluster ion bombardment; gas cluster ion beam; surface ripples; ZnO nanorods; Introduction The
  • -enhanced Raman spectroscopy [4]. Ion beam formation of nanoscale ripples has emerged as a versatile method to imprint uniaxial magnetic anisotropy [5] and to control the magnetic texture of thin films [6]. Formation of self-assembled surface nanoripple structures by monoatomic off-normal ion irradiation
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Published 24 Feb 2020

Nanosecond resistive switching in Ag/AgI/PtIr nanojunctions

  • Botond Sánta,
  • Dániel Molnár,
  • Patrick Haiber,
  • Agnes Gubicza,
  • Edit Szilágyi,
  • Zsolt Zolnai,
  • András Halbritter and
  • Miklós Csontos

Beilstein J. Nanotechnol. 2020, 11, 92–100, doi:10.3762/bjnano.11.9

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  • following the method of Kumar and co-workers [36]. The Ag films were evaporated on standard Si/SiO2 wafers using a 12 nm thick Ti sticking layer. The structural characterization of the thin film samples was carried out by Rutherford backscattering spectrometry (RBS) using an ion beam of 3500 keV 4He
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Published 08 Jan 2020

Mobility of charge carriers in self-assembled monolayers

  • Zhihua Fu,
  • Tatjana Ladnorg,
  • Hartmut Gliemann,
  • Alexander Welle,
  • Asif Bashir,
  • Michael Rohwerder,
  • Qiang Zhang,
  • Björn Schüpbach,
  • Andreas Terfort and
  • Christof Wöll

Beilstein J. Nanotechnol. 2019, 10, 2449–2458, doi:10.3762/bjnano.10.235

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  • . Time-of-flight secondary ion mass spectrometry (TOF-SIMS) measurements were carried out in a TOF-SIMS 5 device (ION-TOF GmbH, Münster, Germany). The spectrometry was performed in static SIMS mode (primary ion beam dose < 2 × 1011 ions/cm2) with Bi3+ primary ions at 25 keV. Spectra were calibrated on
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Published 11 Dec 2019

Gold-coated plant virus as computed tomography imaging contrast agent

  • Alaa A. A. Aljabali,
  • Mazhar S. Al Zoubi,
  • Khalid M. Al-Batanyeh,
  • Ali Al-Radaideh,
  • Mohammad A. Obeid,
  • Abeer Al Sharabi,
  • Walhan Alshaer,
  • Bayan AbuFares,
  • Tasnim Al-Zanati,
  • Murtaza M. Tambuwala,
  • Naveed Akbar and
  • David J. Evans

Beilstein J. Nanotechnol. 2019, 10, 1983–1993, doi:10.3762/bjnano.10.195

Graphical Abstract
  • concentration of 0.01–0.05 mg/mL and deposited on 400 mesh carbon grids (SPI supplies), samples were air dried prior to imaging. Energy-dispersive X-Ray spectroscopy A FIB Scios system was used combined with a scanning electron microscope (SEM) and a focused ion beam equipped with X-MaxN 50 mm2 EDS system to
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Published 07 Oct 2019

Precise local control of liquid crystal pretilt on polymer layers by focused ion beam nanopatterning

  • Maxim V. Gorkunov,
  • Irina V. Kasyanova,
  • Vladimir V. Artemov,
  • Alena V. Mamonova and
  • Serguei P. Palto

Beilstein J. Nanotechnol. 2019, 10, 1691–1697, doi:10.3762/bjnano.10.164

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  • alignment of rubbed polymer layers can be locally flipped to vertical by irradiation with a focused ion beam on a scale of tens of nanometers. Results: We propose a digital method to precisely steer the liquid crystal director tilt at polymer surfaces by combining micrometer-size areas treated with focused
  • ion beam and pristine areas. The liquid crystal tends to average the competing vertical and planar alignment actions and is stabilized with an intermediate pretilt angle determined by the local pattern duty factor. In particular, we create micrometer-sized periodic stripe patterns with this factor
  • techniques such as patterning with nanogrooves [13][14][15] and nanoslits [16], ion-beam irradiation of specific inorganic [17] and polymer [18] substrates, subjecting of photo-controlled aligning polymers to near-threshold doses of ultraviolet radiation [19], formation of surface microdomains from
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Published 12 Aug 2019

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns

  • Michael Mousley,
  • Santhana Eswara,
  • Olivier De Castro,
  • Olivier Bouton,
  • Nico Klingner,
  • Christoph T. Koch,
  • Gregor Hlawacek and
  • Tom Wirtz

Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160

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  • Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf e.V., Bautzner Landstr. 400, 01328 Dresden, Germany Department of Physics, Humboldt University of Berlin, Newtonstraße 15, 12489 Berlin, Germany 10.3762/bjnano.10.160 Abstract A dedicated transmission helium ion microscope
  • impact on the final intensity distribution in the far field. Hence, the different processes contributing to the final intensities will need to be understood in order to decouple and study the relevant ion-beam scattering and deflection phenomena. Keywords: charging; helium ion microscopy; ion
  • The THIM instrument shown schematically in Figure 1 was used to acquire the THIM images of BN nanoparticles adhered to a TEM grid as shown in Figure 2. A video was recorded while varying the Lens 2 voltage (which sets the ion beam focal point) from approximately 5 kV to 9 kV. Simulations with SIMION
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Published 07 Aug 2019

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

  • Wenting Wang,
  • Chengfu Ma,
  • Yuhang Chen,
  • Lei Zheng,
  • Huarong Liu and
  • Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

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  • 11 wt % PMMA in anisole solvent at 1500 rpm for 5 min, resulting in a thickness of approximately 3.5 µm. Then, a 300 nm thick Au film was sputtered on the PMMA substrate by using magnetron sputtering. The Au film was subsequently patterned by focused ion beam (FIB) milling (FEI, Helios NanoLab 650
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Published 07 Aug 2019

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

  • Petr Knotek,
  • Tomáš Plecháček,
  • Jan Smolík,
  • Petr Kutálek,
  • Filip Dvořák,
  • Milan Vlček,
  • Jiří Navrátil and
  • Čestmír Drašar

Beilstein J. Nanotechnol. 2019, 10, 1401–1411, doi:10.3762/bjnano.10.138

Graphical Abstract
  • generated in the analyzer. The work function of the sample was calculated as WF = hν Ecut-off, where Ecut-off was determined from the intersection of the linear extrapolation of the secondary-electron cut-off (SECO) with the background. All samples were sputtered with argon ions using a scanning focused ion
  • beam source in order to remove surface contaminants. A monoatomic argon ion source was utilized with energy of 2 keV, ion current 10 µA, raster area 1 × 1 mm2 and sputtering time 30 s. Results and Discussion Separated metal nanoparticles on the substrate In TE materials the NIs applicable for an
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Published 15 Jul 2019

Gas sensing properties of individual SnO2 nanowires and SnO2 sol–gel nanocomposites

  • Alexey V. Shaposhnik,
  • Dmitry A. Shaposhnik,
  • Sergey Yu. Turishchev,
  • Olga A. Chuvenkova,
  • Stanislav V. Ryabtsev,
  • Alexey A. Vasiliev,
  • Xavier Vilanova,
  • Francisco Hernandez-Ramirez and
  • Joan R. Morante

Beilstein J. Nanotechnol. 2019, 10, 1380–1390, doi:10.3762/bjnano.10.136

Graphical Abstract
  • electrical contacts with individual nanowires [21][22][23][24][25][26][27][28][29][30][31][32][33]. These contacts can be made by means of photolithography, but more often, focused ion beam (FIB) technology is used for this purpose. This approach has several advantages: first, a reliable electrical contact
  • contamination on the sample surfaces. Device manufacture Manufacture of the device based on a single nanowire Individual nanowires were electrically contacted by direct focused-ion beam (FIB) platinum deposition, using an FEI dual beam Strata 235 instrument combined with a metal–organic injector to deposit
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Published 08 Jul 2019

Fabrication of phase masks from amorphous carbon thin films for electron-beam shaping

  • Lukas Grünewald,
  • Dagmar Gerthsen and
  • Simon Hettler

Beilstein J. Nanotechnol. 2019, 10, 1290–1302, doi:10.3762/bjnano.10.128

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  • , which induces unwanted scattering events. Results: Phase masks of conductive amorphous carbon (aC) were successfully fabricated with optical lithography and focused ion beam milling. Analysis by TEM shows the successful generation of Bessel and vortex beams. No charging or degradation of the aC phase
  • structure without any (in-)elastic scattering events, i.e., the amplitude is only modified slightly. Experimentally, focused ion beam (FIB) milling or electron-beam lithography are used to engrave a well-defined thickness profile in an amorphous thin film thereby exploiting the direct proportionality
  • deviations from the desired form because the ideally sharp edges are significantly rounded due to the finite diameter of the ion beam. Application of phase masks Bessel beam phase mask in object plane PMs were first investigated as conventional samples in the object plane of a TEM which allows for a detailed
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Published 25 Jun 2019

CuInSe2 quantum dots grown by molecular beam epitaxy on amorphous SiO2 surfaces

  • Henrique Limborço,
  • Pedro M.P. Salomé,
  • Rodrigo Ribeiro-Andrade,
  • Jennifer P. Teixeira,
  • Nicoleta Nicoara,
  • Kamal Abderrafi,
  • Joaquim P. Leitão,
  • Juan C. Gonzalez and
  • Sascha Sadewasser

Beilstein J. Nanotechnol. 2019, 10, 1103–1111, doi:10.3762/bjnano.10.110

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  • present one line for each element. The STEM lamellae were prepared in a focused ion beam (FIB) FEI Dual-Beam Helios 450S with FIB Mo-grids using a technique known as “lift-out” [35]. To improve FIB preparation and visualization of the nanodots in the STEM, the samples were coated with an amorphous carbon
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Published 22 May 2019

Nanoscale optical and structural characterisation of silk

  • Meguya Ryu,
  • Reo Honda,
  • Adrian Cernescu,
  • Arturas Vailionis,
  • Armandas Balčytis,
  • Jitraporn Vongsvivut,
  • Jing-Liang Li,
  • Denver P. Linklater,
  • Elena P. Ivanova,
  • Vygantas Mizeikis,
  • Mark J. Tobin,
  • Junko Morikawa and
  • Saulius Juodkazis

Beilstein J. Nanotechnol. 2019, 10, 922–929, doi:10.3762/bjnano.10.93

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  • modalities of sample preparation for nanoscale imaging include focused ion beam milling and microtome slicing. When the thickness of samples, especially soft biomaterials, is close to 100 nm the cutting tool might cause tear- and cut-induced strain below the surface. In turn, this can cause artifacts in the
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Published 23 Apr 2019

Periodic Co/Nb pseudo spin valve for cryogenic memory

  • Nikolay Klenov,
  • Yury Khaydukov,
  • Sergey Bakurskiy,
  • Roman Morari,
  • Igor Soloviev,
  • Vladimir Boian,
  • Thomas Keller,
  • Mikhail Kupriyanov,
  • Anatoli Sidorenko and
  • Bernhard Keimer

Beilstein J. Nanotechnol. 2019, 10, 833–839, doi:10.3762/bjnano.10.83

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  • sapphire (Al2O3) substrate. Before the deposition the substrates were etched by an argon ion beam inside the chamber. The targets Nb(99.99%) and Co(99.99%) were presputtered to remove metallic oxides and contamination absorbed on the surfaces. Additionally, immediately before deposition of the next layer
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Letter
Published 09 Apr 2019

On the transformation of “zincone”-like into porous ZnO thin films from sub-saturated plasma enhanced atomic layer deposition

  • Alberto Perrotta,
  • Julian Pilz,
  • Stefan Pachmajer,
  • Antonella Milella and
  • Anna Maria Coclite

Beilstein J. Nanotechnol. 2019, 10, 746–759, doi:10.3762/bjnano.10.74

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  • charging was compensated using a dual beam charge neutralization, with a flux of low-energy electrons (ca. 1 eV) combined with positive Ar ions of very low energy (10 eV). Samples were sputter cleaned for 1 min with an Ar ion beam of 1 kV, 1 µA (raster size: 2 × 2 cm2). The acquired spectra were processed
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Published 21 Mar 2019

Biomimetic synthesis of Ag-coated glasswing butterfly arrays as ultra-sensitive SERS substrates for efficient trace detection of pesticides

  • Guochao Shi,
  • Mingli Wang,
  • Yanying Zhu,
  • Yuhong Wang,
  • Xiaoya Yan,
  • Xin Sun,
  • Haijun Xu and
  • Wanli Ma

Beilstein J. Nanotechnol. 2019, 10, 578–588, doi:10.3762/bjnano.10.59

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  • invaluable in research and industrial application. Researchers have paid attention to physical methods (“top-down” techniques) such as focused ion beam lithography (FIB) [14][15], electron beam lithography (EBL) [16][17] or soft nanoimprint nanolithography (NIL) [18], which can produce controllable shapes
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Published 28 Feb 2019

Nanocomposite–parylene C thin films with high dielectric constant and low losses for future organic electronic devices

  • Marwa Mokni,
  • Gianluigi Maggioni,
  • Abdelkader Kahouli,
  • Sara M. Carturan,
  • Walter Raniero and
  • Alain Sylvestre

Beilstein J. Nanotechnol. 2019, 10, 428–441, doi:10.3762/bjnano.10.42

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  • quantified by Rutherford backscattering spectrometry (RBS). Ion beam analyses of the deposited films were performed using a 2.0 MeV 4He+ beam at the Van de Graaf accelerator at the Laboratori Nazionali di Legnaro, with a scattering angle of 160°. We have to highlight that the Cl content measured with RBS (in
  • atoms·cm−2) is directly converted into the amount of parylene (in monomeric units·cm−2), since each monomeric unit contains one Cl atom. RBS analysis was performed on coatings deposited on silicon substrates. Taking into account the desorption of Cl-containing species from the film occurring during ion
  • beam analysis [72], RBS spectra were acquired by irradiating different spots of the pristine samples and collecting only 0.2 µC of charge on each spot until a total collected charge of a few microcoulombs was reached. A stylus profilometer (Tencor Instruments, model Alpha-Step 200) was used to measure
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Published 12 Feb 2019

Interaction of Te and Se interlayers with Ag or Au nanofilms in sandwich structures

  • Arkadiusz Ciesielski,
  • Lukasz Skowronski,
  • Marek Trzcinski,
  • Ewa Górecka,
  • Wojciech Pacuski and
  • Tomasz Szoplik

Beilstein J. Nanotechnol. 2019, 10, 238–246, doi:10.3762/bjnano.10.22

Graphical Abstract
  • interlaced by Ar-ion etching in order to study the chemical composition of subsequent sublayers. The energy of Ar ions was 4 keV and the incidence angle was 69°. An ion beam scanned an area of 4 × 4 mm in order to etch the analyzed surface homogeneously. The concentration of elements was estimated by fitting
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Published 21 Jan 2019
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