Nanoporous water oxidation electrodes with a low loading of laser-deposited Ru/C exhibit enhanced corrosion stability

• Sandra Haschke,
• Dmitrii Pankin,
• Vladimir Mikhailovskii,
• Maïssa K. S. Barr,
• Adriana Both-Engel,
• Alina Manshina and
• Julien Bachmann

Beilstein J. Nanotechnol. 2019, 10, 157–167, doi:10.3762/bjnano.10.15

• silicon drift detector (SDD). All Raman spectra were collected at room temperature in a backscattering geometry using a Horiba Jobin-Yvon LabRam HR 800 Raman spectrometer equipped with an Olympus BX41 microscope. The spectra were obtained with 488 nm radiation from an Ar+ gas laser and recorded in the 35

Bidirectional biomimetic flow sensing with antiparallel and curved artificial hair sensors

• Claudio Abels,
• Antonio Qualtieri,
• Toni Lober,
• Alessandro Mariotti,
• Lily D. Chambers,
• Massimo De Vittorio,
• William M. Megill and
• Francesco Rizzi

Beilstein J. Nanotechnol. 2019, 10, 32–46, doi:10.3762/bjnano.10.4

• behaviour. Influence of temperature on micro strain gauges As shown in Figure 8, the offset voltage of the Wheatstone quarter-bridge circuit (single cantilever) drifted around 100 mV, from 7.22 V up to 7.32 V after cooling down the sensor unit from 25 °C to 19 °C. This drift suggests that the sudden

• temperature decrease influenced the offset voltage for the single cantilever sensor. In the subsequent warming up phase (data not shown), the output dropped back to its offset voltage (7.22 V). Accommodating for signal amplification, the actual drift was 1 mV. The temperature experiments were repeated for the

• . Due to variation in the resistances (see Table 3), the half-bridge circuit was not perfectly balanced and a drift of 15 mV was measured. Accommodating for signal amplification, the actual drift was 0.15 mV. The artificial hair sensors did not generate heat, which suggests that they changed their

Colloidal chemistry with patchy silica nanoparticles

• Pierre-Etienne Rouet,
• Cyril Chomette,
• Laurent Adumeau,
• Etienne Duguet and
• Serge Ravaine

Beilstein J. Nanotechnol. 2018, 9, 2989–2998, doi:10.3762/bjnano.9.278

• carboxylic acid groups. The grafting efficiency was evidenced by zeta potential measurements and diffuse reflectance infrared Fourier-transform (DRIFT) spectroscopy. Figure 2b shows that after treatment of the silica surface by APTES, the so-aminated nanoparticles display a quite high zeta potential value of

• Fourier-transform (DRIFT) spectroscopy We evaporated solvent from the solution of PS or modified PS. To 9 mg of the dried sample we added 281 mg of desiccated KBr (spectroscopy grade). We ground the mixture in an agate mortar and deposited the powder on the sample holder. The sample was then introduced

• carboxylic acid groups, (b) zeta potential as a function of pH value, and (c) DRIFT spectra of bare (purple curve), aminated (orange curve) and carboxylated (green curve) silica particles; d) photograph of dimpled silica nanoparticles suspension before (left) and after (right) amination of the PS residues in

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

• Majid Fazeli Jadidi,
• Umut Kamber,
• Oğuzhan Gürlü and
• H. Özgür Özer

Beilstein J. Nanotechnol. 2018, 9, 2953–2959, doi:10.3762/bjnano.9.274

• -specific spectroscopy at room temperature due to thermal drift. Our goal was to carry out spectroscopy on a carbon and a hollow site. We imaged the surface for a long while until the thermal drift was minimized. Then by moving the tip to targeted lateral positions (carbon and hollow sites) we obtained

Charged particle single nanometre manufacturing

• Philip D. Prewett,
• Cornelis W. Hagen,
• Claudia Lenk,
• Steve Lenk,
• Marcus Kaestner,
• Tzvetan Ivanov,
• Ahmad Ahmad,
• Ivo W. Rangelow,
• Xiaoqing Shi,
• Stuart A. Boden,
• Alex P. G. Robinson,
• Dongxu Yang,
• Sangeetha Hari,
• Marijke Scotuzzi and
• Ejaz Huq

Beilstein J. Nanotechnol. 2018, 9, 2855–2882, doi:10.3762/bjnano.9.266

• substrate properties. Due to the time taken for etching, drift in the system is also noted as being significant. This is another factor requiring optimisation since it affects the quality of etched lines. Understanding the chemical kinetics of EBIE is important for achieving greater control over the

Graphene-enhanced metal oxide gas sensors at room temperature: a review

• Dongjin Sun,
• Yifan Luo,
• Marc Debliquy and
• Chao Zhang

Beilstein J. Nanotechnol. 2018, 9, 2832–2844, doi:10.3762/bjnano.9.264

• the width of depletion layer at the α-Fe2O3 and rGO interfaces leading to higher sensitivity. In addition, the periodic exposure of the α-Fe2O3–rGO sensor to 0.1 ppm NO2 indicated that the process of response was repeatable. However, a drift of the baseline was easily noted, which usually appears in

• room-temperature sensors, and further optimization is needed to control the drift. In another work, p–p junctions were accounted for the outstanding sensitivity to NO2 of Co3O4–rGO sensors at room temperature [60]. Liu et al. [61] prepared sulfonated reduced graphene oxide (S-rGO) via adding a solution

• showed low surface affinity to these molecules, which makes detection difficult. A small number of these composite sensors seem to exhibit the phenomenon of resistance-baseline drift, which is due to the formation of chemical bonds during the adsorption of gas molecules at the material surface, resulting

Effective sensor properties and sensitivity considerations of a dynamic co-resonantly coupled cantilever sensor

• Julia Körner

Beilstein J. Nanotechnol. 2018, 9, 2546–2560, doi:10.3762/bjnano.9.237

• frequency drift noise), the measurement principle (e.g., magnetic noise in case of magnetic measurements) and the excitation and detection setup (e.g., oscillator noise, detector noise) [8][20]. However, the lowest limit for a cantilever’s sensitivity is given by its thermal fluctuations leading to a

High-throughput synthesis of modified Fresnel zone plate arrays via ion beam lithography

• Kahraman Keskinbora,
• Umut Tunca Sanli,
• Margarita Baluktsian,
• Corinne Grévent,
• Markus Weigand and
• Gisela Schütz

Beilstein J. Nanotechnol. 2018, 9, 2049–2056, doi:10.3762/bjnano.9.194

• in Figure 1b–d. Removal of large volumes of material (for instance, 100 µm diameter, 500 nm gold thickness [36]) usually means lengthy processes that require an multi-pass-exposure (MP-E) strategy as depicted in Figure 1b, and involves drift correction steps in between cycles [29][35][36]. In some

• cases, the drift correction can be unnecessary, but the MP-E can still be desired when a better dose distribution or a well-defined wall geometry is aimed for in structures with higher aspect ratio [38]. We have shown that a much faster process can be devised by employing a single-pass-exposure (SP-E

• 35% in total time. Thanks to the speed of fabrication, the maximum shift of the central zones caused by drift during the process were estimated to be less than 100 nm. Due to the particular nature of the writing strategy, the line-to-space ratio (L:S) continuously decreases towards the outermost

A variable probe pitch micro-Hall effect method

• Maria-Louise Witthøft,
• Frederik W. Østerberg,
• Janusz Bogdanowicz,
• Rong Lin,
• Henrik H. Henrichsen,
• Ole Hansen and
• Dirch H. Petersen

Beilstein J. Nanotechnol. 2018, 9, 2032–2039, doi:10.3762/bjnano.9.192

• MHE measurement itself is performed simply by placing a micro four-point probe (M4PP) in parallel and close proximity to an insulating boundary, with an orthogonal magnetic field applied. Then the measured resistance will have three contributions: a drift term, a Hall effect term and a magnetoresitive

Nonlinear effect of carrier drift on the performance of an n-type ZnO nanowire nanogenerator by coupling piezoelectric effect and semiconduction

• Yuxing Liang,
• Shuaiqi Fan,
• Xuedong Chen and
• Yuantai Hu

Beilstein J. Nanotechnol. 2018, 9, 1917–1925, doi:10.3762/bjnano.9.183

• University of Science and Technology, Wuhan 430074, China 10.3762/bjnano.9.183 Abstract In piezoelectric semiconductors, electric fields drive carriers into motion/redistribution, and in turn the carrier motion/redistribution has an opposite effect on the electric field itself. Thus, carrier drift in a

• piezoelectric semiconducting structure is essentially nonlinear unless the induced fluctuation of carrier concentration is very small. In this paper, the nonlinear governing equation of carrier concentration was established by coupling both piezoelectric effect and semiconduction. A nonlinear carrier-drift

• power was analyzed in detail. The electrode size for the optimal performance of a ZnO nanowire generator was proposed. This analysis that couples electromechanical fields and carrier concentration as a whole has some referential significance to piezotronics. Keywords: carrier drift; crystallogrpahic c

The role of the Ge mole fraction in improving the performance of a nanoscale junctionless tunneling FET: concept and scaling capability

• Hichem Ferhati,
• Fayçal Djeffal and
• Toufik Bentrcia

Beilstein J. Nanotechnol. 2018, 9, 1856–1862, doi:10.3762/bjnano.9.177

• modified drift–diffusion model, which includes other effects related to the short-channel nature of the investigated transistor and to quantum effects is used. Further, the gradient density model is also included, which consists of the quantum correction associated with the local potential to the carrier

Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics

• Katherine Atamanuk,
• Justin Luria and
• Bryan D. Huey

Beilstein J. Nanotechnol. 2018, 9, 1802–1808, doi:10.3762/bjnano.9.171

• practically removed per image frame, leading to effective 30 nm resolution in the z-direction between consecutive pairs of ISC* and VOC* maps throughout the polycrystalline film thickness. During such progressive imaging some spatial drift is unavoidable, though this is easily accommodated by commercial, free

• , or custom image analysis routines (respectively Igor Pro, FIJI, and in this case programs written for MATLAB). The necessary drift corrections, typically based on purely rigid registration, cause ca. 10% around the outskirts of the initial property maps to be incomplete for the overall 3D dataset

• ) conditions. In addition to protecting the specimen and probe from high currents as in conventional I/V sweeps, the efficiency of this single-pass approach for direct VOC* mapping is beneficial for measurements sensitive to ambient exposure, thermal drift, or multi-image investigations such as tomographic AFM

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

• Yann Almadori,
• David Moerman,
• Jaume Llacer Martinez,
• Philippe Leclère and
• Benjamin Grévin

Beilstein J. Nanotechnol. 2018, 9, 1695–1704, doi:10.3762/bjnano.9.161

• drift under the built-in electric field (step 1), the ion migration under illumination (step 2), the photocarrier recombination (step 3), and finally, the reverse ion migration under dark conditions (step 4). Note that the whole crystal volume is not represented in this sketch, which depicts only the

Friction force microscopy of tribochemistry and interfacial ageing for the SiO_x/Si/Au system

• Christiane Petzold,
• Marcus Koch and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2018, 9, 1647–1658, doi:10.3762/bjnano.9.157

• turning points varied between 252 μs and 3.9 ms. Hold times and velocities were varied randomly in order to identify possible systematic errors. The stationary contact in FFM is prone to unwanted movements caused by creep of the piezo actuator and by instrumental drift upon temperature changes. To

Nanocomposites comprised of homogeneously dispersed magnetic iron-oxide nanoparticles and poly(methyl methacrylate)

• Sašo Gyergyek,
• David Pahovnik,
• Ema Žagar,
• Alenka Mertelj,
• Rok Kostanjšek,
• Miloš Beković,
• Marko Jagodič,
• Heinrich Hofmann and
• Darko Makovec

Beilstein J. Nanotechnol. 2018, 9, 1613–1622, doi:10.3762/bjnano.9.153

• -shift standard. The diffuse reflectance infrared Fourier transform spectra (DRIFT, Perkin Elmer Spectrum 400 equipped with DRIFT accessory) were recorded in KBr. The weight fraction of nanoparticles in the nanocomposites was determined with a Mettler Toledo thermogravimetric analysis (TGA) instrument

• copolymerization of the RA-MMA with the neat MMA (Supporting Information File 1, Figure S4). The DRIFT spectrum of the NP-RA showed absorption peaks at 1520 cm−1 (νa COO−) and 1417 cm−1 (νs COO−) (Figure 2). The difference Δν = νa(COO−) − νs(COO−) is 103 cm−1. According to Deacon and Philips [30], the change in

• disk between the containers is a permanent magnet. DRIFT spectra of the nanoparticle samples NP-RA, NP-MMA and NP-PMMA-3. Number-weighted hydrodynamic diameter size-distribution function of the NP-RA and NP-PMMA-3 nanoparticle samples. Cross-sectional TEM images of the nanocomposite sample NC-1 at

Optical near-field mapping of plasmonic nanostructures prepared by nanosphere lithography

• Gitanjali Kolhatkar,
• Alexandre Merlen,
• Jiawei Zhang,
• Chahinez Dab,
• Gregory Q. Wallace,
• François Lagugné-Labarthet and
• Andreas Ruediger

Beilstein J. Nanotechnol. 2018, 9, 1536–1543, doi:10.3762/bjnano.9.144

• tips to ensure a detectable near-field contribution that will exceed the ubiquitous background far-field signal in the scattered light. In ideal conditions, fast scanning on the surface ensures a high sensitivity, and minimizes the drift. To achieve this objective, most nano-antennas used in aSNOM are

Cr(VI) remediation from aqueous environment through modified-TiO₂-mediated photocatalytic reduction

• Rashmi Acharya,
• Brundabana Naik and
• Kulamani Parida

Beilstein J. Nanotechnol. 2018, 9, 1448–1470, doi:10.3762/bjnano.9.137

• quantum efficiency and a largely enhanced photocatalytic performance. It also caused a drift of photogenerated electrons to the CB of TiO2 for reduction of Cr(VI) to Cr(III) and that of holes to the VB of Cu2O for oxidation of water to oxygen under visible-light irradiation. Since green colored

Electrostatically actuated encased cantilevers

• Benoit X. E. Desbiolles,
• Gabriela Furlan,
• Adam M. Schwartzberg,
• Paul D. Ashby and
• Dominik Ziegler

Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130

• unstable imaging conditions. More importantly, the indirect excitation of the cantilever is often very sensitive to changes to external factors causing drift over time of the excitation signal complicating imaging and preventing quantitative interpretation of image data [3][4]. Attempts to reduce spurious

Formation mechanisms of boron oxide films fabricated by large-area electron beam-induced deposition of trimethyl borate

• Aiden A. Martin and
• Philip J. Depond

Beilstein J. Nanotechnol. 2018, 9, 1282–1287, doi:10.3762/bjnano.9.120

• chemical composition was determined by energy-dispersive X-ray spectroscopy (EDS) and scanning electron microscopy using a Phenom ProX SEM at 5 keV electron energy. The Phenom ProX SEM EDS subsystem consists of a silicon drift detector with a 25 mm2 active area and a resolution of ≤137 eV at Mn Kα, a Si3N4

A novel copper precursor for electron beam induced deposition

• Caspar Haverkamp,
• George Sarau,
• Mikhail N. Polyakov,
• Ivo Utke,
• Marcos V. Puydinger dos Santos,
• Silke Christiansen and
• Katja Höflich

Beilstein J. Nanotechnol. 2018, 9, 1220–1227, doi:10.3762/bjnano.9.113

•  1). In this case EDX was performed using a Hitachi S 4800 equipped with an EDAX silicon drift detector using an acceleration voltage of 8 kV and 1 nA beam current. The obtained k-ratios were evaluated using the software Stratagem according to a routine described earlier [26] and provided copper

• microscopy (TEM) images onto the nanostructures were acquired with a Gatan Orius CCD-Camera inside a CM12 (Phillips) at an accelerating voltage of 120 kV equipped with a EDAX Genesis silicon drift detector. For TEM investigations the nanostructures were directly deposited onto Omniprobe molybdenum TEM grids

Automated image segmentation-assisted flattening of atomic force microscopy images

• Yuliang Wang,
• Tongda Lu,
• Xiaolai Li and
• Huimin Wang

Beilstein J. Nanotechnol. 2018, 9, 975–985, doi:10.3762/bjnano.9.91

• , which are mainly caused by mechanical drift in AFM systems [18][19][20][21]. As illustrated in Figure 1a, an AFM system is generally composed of two piezo-driven stages, an x–y sample stage and a z-scanner. The x–y sample stage is used to implement precise lateral motion for point-by-point scanning

• unavoidably influenced by the mechanical drift between the two stages (Figure 1b). Using the visual sensing approach, Wang et al. demonstrated that the vertical drift between the two stages can be up to 600 nm within a 30 min time period [21]. Therefore, mechanical drift becomes a major source of artifacts

• flattening During scanning, AFM images are constructed line by line. The time required for each scan line is around 1 s along the fast scanning direction, which is much shorter than that of several minutes required for an entire image. As a result, the direction of drift is normally perpendicular to that of

Nanoscale mapping of dielectric properties based on surface adhesion force measurements

• Ying Wang,
• Yue Shen,
• Xingya Wang,
• Zhiwei Shen,
• Bin Li,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

• the adhesion forces mentioned in this paper are relative values to mica, the effect of system drift on force–distance curves during the imaging process can be eliminated (Supporting Information File 1, Figure S2). The increases in the adhesion forces of CRGO and TRGO when the tip bias increased from 0

Towards the third dimension in direct electron beam writing of silver

• Katja Höflich,
• Jakub Mateusz Jurczyk,
• Katarzyna Madajska,
• Maximilian Götz,
• Luisa Berger,
• Carlos Guerra-Nuñez,
• Caspar Haverkamp,
• Iwona Szymanska and
• Ivo Utke

Beilstein J. Nanotechnol. 2018, 9, 842–849, doi:10.3762/bjnano.9.78

• whole deposition series. High-resolution scanning electron microscopy (SEM) imaging and energy-dispersive X-ray spectroscopy (EDX) was performed using a Hitachi S 4800 equipped with an EDAX silicon drift detector (SSD). EDX data acquisition was performed for acceleration voltages of 8 and 12 kV using a

• AgO2F5Prop. The red arrow on the right side depicts the direction in which the AFM profiles were taken. This was chosen such, that deposit deformations due to stage drift and beam blanker velocity do not influence the displayed topography below. The AFM profiles are the result of averaging over seven

A review of carbon-based and non-carbon-based catalyst supports for the selective catalytic reduction of nitric oxide

• Shahreen Binti Izwan Anthonysamy,
• Syahidah Binti Afandi,
• Mehrnoush Khavarian and
• Abdul Rahman Bin Mohamed

Beilstein J. Nanotechnol. 2018, 9, 740–761, doi:10.3762/bjnano.9.68

• , following the Langmuir–Hinshelwood mechanism. Shi et al. [25] used DRIFT to investigate the chemical reaction of reactants with the Lewis acid site and Brønsted acid site to improve activity at low temperature. Chen et al. [26] found that CeO2 provided both acid sites, while WO3 helped in increasing the

Dynamics and fragmentation mechanism of (C₅H₄CH₃)Pt(CH₃)₃ on SiO₂ surfaces

• Kaliappan Muthukumar,
• Harald O. Jeschke and
• Roser Valentí

Beilstein J. Nanotechnol. 2018, 9, 711–720, doi:10.3762/bjnano.9.66

• four considered cases are shown in Figure 4. The analysis of the trajectory indicates that on the fully hydroxylated surfaces (Figure 4a) the molecule exhibits significant changes in orientation and a drift similar as we found for carbonyl precursors [11]. The Pt–Cp ring and Pt–methyl bonds fluctuate