Microwave-induced electric discharges on metal particles for the synthesis of inorganic nanomaterials under solvent-free conditions

• Vijay Tripathi,
• Harit Kumar,
• Anubhav Agarwal and
• Leela S. Panchakarla

Beilstein J. Nanotechnol. 2020, 11, 1019–1025, doi:10.3762/bjnano.11.86

• treatment is essential before using metal particles in further microwave arc experiments. All metal powders were treated with 0.5 M nitric acid under sonication for 10 min to create rough surfaces. In this process, copper partially gets oxidized to Cu2O. The X-ray diffraction (XRD) patterns show reflections

• copper. Graphitic carbon nitride (g-C3N4) or graphite powder (commercially available) are used as carbon source. g-C3N4 is synthesized and characterized according to [18]. X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) confirms the formation of g-C3N4 (Figure S1 in Supporting

• with either graphite or graphitic carbon nitride (g-C3N4) yields carbon-coated or nitrogen-doped carbon-coated metallic nanoparticles. When these reactions are conducted in a Teflon reactor, the products are further functionalized with fluorine. Figure 3a shows XRD patterns of Cu and Ni nanoparticles

Gas-sensing features of nanostructured tellurium thin films

• Dumitru Tsiulyanu

Beilstein J. Nanotechnol. 2020, 11, 1010–1018, doi:10.3762/bjnano.11.85

• one another. No Te crystallites were observed in this case. The structural phase state of the grown films was adequately confirmed by X-ray diffraction (XRD). Figure 2 shows the XRD patterns of Te films grown on either Pyrex glass (Figure 2A) or nanostructured Al2O3 substrates (Figure 2B). According

• to Figure 2A, the XRD pattern of films grown on Pyrex glass substrates reveals a highly crystalline structure with a predominant Te hexagonal phase. The positions of the most intense peaks matched the reference values: from right to left, the first peak occurs due to the reflection from the (100

• predominant growth orientation of the nanocrystals. As a counter example, the XRD pattern of a Te film grown on Al2O3 substrates with a higher deposition rate ≈30 nm/s (Figure 2B, adapted from [27]) only shows two weak Te peaks (ASTM, 4-554). These type of films are considered amorphous. It should also be

Uniform Fe₃O₄/Gd₂O₃-DHCA nanocubes for dual-mode magnetic resonance imaging

• Miao Qin,
• Yueyou Peng,
• Mengjie Xu,
• Hui Yan,
• Yizhu Cheng,
• Xiumei Zhang,
• Di Huang,
• Weiyi Chen and
• Yanfeng Meng

Beilstein J. Nanotechnol. 2020, 11, 1000–1009, doi:10.3762/bjnano.11.84

• planes in Fe3O4 [29]. In order to further analyze the FGDA nanocube composition, XRD analysis was performed. According to Figure 2h, the major diffraction peaks were consistent with the diffraction peaks of pure Fe3O4 and Gd2O3 [23][30], confirming that the FGDA nanocubes were constituted by uniformly

• analyze the distribution of the elements within the samples. The samples were ultrasonically homogenized for 30 minutes and an 8 μL aliquot was collected in a copper mesh and kept at 55 °C for 2 h. After drying, the samples were placed in the HRTEM for imaging. X-ray diffraction (XRD, UltimalV, Japan; Cu

• EDS spectrum shows the main elements that constitute the FGDA nanocubes. (g) The EDS mapping shows that Gd (green, left panel) and Fe (red, middle) are homogeneously distributed throughout the nanocubes (overlay, right panel). (h) The XRD pattern of FGDA nanocubes shows that the spectrum peaks

Electrochemical nanostructuring of (111) oriented GaAs crystals: from porous structures to nanowires

• Elena I. Monaico,
• Eduard V. Monaico,
• Veaceslav V. Ursaki,
• Shashank Honnali,
• Vitalie Postolache,
• Karin Leistner,
• Kornelius Nielsch and
• Ion M. Tiginyanu

Beilstein J. Nanotechnol. 2020, 11, 966–975, doi:10.3762/bjnano.11.81

• passivation during anodization of the huge internal surface of the porous sample [18]. The preservation of the quality of the GaAs compound after anodization is also confirmed by the results of XRD analysis (Figure 6). The high quality of the material produced by anodization is indicated by narrow reflexes

• with a full width at half maximum (FWHM) of about 0.08°. The predominance of (111) and (333) reflexes in the XRD pattern indicates also to the preservation of the initial (111)B crystallographic orientation of the sample. To demonstrate the applicability of the nanowires for device fabrication, a

• bulk (curve 1) and anodized (curve 2) GaAs samples measured at a temperature of 10 K. XRD pattern of the anodized GaAs(111)B sample. (A) Optical microscopy image of the opened regions in the photoresist on the glass substrate for deposition of the metal contacts on the selected GaAs nanowire. The inset

Atomic layer deposition for efficient oxygen evolution reaction at Pt/Ir catalyst layers

• Stefanie Schlicht,
• Korcan Percin,
• Stefanie Kriescher,
• André Hofer,
• Claudia Weidlich,
• Matthias Wessling and
• Julien Bachmann

Beilstein J. Nanotechnol. 2020, 11, 952–959, doi:10.3762/bjnano.11.79

• particular, we have determined particle sizes by transmission electron microscopy (TEM), investigated the homogeneously mixed nature of the Pt/Ir catalyst by X-ray diffraction (XRD), selected-area electron diffraction (SAED), and X-ray photoelectron spectroscopy (XPS). We have also examined various ALD

Band tail state related photoluminescence and photoresponse of ZnMgO solid solution nanostructured films

• Vadim Morari,
• Aida Pantazi,
• Nicolai Curmei,
• Vitalie Postolache,
• Emil V. Rusu,
• Marius Enachescu,
• Ion M. Tiginyanu and
• Veaceslav V. Ursaki

Beilstein J. Nanotechnol. 2020, 11, 899–910, doi:10.3762/bjnano.11.75

• nanoparticles embedded into the ZnMgO matrix are useful for fast electron transport and high charge balance in quantum dot light emitting diodes [22]. The multiphase composition of films prepared by spin coating and annealed at temperatures lower that 450 °C was revealed by X-ray diffraction (XRD) analysis. As

• treatment at lower temperatures is not enough for producing single phase films, ZnO nanoparticles being embedded into the ZnMgO matrix, as deduced from photoluminescence spectra and XRD analysis. Nevertheless, such films could also find specific applications, for instance in quantum dot light emitting

• ), annealed at 400 °C and measured at a) 300 K and b) 20 K. For comparison, the spectrum of a bulk ZnO single crystal is shown by curve (4). a) XRD pattern of a Zn0.8Mg0.2O film deposited by spin coating on a Si substrate and annealed at 500 °C. b) XRD pattern of a Zn0.8Mg0.2O film deposited by spin coating

Templating effect of single-layer graphene supported by an insulating substrate on the molecular orientation of lead phthalocyanine

• K. Priya Madhuri,
• Abhay A. Sagade,
• Pralay K. Santra and
• Neena S. John

Beilstein J. Nanotechnol. 2020, 11, 814–820, doi:10.3762/bjnano.11.66

• ) reflection is measured at an azimuthal angle (Figure 3c). The 2D-XRD also shows the presence of a peak at 0.49 Å−1 along the qz direction, which may be assigned to the (200) reflection of the monoclinic phase or the (001) reflection of the triclinic phase, occurring at the same positions with d = 12.82 Å

Epitaxial growth and superconducting properties of thin-film PdFe/VN and VN/PdFe bilayers on MgO(001) substrates

• Wael M. Mohammed,
• Igor V. Yanilkin,
• Amir I. Gumarov,
• Airat G. Kiiamov,
• Roman V. Yusupov and
• Lenar R. Tagirov

Beilstein J. Nanotechnol. 2020, 11, 807–813, doi:10.3762/bjnano.11.65

• , VN and Pd: aMgO = 421.2 pm, aVN = 413.7 pm [35] and aPd = 389.1 pm. Thus, the lattice mismatch between MgO and VN is only about 1.7%, and between Pd and VN it is as small as 5.95%. The in situ LEED analysis was corroborated with ex situ X-ray diffraction (XRD, BRUKER D8, Germany) measurements using

• Cu Kα (λ = 1.5418 Å) radiation in the Bragg–Brentano geometry with a scanning rate of 0.002°/s in the 2θ range from 17° to 82° and a step width of 0.0153°. Room-temperature XRD patterns of the pristine MgO(001) substrate, the VN thin film on MgO, Pd0.96Fe0.04 on MgO and the Pd0.96Fe0.04/VN

• ) film can be easily identified. The significant peak broadening of the diffraction maxima of VN and Pd0.96Fe0.04 is primarily due to small coherent scattering range τ along the normal to the film plane (Scherrer broadening); XRD data with accounting for the instrument function [33] yields estimates of τ

Structural optical and electrical properties of a transparent conductive ITO/Al–Ag/ITO multilayer contact

• Aliyu Kabiru Isiyaku,
• Ahmad Hadi Ali and
• Nafarizal Nayan

Beilstein J. Nanotechnol. 2020, 11, 695–702, doi:10.3762/bjnano.11.57

• –Ag/ITO) are examined. Moreover, annealing was carried out at 400 °C with an ITO/Al–Ag/ITO (IAAI) multilayer film and a pure ITO film for comparison. Results and Discussion Figure 1 shows the X-ray diffraction (XRD) patterns for as-deposited and annealed IAAI multilayer films. The as-deposited film

• contact measurements at room temperature before Hall mobility and carrier concentration measurements. XRD spectra of as-deposited and annealed IAAI films. EDXS spectra of (a) the as-deposited IAAI film and (b) the annealed IAAI film. AFM 3D images of (a) the as-deposited IAAI film, (b) the annealed IAAI

Exfoliation in a low boiling point solvent and electrochemical applications of MoO₃

• Matangi Sricharan,
• Bikesh Gupta,
• Sreejesh Moolayadukkam and
• H. S. S. Ramakrishna Matte

Beilstein J. Nanotechnol. 2020, 11, 662–670, doi:10.3762/bjnano.11.52

• the MoO3 layers were recorded using a 532 nm excitation laser. X-ray diffractograms (XRD; Rigaku Smart lab) of the bulk and exfoliated MoO3 were obtained using a Cu Kα (1.54 Å) X-ray source. The surface potential of MoO3 dispersions was determined by zeta potential measurements using a Malvern

• retention of the orthorhombic phase of exfoliated MoO3 nanosheets are evident from XRD (Figure S4, Supporting Information File 1). The HRTEM micrograph in Figure 2b shows a d-spacing of 0.38 nm corresponding to the (110) planes of orthorhombic MoO3 (indexed with JCPDS file No. 05-0506). The AFM micrograph

Preparation, characterization and photocatalytic performance of heterostructured CuO–ZnO-loaded composite nanofiber membranes

• Wei Fang,
• Liang Yu and
• Lan Xu

Beilstein J. Nanotechnol. 2020, 11, 631–650, doi:10.3762/bjnano.11.50

• -transform infrared spectroscopy (FTIR, Nicolet5700, Thermo Nicolet Company, Waltham, MA, USA), carrying out 32 scans within the wavenumber range of 400–4000 cm−1 with a resolution of 4 cm−1. X-ray diffraction (XRD) analyses were carried out using a Philips X’Pert-Pro MPD (PANalytical, Almelo & Eindhoven

• studies. FTIR and XRD analysis: FTIR was used to characterize the CNFMs with different [Cu(Ac)2/Zn(Ac)2]/[PVDF/PAN] weight ratios (Figure 7). The peaks at 879 cm−1 correspond to the asymmetric stretching vibration of –CF2– in PVDF. The peaks at 1070 and 1276 cm−1 represent the β-phase of PVDF. There was

• influence of the [Cu(Ac)2/Zn(Ac)2]/[PVDF/PAN] weight ratio on the crystallinity of the CNFMs, XRD analyses were performed and the XRD patterns are shown in Figure 8 and Figure 9. Pure PVDF/PAN CNFMs show the characteristic diffraction peaks at 17° and 21° (Figure 8a). The pure Cu(Ac)2 and Zn(Ac)2 powders

Correction: Photocatalytic antibacterial performance of TiO₂ and Ag-doped TiO₂ against S. aureus. P. aeruginosa and E. coli

• Kiran Gupta,
• R. P. Singh,
• Ashutosh Pandey and
• Anjana Pandey

Beilstein J. Nanotechnol. 2020, 11, 547–549, doi:10.3762/bjnano.11.43

• ., India Department of Biotechnology, Motilal Nehru National Institute of Technology, Allahabad, Prayagraj, 211004, U.P., India 10.3762/bjnano.11.43 Keywords: Ag-doped TiO2; antimicrobial activity; sol–gel; The following is a correction to the section “XRD of TiO2 and Ag-doped TiO2”, which contains a new

• results of the article. XRD of TiO2 and Ag-doped TiO2 nanoparticles X-ray diffraction (XRD) was used to characterize as-prepared TiO2 and Ag-doped TiO2 nanoparticles. The diameter of crystalline TiO2, 3 wt % Ag-doped TiO2 and 7 wt % Ag-doped TiO2 nanoparticles annealed at 450 °C was calculated by the

• Scherrer equation to be approximately 20, 22, and 16 nm, respectively. The analysis was based on the broadening of the (101) XRD peak of the pattern shown in Figure 1a–c. The XRD analysis was performed with X-pert High score plus software to determine the phase structure of the three samples by comparing

Interfacial charge transfer processes in 2D and 3D semiconducting hybrid perovskites: azobenzene as photoswitchable ligand

• Nicole Fillafer,
• Tobias Seewald,
• Lukas Schmidt-Mende and
• Sebastian Polarz

Beilstein J. Nanotechnol. 2020, 11, 466–479, doi:10.3762/bjnano.11.38

• . The suspension was stirred for 1 h, then the particles were centrifuged, washed three times with 3 mL DCM and then dried under reduced pressure. The samples were kept under nitrogen atmosphere to prevent decomposition. Characterization X-ray diffraction (XRD) measurements of drop-cast particles on

Synthesis and enhanced photocatalytic performance of 0D/2D CuO/tourmaline composite photocatalysts

• Changqiang Yu,
• Min Wen,
• Zhen Tong,
• Shuhua Li,
• Yanhong Yin,
• Xianbin Liu,
• Yesheng Li,
• Tongxiang Liang,
• Ziping Wu and
• Dionysios D. Dionysiou

Beilstein J. Nanotechnol. 2020, 11, 407–416, doi:10.3762/bjnano.11.31

• product was named CuO/tourmaline-1:1 (1:1 in mass ratio of the CuO/tourmaline). By controlling the dosage of Cu(CH3COO)2·H2O and NaOH in proportion the CuO/tourmaline composites in different mass ratios of the CuO/tourmaline were acquired. Characterization X-ray diffraction (XRD) patterns were obtained

• MB for the subsequent experiments. Results and Discussion Figure 1a displays the XRD spectra of the samples. The main peaks with 2θ values of 32.51°, 35.54°, 38.71°, 48.72°, 53.49°, 58.26°, 61.52°, 66.22°, 68.12°, 72.37°, and 75.24° matched well with those of monoclinic CuO (JCPDS 48-1548). As for

• Figure 8, MB degradation over the CuO/tourmaline composite remained at 93.3% after being used for five times. There was no obvious distinction between the XRD patterns and FTIR spectra of the fresh and reused CuO/tourmaline composite, except for a slight decrease in the intensity (Supporting Information

Facile biogenic fabrication of hydroxyapatite nanorods using cuttlefish bone and their bactericidal and biocompatibility study

• Satheeshkumar Balu,
• Manisha Vidyavathy Sundaradoss,
• Swetha Andra and
• Jaison Jeevanandam

Beilstein J. Nanotechnol. 2020, 11, 285–295, doi:10.3762/bjnano.11.21

• ) nanorods using cuttlefish bone powder as a precursor (CB-Hap NRs). The obtained CB-Hap NRs were investigated using transmission electron microscopy (TEM), Fourier transform infrared spectroscopy (FTIR), X-ray diffraction (XRD) and thermogravimetric analysis (TGA) techniques to evaluate their

• physicochemical properties. The crystallite size (20.86 nm) obtained from XRD data and the elemental analysis (Ca/P molar ratio was estimated to be 1.6) showed that the Hap NRs are similar to that of natural human bone (≈1.67). Moreover, the FTIR data confirmed the presence of phosphate as a functional group and

• setup via an oil bath approach to synthesize Hap nanorods from cuttlefish bone powders and optimize their synthesis parameters. The systematic characterization using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR) and transmission electron microscopy (TEM) was performed to

High-performance asymmetric supercapacitor made of NiMoO₄ nanorods@Co₃O₄ on a cellulose-based carbon aerogel

• Meixia Wang,
• Jing Zhang,
• Xibin Yi,
• Benxue Liu,
• Xinfu Zhao and
• Xiaochan Liu

Beilstein J. Nanotechnol. 2020, 11, 240–251, doi:10.3762/bjnano.11.18

• supercapacitor. The crystal structure of CA, NiMoO4, the Co3O4 nanoparticles derived from ZIF-67 and the NiMoO4@Co3O4/CA composite was examined using X-ray powder diffraction (XRD) as shown in Figure 3a. For CA, a broad diffraction peak is observed at about 22.8°, which can be attributed to the (120) planes of

• characteristic reflections from CA and NiMoO4, the XRD pattern of Co3O4 is in good agreement with the standard pattern (JCPDS No.42-1467). The intensity of the diffraction peaks of CA and NiMoO4 in the XRD pattern of NiMoO4@Co3O4/CA is reduced due to the ZIF-67 cover on the surface of the NiMoO4/CA nanomaterial

• , which agrees well with the XRD results. To investigate the chemical composition and the valence states of the NiMoO4@Co3O4/CA nanocomposite, X-ray photoelectron spectroscopy (XPS) was performed and the results are shown in Figure 4. According to Figure 4a, the elements Co, Ni, Mo, O and C can be clearly

Size effects of graphene nanoplatelets on the properties of high-density polyethylene nanocomposites: morphological, thermal, electrical, and mechanical characterization

• Tuba Evgin,
• Alpaslan Turgut,
• Georges Hamaoui,
• Zdenko Spitalsky,
• Nicolas Horny,
• Matej Micusik,
• Mihai Chirtoc,
• Mehmet Sarikanat and
• Maria Omastova

Beilstein J. Nanotechnol. 2020, 11, 167–179, doi:10.3762/bjnano.11.14

• HDPE and HDPE/GnP nanocomposites had almost the same absorption peaks. The size and content of the GnPs caused no change in the characteristic peaks of the HDPE matrix. Additionally, the crystalline structures of GnPs, HDPE, and HDPE/GnP nanocomposites were studied, and their XRD patterns are shown in

• 2θ = 29.93° and 36.13°, corresponding to the (210) and (020) reflection planes, respectively, were clearly seen in the XRD pattern of pure HDPE. Similar HDPE peaks were observed by Sever and co-workers [22] and Wang and co-workers [23]. In the XRD patterns of the HDPE/GnP nanocomposites, the

• intensities of the peaks at 2θ ≈ 21.4° and 2θ ≈ 23.8° decreased with increasing GnP loading, while the intensities of the peaks at 2θ ≈ 26.5° and 2θ ≈ 54.6° increased. The XRD pattern of the HDPE-based nanocomposites exhibited a mix of the peaks appearing for HDPE and the GnPs. In the XRD patterns of the HDPE

Simple synthesis of nanosheets of rGO and nitrogenated rGO

• Pallellappa Chithaiah,
• Madhan Mohan Raju,
• Giridhar U. Kulkarni and
• C. N. R. Rao

Beilstein J. Nanotechnol. 2020, 11, 68–75, doi:10.3762/bjnano.11.7

• any solvents, metal catalysts, reagents and hazardous chemicals. Similarly, N-rGO nanosheets have also been synthesized using glycine as precursor. Results and Discussion The typical XRD patterns of rGO and N-rGO nanosheets are shown in Figure 1. The XRD pattern of the as-prepared rGO (Figure 1a

• ) exhibits a broad peak at 23.5° corresponding to an interlayer d-spacing of 0.378 nm. The XRD pattern of N-rGO (Figure 1b) shows a diffraction peak at 25.8° corresponding to an interlayer d spacing of 0.345 nm. From the XRD patterns, it is observed that the peak commonly obtained for GO around 2θ of 10.3

• kind of material called graphene oxide nanosheets. The product was left in a furnace for ca. 7 min to get the pure phase without any impurities. The fraction of oxygen in the prepared sample is ca. 24 atom %, as measured with EDS, and the XRD pattern of the sample shows a broad peak around 23.5

Recent progress in perovskite solar cells: the perovskite layer

• Xianfeng Dai,
• Ke Xu and
• Fanan Wei

Beilstein J. Nanotechnol. 2020, 11, 51–60, doi:10.3762/bjnano.11.5

• C6H18N2O2PbI4 (EDBEPbI4) chains into 3D perovskites. The 2D/3D perovskites solved the discrepancy between PCE and stability. XRD patterns and UV–vis absorption spectra, retracing the formation of such heterojunctions, are shown in Figure 4b and Figure 4c. Doping with EDBEPbI4 gradually increases the grain size

• ][41][42][43][44][45][46][47][48][49][50][51]. Structural characterization and morphology. (a) Schematic illustration of the structure of the 2D/3D PSCs. (b) XRD patterns as a function of the 2D perovskite doping concentration and (c) UV–vis absorption spectra of the (EDBEPbI4)x(MAPbI3)1−x films. (d–g

Influence of the epitaxial composition on N-face GaN KOH etch kinetics determined by ICP-OES

• Markus Tautz,
• Maren T. Kuchenbrod,
• Joachim Hertkorn,
• Robert Weinberger,
• Martin Welzel,
• Arno Pfitzner and
• David Díaz Díaz

Beilstein J. Nanotechnol. 2020, 11, 41–50, doi:10.3762/bjnano.11.4

• diffraction (XRD). Thin-film processing including laser lift off (LLO) was applied. The influence of epitaxial changes on the N-face etch kinetics was determined in aqueous KOH solution at elevated temperature. Inductively-coupled plasma optical emission spectroscopy (ICP-OES) was used to measure the etch

• ICP-OES analysis. Methods PLM images were recorded directly after epitaxy on an Olympus BX51 microscope combined with an Olympus U-RFL-T UV light source. For excitation, 408 nm wavelength light was used. X-ray diffraction (XRD) was measured on a Bruker/Jordan Valley QC Velox. Scanning electron

• etch process. Variation in epitaxial stack The dislocation density of epitaxial layers A–E was monitored by XRD and PLM (Table 2). A acts as a reference sample in the reported experiments here. Crystal quality was improved slightly by increasing the 2D-1 thickness from 300 nm (A) to 1000 nm (B). This

Synthesis of amorphous and graphitized porous nitrogen-doped carbon spheres as oxygen reduction reaction catalysts

• Maximilian Wassner,
• Markus Eckardt,
• Andreas Reyer,
• Thomas Diemant,
• Michael S. Elsaesser,
• R. Jürgen Behm and
• Nicola Hüsing

Beilstein J. Nanotechnol. 2020, 11, 1–15, doi:10.3762/bjnano.11.1

• %). TEM images (Figure 3a–d) reveal no highly ordered domains (e.g., graphene layers) of the said N-doped carbon spheres, which is in good agreement with the results of the X-ray diffraction measurements (XRD, Figure 4), confirming an amorphous carbon structure for all particles mentioned so far. Upon

• temperatures is rather noisy, which results in a larger error when evaluating the quantitative amounts of each N configuration. This does not change, however, the trends resulting from the XPS data discussed later. Focusing on structural aspects, the NCS series, g-NCS-550 and g-NCS-700 samples exhibit XRD

• nitriding temperature, the microporosity increases strongly (Figure 9) and additionally we found a slight increase of the amount of graphenic structures in the catalysts, as indicated by the peak narrowing in the XRD patterns and the decreasing AD/AG ratio in the Raman signals. These structural changes may

Synthesis and acetone sensing properties of ZnFe₂O₄/rGO gas sensors

• Kaidi Wu,
• Yifan Luo,
• Ying Li and
• Chao Zhang

Beilstein J. Nanotechnol. 2019, 10, 2516–2526, doi:10.3762/bjnano.10.242

• diffraction (XRD, Bruker D8 Advance) using Cu Kα radiation at room temperature. The 2θ range was 10−80°, and the scanning rate was 5°·min−1. The microscopic morphology and the size of all samples were observed using a field-emission scanning electron microscope equipped with an energy-dispersive spectrometer

• time required for a change of the resistance of 90%. Results and Discussion Samples characterization The XRD patterns of the spheres of pure ZnFe2O4 and the four ZnFe2O4/rGO composites with different mass fractions of rGO are shown in Figure 2. All samples showed similar diffraction peaks, and

• selected area diffraction (SAED) pattern shows a series of distinct diffraction rings, which can be readily indexed to the (220), (311), (400), (422), (511) and (440) planes of the spinel ZnFe2O4 crystal, in line with the above XRD results. Moreover, the SAED pattern exhibits the polycrystalline nature of

Coating of upconversion nanoparticles with silica nanoshells of 5–250 nm thickness

• Cynthia Kembuan,
• Maysoon Saleh,
• Bastian Rühle,
• Ute Resch-Genger and
• Christina Graf

Beilstein J. Nanotechnol. 2019, 10, 2410–2421, doi:10.3762/bjnano.10.231

• (XRD) measurements of the oleate-coated UCNP cores C1 and the same particles after the growth of two, three, four and five additional silica shells (samples C1_2S, C1_3S, C1_4S, and C1_5S). These data exclude a possible influence of the silica shell on the crystallinity of the UCNP core. The cores have

• a predominantly hexagonal crystal structure. Minor peaks at 47° (220) and 55° (311) 2θ indicate a small fraction of the cubic phase. The XRD patterns of the silica-coated UCNPs show the same peaks (mainly the hexagonal phase) with decreasing intensity as the silica shell thickness increases

• , 20 and 40 ppm) or erbium standard for ICP (c(Er3+) = 1, 5 and 10 ppm). X-ray diffraction (XRD) measurements A minimum amount of 10 mg of dried particles were used for the XRD measurements. The XRD device was a Rigaku SmartLab 3 kW with a DTex Ultra 250 detector (40 kV, 30 mA) equipped with a Cu Kα1

Semitransparent Sb₂S₃ thin film solar cells by ultrasonic spray pyrolysis for use in solar windows

• Jako S. Eensalu,
• Atanas Katerski,
• Erki Kärber,
• Lothar Weinhardt,
• Monika Blum,
• Clemens Heske,
• Wanli Yang,
• Ilona Oja Acik and
• Malle Krunks

Beilstein J. Nanotechnol. 2019, 10, 2396–2409, doi:10.3762/bjnano.10.230

• and back contact is needed to attain an AVT in excess of 20% for the complete solar cell. As-deposited Sb2S3 layers on glass/ITO/TiO2 substrate were amorphous (Figure 1d), as only signals of anatase-TiO2 and In2O3 from the substrate were detected by X-ray diffraction (XRD). In contrast, the XRD

• detected, which is an expected result when crystalline Sb2S3 is formed [28][46][49]. No traces of additional phases were detected by either XRD or Raman in any glass/ITO/TiO2/Sb2S3 samples. Chlorine, which could originate from the SbCl3 precursor, was not detected by energy-dispersive X-ray spectroscopy

• perforated metal masks. The area of cells larger than 7.1 mm2 was defined by mechanically scribing contacts after Au deposition. Thin film characterization The characterization methods employed in this study, except for XRD and XES, have already been described in detail elsewhere [28]. The structure and

Polyvinylpyrrolidone as additive for perovskite solar cells with water and isopropanol as solvents

• Chen Du,
• Shuo Wang,
• Xu Miao,
• Wenhai Sun,
• Yu Zhu,
• Chengyan Wang and
• Ruixin Ma

Beilstein J. Nanotechnol. 2019, 10, 2374–2382, doi:10.3762/bjnano.10.228

• SUPRA55. X-ray diffraction (XRD) patterns were collected with a SmartLab from Rigaku at 40 kV and 150 mA by using Cu Kα radiation (λ = 0.15405 nm). The photovoltaic performance of the PSCs was recorded using a Keithley 4200 source meter under one-sun AM 1.5G (100 mW·cm−2) illumination with a solar light

• small cubes on the surface, which are attributed to the surface crystallization of MAX residual after the immersion. The photoelectric performance of the PSCs is unaffected by the small cubes. The XRD patterns of the Pb(NO3)2 films coated on the SnO2 ETL are presented in Figure 3a. Pb(NO3)2 contains no

• preparation the PSCs. (a–e) SEM images of perovskite films prepared with different amounts of PVP additives: (a) PVP-0 mg/mL, (b) PVP-0.5 mg/mL, (c) PVP-1 mg/mL, (d) PVP-2 mg/mL, (e) PVP-3 mg/mL. (a) XRD patterns of the Pb(NO3)2 films with different amounts of PVP additive. (b) XRD patterns of the perovskite