Temperature and chemical effects on the interfacial energy between a Ga–In–Sn eutectic liquid alloy and nanoscopic asperities

• Yujin Han,
• Pierre-Marie Thebault,
• Corentin Audes,
• Xuelin Wang,
• Haiwoong Park,
• Jian-Zhong Jiang and
• Arnaud Caron

Beilstein J. Nanotechnol. 2022, 13, 817–827, doi:10.3762/bjnano.13.72

• atomic force microscopy (AFM) tips of different chemistries as a function of the temperature (T = 21–90 °C) by AFM force spectroscopy using an XE100 AFM equipped with a heating stage (manufactured by Park Instruments, Republic of Korea). We recorded force–distance curves with PtSi-coated Si cantilevers

• (PtSi-cont, manufactured from NanoSensors, Switzerland), SiOx cantilevers (Contsc, manufactured from NanoSensors, Switzerland), and Au-coated Si cantilevers (ContscAu, manufactured from NanoSensors, Switzerland). Before measurements, the sensitivity of the AFM photodiode was calibrated by recording a

Optimizing PMMA solutions to suppress contamination in the transfer of CVD graphene for batch production

• Chun-Da Liao,
• Andrea Capasso,
• Tiago Queirós,
• Telma Domingues,
• Fatima Cerqueira,
• Nicoleta Nicoara,
• Jérôme Borme,
• Paulo Freitas and
• Pedro Alpuim

Beilstein J. Nanotechnol. 2022, 13, 796–806, doi:10.3762/bjnano.13.70

• ., Cu or Ni) to the desired target substrate (e.g., SiO2/Si, glass, or flexible polymers) often introduces inconsistencies among devices [10]. Various approaches have been developed to address this issue and establish a reproducible transfer process [11][12][13][14][15][16][17]. Among the many, the poly

• up with a target substrate (SiO2/Si wafer). The sample was dried in a vacuum chamber (ca. 10−4 Torr) at room temperature for 2 h. For PMMA removal, the entire sample was vertically dipped into an acetone bath for 4 h. After that, the exposed graphene on a SiO2/Si substrate was again vertically dipped

• synthesized graphene domains easy to be observed in an optical microscope equipped with a CCD camera (Supporting Information File 1, Figure S1a). Raman spectroscopy Large-area graphene films and single graphene crystals transferred onto SiO2/Si substrates were characterized by Raman microscopy (WITec GmbH

Efficient liquid exfoliation of KP₁₅ nanowires aided by Hansen's empirical theory

• Zhaoxuan Huang,
• Zhikang Jiang,
• Nan Tian,
• Disheng Yao,
• Fei Long,
• Yanhan Yang and
• Danmin Liu

Beilstein J. Nanotechnol. 2022, 13, 788–795, doi:10.3762/bjnano.13.69

• . For the Raman tests, KP15 samples were spun on SiO2(300 nm)/Si substrates. The excitation wavelength used was 532 nm, the spot size was approx. 1 μm, and the laser power was kept below 20 μW. For low-temperature Raman measurements, a Linkam THMS600 cryostat cooled by liquid nitrogen was used to

• control the temperature. To prevent sample drift, SiO2 (300 nm)/Si substrates with tested KP15 samples were attached by fixtures to the Linkam THMS600 cryostat. Results and Discussion KP15 bulks, prepared by the gas-phase-transfer method, had a flat and smooth surface shown in Figure 1a. The X-ray

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

• Masato Miyazaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2022, 13, 712–720, doi:10.3762/bjnano.13.63

• was arranged in front of a photodetector of the OBD system to suppress the influence of the UV light on the deflection sensor. We used a commercial Ir-coated Si cantilever (NANOSENSORS, SD-T7L100) with a resonant frequency f0 of 913 kHz, a spring constant k of 650 N/m, and a quality factor Q of 7748

Experimental and theoretical study of field-dependent spin splitting at ferromagnetic insulator–superconductor interfaces

• Peter Machon,
• Michael J. Wolf,
• Detlef Beckmann and
• Wolfgang Belzig

Beilstein J. Nanotechnol. 2022, 13, 682–688, doi:10.3762/bjnano.13.60

• a Si(111) substrate heated to 800 °C. In a second fabrication step, aluminium/aluminium oxide/copper tunnel junctions were fabricated on the EuS film using e-beam lithography and shadow evaporation. The nominal aluminium film thickness was d = 10 nm. The differential conductance g = dI/dV of the

Sodium doping in brookite TiO₂ enhances its photocatalytic activity

• Boxiang Zhuang,
• Honglong Shi,
• Honglei Zhang and
• Zeqian Zhang

Beilstein J. Nanotechnol. 2022, 13, 599–609, doi:10.3762/bjnano.13.52

• ). (1) Brookite—platy grains. Energy-dispersive X-ray spectroscopy (EDX) results of platy grains (Figure 4b) indicate that Na can be well identified besides Ti and O (note that the characteristic peak of C comes from the carbon conducting resin, Al from the sample holder, and Si from the silicon wafer

Revealing local structural properties of an atomically thin MoSe₂ surface using optical microscopy

• Lin Pan,
• Peng Miao,
• Anke Horneber,
• Alfred J. Meixner,
• Pierre-Michel Adam and
• Dai Zhang

Beilstein J. Nanotechnol. 2022, 13, 572–581, doi:10.3762/bjnano.13.49

• local structural properties on the Raman enhancement at 2D-TMDC monolayer surfaces. Results In this work, triangular MoSe2 flakes were chemically synthesized on a precleaned Si substrate coated with a thermally grown layer of SiO2. To investigate the Raman enhancement effect on a MoSe2 flake, we choose

• in Figure 1b are high-resolution AFM images of CuPc/MoSe2. The upper inset exhibits a step from the SiO2/Si substrate to the border of the MoSe2 flake, and the lower inset shows a distinct transition from the border to the center of the MoSe2 flake. The MoSe2 flake is fully covered by CuPc molecule

• aggregations, while on the SiO2/Si substrate some CuPc molecules aggregated to a rod-like particle, which has been also reported in the literature [24]. The height profile marked by the dashed white line in Figure 1b is visualized in Figure 1c. It suggests that the center of the MoSe2 flake is slightly thinner

Electrostatic pull-in application in flexible devices: A review

• Teng Cai,
• Yuming Fang,
• Yingli Fang,
• Ruozhou Li,
• Ying Yu and
• Mingyang Huang

Beilstein J. Nanotechnol. 2022, 13, 390–403, doi:10.3762/bjnano.13.32

• . Electrode materials include diamond, SiC, Si, and Ge. Table 3 summarizes nanowire materials commonly used for NEM switches. The research on NWs-NEM switches can be classified into two types, namely manufacturing techniques and in situ techniques. In the former, the switches are first processed by top-down

• with a switching ratio of about 103. Qian et al. [37] produced a U-shaped NEM switch with two Si nanowires, which support a square capacitive plate to form a U-shaped removable electrode, as shown in Figure 5b. The length of the silicon nanowires is 5 µm, the cross section is 90 × 90 nm square, the

• lateral gap is 2 µm, the gap between the electrode and the substrate is 145 nm, and the voltage is 1.12 V. However, the critical voltage fluctuation range is 1 V, and only five life cycles were achieved. Boodhoo et al. [38] used heavily doped Si NWs that were 1800 nm long, 42 nm wide and 50 nm thick, with

A broadband detector based on series YBCO grain boundary Josephson junctions

• Egor I. Glushkov,
• Alexander V. Chiginev,
• Leonid S. Kuzmin and
• Leonid S. Revin

Beilstein J. Nanotechnol. 2022, 13, 325–333, doi:10.3762/bjnano.13.27

• , respectively [36][37]. For a Josephson junction having a non-hysteretic IVC, the output voltage spectrum at a fixed bias current is defined as [38]: where Rd is the differential resistance; and depend on the nature of the junction barrier. For the considered structures, SI = 10−12 was chosen as a typical

Investigation of a memory effect in a Au/(Ti–Cu)Ox-gradient thin film/TiAlV structure

• Damian Wojcieszak,
• Jarosław Domaradzki,
• Michał Mazur,
• Tomasz Kotwica and
• Danuta Kaczmarek

Beilstein J. Nanotechnol. 2022, 13, 265–273, doi:10.3762/bjnano.13.21

• requirements of the different characterization methods, thin gradient layers were deposited on silicon (Si), amorphous silica (SiO2) and conductive metallic substrates (Ti6Al4V). The resulting thickness of the prepared thin films was about 610 nm as measured using a Talysurf optical profiler (Tylor Hobson CCI

• film: a) Cu 2p, b) Ti 2p, and c) O 1s core levels. (a) Photoelectron spectrum of the valence band, (b) schematic energy diagram of the surface of the (Ti0.48Cu0.52)Ox thin film. Results of TEM analysis and distribution of Cu, Ti, O, and Si in the gradient (Ti–Cu)Ox thin film with correlation to U

Relationship between corrosion and nanoscale friction on a metallic glass

• Haoran Ma and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2022, 13, 236–244, doi:10.3762/bjnano.13.18

• corrosive solution was added. For these experiments, we used an electrochemical atomic force microscope (ECAFM, Agilent 5500) and the oxidized tip (radius of ca. 30 nm) of a single-crystalline Si cantilever (PPP-CONT, NanoSensors, Germany). We adopted the beam geometry method to calibrate the force

Impact of device design on the electronic and optoelectronic properties of integrated Ru-terpyridine complexes

• Max Mennicken,
• Sophia Katharina Peter,
• Corinna Kaulen,
• Ulrich Simon and
• Silvia Karthäuser

Beilstein J. Nanotechnol. 2022, 13, 219–229, doi:10.3762/bjnano.13.16

• German Research Foundation (DFG Si 609/16-1, Ka 1819/7-1)).

Engineered titania nanomaterials in advanced clinical applications

• Padmavati Sahare,
• Paulina Govea Alvarez,
• Juan Manual Sanchez Yanez,
• Gabriel Luna-Bárcenas,
• Samik Chakraborty,
• Sujay Paul and
• Miriam Estevez

Beilstein J. Nanotechnol. 2022, 13, 201–218, doi:10.3762/bjnano.13.15

• regenerative medicine because of the utilization of the endogenous stem cells of the host or tissue-specific progenitor cells at the injury site. Akermanite is a bioceramic that has received significant attention because, after implantation, it can release Ca, Si, and Mg ions, which enhances adhesion

Low-energy electron interaction and focused electron beam-induced deposition of molybdenum hexacarbonyl (Mo(CO)₆)

• Po-Yuan Shih,
• Maicol Cipriani,
• Christian Felix Hermanns,
• Jens Oster,
• Klaus Edinger,
• Armin Gölzhäuser and
• Oddur Ingólfsson

Beilstein J. Nanotechnol. 2022, 13, 182–191, doi:10.3762/bjnano.13.13

• with an integrated Oxford EDX detector. The elemental composition of Mo(CO)6 FEBID deposits obtained by EDX measurement is shown in Table 3. Figure 4 shows the corresponding EDX spectrum along with the SEM image of the deposit. Traces of the EDX signal are discernable from the Au and Si components of

Thermal oxidation process on Si(113)-(3 × 2) investigated using high-temperature scanning tunneling microscopy

• Hiroya Tanaka,
• Shinya Ohno,
• Kazushi Miki and
• Masatoshi Tanaka

Beilstein J. Nanotechnol. 2022, 13, 172–181, doi:10.3762/bjnano.13.12

• Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan 10.3762/bjnano.13.12 Abstract Thermal oxidation of Si(113) in a monolayer regime was investigated using high-temperature scanning tunneling microscopy (STM). Dynamic processes during thermal oxidation were examined in three

• oxidation modes – oxidation, etching, and transition modes – in the third of which both oxidation and etching occur. A precise temperature–pressure growth mode diagram was obtained via careful measurements for Si(113), and the results were compared with those for Si(111) in the present work and Si(001) in

• the literature. Initial oxidation processes were identified based on high-resolution STM images. Keywords: high-index Si surface; in situ measurement; oxidation; scanning tunneling microscopy (STM); Introduction High-index silicon surfaces have drawn considerable interest for their usefulness in

Influence of magnetic domain walls on all-optical magnetic toggle switching in a ferrimagnetic GdFe film

• Rahil Hosseinifar,
• Evangelos Golias,
• Ivar Kumberg,
• Quentin Guillet,
• Karl Frischmuth,
• Sangeeta Thakur,
• Mario Fix,
• Manfred Albrecht,
• Florian Kronast and
• Wolfgang Kuch

Beilstein J. Nanotechnol. 2022, 13, 74–81, doi:10.3762/bjnano.13.5

• thickness, deposited at room temperature using magnetron sputtering (base pressure <10−8 mbar) from elemental targets. The Ar sputter pressure was kept constant at 3.5 × 10−3 mbar during the deposition process. The film was prepared with 5 nm Pt as a seed layer on a Si(100) substrate with a 100 nm thick

• (100 nm)/Si(100). Magnetic properties were characterized by superconducting quantum interference device vibrating sample magnetometry, which confirmed an out-of-plane easy axis of magnetization with rectangular hysteresis loops and a coercivity of about 5 mT at room temperature, see Supporting

Sputtering onto liquids: a critical review

• Anastasiya Sergievskaya,
• Adrien Chauvin and
• Stephanos Konstantinidis

Beilstein J. Nanotechnol. 2022, 13, 10–53, doi:10.3762/bjnano.13.2

Nonmonotonous temperature dependence of Shapiro steps in YBCO grain boundary junctions

• Leonid S. Revin,
• Dmitriy V. Masterov,
• Alexey E. Parafin,
• Sergey A. Pavlov and
• Andrey L. Pankratov

Beilstein J. Nanotechnol. 2021, 12, 1279–1285, doi:10.3762/bjnano.12.95

• analysis of the transport properties, the best structure was selected and located at the center of a Si lens for efficient detection. The sample was mounted into a dry cryostat allowing for measurements in a wide temperature range from helium temperatures to ≈80 K. An external gigahertz signal was fed

Morphology-driven gas sensing by fabricated fractals: A review

• Vishal Kamathe and
• Rupali Nagar

Beilstein J. Nanotechnol. 2021, 12, 1187–1208, doi:10.3762/bjnano.12.88

• study, Kante et al. prepared SnO2 films with fractal morphology by an electrochemical method with a subsequent oxidation process [68]. Both groups tested the films for CO gas sensing at different temperatures. Figure 8a–d shows the SEM images of SnO2 thin films on a Si(100) substrate obtained by Chen

• the sensor, while Figure 12d shows individual EDS maps of Si, Pt, O, and Ti. The fabricated sensor displayed good sensitivity towards acetone under exposure to UV light with a detection limit greater than 97% at 10 ppb. The exceptional sensitivity achieved was attributed to high porosity, network

• -assisted chemical etching was used by Qin et al. [79] to prepare a dendritic array of Si/WO3 NW composites, which was tested for the detection of NO2 gas at room temperature. Figure 17a–e SEM and high-resolution transmission electron microscopy (HR-TEM) images of Si/WO3 NWs. Figure 17f shows the XRD

Irradiation-driven molecular dynamics simulation of the FEBID process for Pt(PF₃)₄

• Alexey Prosvetov,
• Alexey V. Verkhovtsev,
• Gennady Sushko and
• Andrey V. Solov’yov

Beilstein J. Nanotechnol. 2021, 12, 1151–1172, doi:10.3762/bjnano.12.86

• substrate The first step of the FEBID simulation procedure shown in Figure 1 concerns the specification of a precursor molecule and a substrate. The selection of the system components is usually linked to available experiments. Common experimentally used substrate materials are, for example, SiO2, Si, Au

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

• Gheorghe Stan and
• Pradeep Namboodiri

Beilstein J. Nanotechnol. 2021, 12, 1115–1126, doi:10.3762/bjnano.12.83

• electrical [57][58], chemical [59], optical [60][61], and mechanical [62][63] measurements. Results and Discussion Closed-loop KPFM measurements in two-pass PFT mode The new OL AM-KPFM implementation was tested on a commercially available sample consisting of large Au and Al metal regions deposited on a Si

• substrate (Bruker Nano Surfaces, Santa Barbara, CA, USA); the metal regions are separated by trenches that expose the Si substrate at their bottom. Figure 1a shows the AFM topographical image of one of these trenches, bordered by Au (left) and Al (right). The CPD maps over the sample were obtained first by

• coated probe (Bruker, Santa Barbara, CA, USA). A set of CPD maps over the same Au/Si/Al trench is shown in Figure 1d–g. As can be seen, the CPD contrast of the maps obtained by CL AM-KPFM changes with the position of the cantilever over either Au or Al (refer to Figure 1d–f) whereas the CPD maps from CL

Assessment of the optical and electrical properties of light-emitting diodes containing carbon-based nanostructures and plasmonic nanoparticles: a review

• Keshav Nagpal,
• Erwan Rauwel,
• Frédérique Ducroquet and
• Protima Rauwel

Beilstein J. Nanotechnol. 2021, 12, 1078–1092, doi:10.3762/bjnano.12.80

• their sizes [92]. Generally, a QD-based EML is sandwiched between a polymer-based ETL and HTL. Carbon-based nanomaterials such as SWNT have also been investigated as EML in OLED. Firstly, a SWNT p–n junction on a Si substrate has been investigated by Lee et al. [93]. Further, Mueller et al., with some

Progress and innovation of nanostructured sulfur cathodes and metal-free anodes for room-temperature Na–S batteries

• Marina Tabuyo-Martínez,
• Bernd Wicklein and
• Pilar Aranda

Beilstein J. Nanotechnol. 2021, 12, 995–1020, doi:10.3762/bjnano.12.75

• to the expansion of these batteries into wider consumer markets, for which hard carbon, Si, Sn and Sb alloys, as well as phosphorous compounds are currently investigated [25][26][27]. This review focuses on the most recent designs of cathode materials for RT Na–S batteries, which attempt to overcome

• accommodated by the matrices, especially in the case of flexible ones. Na alloys and intermetallics Sodium is capable of forming alloys and intermetallic compounds with a range of elements at room temperature, most notably with Sb, Sn, P, Si, Ge, and Bi [73]. This way, considerable amounts of Na can be stored

• intermetallic compounds (M-Sn/Sb/P with M = Sn, Sb, P, Si, Bi, Cu, Ni, Fe, Zn). Fully sodiated Sb, Sn, and P form the phases Na3Sb, Na15Sn4, and Na3P, which offer theoretical capacities of 660, 847 and 2596 mAh·g−1, respectively [73]. However, the measured values are usually somewhat lower due to cycle

A Au/CuNiCoS₄/p-Si photodiode: electrical and morphological characterization

• Adem Koçyiğit,
• Adem Sarılmaz,
• Teoman Öztürk,
• Faruk Ozel and
• Murat Yıldırım

Beilstein J. Nanotechnol. 2021, 12, 984–994, doi:10.3762/bjnano.12.74

• p-type Si by measuring I–V and C–V characteristics. The fabricated Au/CuNiCoS4/p-Si device exhibited good rectifying properties, high photoresponse activity, low series resistance, and high shunt resistance. The C–V characteristics revealed that capacitance and conductance of the photodiode are

• voltage-and frequency-dependent. The fabricated device with CuNiCoS4 thiospinel nanocrystals can be employed in high-efficiency optoelectronic applications. Keywords: Au/CuNiCoS4/p-Si device; CuNiCoS4; optoelectronic applications; Schottky devices; Introduction Recently, spinel materials have attracted

• characteristics of the photodiode after inserting CuNiCoS4 nanocrystals as interlayer between Au metal and p-Si were investigated. The aim is to obtain more powerful photodiodes by using a new type of interlayer material. XRD, HR-TEM, and SEM analyses were carried out to characterize the thiospinel CuNiCoS4

Molecular assemblies on surfaces: towards physical and electronic decoupling of organic molecules

• Sabine Maier and
• Meike Stöhr

Beilstein J. Nanotechnol. 2021, 12, 950–956, doi:10.3762/bjnano.12.71

• ][37][38][39], while also B deposition was shown to result in effective passivation of the Si surface [40][41]. In particular for electronic devices, oxidized semiconductor surfaces (e.g., silicon dioxide layers formed on bare silicon) are mostly used as substrates for fabricating devices [42]. Most of

• molecules from a semiconducting substrate is discussed for the example of both insulating CaF2 thin films on Si(111) [91] and hydrogen passivation of Ge(001) surfaces [92]. In the first case, three scenarios were compared: PTCDA on Si, on a thin CaF2, and on a thicker CaF2 layer. While isolated PTCDA

• molecules were pinned to defects on Si and also on the thin CaF2 layer, PTCDA was physically decoupled via the thicker CaF2 films and self-assembled into small islands. For FePc on H-passivated Ge(001), efficient physical decoupling facilitated the growth of large islands with upright oriented molecules