Exploring the retention properties of CaF₂ nanoparticles as possible additives for dental care application with tapping-mode atomic force microscope in liquid

• Matthias Wasem,
• Joachim Köser,
• Sylvia Hess,
• Enrico Gnecco and
• Ernst Meyer

Beilstein J. Nanotechnol. 2014, 5, 36–43, doi:10.3762/bjnano.5.4

Noise performance of frequency modulation Kelvin force microscopy

• Heinrich Diesinger,
• Dominique Deresmes and
• Thierry Mélin

Beilstein J. Nanotechnol. 2014, 5, 1–18, doi:10.3762/bjnano.5.1

• deteriorating one noise source when improving the other, ultimately merging into the uncertainty relation governing that a system cannot be measured without changing it by whatever kind of sensor back-action. Experimental The KFM is based on an Omicron ultrahigh vacuum variable temperature atomic force

• microscope (UHV-VT-AFM). It is operated by a Nanonis scanning probe microscopy (SPM) controller entirely based on digital signal processing (DSP). The probe that was used in these experiments is a platinum-iridium coated Nanosensors Point Probe Plus EFM tip with a spring constant between 1 and 3 N/m. Its

Atomic force microscopy recognition of protein A on Staphylococcus aureus cell surfaces by labelling with IgG–Au conjugates

• Elena B. Tatlybaeva,
• Hike N. Nikiyan,
• Alexey S. Vasilchenko and
• Dmitri G. Deryabin

Beilstein J. Nanotechnol. 2013, 4, 743–749, doi:10.3762/bjnano.4.84

• conjugated with electron-dense particles, such as colloidal gold [2]. Significant progress in microscopic techniques has been reached with the invention of the atomic force microscope (AFM) [3]. However, appropriate approaches for the utilization of AFM in revealing markers are still being developed

• ]. The mica surface is most commonly used for protein AFM imaging because of its hydrophilic character, its atomically flatness and the high affinity for proteins [28]. Atomic force microscopy imaging Images were collected by using an SMM-2000 atomic force microscope (JSC "Proton-MIET Plant", Russia

Evolution of microstructure and related optical properties of ZnO grown by atomic layer deposition

• Adib Abou Chaaya,
• Roman Viter,
• Mikhael Bechelany,
• Zanda Alute,
• Donats Erts,
• Anastasiya Zalesskaya,
• Kristaps Kovalevskis,
• Vincent Rouessac,
• Valentyn Smyntyna and
• Philippe Miele

Beilstein J. Nanotechnol. 2013, 4, 690–698, doi:10.3762/bjnano.4.78

• properties of the ZnO films were characterized by scanning electron microscopy (SEM), ellipsometry, energy-dispersive X-ray spectroscopy (EDX), and grazing incidence X-ray diffraction (GIXRD). An Asylum Research MFP-3D atomic force microscope equipped with a commercial silicon tip was operated in the tapping

Site-selective growth of surface-anchored metal-organic frameworks on self-assembled monolayer patterns prepared by AFM nanografting

• Tatjana Ladnorg,
• Alexander Welle,
• Stefan Heißler,
• Christof Wöll and
• Hartmut Gliemann

Beilstein J. Nanotechnol. 2013, 4, 638–648, doi:10.3762/bjnano.4.71

• the orientation of the SURMOF. Here, we demonstrate for the first time the site-selective growth of the SURMOF HKUST-1 on thiol-based self-assembled monolayers patterned by the nanografting technique, with an atomic force microscope as a structuring tool. Two different approaches were applied: The

k-space imaging of the eigenmodes of sharp gold tapers for scanning near-field optical microscopy

• Martin Esmann,
• Simon F. Becker,
• Bernard B. da Cunha,
• Jens H. Brauer,
• Ralf Vogelgesang,
• Petra Groß and
• Christoph Lienau

Beilstein J. Nanotechnol. 2013, 4, 603–610, doi:10.3762/bjnano.4.67

• is controlled using a tuning fork-based force sensor in a noncontact-mode atomic force microscope (AFM). This microscope is a modified version of the setup described in [10]. The taper probe is attached to one prong of a quartz tuning fork that oscillates with a peak-to-peak amplitude of 1 nm. The

Digging gold: keV He⁺ ion interaction with Au

• Vasilisa Veligura,
• Gregor Hlawacek,
• Robin P. Berkelaar,
• Raoul van Gastel,
• Harold J. W. Zandvliet and
• Bene Poelsema

Beilstein J. Nanotechnol. 2013, 4, 453–460, doi:10.3762/bjnano.4.53

• exposed to a 10 W air plasma for 15 min immediately before loading the samples into the main chamber. After ion implantation the topography of the samples was measured with an Agilent 5100 atomic force microscope (AFM) in intermittent mode. The cantilever was a Mikromasch NSC silicon probe, with a

High-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscope

• Mark Cronin-Golomb and
• Ozgur Sahin

Beilstein J. Nanotechnol. 2013, 4, 243–248, doi:10.3762/bjnano.4.25

• structures are commonly encountered. Topography of electrospun silk fibers on a glass substrate. The 3-D image is rendered according to the local height measured by the atomic force microscope. The scan size is 20 × 20 µm2. The fibers form a mesh-like network. Branches between intersections occasionally form

Diamond nanophotonics

• Katja Beha,
• Helmut Fedder,
• Marco Wolfer,
• Merle C. Becker,
• Petr Siyushev,
• Mohammad Jamali,
• Anton Batalov,
• Christopher Hinz,
• Jakob Hees,
• Lutz Kirste,
• Harald Obloh,
• Etienne Gheeraert,
• Boris Naydenov,
• Ingmar Jakobi,
• Florian Dolde,
• Sébastien Pezzagna,
• Daniel Twittchen,
• Matthew Markham,
• Daniel Dregely,
• Harald Giessen,
• Jan Meijer,
• Fedor Jelezko,
• Christoph E. Nebel,
• Rudolf Bratschitsch,
• Alfred Leitenstorfer and
• Jörg Wrachtrup

Beilstein J. Nanotechnol. 2012, 3, 895–908, doi:10.3762/bjnano.3.100

• . Subsequently, diamond nanocrystals are spin coated onto the substrate. By using a dual atomic force microscope (AFM) and confocal microscopy setup, diamond nanocrystals that contain single color centers are then identified by fluorescence microscopy and second-order photon autocorrelation, and their position

Advanced atomic force microscopy techniques

• Thilo Glatzel,
• Hendrik Hölscher,
• Thomas Schimmel,
• Mehmet Z. Baykara,
• Udo D. Schwarz and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2012, 3, 893–894, doi:10.3762/bjnano.3.99

• introduced in the 19th century, the invention of the atomic force microscope (AFM) in 1986 by Binnig, Quate, and Gerber was a milestone for nanotechnology. The scanning tunneling microscope (STM), introduced some years earlier, had already achieved atomic resolution, but is limited to conductive surfaces

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

• Christian Obermair,
• Marina Kress,
• Andreas Wagner and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2012, 3, 824–830, doi:10.3762/bjnano.3.92

• , Germany 10.3762/bjnano.3.92 Abstract We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substrate surface for site

• are valuable tools for imaging surfaces and surface processes on the nanometer scale. Examples of recent work can be found in the literature [30][31][32][33][34][35][36][37][38][39][40]. At the same time, the scanning tips of the atomic force microscope, the scanning tunneling microscope (STM) and

• structures. We also discuss the implications of these results on the understanding of the deposition mechanism. Results and Discussion Reversible writing, deleting and re-writing Writing of metallic structures with the tip of an atomic force microscope as a “nano-electrochemical pen” was performed as

Pinch-off mechanism in double-lateral-gate junctionless transistors fabricated by scanning probe microscope based lithography

• Farhad Larki,
• Arash Dehzangi,
• Alam Abedini,
• Ahmad Makarimi Abdullah,
• Elias Saion,
• Sabar D. Hutagalung,
• Mohd N. Hamidon and
• Jumiah Hassan

Beilstein J. Nanotechnol. 2012, 3, 817–823, doi:10.3762/bjnano.3.91

• Snow et al. [11]. Subsequent results by this technique are presented in the references [12][13]. In fact, fabrication of nanostructures by SPL and particularly by using atomic force microscope (AFM) nanolithography has been developed with prominent results, and similar structures have been fabricated

Current–voltage characteristics of single-molecule diarylethene junctions measured with adjustable gold electrodes in solution

• Bernd M. Briechle,
• Youngsang Kim,
• Philipp Ehrenreich,
• Artur Erbe,
• Dmytro Sysoiev,
• Thomas Huhn,
• Ulrich Groth and
• Elke Scheer

Beilstein J. Nanotechnol. 2012, 3, 798–808, doi:10.3762/bjnano.3.89

• ], molecular networks with nanoparticle electrodes [18], atomic force microscope (AFM) [22], and carbon-nanotube electrode [23] techniques, as well as structural studies using scanning tunneling microscopy (STM) [24][25] have been performed successfully. In addition, mechanically controlled break-junctions

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

• Blake W. Erickson,
• Séverine Coquoz,
• Jonathan D. Adams,
• Daniel J. Burns and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

• applicable to all channels of AFM data, and can process images in seconds. Keywords: adaptive algorithm; artifact correction; atomic force microscopy; high-speed atomic force microscope; image processing; Introduction Atomic force microscopes (AFMs) are a useful tool for investigating nanoscale surfaces

Friction and durability of virgin and damaged skin with and without skin cream treatment using atomic force microscopy

• Bharat Bhushan,
• Si Chen and
• Shirong Ge

Beilstein J. Nanotechnol. 2012, 3, 731–746, doi:10.3762/bjnano.3.83

• . The nanoscale studies were performed by using atomic force microscope (AFM), and macroscale studies were performed by using a pin-on-disk (POD) reciprocating tribometer. It was found that damaged skin has different mechanical properties, surface roughness, contact angle, friction and durability

Focused electron beam induced deposition: A perspective

• Michael Huth,
• Fabrizio Porrati,
• Christian Schwalb,
• Marcel Winhold,
• Roland Sachser,
• Maja Dukic,
• Jonathan Adams and
• Georg Fantner

Beilstein J. Nanotechnol. 2012, 3, 597–619, doi:10.3762/bjnano.3.70

The oriented and patterned growth of fluorescent metal–organic frameworks onto functionalized surfaces

• Jinliang Zhuang,
• Jasmin Friedel and
• Andreas Terfort

Beilstein J. Nanotechnol. 2012, 3, 570–578, doi:10.3762/bjnano.3.66

• samples. AFM measurements were performed on a NanoScope DimensionTM 3100 atomic force microscope in tapping mode. FT-IR spectra were recorded with a NICOLET 6700 Fourier transform infrared reflection–absorption spectrometer. For bulk substances a diamond ATR cell was used; for thin films on reflective

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

• Jianming Zhang,
• Zehra Parlak,
• Carleen M. Bowers,
• Terrence Oas and
• Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

• lateral resolution is important for a broad range of applications in materials science [1][2][3][4][5][6][7][8][9][10] and in the life sciences [11][12][13][14][15][16][17][18][19][20]. The atomic force microscope (AFM) [21], due to its force sensitivity and ability to image surface topography with high

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• nonlinear interaction [19]. Thus, we investigated the relevance of the experimental parameters, such as oscillation amplitudes and setpoint, for an atomic force microscope operating in the bimodal mode. Experimental Amplitude-and-phase-versus-distance curves We performed amplitude-and-phase-versus-distance

Colloidal lithography for fabricating patterned polymer-brush microstructures

• Tao Chen,
• Debby P. Chang,
• Rainer Jordan and
• Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 397–403, doi:10.3762/bjnano.3.46

• -grade water, dried under a stream of nitrogen, and mounted on steel sample disks prior to AFM measurements. AFM topographic images were collected in contact mode by using V-shaped silicon nitride cantilevers (Nanoprobe, Veeco, spring constant 0.12 N/m; tip radius 20–60 nm) using a MultiMode atomic force

• microscope (Digital Instruments, Santa Barbara, CA). The AFM topographic images performed in air, were obtained under low applied normal forces (<1 nN) to minimize compression and lateral damage of the polymer brushes. The relatively large lateral size of the polymer-brush features did not necessitate image

Models of the interaction of metal tips with insulating surfaces

• Thomas Trevethan,
• Matthew Watkins and
• Alexander L. Shluger

Beilstein J. Nanotechnol. 2012, 3, 329–335, doi:10.3762/bjnano.3.37

• . Keywords: atomic force microscopy; density functional theory; ionic surfaces; metallic asperities; surface interactions; Introduction The noncontact atomic force microscope (NC-AFM) is capable of imaging both conducting and insulating systems with true atomic resolution and has provided extraordinary

Combining nanoscale manipulation with macroscale relocation of single quantum dots

• Francesca Paola Quacquarelli,
• Richard A. J. Woolley,
• Martin Humphry,
• Jasbiner Chauhan,
• Philip J. Moriarty and
• Ashley Cadby

Beilstein J. Nanotechnol. 2012, 3, 324–328, doi:10.3762/bjnano.3.36

• per square micron on the patterned sapphire substrate was achieved. For AFM imaging and manipulation we used an Asylum MFP-3D atomic force microscope in tapping mode (imaging) or contact mode (manipulation) with AC240TS Olympus AFM cantilevers. Several cells were imaged over a large scan, typically 20

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

• Joachim Welker,
• Esther Illek and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

• Sader–Jarvis method. However, the matrix method generally provides the higher deconvolution quality. Keywords: frequency-modulation atomic force microscopy; force deconvolution; numerical implementation; Introduction The atomic force microscope (AFM) was invented 25 years ago as an offspring of the

Modeling noncontact atomic force microscopy resolution on corrugated surfaces

• Kristen M. Burson,
• Mahito Yamamoto and
• William G. Cullen

Beilstein J. Nanotechnol. 2012, 3, 230–237, doi:10.3762/bjnano.3.26

• complete and quantitatively accurate understanding of the factors limiting the resolution of corrugated surfaces. Experimental All NC-AFM images were collected with a JEOL ultrahigh-vacuum atomic force microscope with a base pressure of 4 × 10−8 Pa. SiO2 samples (Figure 1a and Figure 1b) were cleaved in

A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

• Manfred Lange,
• Dennis van Vörden and
• Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 207–212, doi:10.3762/bjnano.3.23