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Search for "capacitance gradients" in Full Text gives 3 result(s) in Beilstein Journal of Nanotechnology.

Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy

  • Pascal N. Rohrbeck,
  • Lukas D. Cavar,
  • Franjo Weber,
  • Peter G. Reichel,
  • Mara Niebling and
  • Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 637–651, doi:10.3762/bjnano.16.49

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  • nanoscale systems across materials science, biology, and nanotechnology, complementing established methods in the field. Keywords: atomic force microscopy; capacitance gradients; dielectric constant; dielectric spectroscopy; heterodyne frequency mixing; Kelvin probe force microscopy; multifrequency AFM
  • , Cherniavskaya et al. and Crider et al. laid the groundwork for EFM-based nanoscale dielectric measurements such as SCFM [68][69]. Generally, EFM methods using higher-order capacitance gradients exhibit superior lateral resolution [75]. An interesting extension of SCM and SCFM is the possibility to vary the
  • or heterodyne Kelvin probe force microscopy (KPFM) [18][26][79]. The second harmonic signals are proportional to the local capacitance gradients, providing information about the local tip–sample capacitance. To ensure a sufficient signal-to-noise ratio, the resulting frequencies should coincide with
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Published 08 May 2025

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

  • Jason I. Kilpatrick,
  • Emrullah Kargin and
  • Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

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  • ] and where ϕ is the half cone angle. Figure 1 shows the z dependence of the capacitance gradients using the sphere and cone models. Again, this simplistic expression only considers the capacitance contribution at the tip apex and ignores the overall geometry of the rest of the cantilever. For
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Published 12 Sep 2022

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

  • Aaron Mascaro,
  • Yoichi Miyahara,
  • Tyler Enright,
  • Omur E. Dagdeviren and
  • Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

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  • resolution, at the expense of longer measurement times. Another complication that may be encountered will be observed when performing measurements on samples with non-static capacitance gradients. For the analysis performed in this case the capacitance was assumed to have only the periodicity of the
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Published 01 Mar 2019
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