Automated collection and categorisation of STM images and STS spectra with and without machine learning

• Dylan Stewart Barker and
• Adam Sweetman

Beilstein J. Nanotechnol. 2025, 16, 1367–1379, doi:10.3762/bjnano.16.99

• that a tip change did not occur during the scan. The obtained topograph is then analysed to find both a large area of clean metal substrate, over which I(V) spectra can be obtained, and to find the location of the molecules in various configurations, over which additional I(V) spectra are taken. After

Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

• Bob Kyeyune,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 944–950, doi:10.3762/bjnano.16.72

• CaF2(111) surface. A change of the atomic contrast is explained by a polarity change of the tip-terminating cluster or by a polarity-preserving tip change via the re-arrangement of the foremost atoms. Based on the established understanding of the unique contrast patterns on CaF2(111), polarity

• . Keywords: atomic resolution imaging; calcium fluoride surface; interaction force; non-contact atomic force microscopy (NC-AFM); tip change; Introduction Non-contact atomic force microscopy (NC-AFM) [1] is a surface science tool that has been used to atomically resolve surfaces of semiconductor and

• a change of the tip-terminating cluster (i.e., a tip change) and a distance-dependent contrast evolution for a stable tip. Tip changes are inevitable in NC-AFM experiments with non-functionalized tips, especially as commonly used silicon tips are very reactive and readily pick up various entities

Spatial variations of conductivity of self-assembled monolayers of dodecanethiol on Au/mica and Au/Si substrates

• Julian Skolaut,
• Jędrzej Tepper,
• Federica Galli,
• Wulf Wulfhekel and
• Jan M. van Ruitenbeek

Beilstein J. Nanotechnol. 2023, 14, 1169–1177, doi:10.3762/bjnano.14.97

• in current in the lower part of the image can be attributed to a tip change. (c, d) The same data for a Au/Si substrate. The topography shows more substructures, which is reflected in more extreme current values in the current map (Fsetpoint = 50 nN, Ubias = 100 mV, RMN probe). (a, b) Topography and

Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

• Jeremiah Croshaw,
• Thomas Dienel,
• Taleana Huff and
• Robert Wolkow

Beilstein J. Nanotechnol. 2020, 11, 1346–1360, doi:10.3762/bjnano.11.119

• (dark) and Figure 2g-1 (bright). To support that these two defects are unique and not the consequence of a tip change, the data were taken sequentially while continuously monitoring for tip changes (except STHM), ensuring identical apex character. The two varieties originate from different

Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites

• Diana El Khoury,
• Richard Arinero,
• Jean-Charles Laurentie,
• Mikhaël Bechelany,
• Michel Ramonda and
• Jérôme Castellon

Beilstein J. Nanotechnol. 2018, 9, 2999–3012, doi:10.3762/bjnano.9.279

• contaminated, requiring a tip change. As a water meniscus created between the tip and the surface in air environment can cause the sticking of the tip to the surface at low distances, layers that adsorb more water molecules are supposed to be responsible for greater attraction forces. Consequently, a water

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

• Majid Fazeli Jadidi,
• Umut Kamber,
• Oğuzhan Gürlü and
• H. Özgür Özer

Beilstein J. Nanotechnol. 2018, 9, 2953–2959, doi:10.3762/bjnano.9.274

• two regions. The change in force contrast accompanied by a slight change in STM topography could suggest a change in alignment of the topmost layer with the underlying graphene layer or the substrate. However, we cannot rule out the possibility of a tip change occurring smoothly during several scan

Noise in NC-AFM measurements with significant tip–sample interaction

• Jannis Lübbe,
• Matthias Temmen,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 1885–1904, doi:10.3762/bjnano.7.181

• during measurements upon a change in tip–sample interaction, for instance due to a change in tip–sample distance or a tip change. In such situations, best results are commonly obtained by following the instinct of the experienced experimentalist. However, the basic adjustment of the system to yield the

Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique

• Zsolt Majzik,
• Martin Setvín,
• Andreas Bettac,
• Albrecht Feltz,
• Vladimír Cháb and
• Pavel Jelínek

Beilstein J. Nanotechnol. 2012, 3, 249–259, doi:10.3762/bjnano.3.28

• measurement with the same sensor but with a different tip apex. The tip change was induced by applying a combination of z pulses and voltage pulses. The obtained data show (Figure 8B) a significant reduction of the force maximum of the short-range force FSR ≈ 0.8 nN. In the weak-interaction regime (here z

Molecular-resolution imaging of pentacene on KCl(001)

• Julia L. Neff,
• Jan Götzen,
• Enhui Li,
• Michael Marz and
• Regina Hoffmann-Vogel

Beilstein J. Nanotechnol. 2012, 3, 186–191, doi:10.3762/bjnano.3.20

• switch due to pick-up or drop-off of a molecule. In Figure 3b a change of the pattern occurs in the lower part of the scanned area. This change is not caused by a tip change, as the border between the original and the modified pattern does not correspond to a line scan but occurs at an angle with respect