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Search for "AFM cantilever" in Full Text gives 83 result(s) in Beilstein Journal of Nanotechnology.

The effect of heat treatment on the morphology and mobility of Au nanoparticles

  • Sven Oras,
  • Sergei Vlassov,
  • Simon Vigonski,
  • Boris Polyakov,
  • Mikk Antsov,
  • Vahur Zadin,
  • Rünno Lõhmus and
  • Karine Mougin

Beilstein J. Nanotechnol. 2020, 11, 61–67, doi:10.3762/bjnano.11.6

Graphical Abstract
  • manipulation of the NPs was performed with a Bruker Multimode 8 AFM in the PeakForce quantitative nanoscale mechanical characteriztion (PeakForce QNM) mode using a rectangular AFM cantilever (Bruker, RTESPA-300, k = 40 N/m) with a resonance frequency of around 300 kHz. Prior to each manipulation, the samples
  • calculated with the following equation [20]: where k is the cantilever spring constant, f0 is the resonance frequency of the cantilever, Aset is the setpoint amplitude, Apiezo is the drive amplitude, θ is the phase signal and Q is the quality factor of the AFM cantilever. The dissipated power was used as a
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Published 06 Jan 2020

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

  • Nahid Hosseini,
  • Matthias Neuenschwander,
  • Oliver Peric,
  • Santiago H. Andany,
  • Jonathan D. Adams and
  • Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

Graphical Abstract
  • topography significantly better. Discussion The critical feature of any AFM cantilever is the tip. For general imaging, the quality of the tip is primarily determined by the tip radius and the wear rate of the tip. We need to comment that our tips have a decent sharpness compared to other silicon nitride
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Published 29 Nov 2019

Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

  • Yan Liu,
  • Li Li,
  • Xing Chen,
  • Ying Wang,
  • Meng-Nan Liu,
  • Jin Yan,
  • Liang Cao,
  • Lu Wang and
  • Zuo-Bin Wang

Beilstein J. Nanotechnol. 2019, 10, 2329–2337, doi:10.3762/bjnano.10.223

Graphical Abstract
  • biomechanical studies [21]. Atomic force acoustic microscopy (AFAM) is a technique based on AFM for nondestructive imaging. This technique operates on a dynamic mode in which the AFM cantilever vibrates upon ultrasound excitation. Accordingly, AFAM shows the ability to measure nanomechanical properties and is
  • surfaces [29][33]. When the probe sensor is in contact with the sample surface, the AFM cantilever directly reflects the vibrations. By modulating the drive frequency and the excitation amplitude used for AFAM imaging, the cantilever is set to adopt to the feedback signal. Finally, by analyzing the
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Published 26 Nov 2019

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

  • Zahra Abooalizadeh,
  • Leszek Josef Sudak and
  • Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

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  • contaminants on the surface when measuring the mechanical properties of atomic-sized defects [15][16][17]. Furthermore, the high quality factor of the AFM cantilever that is achieved under UHV conditions can be very beneficial in dynamic AFM modes, as the Q-factor is inversely proportional to the force
  • mechanical properties is the modulation frequency. Thus, care must be taken when choosing the modulation frequency. Conclusion Dynamic AFM measurements were conducted on HOPG surfaces. Both FMM and CR AFM experimental results showed an increase in the amplitude response of the AFM cantilever as the tip slid
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Published 03 Jul 2019

Mechanical and thermodynamic properties of Aβ42, Aβ40, and α-synuclein fibrils: a coarse-grained method to complement experimental studies

  • Adolfo B. Poma,
  • Horacio V. Guzman,
  • Mai Suan Li and
  • Panagiotis E. Theodorakis

Beilstein J. Nanotechnol. 2019, 10, 500–513, doi:10.3762/bjnano.10.51

Graphical Abstract
  • considered. The former refers to the way that the indentation load is measured by the deflection of the AFM cantilever. The latter is an assumption of the semi-infinite half-space approximation. Once the AFM data is obtained, it requires interpretation by using a contact mechanics theory. There is no
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Published 19 Feb 2019

In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy

  • Jesús S. Lacasa,
  • Lisa Almonte and
  • Jaime Colchero

Beilstein J. Nanotechnol. 2018, 9, 2925–2935, doi:10.3762/bjnano.9.271

Graphical Abstract
  • experimentally very challenging, due to very large tip–sample interaction. In spite of these problems, we have been able to image an AFM cantilever and its tip. Figure 1 shows the flat cantilever part (Figure 1a), an optical image of the whole cantilever (Figure 1b) and the tip (Figure 1c). In the optical image
  • silicon surfaces this second step forms a thin passivating layer. Finally, the surface of the samples is dried by blowing with N2 for about 1 min. AFM images (a, c) and optical image (b) of the tip side of an Olympus OMCL-HA-100 AFM cantilever. Image sizes: 4 × 4 μm2 and 80 nm height scale for the AFM
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Published 23 Nov 2018

Characterization of the microscopic tribological properties of sandfish (Scincus scincus) scales by atomic force microscopy

  • Weibin Wu,
  • Christian Lutz,
  • Simon Mersch,
  • Richard Thelen,
  • Christian Greiner,
  • Guillaume Gomard and
  • Hendrik Hölscher

Beilstein J. Nanotechnol. 2018, 9, 2618–2627, doi:10.3762/bjnano.9.243

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  • contact angle of a single sandfish scale is about 100° (droplet volume 1 µL). SEM images of some probes used in this study. (a) Sharp tip of a conventional AFM cantilever made from silicon. (b) Sand particle glued to the end of a tipless cantilever (“sand probe”). The inset is a side view. (c) Glass
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Published 02 Oct 2018

Nanoscale characterization of the temporary adhesive of the sea urchin Paracentrotus lividus

  • Ana S. Viana and
  • Romana Santos

Beilstein J. Nanotechnol. 2018, 9, 2277–2286, doi:10.3762/bjnano.9.212

Graphical Abstract
  • . lividus could be easily collected on mica (Figure 1a,b) and subsequently located using an optical microscope to be precisely positioned beneath the AFM cantilever (Figure 1c). The diameter of the adhesive footprints roughly corresponded to the size of the tube feet discs (±1 mm). The thickness of the
  • ×) illustrating the positioning of the moist adhesive footprint (indicated by the arrow) beneath the triangular-shaped AFM cantilever. Peak force tapping AFM (PFT-AFM) image (a) and height profile (b) of Paracentrotus lividus moist footprints at the edge of the adhesive material. Image obtained with a ScanAsyst
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Published 24 Aug 2018

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

  • Yann Almadori,
  • David Moerman,
  • Jaume Llacer Martinez,
  • Philippe Leclère and
  • Benjamin Grévin

Beilstein J. Nanotechnol. 2018, 9, 1695–1704, doi:10.3762/bjnano.9.161

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  • by AFM under illumination originate mainly from the intrinsic material deformation [16]. More precisely, thanks to a rigorous experimental protocol, they demonstrated that it is possible to discriminate between the intrinsic material deformation and the extrinsic effects related to the AFM cantilever
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Published 07 Jun 2018

Automated image segmentation-assisted flattening of atomic force microscopy images

  • Yuliang Wang,
  • Tongda Lu,
  • Xiaolai Li and
  • Huimin Wang

Beilstein J. Nanotechnol. 2018, 9, 975–985, doi:10.3762/bjnano.9.91

Graphical Abstract
  • while the z-scanner adjusts the vertical position of the AFM cantilever substrate to maintain constant interaction between the cantilever tip and sample surface. Together, the two stages provide a three-dimensional (3D) topographical reconstruction of the sample surface. However, the obtained images are
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Published 26 Mar 2018

Scanning speed phenomenon in contact-resonance atomic force microscopy

  • Christopher C. Glover,
  • Jason P. Killgore and
  • Ryan C. Tung

Beilstein J. Nanotechnol. 2018, 9, 945–952, doi:10.3762/bjnano.9.87

Graphical Abstract
  • dependence has also been observed in contact-resonance spectroscopy experiments. Killgore et al. [3] reported a scan-speed dependence of the measured CR frequencies of an AFM cantilever. Above a critical speed, CR frequency and quality factor decreased with increasing scan speed. However, in that work, the
  • are the known non-dimensional wavenumbers for a freely vibrating cantilevered beam ( = 1.8751, = 4.6941, = 7.8548), are the measured free frequencies of the AFM cantilever, and are the measured in-contact frequencies of the AFM cantilever. The tip parameter is calculated using the lowest-speed
  • surface moves at a uniform speed U = VS. The measured in-contact resonance frequency of the second mode of an AFM cantilever as a function of the dynamic scan speed on a mica surface at 100 nN force set-point, 41% relative humidity, and a scan angle of 90°. The measured in-contact frequency is clearly
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Published 21 Mar 2018

Dry adhesives from carbon nanofibers grown in an open ethanol flame

  • Christian Lutz,
  • Julia Syurik,
  • C. N. Shyam Kumar,
  • Christian Kübel,
  • Michael Bruns and
  • Hendrik Hölscher

Beilstein J. Nanotechnol. 2017, 8, 2719–2728, doi:10.3762/bjnano.8.271

Graphical Abstract
  • the AFM cantilever completely from the surface. This quantity is indicated as the lowest (negative) force in the diagrams. The adhesion energy is defined as the area between retrace and zero line. It corresponds to the energy necessary to free the sphere from the surface. The force–distance diagrams
  • the preload force. The symbols correspond to the oriented CNFs (blue squares), the randomly oriented CNFs (red triangles) and the flat reference (green circles). The dashed lines represent linear fits. The insert in panel (b) shows a SEM image of the AFM cantilever with the glued SiO2 sphere to
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Published 15 Dec 2017

Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times

  • Enrique A. López-Guerra and
  • Santiago D. Solares

Beilstein J. Nanotechnol. 2017, 8, 2230–2244, doi:10.3762/bjnano.8.223

Graphical Abstract
  • tip trajectory for an AFM cantilever interacting with a viscoelastic surface in tapping-mode AFM (simulation details are provided in the figure caption). The instantaneous tip–sample distance, taking as reference the undeformed sample surface, is approximately given by: where Zeq refers to the average
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Published 26 Oct 2017

Velocity dependence of sliding friction on a crystalline surface

  • Christian Apostoli,
  • Giovanni Giusti,
  • Jacopo Ciccoianni,
  • Gabriele Riva,
  • Rosario Capozza,
  • Rosalie Laure Woulaché,
  • Andrea Vanossi,
  • Emanuele Panizon and
  • Nicola Manini

Beilstein J. Nanotechnol. 2017, 8, 2186–2199, doi:10.3762/bjnano.8.218

Graphical Abstract
  • infinitely rigid AFM cantilever, wait until a steady-sliding regime is established, and discard the initial part affected by transients. For the remaining part of the simulation, we record the total force experienced by the slider as a function of time. This force has fluctuations as a result of collisions
  • . Recently published research also identified relations between dissipation peaks and the properties of a dispersion relation in a different model [63]. The present model can also be investigated in a spring-pulling scheme analogous to the Prandtl–Tomlinson model, to simulate the finite stiffness of an AFM
  • cantilever. In that scheme a stick-slip to smooth-sliding transition can also be investigated, especially at low speed (see Appendix “The static friction force”), allowing one to study in detail the nonlinear phenomena and mechanisms of phonon excitations that arise at slip times. The stick-slip regime and
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Published 19 Oct 2017

Air–water interface of submerged superhydrophobic surfaces imaged by atomic force microscopy

  • Markus Moosmann,
  • Thomas Schimmel,
  • Wilhelm Barthlott and
  • Matthias Mail

Beilstein J. Nanotechnol. 2017, 8, 1671–1679, doi:10.3762/bjnano.8.167

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  • force–distance curve in the negative height regime is the cumulative force constant k of the cantilever and the air–water interface according to Hooke’s law: F = k × height. As we calibrated the AFM cantilever in advance, we were able to determine the force constant of the interface in this case to be
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Published 11 Aug 2017

Functional dependence of resonant harmonics on nanomechanical parameters in dynamic mode atomic force microscopy

  • Federico Gramazio,
  • Matteo Lorenzoni,
  • Francesc Pérez-Murano,
  • Enrique Rull Trinidad,
  • Urs Staufer and
  • Jordi Fraxedas

Beilstein J. Nanotechnol. 2017, 8, 883–891, doi:10.3762/bjnano.8.90

Graphical Abstract
  • below 20 GPa). Keywords: atomic force microscopy; metrology; multifrequency; nanomechanics; Introduction When an AFM cantilever oscillating freely and harmonically at a given frequency f and amplitude A1 approaches a solid surface, the oscillation becomes anharmonic due to the non-linear interaction
  • topographic, phase and amplitude images. (a) Amplitude of the fundamental mode, (b) phase of the fundamental mode and (c) amplitude of the 6th harmonic. Experiments have been performed with a nominally kc ≈ 44 N/m rectangular AFM cantilever with f0 = 293 kHz on silicon surfaces and A1 = 34 nm. (color online
  • ) Evolution of the mean value of the amplitude of the 6th harmonic extracted from the amplitude image simultaneously acquired with the topography and phase images. Experiments have been performed with a nominally 44 N/m rectangular AFM cantilever with resonance frequency 350 kHz on silicon surfaces under
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Published 19 Apr 2017

Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins

  • Gheorghe Stan,
  • Richard S. Gates,
  • Qichi Hu,
  • Kevin Kjoller,
  • Craig Prater,
  • Kanwal Jit Singh,
  • Ebony Mays and
  • Sean W. King

Beilstein J. Nanotechnol. 2017, 8, 863–871, doi:10.3762/bjnano.8.88

Graphical Abstract
  • probe tip in contact with the sample. The repetition rate of the IR laser is tuned to a contact resonance of the AFM cantilever to maximize the oscillation amplitude of the cantilever. By sweeping the IR laser over the wavelengths of interest and monitoring changes in the amplitude of the AFM probe tip
  • angle of 60° from the front of the AFM probe, and swept continuously over the wavenumber range of interest [39]. The AFM-IR spectra were collected by tuning the repetition rate of the QCL to match a contact resonance of the AFM cantilever, typically the second flexural mode of the cantilever at ca. 180
  • , respectively. The spring constant of the cantilever was determined to be 7.35 ± 0.05 N/m by a laser Doppler vibrometer. A lock-in amplifier with an internal signal generator (Signal Recovery AMETEK, Oak Ridge, TN) was used to vibrate the AFM cantilever and to detect the AFM photodiode signal (MultiMode 8
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Published 13 Apr 2017

Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement

  • Steven Ian Moore,
  • Michael G. Ruppert and
  • Yuen Kuan Yong

Beilstein J. Nanotechnol. 2017, 8, 358–371, doi:10.3762/bjnano.8.38

Graphical Abstract
  • AFM cantilever instrumentation requires a piezoelectric stack actuator at the base of the cantilever for excitation [3] inevitably adding additional resonances as is visible from the so called forest of peaks [22]. These additional frequency components make cantilever resonance tuning almost
  • topology of the piezoelectric layer on an AFM cantilever to maximize the actuator gain and sensor sensitivity with respect to the cantilever’s higher order modes. Compared to previous work on modal sensor/actuators [42][43][44][45][46], the design specification of the presented work is to enhance the
  • fashion for the optimized output voltages Vo1–Vo4. In comparison to using a single piezoelectric transducer with a sum of sinusoids excitation, the multi-electrode design provides increased amplitudes at the expense of more complex instrumentation. Conclusion An AFM cantilever with a piezoelectric layer
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Published 06 Feb 2017

Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

  • Michael Klocke and
  • Dietrich E. Wolf

Beilstein J. Nanotechnol. 2016, 7, 708–720, doi:10.3762/bjnano.7.63

Graphical Abstract
  • include the full extent of an AFM cantilever nor that of a substrate within an atomistic simulation. As in previous studies [1][6][20][21][22] the simulation must be restricted to a small volume around the crucial region of interaction between the tip and the substrate. This is sketched in Figure 1. The
  • Michael Klocke Dietrich E. Wolf Department of Physics, University of Duisburg-Essen and CeNIDE, D-47048 Duisburg, Germany 10.3762/bjnano.7.63 Abstract A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM
  • cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur
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Published 17 May 2016

Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

  • Christian Ganser,
  • Gerhard Fritz-Popovski,
  • Roland Morak,
  • Parvin Sharifi,
  • Benedetta Marmiroli,
  • Barbara Sartori,
  • Heinz Amenitsch,
  • Thomas Griesser,
  • Christian Teichert and
  • Oskar Paris

Beilstein J. Nanotechnol. 2016, 7, 637–644, doi:10.3762/bjnano.7.56

Graphical Abstract
  • layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. Keywords: AFM cantilever; bilayer
  • -controlled actuation of a microcantilever based on a mesoporous silica/nonporous silicon bilayer using a commercial AFM cantilever as a substrate. The simplicity and versatility of the approach is promising for applications in several fields where similar systems based on swellable polymers are not
  • two streams, the relative humidity can be continuously controlled. The AFM cantilever was mounted inside a closed commercial fluid cell with a volume of about 10 mL. In addition, a Sensirion SHT21 sensor, which records the relative humidity as well as the temperature, is mounted in the fluid cell
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Published 28 Apr 2016

Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool

  • John D. Parkin and
  • Georg Hähner

Beilstein J. Nanotechnol. 2016, 7, 492–500, doi:10.3762/bjnano.7.43

Graphical Abstract
  • and demonstrate that this, in combination with a thermal noise spectrum, can provide the static flexural spring constant for cantilever sensors of different geometric shapes over a wide range of spring constant values (≈0.8–160 N/m). Keywords: AFM; cantilever sensors; microfluidic force tool; spring
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Published 30 Mar 2016

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

  • Michael G. Ruppert and
  • S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

Graphical Abstract
  • at the respective mode. System identification The AFM cantilever used in this work is a piezoelectric self-actuated silicon microcantilever described in section Modeling. Compared to a standard base excited cantilever whose frequency response is shown in Figure 6a, the piezoelectric cantilever has
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Published 24 Feb 2016

A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

  • Santiago D. Solares

Beilstein J. Nanotechnol. 2015, 6, 2233–2241, doi:10.3762/bjnano.6.229

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  • under the surface. Instead, it consists of ‘small’ SLS models distributed evenly in the x- and y-directions of the surface, each of which can relax independently in the z-direction upon interaction with the tip, which is modeled here as a hard sphere attached to the AFM cantilever. As depicted in Figure
  • tip geometries. These limitations can be partially mitigated by adding additional viscous and elastic elements between adjacent surface locations, although these would come with an added computational cost. Experimental Cantilever dynamics modeling The dynamics of the AFM cantilever were modeled as in
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Published 26 Nov 2015

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

  • Tino Wagner,
  • Hannes Beyer,
  • Patrick Reissner,
  • Philipp Mensch,
  • Heike Riel,
  • Bernd Gotsmann and
  • Andreas Stemmer

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

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  • the following. Figure 1 shows a model calculation using typical cantilever and interaction parameters, summarising how much tip apex, cone, and beam of an AFM cantilever probe contribute to the measured KFM signal in AM and FM operation. Shown are the percentages of the contributions and corresponding
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Published 23 Nov 2015

Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

  • Eyup Cinar,
  • Ferat Sahin and
  • Dalia Yablon

Beilstein J. Nanotechnol. 2015, 6, 2015–2027, doi:10.3762/bjnano.6.205

Graphical Abstract
  • be tackled [5][6][7][8]. Nanoindentation experiments requiring very low force values and high resolution usually use a standard AFM system. With this setup, an AFM cantilever probe is used for indenting the material and the probe displacement is monitored by laser beam bounce technology also known as
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Published 12 Oct 2015
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