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Search for "convolution" in Full Text gives 89 result(s) in Beilstein Journal of Nanotechnology.

Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

  • Eyup Cinar,
  • Ferat Sahin and
  • Dalia Yablon

Beilstein J. Nanotechnol. 2015, 6, 2015–2027, doi:10.3762/bjnano.6.205

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  • (motion in X and Y). The convolution of X and Y motion into the measurement cause overestimation errors in the interpretation of material properties using FD curves. Instrumented nanoindentation (INI) tools can be used for a large dynamic force range. However, the displacement and force sensitivity are
  • process. Note that the AFM probe reflects only the true Z axis movement of the indenter probe unlike the conventional AFM systems where the measurement relies on laser deflection of the cantilever itself which includes a convolution of X and Y motion into the laser deflection reading. As it can be seen
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Published 12 Oct 2015

Distribution of Pd clusters on ultrathin, epitaxial TiOx films on Pt3Ti(111)

  • Christian Breinlich,
  • Maria Buchholz,
  • Marco Moors,
  • Tobias Pertram,
  • Conrad Becker and
  • Klaus Wandelt

Beilstein J. Nanotechnol. 2015, 6, 2007–2014, doi:10.3762/bjnano.6.204

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  • the measured particle diameter is actually the result of a convolution between the true particle size and the STM tip shape [14]. The actual particle diameter is smaller, but the distribution obtained for different coverages and the two different substrates still allow for comparison. Regarding the
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Published 09 Oct 2015

Magnetic reversal dynamics of a quantum system on a picosecond timescale

  • Nikolay V. Klenov,
  • Alexey V. Kuznetsov,
  • Igor I. Soloviev,
  • Sergey V. Bakurskiy and
  • Olga V. Tikhonova

Beilstein J. Nanotechnol. 2015, 6, 1946–1956, doi:10.3762/bjnano.6.199

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  • superconducting quantum bit with a Josephson transmission line. During the propagation of the fast single flux quantum pulse (fluxon) in the transmission line, the magnetic field interacting with the qubit can be represented exactly as a unipolar pulse. The shape of this pulse can be calculated as a convolution
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Published 28 Sep 2015

The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors

  • Rachel M. Thorman,
  • Ragesh Kumar T. P.,
  • D. Howard Fairbrother and
  • Oddur Ingólfsson

Beilstein J. Nanotechnol. 2015, 6, 1904–1926, doi:10.3762/bjnano.6.194

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  • 5 eV [9]. Hence, it is clear that deposit formation in FEBID will be governed by a convolution of the efficiencies of the relevant electron-stimulated processes occurring at the surface and the SE energy distribution at the surface of the substrate. In the case of three-dimensional structures this
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Published 16 Sep 2015

Lower nanometer-scale size limit for the deformation of a metallic glass by shear transformations revealed by quantitative AFM indentation

  • Arnaud Caron and
  • Roland Bennewitz

Beilstein J. Nanotechnol. 2015, 6, 1721–1732, doi:10.3762/bjnano.6.176

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  • underestimate the real values by the maximal peak value of the height signal in the undeformed region of the topographical image. Due to tip-shape convolution effects the size of indents imaged by nc-AFM are underestimated while the pile-up volume is overestimated; this effect is more pronounced for smaller
  • HNI = 4.11 GPa found from nanoindentation measurements. The larger hardness values based on nc-AFM imaging are attributed to the underestimation of the projected area of indents due to tip convolution. The corresponding error for the metallic glass is larger due to the increased difficulty to
  • Figure 3 of α = 74°. As stated above the projected area determined from nc-AFM images of indents is underestimated due to tip-convolution effects and results in an underestimated half-opening angle of the indenter. Discussion A single diamond-coated AFM tip was used to perform several series of
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Published 13 Aug 2015

Current–voltage characteristics of manganite–titanite perovskite junctions

  • Benedikt Ifland,
  • Patrick Peretzki,
  • Birte Kressdorf,
  • Philipp Saring,
  • Andreas Kelling,
  • Michael Seibt and
  • Christian Jooss

Beilstein J. Nanotechnol. 2015, 6, 1467–1484, doi:10.3762/bjnano.6.152

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  • using the convolution functions fSCR and fSCR+D, an integrated EBIC linescan, ΣIEBIC, can be described for both cases. By dividing these two factors, the integrated generation volume is canceled out and leaves only: which can be used as a robust estimate for Lp + Ln if the width of the SCR is known
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Published 07 Jul 2015

Nano-contact microscopy of supracrystals

  • Adam Sweetman,
  • Nicolas Goubet,
  • Ioannis Lekkas,
  • Marie Paule Pileni and
  • Philip Moriarty

Beilstein J. Nanotechnol. 2015, 6, 1229–1236, doi:10.3762/bjnano.6.126

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  • more than 1 nm into the repulsive (i.e., positive force) regime of the probe–nanocrystal interaction potential. Constant height force microscopy has been used to map tip–sample interactions in this regime, revealing inhomogeneities which arise from the convolution of the tip structure with the ligand
  • for the first time and demonstrate that subparticle resolution images can be acquired in constant height mode, despite the high curvature of the particle surfaces. There remains, of course, the perennial issue plaguing the interpretation of scanning probe microscopy images: the convolution of the tip
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Published 29 May 2015

Automatic morphological characterization of nanobubbles with a novel image segmentation method and its application in the study of nanobubble coalescence

  • Yuliang Wang,
  • Huimin Wang,
  • Shusheng Bi and
  • Bin Guo

Beilstein J. Nanotechnol. 2015, 6, 952–963, doi:10.3762/bjnano.6.98

Graphical Abstract
  • of the AFM tip [46]. One can see that tip convolution leads to an overestimation of the radius of curvature. Assuming the NB heights are not influenced by the tip shape, the NB width and contact angle can then be obtained. The proposed method was used to study morphological changes in NBs in terms of
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Published 14 Apr 2015

Observation of a photoinduced, resonant tunneling effect in a carbon nanotube–silicon heterojunction

  • Carla Aramo,
  • Antonio Ambrosio,
  • Michelangelo Ambrosio,
  • Maurizio Boscardin,
  • Paola Castrucci,
  • Michele Crivellari,
  • Marco Cilmo,
  • Maurizio De Crescenzi,
  • Francesco De Nicola,
  • Emanuele Fiandrini,
  • Valentina Grossi,
  • Pasqualino Maddalena,
  • Maurizio Passacantando,
  • Sandro Santucci,
  • Manuela Scarselli and
  • Antonio Valentini

Beilstein J. Nanotechnol. 2015, 6, 704–710, doi:10.3762/bjnano.6.71

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  • –2.4 eV that is a convolution of the several electronic transitions occurring in each nanotube. The contacts among the nanotubes ensure the charge transfer between the nanotubes and the observation in the I–V curve. The bell shape of the absorption band detected in the I–V spectra mimics that observed
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Published 10 Mar 2015

Fundamental edge broadening effects during focused electron beam induced nanosynthesis

  • Roland Schmied,
  • Jason D. Fowlkes,
  • Robert Winkler,
  • Phillip D. Rack and
  • Harald Plank

Beilstein J. Nanotechnol. 2015, 6, 462–471, doi:10.3762/bjnano.6.47

Graphical Abstract
  • measurements identified conductive and non-conductive proximity regions. It was determined that the highest primary electron energies enable the highest edge sharpness while lower energies contain a complex convolution of broadening effects. Moreover, it is demonstrated that intermediate energies lead to even
  • is the fact that the surface potential of the outer halo level is below those of both the PtC pad and the SiO2. This excludes the idea that the formation of this intermediate level is a simple convolution of substrate and central deposit. Once the outer halo gets thinner at increasing radii, the
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Published 16 Feb 2015

Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes

  • Gemma Rius,
  • Matteo Lorenzoni,
  • Soichiro Matsui,
  • Masaki Tanemura and
  • Francesc Perez-Murano

Beilstein J. Nanotechnol. 2015, 6, 215–222, doi:10.3762/bjnano.6.20

Graphical Abstract
  • line is a convolution of the typical sharp line features, as obtained, e.g., when using 14 V, with a more delocalized lateral chemical reaction. This aspect would suggest additional mechanisms in addition to the induced main anodic reaction induced by the electric field, such as an ionic diffusive
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Published 19 Jan 2015

X-ray photoelectron spectroscopy of graphitic carbon nanomaterials doped with heteroatoms

  • Toma Susi,
  • Thomas Pichler and
  • Paola Ayala

Beilstein J. Nanotechnol. 2015, 6, 177–192, doi:10.3762/bjnano.6.17

Graphical Abstract
  • linewidth that is related to the excited state lifetime, usually well described by a Lorentzian profile. Thus, a convolution of Gaussian (G) and Lorentzian (L) profiles, also called the Voigtian (V), is the most adequate way to describe the line shapes IV(E) of the photoemission responses: where G(E) and L
  • function and α is the so-called asymmetry parameter. The asymmetry is zero for semiconductors and insulators, recovering the symmetric Lorentzian form. Measurement A typical XPS spectrum consists of a so-called primary spectrum, which is a convolution of the final state binding energies of each excited
  • thus their photoemission response is a convolution of these two different signals. In the past few years, this challenge has been overcome by the development of methods for separating nanotube samples according to their metallicity or even chirality [91][92][93]. Photoemission measurements from both
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Published 15 Jan 2015

Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM

  • Kfir Kuchuk and
  • Uri Sivan

Beilstein J. Nanotechnol. 2015, 6, 149–156, doi:10.3762/bjnano.6.14

Graphical Abstract
  • amplitude and z is the distance of closest approach to the surface in the oscillation cycle. Various techniques have been proposed to invert the convolution in Equation 2 and extract the interaction force from the measured shift in frequency. At first, these were either numerical solutions or analytic
  • harmonics to a convolution over Fts, have been derived [15][17], but existing methods to recover Fts from higher harmonics rely on spectral analysis of the AFM signal [18][19], and require the measurement of a significant number of harmonics to obtain reasonable accuracy [5][17]. Although measurement of all
  • that for small oscillation amplitudes, higher harmonics enhance the sensitivity to short range interactions compared with first harmonic FM-AFM. This sensitivity has been reasoned by an expression derived by Giessibl [6], which relates the nth harmonic to a convolution over the nth derivative of the
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Published 13 Jan 2015

UHV deposition and characterization of a mononuclear iron(III) β-diketonate complex on Au(111)

  • Irene Cimatti,
  • Silviya Ninova,
  • Valeria Lanzilotto,
  • Luigi Malavolti,
  • Luca Rigamonti,
  • Brunetto Cortigiani,
  • Matteo Mannini,
  • Elena Magnano,
  • Federica Bondino,
  • Federico Totti,
  • Andrea Cornia and
  • Roberta Sessoli

Beilstein J. Nanotechnol. 2014, 5, 2139–2148, doi:10.3762/bjnano.5.223

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  • × 15.0 × 40.0) Å3. During the geometry optimization, the atomic positions of the bottom Au layer were kept fixed to the bulk experimental distances (2.885 Å), whereas the other two layers were allowed to relax. In all simulated DOS studies, the Gaussian width of the convolution, σ, was set to 0.30 eV
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Published 18 Nov 2014

Controlling the dispersion of supported polyoxometalate heterogeneous catalysts: impact of hybridization and the role of hydrophilicity–hydrophobicity balance and supramolecularity

  • Gijo Raj,
  • Colas Swalus,
  • Eglantine Arendt,
  • Pierre Eloy,
  • Michel Devillers and
  • Eric M. Gaigneaux

Beilstein J. Nanotechnol. 2014, 5, 1749–1759, doi:10.3762/bjnano.5.185

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  • is semi-quantitative due to the well-known tip-convolution effect [32]. However, the (vertical) peak-to-peak distance of periodic structures measured by AFM is more accurate and it closely matches with the theoretical size of the hybrid nanorods. The formation of the nanorods was also determined by
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Published 10 Oct 2014

Scale effects of nanomechanical properties and deformation behavior of Au nanoparticle and thin film using depth sensing nanoindentation

  • Dave Maharaj and
  • Bharat Bhushan

Beilstein J. Nanotechnol. 2014, 5, 822–836, doi:10.3762/bjnano.5.94

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  • and after indentation. The topography maps of the nanoparticles appear not totally circular due to tip shape convolution effects, however they are used to confirm the indentation of the nanoparticle and that the nanoparticle did not slip during loading and unloading. The vertical arrows on the load
  • compression at a maximum load of 80 µN, along with topography maps of the nanoparticles over a 10 µm × 10 µm scan area and 2-D profiles before and after compression. The topography maps of the nanoparticles appear not completely circular because of tip-shape convolution effects, however, they are used to
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Published 11 Jun 2014

Energy dissipation in multifrequency atomic force microscopy

  • Valentina Pukhova,
  • Francesco Banfi and
  • Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 494–500, doi:10.3762/bjnano.5.57

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  • dilations (or scaling, s) of a mother wavelet Ψ(t) [7]. The temporal convolution of the signal with the wavelets at all possible scales and delays constitute the wavelet transform (WT) of the signal Wh(s,d) [7]. Scaling is connected to frequency, delays to time. The signal spectrum Wh(s,d) is a frequency
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Published 17 Apr 2014

Constant-distance mode SECM as a tool to visualize local electrocatalytic activity of oxygen reduction catalysts

  • Michaela Nebel,
  • Thomas Erichsen and
  • Wolfgang Schuhmann

Beilstein J. Nanotechnol. 2014, 5, 141–151, doi:10.3762/bjnano.5.14

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  • shearforce-based constant-distance mode for the investigation of the activity of ORR catalyst powders enables the visualization of the activity distribution within a catalyst spot avoiding any convolution due to topography effects. Catalyst-filled microcavities were successfully used as platform for the
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Published 07 Feb 2014

Modulation of defect-mediated energy transfer from ZnO nanoparticles for the photocatalytic degradation of bilirubin

  • Tanujjal Bora,
  • Karthik K. Lakshman,
  • Soumik Sarkar,
  • Abhinandan Makhal,
  • Samim Sardar,
  • Samir K. Pal and
  • Joydeep Dutta

Beilstein J. Nanotechnol. 2013, 4, 714–725, doi:10.3762/bjnano.4.81

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  • fitted by using a nonlinear least square method to the function which comprises the convolution of the IRF, E(t), with a sum of exponentials where Bi is the pre-exponential factor, τi are the characteristic lifetimes and A represents a background. The relative concentration in a multi-exponential decay
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Published 04 Nov 2013

Plasmonic oligomers in cylindrical vector light beams

  • Mario Hentschel,
  • Jens Dorfmüller,
  • Harald Giessen,
  • Sebastian Jäger,
  • Andreas M. Kern,
  • Kai Braun,
  • Dai Zhang and
  • Alfred J. Meixner

Beilstein J. Nanotechnol. 2013, 4, 57–65, doi:10.3762/bjnano.4.6

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  • is given by the superposition of the excitation spot and its intensity distribution with the geometry of the oligomer rings. A convolution of these two quantities describes the observed phenomenon. Near-field microscopy of aluminium heptamers During the progress of our experiments we found that the
  • optical microscopes. Oligomer rings composed of gold nanodots, SEM images on the left, confocal luminescence images under azimuthally polarized illumination on the right. Lower row: Simulations based on a planar convolution of the exciting light field with the structure geometry. The left image depicts
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Published 24 Jan 2013

Sub-10 nm colloidal lithography for circuit-integrated spin-photo-electronic devices

  • Adrian Iovan,
  • Marco Fischer,
  • Roberto Lo Conte and
  • Vladislav Korenivski

Beilstein J. Nanotechnol. 2012, 3, 884–892, doi:10.3762/bjnano.3.98

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  • the etching procedure is shown in Figure 3, imaged by AFM for etching quality, surface topography, and particle size. The height of the particles is measured accurately, but not the diameter, since the convolution of a small particle and the tip produces a width distortion. Keeping all the process
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Published 19 Dec 2012

Assessing the plasmonics of gold nano-triangles with higher order laser modes

  • Laura E. Hennemann,
  • Andreas Kolloch,
  • Andreas Kern,
  • Josip Mihaljevic,
  • Johannes Boneberg,
  • Paul Leiderer,
  • Alfred J. Meixner and
  • Dai Zhang

Beilstein J. Nanotechnol. 2012, 3, 674–683, doi:10.3762/bjnano.3.77

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  • that the high refractive index of the pure silicon is mainly responsible for our observations. 2e. Comparison with a theoretical convolution solution For a better understanding of our experimental findings, we calculated the plasmon resonances of the individual nano-triangles and computed a convolution
  • to the focus field is then multiplied according to the number of nano-triangles within the scanning range, yielding a convolution image from many Fischer patterns. The optical signal counted by this model is based on the proportionality of the luminescence signal to the incident electric field
  • intensity. Due to the high numerical aperture (NA = 0.9998) almost all the luminescence signal is collected. Scanning the structure through the focal plane consequently corresponds to a convolution of the structure with the field intensity (as depicted in Figure 1b,c) in the focal plane. When comparing the
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Published 04 Oct 2012

Dimer/tetramer motifs determine amphiphilic hydrazine fibril structures on graphite

  • Loji K. Thomas,
  • Nadine Diek,
  • Uwe Beginn and
  • Michael Reichling

Beilstein J. Nanotechnol. 2012, 3, 658–666, doi:10.3762/bjnano.3.75

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  • adjacent aromatic rings. The measured heights (brightness) of individual bright blobs in a zigzag vary slightly, which could be a convolution of electronic and topographic effects implying the three-dimensional nature of the structure hidden in the topographic image. A structural model is proposed for the
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Published 19 Sep 2012

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

  • Jianming Zhang,
  • Zehra Parlak,
  • Carleen M. Bowers,
  • Terrence Oas and
  • Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

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  • the contact stiffness decreases the phase response (Figure 2c). As a consequence, soft regions on the sample appear bright in the phase images. Importantly, however, the higher phase observed on softer areas reflects the convolution of the cantilever dynamics and time-dependent contact stiffness, and
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Published 26 Jun 2012

Structural, electronic and photovoltaic characterization of multiwalled carbon nanotubes grown directly on stainless steel

  • Luca Camilli,
  • Manuela Scarselli,
  • Silvano Del Gobbo,
  • Paola Castrucci,
  • Eric Gautron and
  • Maurizio De Crescenzi

Beilstein J. Nanotechnol. 2012, 3, 360–367, doi:10.3762/bjnano.3.42

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  • film. The Auger spectra were acquired using an electron gun as the exciting source with a primary beam energy of 1500 eV. Bearing in mind that the Auger spectrum is a self-convolution of the filled valence states below the Fermi level, the two experimental spectra reported in Figure 4 show some
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Published 02 May 2012
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