Anchoring of a dye precursor on NiO(001) studied by non-contact atomic force microscopy

• Sara Freund,
• Antoine Hinaut,
• Nathalie Marinakis,
• Edwin C. Constable,
• Ernst Meyer,
• Catherine E. Housecroft and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2018, 9, 242–249, doi:10.3762/bjnano.9.26

• extracted to be 0.5 D·nm−2. Taking into account a measured molecule density of 0.43 nm−2, which could be calculated thanks to high-resolution imaging, an average dipole moment of 1.1 D per molecule is estimated. This dipole moment is directed towards the NiO surface and can be attributed to a partial charge

Comparative study of post-growth annealing of Cu(hfac)₂, Co₂(CO)₈ and Me₂Au(acac) metal precursors deposited by FEBID

• Marcos V. Puydinger dos Santos,
• Aleksandra Szkudlarek,
• Artur Rydosz,
• Carlos Guerra-Nuñez,
• Fanny Béron,
• Kleber R. Pirota,
• Stanislav Moshkalev,
• José Alexandre Diniz and
• Ivo Utke

Beilstein J. Nanotechnol. 2018, 9, 91–101, doi:10.3762/bjnano.9.11

• light-brown with temperature, suggesting that less significant changes occurred in the Cu–C(–O–F) and Au–C(–O) deposits during the post-growth treatment (Figure 1b,c). In order to obtain a more precise description of the induced changes, high-resolution imaging was performed using a Hitachi S-4800 SEM

Photobleaching of YOYO-1 in super-resolution single DNA fluorescence imaging

• Joseph R. Pyle and
• Jixin Chen

Beilstein J. Nanotechnol. 2017, 8, 2296–2306, doi:10.3762/bjnano.8.229

• as stimulated emission depletion (STED) microscopy [26][27]; (2) using software to super-localize single molecules [28][29][30][31], such as stochastic optical reconstruction microscopy (STORM) [32], photo-activated localization microscopy (PALM) [33], single-molecule high-resolution imaging with

Synthesis and functionalization of NaGdF₄:Yb,Er@NaGdF₄ core–shell nanoparticles for possible application as multimodal contrast agents

• Dovile Baziulyte-Paulaviciene,
• Vitalijus Karabanovas,
• Marius Stasys,
• Greta Jarockyte,
• Vilius Poderys,
• Simas Sakirzanovas and
• Ricardas Rotomskis

Beilstein J. Nanotechnol. 2017, 8, 1815–1824, doi:10.3762/bjnano.8.183

• treated with 10 µg/mL of Tween 80-coated core–shell UCNPs for 24 h. Then the cells were fixed with 4% paraformaldehyde and stained with DAPI. The high-resolution imaging system for UCNP imaging was based on a confocal microscopy system Nikon C1si (Japan). A 980 nm continuous wave laser with an intensity

Collembola cuticles and the three-phase line tension

• Håkon Gundersen,
• Hans Petter Leinaas and
• Christian Thaulow

Beilstein J. Nanotechnol. 2017, 8, 1714–1722, doi:10.3762/bjnano.8.172

• local high-resolution imaging at the contact line and reported values in the range of λ = 10−10 N [21]. There is also contention with regards to the sign of the line tension [17][18], several theoretical studies predict both negative and positive signs for the line tension [19], while a majority of

Ion beam profiling from the interaction with a freestanding 2D layer

• Ivan Shorubalko,
• Kyoungjun Choi,
• Michael Stiefel and
• Hyung Gyu Park

Beilstein J. Nanotechnol. 2017, 8, 682–687, doi:10.3762/bjnano.8.73

• important issue is high-resolution imaging of the pores. When pore size becomes smaller than a few nanometers, like in the case of 1–3 pA He+ beams, it is difficult to measure these pore dimensions precisely with standard STEM or HIM. Time consuming high-resolution TEM imaging would be required. The third

Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement

• Steven Ian Moore,
• Michael G. Ruppert and
• Yuen Kuan Yong

Beilstein J. Nanotechnol. 2017, 8, 358–371, doi:10.3762/bjnano.8.38

• was shown that these higher modes can be more sensitive to material properties such as elastic modulus and damping coefficients [17][18][19]. Additionally, stiff cantilevers have proven to provide high resolution imaging in ambient and liquid environments using quartz resonators [20][21]. Traditional

Ordering of Zn-centered porphyrin and phthalocyanine on TiO₂(011): STM studies

• Piotr Olszowski,
• Lukasz Zajac,
• Szymon Godlewski,
• Bartosz Such,
• Rémy Pawlak,
• Antoine Hinaut,
• Res Jöhr,
• Thilo Glatzel,
• Ernst Meyer and
• Marek Szymonski

Beilstein J. Nanotechnol. 2017, 8, 99–107, doi:10.3762/bjnano.8.11

• molecular structures were unstable against the STM tip, precluding any high-resolution imaging. It was found, however, that this situation could be greatly improved if the wetting layer of the native CuPc molecules was substituted by Zn(II)meso-tetraphenylporphyrins (ZnTPP) [5]. The present work extends

Reasons and remedies for the agglomeration of multilayered graphene and carbon nanotubes in polymers

• Rasheed Atif and
• Fawad Inam

Beilstein J. Nanotechnol. 2016, 7, 1174–1196, doi:10.3762/bjnano.7.109

• (TEM) and other high-resolution imaging tools. Wrinkles were observed in flat graphene sheets that occur due to the instability of the 2D lattice structure [13]. Wrinkling is a large and out-of-plane deflection caused by compression (in-plane) or shear, and it is usually found in thin and flexible

Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

• Lukasz Rzeznik,
• Yves Fleming,
• Tom Wirtz and
• Patrick Philipp

Beilstein J. Nanotechnol. 2016, 7, 1113–1128, doi:10.3762/bjnano.7.104

• is a SIMS instrument dedicated to high-resolution imaging, a lateral resolution of around 50 nm can be reached. Recently, the development of a SIMS add-on system for the helium ion microscope (HIM) [2] demonstrated SIMS imaging with even higher lateral resolution in the 10 nm range [3]. Initially the

• influenced a lot by the impact energy of the primary ions. At higher energies required for the high-resolution imaging, the preferential sputtering is more important than at the low energies used for depth profiling. For PTFE, the difference between initial sample composition and surface composition after a

Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7

• Adam Sweetman,
• Samuel P. Jarvis and
• Mohammad A. Rashid

Beilstein J. Nanotechnol. 2016, 7, 937–945, doi:10.3762/bjnano.7.85

• temperature scanning probe instrumentation [1], coupled with specific experimental techniques utilising the in situ functionalisation of scanning probe tips with single molecules [2], and operation in the constant-height imaging mode, have resulted in an explosion of interest in high-resolution imaging and

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

• Hannes Beyer,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

• limited to ultra-high vacuum conditions and cryogenic temperatures. Measurements under ambient conditions are influenced by variations of the dew point and thin water layers present on practically every surface, complicating stable imaging with high resolution. We demonstrate high-resolution imaging in

• hamper high-resolution imaging under ambient conditions. Especially, water layers present on surfaces exposed to air affect the forces acting on the tip, and as a result the stability. Meniscus forces may dominate the interaction and overshadow forces responsible for atomic contrast, namely short-range

• . Conclusion We have demonstrated high-resolution FM-AFM imaging under ambient conditions with the length-extension resonator. The resonator can be operated stably at small as well as large tip–sample interaction forces. Adsorbates of nitrogen were imaged on HOPG, which paves the road for high-resolution

Hydration of magnesia cubes: a helium ion microscopy study

• Ruth Schwaiger,
• Johannes Schneider,
• Gilles R. Bourret and
• Oliver Diwald

Beilstein J. Nanotechnol. 2016, 7, 302–309, doi:10.3762/bjnano.7.28

• images are not directly compromised [16]. In addition to the high SE-yield, helium ion microscopy allows the use of low beam currents for imaging [7]. For biological materials and polymers, HIM is preferable to SEM for high resolution imaging due to the problems related to electron-beam-induced damage

• [17]. However, shrinkage of PMMA after helium ion imaging at 30 kV was reported [18], showing that also helium ions may damage soft materials by radiolysis just like low-energy (below 1 keV) electron beams. Thus, without additional damage to soft materials, HIM facilitates high resolution imaging

Electrospray deposition of organic molecules on bulk insulator surfaces

• Antoine Hinaut,
• Rémy Pawlak,
• Ernst Meyer and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2015, 6, 1927–1934, doi:10.3762/bjnano.6.195

• molecules, their decoupling from the metal surface is desirable. Deposition and analysis on insulating films or crystals is thus mandatory and requires high resolution imaging. Therefore, for the characterization at the atomic-scale, atomic force microscopy (AFM) is mandatory. Numerous experimental AFM

• . Furthermore, this functional group is known to be quite flexible and will therefore, especially at room temperature conditions, prevent high-resolution imaging. A schematic model of an island is proposed in Figure 5d and Figure 5e showing a possible molecular arrangement. In this configuration, columnar

Focused particle beam-induced processing

• Michael Huth and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2015, 6, 1883–1885, doi:10.3762/bjnano.6.191

• direction, Yuri Petrov and Oleg Vyvenko have exploited reflected helium ions for high-resolution imaging with “chemical contrast” [11]. Hongzhou Zhang and coworkers have utilized a focused helium ion beam to modify and mill thin silicon foils [12], which constitutes pioneering work in HIM towards

Imaging of carbon nanomembranes with helium ion microscopy

• André Beyer,
• Henning Vieker,
• Robin Klett,
• Hanno Meyer zu Theenhausen,
• Polina Angelova and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2015, 6, 1712–1720, doi:10.3762/bjnano.6.175

• where the membranes were exposed to highly charged ions [27]. This treatment induced nanopores in the size range of 10 nm, which were imaged by HIM with a reasonably high resolution [27]. Note that high resolution imaging of large freestanding CNMs requires the use of the electron flood gun for charge

Addition of Zn during the phosphine-based synthesis of indium phospide quantum dots: doping and surface passivation

• Natalia E. Mordvinova,
• Alexander A. Vinokurov,
• Oleg I. Lebedev,
• Tatiana A. Kuznetsova and
• Sergey G. Dorofeev

Beilstein J. Nanotechnol. 2015, 6, 1237–1246, doi:10.3762/bjnano.6.127

• scattering region. This discrepancy can be explained by fact that the contrast in bright-field low-magnification TEM is a mass-thickness contrast, which arises from Rutherford elastic scattering of electrons, rather than a diffraction or an amplitude contrast in the case of dislocations and high resolution

• imaging. Thus, the amorphous shell will be the basis of the main contrast in Figure 3a and, correspondingly, of the mean size of the QDs. Therefore, the change of the particle size, which depends on the Zn amount, is noticeable in the TEM images as well: for non-doped QDs dmean ≈ 4.3 nm (Figure 3a), for

Nano-contact microscopy of supracrystals

• Adam Sweetman,
• Nicolas Goubet,
• Ioannis Lekkas,
• Marie Paule Pileni and
• Philip Moriarty

Beilstein J. Nanotechnol. 2015, 6, 1229–1236, doi:10.3762/bjnano.6.126

• distribution at the nanocrystal surface. Conclusion: Our combined STM–AFM measurements show that the contrast mechanism underpinning high resolution imaging of nanoparticle supracrystals involves a form of nanoscale contact imaging, rather than the through-vacuum tunnelling which underpins traditional

Overview about the localization of nanoparticles in tissue and cellular context by different imaging techniques

• Anja Ostrowski,
• Daniel Nordmeyer,
• Alexander Boreham,
• Cornelia Holzhausen,
• Lars Mundhenk,
• Christina Graf,
• Martina C. Meinke,
• Annika Vogt,
• Sabrina Hadam,
• Jürgen Lademann,
• Eckart Rühl,
• Ulrike Alexiev and
• Achim D. Gruber

Beilstein J. Nanotechnol. 2015, 6, 263–280, doi:10.3762/bjnano.6.25

• been used to study NP, such as QD due to their favored optical properties [122][124][125] and in investigations on the architecture of specific NP [117]. Raman microspectroscopy Raman microspectroscopy provides high-resolution imaging combined with chemical analysis without destruction of the

High-frequency multimodal atomic force microscopy

• Adrian P. Nievergelt,
• Jonathan D. Adams,
• Pascal D. Odermatt and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

• multifrequency materials contrast imaging of a polymer blend in both air and fluid, and gentle, high-resolution imaging of an F-actin fibre in fluid. Results and Discussion Instrument design The basis for our optical design is a modular AFM readout head design we have reported earlier [36]. The modular nature of

Carbon nano-onions (multi-layer fullerenes): chemistry and applications

• Juergen Bartelmess and
• Silvia Giordani

Beilstein J. Nanotechnol. 2014, 5, 1980–1998, doi:10.3762/bjnano.5.207

• earlier study, one of the azaBODIPY-CNO derivatives showed a pH-dependent switching (on–off) of the fluorescence, a feature that could also be observed inside the cells. The latter CNO nanomaterial was subject to co-localization experiments with Lysotracker Red dye and it was confirmed by high-resolution

• imaging that the CNOs were deposited in the lysosomes of the cells. Biological sensing: In the aforementioned study of Luszczyn et al. [36], CNOs were covalently functionalized with biomolecules and studied for the first time as biosensors by using avitin–biotin interactions. The CNO served as linking

PVP-coated, negatively charged silver nanoparticles: A multi-center study of their physicochemical characteristics, cell culture and in vivo experiments

• Sebastian Ahlberg,
• Alexandra Antonopulos,
• Jörg Diendorf,
• Ralf Dringen,
• Matthias Epple,
• Rebekka Flöck,
• Wolfgang Goedecke,
• Christina Graf,
• Nadine Haberl,
• Jens Helmlinger,
• Fabian Herzog,
• Frederike Heuer,
• Stephanie Hirn,
• Christian Johannes,
• Stefanie Kittler,
• Manfred Köller,
• Katrin Korn,
• Wolfgang G. Kreyling,
• Fritz Krombach,
• Jürgen Lademann,
• Kateryna Loza,
• Eva M. Luther,
• Marcelina Malissek,
• Martina C. Meinke,
• Daniel Nordmeyer,
• Anne Pailliart,
• Jörg Raabe,
• Fiorenza Rancan,
• Barbara Rothen-Rutishauser,
• Eckart Rühl,
• Carsten Schleh,
• Andreas Seibel,
• Christina Sengstock,
• Lennart Treuel,
• Annika Vogt,
• Katrin Weber and
• Reinhard Zellner

Beilstein J. Nanotechnol. 2014, 5, 1944–1965, doi:10.3762/bjnano.5.205

• correlated with morphological changes of cells as well as biochemical reactions in cellular media, such as changes in the intracellular distribution of Ca2+ during apoptosis. Such investigations require spectroscopic methods which permit high resolution imaging combined with selective probing. Imaging by

Imaging the intracellular degradation of biodegradable polymer nanoparticles

• Anne-Kathrin Barthel,
• Martin Dass,
• Melanie Dröge,
• Jens-Michael Cramer,
• Daniela Baumann,
• Markus Urban,
• Katharina Landfester,
• Volker Mailänder and
• Ingo Lieberwirth

Beilstein J. Nanotechnol. 2014, 5, 1905–1917, doi:10.3762/bjnano.5.201

• come into focus in TEM examination. To examine the detailed morphology and the intracellular environment of the PLLA nanoparticles, however, a high resolution imaging technique such as TEM is indispensable. Morphology of pristine PLLA nanoparticles To determine the initial morphology, size and the

A nanometric cushion for enhancing scratch and wear resistance of hard films

• Katya Gotlib-Vainshtein,
• Olga Girshevitz,
• Chaim N. Sukenik,
• David Barlam and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2014, 5, 1005–1015, doi:10.3762/bjnano.5.114

• studies to the nanoscale while providing high-resolution imaging of the damage caused by wear or scratching [29][30][31][32]. The quantitative mechanical measurements require calibration both of the normal and lateral forces. For scratch resistance, only the normal force calibration is necessary

Peak forces and lateral resolution in amplitude modulation force microscopy in liquid

• Horacio V. Guzman and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2013, 4, 852–859, doi:10.3762/bjnano.4.96

• microscopy; lateral resolution; nanomechanics; peak force; Introduction The high-resolution imaging of heterogeneous materials, in particular soft materials in liquid, by amplitude modulation atomic force microscopy (AM-AFM) is an active area of research in nanotechnology [1][2][3][4][5][6][7][8][9][10][11