Electrochemical nanostructured CuBTC/FeBTC MOF composite sensor for enrofloxacin detection

• Thi Kim Ngan Nguyen,
• Tien Dat Doan,
• Huy Hieu Luu,
• Hoang Anh Nguyen,
• Thi Thu Ha Vu,
• Quang Hai Tran,
• Ha Tran Nguyen,
• Thanh Binh Dang,
• Thi Hai Yen Pham and
• Mai Ha Hoang

Beilstein J. Nanotechnol. 2024, 15, 1522–1535, doi:10.3762/bjnano.15.120

• existence of C (284 eV), O (532 eV), Fe (712 and 726 eV), and Cu (935 eV). The C 1s XPS spectrum of the (Cu)(Fe)BTC sample (Figure 2b) reveals four peaks attributed to C=C/C–C (284.78 eV), C–O (285.42 eV), C=O (286.11 eV), and O–C=O (288.62 eV) [39]. The high-resolution O 1s XPS spectrum (Figure 2c) can be

• room temperature (25 ± 1 °C). (a) XRD pattern and (b) N2 adsorption/desorption isotherms of the (Cu)(Fe)BTC sample. Full-scan (a) and high-resolution C 1s (b), O 1s (c), Fe 2p (d), and Cu 2p (e) XPS spectra of the (Cu)(Fe)BTC sample. TEM image of (Cu)(Fe)BTC sample. SEM images of (Cu)(Fe)BTC@CPE (a

A biomimetic approach towards a universal slippery liquid infused surface coating

• Ryan A. Faase,
• Madeleine H. Hummel,
• AnneMarie V. Hasbrook,
• Andrew P. Carpenter and
• Joe E. Baio

Beilstein J. Nanotechnol. 2024, 15, 1376–1389, doi:10.3762/bjnano.15.111

• flood gun. Scans were collected with a takeoff angle of 55° at a pressure below 3 × 10−9 Torr. A pass energy of 187.5 eV with a step size of 0.8 eV was used for the survey scans, and the high resolution had a pass energy of 23.5 eV and a step size of 0.5 eV/step. Spectra were collected with an X-ray

• steps. XPS survey and high-resolution C 1s spectra collected from PDA–FDT-coated substrates can be found in Figure 3. All survey spectra (Figure 3a,c,e) are nearly identical across the three substrates, which suggests a uniform FDT coating across the three different sample types. High-resolution C 1s

• stem from the PDA layer, while the fluorinated species can be attributed to the FDT layer covalently attached the PDA film. This covalent attachment is also confirmed by the XPS S 2p high-resolution spectra (Supporting Information File 1), which exhibited the same peak envelope across all the three

Interaction of graphene oxide with tannic acid: computational modeling and toxicity mitigation in C. elegans

• Romana Petry,
• James M. de Almeida,
• Francine Côa,
• Felipe Crasto de Lima,
• Diego Stéfani T. Martinez and
• Adalberto Fazzio

Beilstein J. Nanotechnol. 2024, 15, 1297–1311, doi:10.3762/bjnano.15.105

• TA. XPS survey data suggest that GO after 24 h in EPA medium is composed of 75.33 ± 0.40% carbon and 24.67 ± 0.40% of oxygen, whereas GO after interaction with TA presents 73.30 ± 0.40% of carbon and 26.70 ± 0.44% of oxygen. High-resolution C 1s XPS analysis showed a C–C/C–H peak contribution of

• fingerprint region with 1734(1), 1625(2), 1390(3), 1230(4), and 1068(5) cm−1 bands, and TA-related bands at 1704(6), 1600(7), 1310(8), and 1180(9) cm−1; b) Raman spectra normalized by intensity of G band; High-resolution C 1s XPS analysis of c) GO and d) GO with TA (10 mg·L−1) showing the peaks of carbon sp2

Dual-functionalized architecture enables stable and tumor cell-specific SiO₂NPs in complex biological fluids

• Iris Renata Sousa Ribeiro,
• Raquel Frenedoso da Silva,
• Romênia Ramos Domingues,
• Adriana Franco Paes Leme and
• Mateus Borba Cardoso

Beilstein J. Nanotechnol. 2024, 15, 1238–1252, doi:10.3762/bjnano.15.100

• ), SiO2NPs-ZW-NH2 (with ZW + APTES), and SiO2NPs-ZW-FO (with ZW + APTES + folate). Characterization of SiO2NPs Scanning electron microscopy (SEM) micrographs were obtained in a high-resolution FEI Inspect F50 microscope. A NP suspension (7 μL) was deposited directly onto a copper substrate, dried, and

• -rays with charge compensation. Spectra were recorded in three distinct areas per sample with 400 μm spatial resolution, using 200 eV pass energy. High-resolution spectra for C 1s, N 1s, Si 2p, and S 2p were recorded with a resolution of 0.1 eV, using a pass energy of 40 eV. All spectra were analyzed

• ), respectively. Scale bar: 500 nm. d) DLS and zeta potential results for SiO2NPs, SiO2NPs-ZW, SiO2NPs-ZW-NH2, and SiO2NPs-ZW-FO samples. e) Results obtained by the elemental analysis technique. Values in mg of nitrogen present in 1 g of sample for each step of the synthesis. f) High-resolution XPS spectrum (C 1s

Local work function on graphene nanoribbons

• Daniel Rothhardt,
• Amina Kimouche,
• Tillmann Klamroth and
• Regina Hoffmann-Vogel

Beilstein J. Nanotechnol. 2024, 15, 1125–1131, doi:10.3762/bjnano.15.91

• density functional theory calculations, which verify that the maps reflect the doping of the nanoribbons. Our results help to understand the relation between atomic structure and electronic properties both in high-resolution images and in the distance dependence of the LCPD. Keywords: graphene

Direct electron beam writing of silver using a β-diketonate precursor: first insights

• Katja Höflich,
• Krzysztof Maćkosz,
• Chinmai S. Jureddy,
• Aleksei Tsarapkin and
• Ivo Utke

Beilstein J. Nanotechnol. 2024, 15, 1117–1124, doi:10.3762/bjnano.15.90

• deposition of an automated sequence of shapes overnight, carefully avoiding unintended electron beam impact while precursor molecules were present (cf. the section on deposit evolution in Supporting Information File 1 for more details). The high-resolution images presented in the main manuscript were taken

• second part of the first halo region (H1’), where the background forms irregularly shaped dark and bright regions of several hundreds of nanometers in size. After taking the high-resolution images, the imaged regions showed an increase in particle size and brightness (cf. Supporting Information File 1

• magnification were adapted to match the high-resolution SEM (HRSEM) image above. The deposit structure turned out to be extremely non-uniform with a continuous layer of elemental silver at the interface between deposit and silicon substrate (cf. Supporting Information File 1, Figure S4, for more details on the

Unveiling the potential of alginate-based nanomaterials in sensing technology and smart delivery applications

• Shakhzodjon Uzokboev,
• Khojimukhammad Akhmadbekov,
• Ra’no Nuritdinova,
• Salah M. Tawfik and
• Yong-Ill Lee

Beilstein J. Nanotechnol. 2024, 15, 1077–1104, doi:10.3762/bjnano.15.88

• wall [60]. Another important morphological feature of polymers is the surface of the polymers, and atomic force microscopy (AFM) can be utilized to detect surface features of polymeric nanoparticles. It is very useful tool that offers high-resolution images in three dimensions at the nanometer scale

Water-assisted purification during electron beam-induced deposition of platinum and gold

• Cristiano Glessi,
• Fabian A. Polman and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 884–896, doi:10.3762/bjnano.15.73

• patterned area ranges between −0.125 and 0.125 µm. The (a) carbon and (b) platinum contents are presented in atom %. The background Si signal was not excluded from the analysis. (a) High-resolution TEM image and (b) overlay of the HAADF image and the STEM-EDX map of the cross section of deposit 1g. Layers

Intermixing of MoS₂ and WS₂ photocatalysts toward methylene blue photodegradation

• Maryam Al Qaydi,
• Nitul S. Rajput,
• Michael Lejeune,
• Abdellatif Bouchalkha,
• Mimoun El Marssi,
• Steevy Cordette,
• Chaouki Kasmi and
• Mustapha Jouiad

Beilstein J. Nanotechnol. 2024, 15, 817–829, doi:10.3762/bjnano.15.68

• additional peaks observed in all XRD diagrams at ≈37° and ≈69° positions are due to the silicon substrate. The X-ray photoelectron spectroscopy (XPS) survey scans and high-resolution scans for all samples are presented in Figure 3a–j. All XPS analyses were first calibrated using the C 1s peak of carbon at

• addition, the deconvoluted peaks of S 2p appear at ≈162.9 eV and ≈164.1 eV attributed to the S 2p doublet (2p3/2 and 2p1/2) as shown in Figure 3c [30]. High-resolution scans of W 4f and S 2p are shown in Figure 2e and Figure 2f, W 4f shows deconvoluted peaks at around ≈33.3 eV and ≈35.4 eV corresponding to

• process. However, the distinct features of the flakes were overall conserved. Figure 5 depicts TEM images carried out on the samples. Low- and high-resolution images captured from MoS2, WS2, and MoS2/WS2 composite samples are shown in Figure 5a–f. The low-magnification TEM image indicates that the size of

Electron-induced ligand loss from iron tetracarbonyl methyl acrylate

• Hlib Lyshchuk,
• Atul Chaudhary,
• Thomas F. M. Luxford,
• Miloš Ranković,
• Jaroslav Kočišek,
• Juraj Fedor,
• Lisa McElwee-White and
• Pamir Nag

Beilstein J. Nanotechnol. 2024, 15, 797–807, doi:10.3762/bjnano.15.66

• loss of either a carbonyl or the methyl acrylate ligand is exothermic, and this is manifested in the near-zero-electronvolts DEA peaks. High-resolution DEA studies, together with a use of effective range theory with complex boundary conditions, have shown that in Fe(CO)5 a crucial factor influencing

Effect of repeating hydrothermal growth processes and rapid thermal annealing on CuO thin film properties

• Monika Ozga,
• Eunika Zielony,
• Aleksandra Wierzbicka,
• Anna Wolska,
• Marcin Klepka,
• Marek Godlewski,
• Bogdan J. Kowalski and
• Bartłomiej S. Witkowski

Beilstein J. Nanotechnol. 2024, 15, 743–754, doi:10.3762/bjnano.15.62

• underwent structural analysis using a high-resolution X-ray diffractometer X’Pert Pro MRD (Panalytical) equipped with a Cu anode (λ = 1.54060 Å). X-ray photoelectron spectroscopy (XPS) measurements were conducted utilizing a Scienta R4000 hemispherical analyzer with a pass energy of 200 eV and monochromatic

• films surface prior to (left) and after exposure of the indicated area to an electron beam for 30 s (right). The C 1s peaks in high-resolution XPS spectra of as-grown films (left) and processed using the HT+RTA procedure (2×) (right). SEM and AFM images of the surface of the as-grown, 1×, 2×, and 3

Level set simulation of focused ion beam sputtering of a multilayer substrate

• Alexander V. Rumyantsev,
• Nikolai I. Borgardt,
• Roman L. Volkov and
• Yuri A. Chaplygin

Beilstein J. Nanotechnol. 2024, 15, 733–742, doi:10.3762/bjnano.15.61

• semiconductor heterostructures [13]. Metal and dielectric layers can be used as hard masks for achieving high resolution and throughput of the FIB nanofabrication process [14]. Modification of integrated circuits [15] is an industrially relevant application of multilayer structure processing. Effective

Simultaneous electrochemical determination of uric acid and hypoxanthine at a TiO₂/graphene quantum dot-modified electrode

• Vu Ngoc Hoang,
• Dang Thi Ngoc Hoa,
• Nguyen Quang Man,
• Le Vu Truong Son,
• Le Van Thanh Son,
• Vo Thang Nguyen,
• Le Thi Hong Phong,
• Ly Hoang Diem,
• Kieu Chan Ly,
• Ho Sy Thang and
• Dinh Quang Khieu

Beilstein J. Nanotechnol. 2024, 15, 719–732, doi:10.3762/bjnano.15.60

• diffraction, Raman spectroscopy, high-resolution transmission electron microscopy, and energy-dispersive X-ray mapping. The TiO2/GQDs-GCE exhibits better electrochemical activity for uric acid and hypoxanthine than GQDs/GCE or TiO2/GCE in differential pulse voltammetry (DPV) measurements. Under optimized

• GQDs were observed by using a JEM 2100 high-resolution transmission electron microscopy (HRTEM), Joel, Japan. Raman spectroscopy measurements were performed on a WiTec, Alpha 300R with a 532 nm laser. Surface analyses of the obtained materials were carried out using a S-4800 scanning electron

Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system

• Wendong Sun,
• Jianqiang Qian,
• Yingzi Li,
• Yanan Chen,
• Zhipeng Dou,
• Rui Lin,
• Peng Cheng,
• Xiaodong Gao,
• Quan Yuan and
• Yifan Hu

Beilstein J. Nanotechnol. 2024, 15, 694–703, doi:10.3762/bjnano.15.57

• , Chinese Academy of Sciences, Dalian 116023, P. R. China 10.3762/bjnano.15.57 Abstract Multifrequency atomic force microscopy (AFM) utilizes the multimode operation of cantilevers to achieve rapid high-resolution imaging and extract multiple properties. However, the higher-order modal response of

Laser synthesis of nanoparticles in organic solvents – products, reactions, and perspectives

• Theo Fromme,
• Sven Reichenberger,
• Katharine M. Tibbetts and
• Stephan Barcikowski

Beilstein J. Nanotechnol. 2024, 15, 638–663, doi:10.3762/bjnano.15.54

Exfoliation of titanium nitride using a non-thermal plasma process

• Priscila Jussiane Zambiazi,
• Dolores Ribeiro Ricci Lazar,
• Larissa Otubo,
• Rodrigo Fernando Brambilla de Souza,
• Almir Oliveira Neto and
• Cecilia Chaves Guedes-Silva

Beilstein J. Nanotechnol. 2024, 15, 631–637, doi:10.3762/bjnano.15.53

• the same exfoliation method. These combined findings highlight the structural changes during the non-thermal plasma exfoliation process, further supporting the successful transformation of bulk TiN into nanosheets. Figure 3 shows high-resolution transmission electron microscopy (HRTEM) images of TiN

• higher transparency to the microscope beam is observed, indicating fewer scattering centers. When comparing Figure 3a and Figure 3d, it is clear that the initial compact 3D TiN blocks underwent a transformation and evolved into plate-like thin layers. The high-resolution image in Figure 3f shows a

AFM-IR investigation of thin PECVD SiO_x films on a polypropylene substrate in the surface-sensitive mode

• Hendrik Müller,
• Hartmut Stadler,
• Teresa de los Arcos,
• Adrian Keller and
• Guido Grundmeier

Beilstein J. Nanotechnol. 2024, 15, 603–611, doi:10.3762/bjnano.15.51

• detection. The chosen detection frequency should equal a mechanical contact resonance of the tip–sample contact for a sufficiently large signal level. NAP-XPS survey (a) and high-resolution core level spectra of oxygen O 1s (b), carbon C 1s, (c) and silicon Si 2p (d) of the polypropylene foil covered with

• 50 nm SiOx measured in a 1.5 mbar N2 atmosphere for environmental charge compensation. Black dots represent measured data, while the blue lines are fits to the data that incorporate different components as indicated by the red lines. NAP-XPS survey (a) and high-resolution core level spectra of oxygen

Radiofrequency enhances drug release from responsive nanoflowers for hepatocellular carcinoma therapy

• Yanyan Wen,
• Ningning Song,
• Yueyou Peng,
• Weiwei Wu,
• Qixiong Lin,
• Minjie Cui,
• Rongrong Li,
• Qiufeng Yu,
• Sixue Wu,
• Yongkang Liang,
• Wei Tian and
• Yanfeng Meng

Beilstein J. Nanotechnol. 2024, 15, 569–579, doi:10.3762/bjnano.15.49

• sample was added to ethanol and ultrasonically dispersed. Then the dispersed liquid was added dropwise to the copper net. After drying, the US FEI Tecnai F20 TEM was used at an accelerated voltage of 200 kV to capture the morphology in high resolution. Zeta potentials and hydrodynamic diameters were

Photocatalytic degradation of methylene blue under visible light by cobalt ferrite nanoparticles/graphene quantum dots

• Vo Chau Ngoc Anh,
• Le Thi Thanh Nhi,
• Le Thi Kim Dung,
• Dang Thi Ngoc Hoa,
• Nguyen Truong Son,
• Nguyen Thi Thao Uyen,
• Nguyen Ngoc Uyen Thu,
• Le Van Thanh Son,
• Le Trung Hieu,
• Tran Ngoc Tuyen and
• Dinh Quang Khieu

Beilstein J. Nanotechnol. 2024, 15, 475–489, doi:10.3762/bjnano.15.43

• (Japan). High-resolution transmission electron microscopy (HR-TEM) observation was performed with a JEM 1010. The intermediates in the MB degradation were determined by using an Agilent 1100 LC/MS-MS system with an electron spray ionization source combined with an ion trap. Synthesis of CoFe2O4, CoFe2O4

Sidewall angle tuning in focused electron beam-induced processing

• Sangeetha Hari,
• Willem F. van Dorp,
• Johannes J. L. Mulders,
• Piet H. F. Trompenaars,
• Pieter Kruit and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 447–456, doi:10.3762/bjnano.15.40

• simply varying the etch position on the sidewall using the top view SE image for reference, the slope of the deposit can be tuned from negative (outward) to positive (inward). The evolution has been studied in detail by high-resolution imaging in a TEM. A surprising trend not indicated by the simple

• : Additional experimental data. Acknowledgements Considerable parts of this paper originate from Hari, S., ‘High resolution resist-free lithography in the SEM’, doctoral thesis (chapter 6), Delft University of Technology, Netherlands, 2017. Funding This work is supported by NanoNextNL, a micro- and

Investigating ripple pattern formation and damage profiles in Si and Ge induced by 100 keV Ar⁺ ion beam: a comparative study

• Indra Sulania,
• Harpreet Sondhi,
• Tanuj Kumar,
• Sunil Ojha,
• G R Umapathy,
• Ambuj Mishra,
• Ambuj Tripathi,
• Richa Krishna,
• Devesh Kumar Avasthi and
• Yogendra Kumar Mishra

Beilstein J. Nanotechnol. 2024, 15, 367–375, doi:10.3762/bjnano.15.33

• electron microscopy; Introduction Scientific research varying from electronics to photonics, homeland security, high-resolution parallel patterning of magnetic media, biotechnology, and medicine are based upon nanotechnology. These applications require nanopatterning techniques to fabricate devices or

• in a controlled manner on a wide variety of substrates with required dimensions. There are reports from 1960’s, by Cunningham et al. [1] and Navez et al. [2], on the production of submicron and nanoscale patterns by IBS. However, with the availability of high-resolution tools such as atomic force

Vinorelbine-loaded multifunctional magnetic nanoparticles as anticancer drug delivery systems: synthesis, characterization, and in vitro release study

• Zeynep Özcan and
• Afife Binnaz Hazar Yoruç

Beilstein J. Nanotechnol. 2024, 15, 256–269, doi:10.3762/bjnano.15.24

• , 2:1, and 4:1) and the cumulative drug release were determined by calculating according to Equations 2–4 utilizing the absorbance values obtained from UV–vis spectrophotometer and calibration curves. Characterization The morphology of the synthesized nanoparticles was determined with a high

• -resolution analytical electron microscope (FE-SEM, Thermo Scientific, Apreo 2S LoVac) and a scanning transmission electron microscope (STEM, Phillips XL, 30 ESEM-FEG/EDAX) operating at 120 kV acceleration voltage. The structure of the nanoparticles was analyzed by X-ray diffraction (XRD, PANalytical, Xpert

Graphene removal by water-assisted focused electron-beam-induced etching – unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO₂ substrates

• Aleksandra Szkudlarek,
• Jan M. Michalik,
• Inés Serrano-Esparza,
• Zdeněk Nováček,
• Veronika Novotná,
• Piotr Ozga,
• Czesław Kapusta and
• José María De Teresa

Beilstein J. Nanotechnol. 2024, 15, 190–198, doi:10.3762/bjnano.15.18

• shape control are very limited in those cases. Conventional electron beam lithography (EBL) reaches the resolution of a few nanometers. However, it leaves residual resists on the surface [9], which strongly affects electrical transport properties [10]. A similar high resolution can be achieved with e

Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

• Mustafa Kangül,
• Navid Asmari,
• Santiago H. Andany,
• Marcos Penedo and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

• at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types, including biological samples, soft polymers, and hard materials. These modes offer precise and stable control of vertical

TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranes

• Joshua Williams,
• Michael I. Faley,
• Joseph Vimal Vas,
• Peng-Han Lu and
• Rafal E. Dunin-Borkowski

Beilstein J. Nanotechnol. 2024, 15, 1–12, doi:10.3762/bjnano.15.1

• membrane also allows for high-resolution patterning since there is less electron scattering during exposure [26]. The purpose of applying two layers of resist is to create a large undercut by using a bottom layer that is more sensitive than the top layer. This prevents the unwanted deposition of metal that

• and to create a meniscus shape, thus, decreasing the redeposition at the edge of the resist during etching. The advantage of IBE are the well-defined structures with good edge sharpness (Figure 8). This technique offers high resolution for structures down to 200 nm, and dense structures with spacings

• etching opens further applications for TEM sample preparation for more complicated high-resolution nanostructures. We have developed a straightforward method to prepare a SiN membrane with nanostructures on one side. This method allows for the use of an ultrasonic bath, higher deposition temperatures, and