In situ AFM visualization of Li–O₂ battery discharge products during redox cycling in an atmospherically controlled sample cell

• Kumar Virwani,
• Younes Ansari,
• Khanh Nguyen,
• Francisco José Alía Moreno-Ortiz,
• Jangwoo Kim,
• Maxwell J. Giammona,
• Ho-Cheol Kim and
• Young-Hye La

Beilstein J. Nanotechnol. 2019, 10, 930–940, doi:10.3762/bjnano.10.94

• surface was cleaned and then imaged using tapping mode. Liu et al. [24] performed in situ AFM investigations of Li/O2 electrochemistry measuring formation of toroidal and spherical structures. The AFM scanner was briefly exposed to the atmosphere in their case, leading to possible increases in the amount

• tapping mode AFM with complete time domain correlated visualizations recorded during discharge and recharge cycling. The voltage and capacity of an electrochemical Li/O2 cell were simultaneously monitored and correlated with the evolution of nano- and micro-structured discharge products. In contrast to

• experiments. The AFM probe oscillated with a 10 nm peak-to-peak amplitude away from the surface while submerged in electrolyte. The surface engaged amplitude of the probe was 7.5 nm peak-to-peak. The scan rate was 2 Hz for a 3 μm scan size. Since tapping mode scanning could have a propensity to change the

Nanoscale optical and structural characterisation of silk

• Meguya Ryu,
• Reo Honda,
• Adrian Cernescu,
• Arturas Vailionis,
• Armandas Balčytis,
• Jitraporn Vongsvivut,
• Jing-Liang Li,
• Denver P. Linklater,
• Elena P. Ivanova,
• Vygantas Mizeikis,
• Mark J. Tobin,
• Junko Morikawa and
• Saulius Juodkazis

Beilstein J. Nanotechnol. 2019, 10, 922–929, doi:10.3762/bjnano.10.93

• AFM operation and, simultaneously, under external infrared illumination (broadband laser with difference frequency generation, Toptica), acts as a light-concentrating antenna such that the sample is probed with a nanofocused light field. The AFM tapping-mode operation (ca. 60 nm amplitude) modulates

Self-assembly and wetting properties of gold nanorod–CTAB molecules on HOPG

• Imtiaz Ahmad,
• Floor Derkink,
• Tim Boulogne,
• Pantelis Bampoulis,
• Harold J. W. Zandvliet,
• Hidayat Ullah Khan,
• Rahim Jan and
• E. Stefan Kooij

Beilstein J. Nanotechnol. 2019, 10, 696–705, doi:10.3762/bjnano.10.69

• centrifuge tube. Characterization techniques Scanning electron microscopy (SEM) imaging of the samples was undertaken with a Zeiss 1550 system (optimum resolution ≈1 nm at 2 kV accelerating voltage). Tapping-mode AFM imaging was carried out with an Agilent 5100 atomic force microscope using HQ:NSC35/Al

Direct observation of the CVD growth of monolayer MoS₂ using in situ optical spectroscopy

• Claudia Beatriz López-Posadas,
• Yaxu Wei,
• Wanfu Shen,
• Daniel Kahr,
• Michael Hohage and
• Lidong Sun

Beilstein J. Nanotechnol. 2019, 10, 557–564, doi:10.3762/bjnano.10.57

• situ using atomic force microscopy (Veeco Dimensions S3100) in tapping mode. A soft cantilever (TipsNano) was employed. The Raman and PL spectra spectra of the MoS2 thin films were collected using a JY Horiba LabRAM Aramis VIS microscope with an excitation wavelength of 532 nm. Measurements were

Sputtering of silicon nanopowders by an argon cluster ion beam

• Xiaomei Zeng,
• Vasiliy Pelenovich,
• Zhenguo Wang,
• Wenbin Zuo,
• Sergey Belykh,
• Alexander Tolstogouzov,
• Dejun Fu and
• Xiangheng Xiao

Beilstein J. Nanotechnol. 2019, 10, 135–143, doi:10.3762/bjnano.10.13

• surface, with energy in the range of 10.4–69 keV and dose of 7.2 × 1014–2.3 × 1016 cluster/cm2 at room temperature. The sputtering depth and surface roughness RRMS (root mean squared roughness) were monitored by AFM with a Shimadzu SPM-9500 J3 device, operated in tapping mode with a measuring area of 7

Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites

• Diana El Khoury,
• Richard Arinero,
• Jean-Charles Laurentie,
• Mikhaël Bechelany,
• Michel Ramonda and
• Jérôme Castellon

Beilstein J. Nanotechnol. 2018, 9, 2999–3012, doi:10.3762/bjnano.9.279

• , while exciting the probe at its first eigenmode f0 [58]. During the first scan, sample topography was extracted and collected on a first image using the tapping mode. For the second scan, the sensor was lifted by a known distance from the surface, the so-called “lift” distance, and controlled to follow

Ternary nanocomposites of reduced graphene oxide, polyaniline and hexaniobate: hierarchical architecture and high polaron formation

• Claudio H. B. Silva,
• Maria Iliut,
• Christopher Muryn,
• Christian Berger,
• Zachary Coldrick,
• Vera R. L. Constantino,
• Marcia L. A. Temperini and
• Aravind Vijayaraghavan

Beilstein J. Nanotechnol. 2018, 9, 2936–2946, doi:10.3762/bjnano.9.272

• /washing cycles (14000 rpm, 20 min and HCl solution pH 2.6) to obtain dispersions of a total concentration of 1.0 mg·mL−1. Characterization The AFM images were recorded with a Bruker Dimension FastScan probe microscope, operating in tapping mode, with aluminium-coated Si tips (Bruker). Samples were

Biomimetic surface structures in steel fabricated with femtosecond laser pulses: influence of laser rescanning on morphology and wettability

• Camilo Florian Baron,
• Alexandros Mimidis,
• Daniel Puerto,
• Evangelos Skoulas,
• Emmanuel Stratakis,
• Javier Solis and
• Jan Siegel

Beilstein J. Nanotechnol. 2018, 9, 2802–2812, doi:10.3762/bjnano.9.262

• surfaces were polished obtaining mirror-like quality with an average roughness Ra < 2 nm measured by an atomic force microscope (AFM, Agilent 5100 AFM/SPM in tapping mode). In order to avoid environmental oxidation by humidity, the samples were stored in a desiccator at 30% relative humidity. Before and

Disorder in H⁺-irradiated HOPG: effect of impinging energy and dose on Raman D-band splitting and surface topography

• Lisandro Venosta,
• Noelia Bajales,
• Sergio Suárez and
• Paula G. Bercoff

Beilstein J. Nanotechnol. 2018, 9, 2708–2717, doi:10.3762/bjnano.9.253

• tapping mode. Standard Si cantilevers with sharp tips were used for high-resolution topography imaging and the software Gwyddion 2.36 was used for image analyses. Results and Discussion Raman characterization Figure 1 compares the Raman spectra after excitation with a laser wavelength of 514 nm

Optimization of Mo/Cr bilayer back contacts for thin-film solar cells

• Nima Khoshsirat,
• Fawad Ali,
• Vincent Tiing Tiong,
• Mojtaba Amjadipour,
• Hongxia Wang,
• Mahnaz Shafiei and
• Nunzio Motta

Beilstein J. Nanotechnol. 2018, 9, 2700–2707, doi:10.3762/bjnano.9.252

• tapping mode NT-MDT Solver-Pro atomic force microscope (AFM). A KeithLink four-point probe system was used to measure the sheet resistivity of the films. A Cary 5000 UV–vis–NIR spectrophotometer was also used for the optical properties measurements. The adhesion of the Mo layer was tested through ultra

Characterization of the microscopic tribological properties of sandfish (Scincus scincus) scales by atomic force microscopy

• Weibin Wu,
• Christian Lutz,
• Simon Mersch,
• Richard Thelen,
• Christian Greiner,
• Guillaume Gomard and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2018, 9, 2618–2627, doi:10.3762/bjnano.9.243

• controlled temperature (21–23 °C) and humidity (50–70%). All AFM experiments were conducted with a Dimension Icon AFM (Veeco Inc., USA). The topography of the samples was measured in tapping mode while adhesion force, friction, and wear analysis were conducted in contact mode. No extra treatment was applied

Non-agglomerated silicon–organic nanoparticles and their nanocomplexes with oligonucleotides: synthesis and properties

• Asya S. Levina,
• Marina N. Repkova,
• Nadezhda V. Shikina,
• Zinfer R. Ismagilov,
• Svetlana A. Yashnik,
• Dmitrii V. Semenov,
• Yulia I. Savinovskaya,
• Natalia A. Mazurkova,
• Inna A. Pyshnaya and
• Valentina F. Zarytova

Beilstein J. Nanotechnol. 2018, 9, 2516–2525, doi:10.3762/bjnano.9.234

• microscope. The results are presented in Figure 3. Atomic force microscopy (AFM) was performed on a Solver P47 Bio atomic force microscope (NT-МDT, Russia) in a tapping mode. The aqueous solution of the Si–NH2·ODN(1) sample (10 µL, 0.16 µM, NH2/p = 10) was applied to a freshly cleaved mica area of 25–30 mm2

Phosphorus monolayer doping (MLD) of silicon on insulator (SOI) substrates

• Noel Kennedy,
• Ray Duffy,
• Luke Eaton,
• Dan O’Connell,
• Scott Monaghan,
• Shane Garvey,
• James Connolly,
• Chris Hatem,
• Justin D. Holmes and
• Brenda Long

Beilstein J. Nanotechnol. 2018, 9, 2106–2113, doi:10.3762/bjnano.9.199

• Figure S2 (Supporting Information File 1), which lead to the use of a 1050 °C annealing for a time period of 5 s for all applications to SOI. Characterisation Atomic force microscopy was carried out in tapping mode at room temperature to analyse the surface quality throughout the MLD process. ECV

A scanning probe microscopy study of nanostructured TiO₂/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications

• Laurie Letertre,
• Roland Roche,
• Olivier Douhéret,
• Hailu G. Kassa,
• Denis Mariolle,
• Nicolas Chevalier,
• Łukasz Borowik,
• Philippe Dumas,
• Benjamin Grévin,
• Roberto Lazzaroni and
• Philippe Leclère

Beilstein J. Nanotechnol. 2018, 9, 2087–2096, doi:10.3762/bjnano.9.197

• average spacing between the columns is (10 ± 3) nm, with an average width of the columns of (19 ± 4) nm, as determined by SEM measurements [24]. The topography of the deposit is shown in the tapping-mode atomic force microscopy (TM-AFM) image of Figure 1d, where the apex of the columns appears as

The structural and chemical basis of temporary adhesion in the sea star Asterina gibbosa

• Birgit Lengerer,
• Marie Bonneel,
• Mathilde Lefevre,
• Elise Hennebert,
• Philippe Leclère,
• Emmanuel Gosselin,
• Peter Ladurner and
• Patrick Flammang

Beilstein J. Nanotechnol. 2018, 9, 2071–2086, doi:10.3762/bjnano.9.196

• (Bruker Nano Inc., Santa Barbara, CA) using AFM in tapping mode. Tapping mode AFM was performed in amplitude modulation mode. The height of the cantilever position is constantly adjusted (via a feedback loop) to keep constant the ratio of the tip vibrational amplitude in contact with the sample surface to

A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si_1−xGe_x and Si layers

• Richard Daubriac,
• Emmanuel Scheid,
• Hiba Rizk,
• Richard Monflier,
• Sylvain Joblot,
• Rémi Beneyton,
• Pablo Acosta Alba,
• Sébastien Kerdilès and
• Filadelfo Cristiano

Beilstein J. Nanotechnol. 2018, 9, 1926–1939, doi:10.3762/bjnano.9.184

• good agreement with previous results obtained by our research group [26]. Concerning the surface roughness, tapping mode AFM analysis provided arithmetic averages Ra of about 1.2 Å (Figure S2, Supporting Information File 1). However, in view of its application for DHE experiments, it is necessary to

Synthesis of hafnium nanoparticles and hafnium nanoparticle films by gas condensation and energetic deposition

• Irini Michelakaki,
• Nikos Boukos,
• Dimitrios A. Dragatogiannis,
• Spyros Stathopoulos,
• Costas A. Charitidis and
• Dimitris Tsoukalas

Beilstein J. Nanotechnol. 2018, 9, 1868–1880, doi:10.3762/bjnano.9.179

• of the NPs and NTFs were performed by field-emission scanning electron microscopy (FESEM FEI Nova Nano SEM 230) and atomic force microscopy (Veeco diInnova) in tapping mode. The nanomechanical properties of the NTFs were determined by nanoindentation. Nanoidentation testing was performed with a

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

• Amelie Axt,
• Ilka M. Hermes,
• Victor W. Bergmann,
• Niklas Tausendpfund and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2018, 9, 1809–1819, doi:10.3762/bjnano.9.172

• commercial scanning probe microscopy systems, mainly due to its easy implementation. Nevertheless, there are different ways to operate AM-KPFM. In the simplest form, an AC voltage is applied during normal tapping mode imaging (single scan) at a frequency far below the first resonance ωE << ω0. We refer to

• and CPD measurements are decoupled: In a first step, a topographic contour line is recorded in tapping mode. In a second step, the mechanical excitation is switched off and the tip follows the same contour line shifted in z-direction by a defined lift height, typically 10–100 nm above the sample. AM

Uniform cobalt nanoparticles embedded in hexagonal mesoporous nanoplates as a magnetically separable, recyclable adsorbent

• Can Zhao,
• Yuexiao Song,
• Tianyu Xiang,
• Wenxiu Qu,
• Shuo Lou,
• Xiaohong Yin and
• Feng Xin

Beilstein J. Nanotechnol. 2018, 9, 1770–1781, doi:10.3762/bjnano.9.168

• magnetometer (VSM) with an applied magnetic field between −20 kOe and 20 kOe at room temperature (SQUID-VSM, USA). Atomic force microscopy (AFM) was performed on an AFM instrument (NTEGRA Spectra, Russia) using tapping mode. The samples were deposited onto clean Si substrates and dried at 60 °C. UV–vis

Correlative electrochemical strain and scanning electron microscopy for local characterization of the solid state electrolyte Li_1.3Al_0.3Ti_1.7(PO₄)₃

• Nino Schön,
• Deniz Cihan Gunduz,
• Shicheng Yu,
• Hermann Tempel,
• Roland Schierholz and
• Florian Hausen

Beilstein J. Nanotechnol. 2018, 9, 1564–1572, doi:10.3762/bjnano.9.148

• , respectively, the assignment of the individual phases to their chemical composition is further supported. Additionally, the occurrence of a secondary phase of AlPO4 has been previously observed [1][4]. No changes based on the different composition in phase images of tapping-mode AFM, nor in peak-force tapping

Electrostatically actuated encased cantilevers

• Benoit X. E. Desbiolles,
• Gabriela Furlan,
• Adam M. Schwartzberg,
• Paul D. Ashby and
• Dominik Ziegler

Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130

• an annealed ultra-flat gold surface. The surface is imaged in tapping mode using harmonic excitation with amplitude modulation feedback, a free amplitude of 1 nm and a set-point of 0.8 nm. In harmonic excitation, we observe that intentional switching of the applied Udc by a few volts would result in

Heterostuctures of 4-(chloromethyl)phenyltrichlorosilane and 5,10,15,20-tetra(4-pyridyl)-21H,23H-porphine prepared on Si(111) using particle lithography: Nanoscale characterization of the main steps of nanopatterning

• Phillip C. Chambers and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2018, 9, 1211–1219, doi:10.3762/bjnano.9.112

• OTS on Si(111) Particle lithography with an immersion step was used to prepare nanoholes within a film of OTS. A topographic view of the nanoholes is shown in Figure 2a, with the simultaneously acquired phase image (Figure 2b).The ex situ images were acquired with tapping-mode AFM in air. The

• sonication step was repeated 4 times and then the samples were dried under nitrogen. Atomic force microscopy Samples were characterized using a model 5500 atomic force microscope (Keysight Technologies, Santa Rosa, CA). Images of samples were acquired using tapping-mode in ambient air. Silicon nitride tips

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

• Yue Shen,
• Ying Wang,
• Yuan Zhou,
• Chunxi Hai,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

• ., Manchester, UK), UV–vis absorption spectra (Lambda 750 UV/VIS/NIR spectrometer, PerkinElmer, Inc., Waltham, MA, USA) and SPFM. In the SPFM, a DC or AC bias is applied to a tapping mode AFM tip, generating an electrostatic attractive force (polarization force) between the biased tip and the polarized charge

Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition

• Federico Venturi,
• Gian Carlo Gazzadi,
• Amir H. Tavabi,
• Alberto Rota,
• Rafal E. Dunin-Borkowski and
• Stefano Frabboni

Beilstein J. Nanotechnol. 2018, 9, 1040–1049, doi:10.3762/bjnano.9.97

• a two-dimensional magnetization map can be recorded. MFM analysis was performed with a VEECO EnviroScope system, working in tapping mode with amplitude detection feedback. The MFM maps were acquired in two-pass lift-mode, with the magnetic signal collected about 30 nm above the surface. The probe

Automated image segmentation-assisted flattening of atomic force microscopy images

• Yuliang Wang,
• Tongda Lu,
• Xiaolai Li and
• Huimin Wang

Beilstein J. Nanotechnol. 2018, 9, 975–985, doi:10.3762/bjnano.9.91

• AFM (Resolve, Bruker) in tapping mode with 96% setpoint value. A silicon cantilever (NSC36/ALBS, MikroMasch) with quoted stiffness of 0.6 N/m and tip radius of 8 nm was used for scanning. The scanning frequency and scanning angle were 2 Hz and 0°, respectively. Methods The step-by-step procedure of