Studying friction while playing the violin: exploring the stick–slip phenomenon

• Santiago Casado

Beilstein J. Nanotechnol. 2017, 8, 159–166, doi:10.3762/bjnano.8.16

• , very few studies in the literature are concerned with the nanoscopic analysis of the bow hairs or the strings of musical instruments. In the present work, an optical microscope and an atomic force microscope (AFM) are used to inspect the structural differences at the micro- and nanoscale of two types

Grazing-incidence optical magnetic recording with super-resolution

• Gunther Scheunert,
• Sidney. R. Cohen,
• René Kullock,
• Ryan McCarron,
• Katya Rechev,
• Ifat Kaplan-Ashiri,
• Ora Bitton,
• Paul Dawson,
• Bert Hecht and
• Dan Oron

Beilstein J. Nanotechnol. 2017, 8, 28–37, doi:10.3762/bjnano.8.4

• = 0.3 T with individual laser pulses of 40 mW power and 50 ns duration with a laser spot size of 3 μm (short axis) at the sample surface – six times larger than the magnetic features. Herein, the presence of a nanoscopic object, i.e., the tip of an atomic force microscope in the focus of the laser at

Obtaining and doping of InAs-QD/GaAs(001) nanostructures by ion beam sputtering

• Sergei N. Chebotarev,
• Alexander S. Pashchenko,
• Leonid S. Lunin,
• Elena N. Zhivotova,
• Georgy A. Erimeev and
• Marina L. Lunina

Beilstein J. Nanotechnol. 2017, 8, 12–20, doi:10.3762/bjnano.8.2

• impurity flux did not exceed the GaAs flux. The surface morphology was studied with an atomic force microscope Solver HV in the semicontact mode by NSG10 probes using positional marks, which allowed us to identify specific region on a surface [33]. The structure of the quantum dots was studied with a

Dynamic of cold-atom tips in anharmonic potentials

• Tobias Menold,
• Peter Federsel,
• Carola Rogulj,
• Hendrik Hölscher,
• József Fortágh and
• Andreas Günther

Beilstein J. Nanotechnol. 2016, 7, 1543–1555, doi:10.3762/bjnano.7.148

• is 660 ms. Detecting tip dynamics The detection of a cold-atom tip is fundamentally different from conventional scanning probe techniques. In an atomic force microscope, for instance, the tip position can be monitored in real-time using methods like laser beam deflection [43][44], laser

• density distribution At all times, the cold-atom tip shows a Gaussian shape with constant width σx. The dynamics is thus fully included in the center-of-mass oscillation μ(t). In this sense, a cold-atom tip oscillating in a harmonic potential behaves very much like a solid tip in an atomic force

• microscope. To illustrate the dynamics of the cold-atom tip, Figure 1a shows in the two-dimensional phase space at four different times after the initial displacement. The data are derived from a numerical simulation of the cold atom tip with 5 × 105 atoms at 500 nK, moving in an harmonic potential with ω0

Localized surface plasmons in structures with linear Au nanoantennas on a SiO₂/Si surface

• Ilya A. Milekhin,
• Sergei A. Kuznetsov,
• Ekaterina E. Rodyakina,
• Alexander G. Milekhin,
• Alexander V. Latyshev and
• Dietrich R. T. Zahn

Beilstein J. Nanotechnol. 2016, 7, 1519–1526, doi:10.3762/bjnano.7.145

• plasmon–phonon coupling are to be expected. Indeed, as it was is shown in [31], such a coupling may drastically increase (by a factor of 200) the scattering intensity in the near field of the metal (Pt) tip of an atomic force microscope at frequencies of the SiC surface optical (SO) phonons. The results

Surface roughness rather than surface chemistry essentially affects insect adhesion

• Matt W. England,
• Tomoya Sato,
• Makoto Yagihashi,
• Atsushi Hozumi,
• Stanislav N. Gorb and
• Elena V. Gorb

Beilstein J. Nanotechnol. 2016, 7, 1471–1479, doi:10.3762/bjnano.7.139

• (Soot-TMOS-FAS17Cl) were estimated from cross-sectional images acquired by a scanning electron microscope (SEM, Phenom Pro Scanning Electron Microscope, Phenom World). The surface morphologies of the samples were either observed using the same SEM system or by atomic force microscope in a tapping mode

Fracture behaviors of pre-cracked monolayer molybdenum disulfide: A molecular dynamics study

• Qi-lin Xiong,
• Zhen-huan Li and
• Xiao-geng Tian

Beilstein J. Nanotechnol. 2016, 7, 1411–1420, doi:10.3762/bjnano.7.132

• experiments by using the tip of an atomic force microscope (AFM) and measured the elastic properties of freely suspended multi-layered MoS2 nanosheets (5 to 25 layers). Bertolazzi et al. [10] reported on measurements of the stiffness and breaking strength of monolayer MoS2, found the effective Young's modulus

Influence of synthesis conditions on microstructure and phase transformations of annealed Sr₂FeMoO_6−x nanopowders formed by the citrate–gel method

• Marta Yarmolich,
• Nikolai Kalanda,
• Sergey Demyanov,
• Herman Terryn,
• Jon Ustarroz,
• Maksim Silibin and
• Gennadii Gorokh

Beilstein J. Nanotechnol. 2016, 7, 1202–1207, doi:10.3762/bjnano.7.111

• polythermic approach in a reducing atmosphere (5% H2/Ar gas mixture: 5% H2/95% Ar). The microstructure of the SFMO powders was investigated using a JEOL JSM-7000F field emission scanning electron microscope. The grain size was evaluated using a NT-206 atomic force microscope. The particle size distributions

Generalized Hertz model for bimodal nanomechanical mapping

• Aleksander Labuda,
• Marta Kocuń,
• Waiman Meinhold,
• Deron Walters and
• Roger Proksch

Beilstein J. Nanotechnol. 2016, 7, 970–982, doi:10.3762/bjnano.7.89

• experimental data and extract a shape and size of the tip interacting with a polystyrene surface. Keywords: bimodal atomic force microscopy; bimodal spectroscopy; contact mechanics; multifrequency; nanomechanical mapping; nanomechanics; Introduction Over the decades since its invention [1] the atomic force

• microscope (AFM) has been used in a variety of modes to characterize micro- and nanoscale heterogeneous structures in composites and other advanced materials. The AFM can provide high resolution topographic and mechanical properties mapping using techniques such as force curves [2][3], contact resonance [4

Noncontact atomic force microscopy III

• Mehmet Z. Baykara and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2016, 7, 946–947, doi:10.3762/bjnano.7.86

• tunneling microscopy (STM) relies on quantum mechanical tunneling of electrons to enable the atomic-resolution imaging of (semi-)conducting sample surfaces, it was the atomic force microscope (AFM) that eventually allowed for nanometer-scale imaging of sample surfaces with no limitations on electrical

Understanding interferometry for micro-cantilever displacement detection

• Alexander von Schmidsfeld,
• Tobias Nörenberg,
• Matthias Temmen and
• Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

• Alexander von Schmidsfeld Tobias Norenberg Matthias Temmen Michael Reichling Fachbereich Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany 10.3762/bjnano.7.76 Abstract Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM

• displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz0.5 under optimum conditions. Keywords: displacement noise spectral density; interferometer; non-contact atomic force microscope (NC-AFM); opto-mechanic

• measurement makes the interferometer a suitable system for displacement detection in a cantilever based non-contact atomic force microscope (NC-AFM) [7]. In contrast to a classical interferometer, the setup commonly involving a fiber end and a cantilever is characterized by a significant beam divergence and a

Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

• Christian Ganser,
• Gerhard Fritz-Popovski,
• Roland Morak,
• Parvin Sharifi,
• Benedetta Marmiroli,
• Barbara Sartori,
• Heinz Amenitsch,
• Thomas Griesser,
• Christian Teichert and
• Oskar Paris

Beilstein J. Nanotechnol. 2016, 7, 637–644, doi:10.3762/bjnano.7.56

• cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative

• the hydrophobization step with the SAMs was skipped. AFM The atomic force microscope in use was an Asylum Research MFP-3D, of which only the cantilever deflection was read-out and recorded as a function of the time. The deflection read-out was performed by the light-beam method, where a laser beam is

Determination of Young’s modulus of Sb₂S₃ nanowires by in situ resonance and bending methods

• Liga Jasulaneca,
• Raimonds Meija,
• Alexander I. Livshits,
• Juris Prikulis,
• Subhajit Biswas,
• Justin D. Holmes and
• Donats Erts

Beilstein J. Nanotechnol. 2016, 7, 278–283, doi:10.3762/bjnano.7.25

• ). One method was the electric-field-induced mechanical resonance, while the other involved static bending of Sb2S3 NWs with atomic force microscope (AFM) tip inside SEM. The choice of the methods for this study allowed for subsequent characterization of the same NW without changing other experimental

Counterion effects on nano-confined metal–drug–DNA complexes

• Nupur Biswas,
• Sreeja Chakraborty,
• Alokmay Datta,
• Munna Sarkar,
• Mrinmay K. Mukhopadhyay,
• Mrinal K. Bera and
• Hideki Seto

Beilstein J. Nanotechnol. 2016, 7, 62–67, doi:10.3762/bjnano.7.7

• functions of several variables. Here an iterative process continues and termination occurs when the relative error between two consecutive iterates is below 10−9. Atomic force microscope (AFM) images recorded in tapping mode using Nanonics MultiView1000 with glass tips of about 20 nm diameter, provides in

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

• Urs Gysin,
• Thilo Glatzel,
• Thomas Schmölzer,
• Adolf Schöner,
• Sergey Reshanov,
• Holger Bartolf and
• Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

• their detailed inspection by KPFM is only feasible due to the implemented large scan range unit. Experimental The atomic force microscope (AFM) [24] developed and built in our physics department is placed in an ultra-high vacuum (UHV) system with a base pressure of <10−9 mbar. Operating the instrument

• potential can directly be associated with a change in the doping concentration of the p-SiC layer. Conclusion A novel atomic force microscope with a large scan area is operated under UHV conditions at room temperature. The instrument is ideal to analyse devices, either conducting or semiconducting, which

• piezo actuators. The stages are compressed by three flexures. The piezo step motor in the aperture of the scanner allows to approach the sample to the probe with nanoscale accuracy. The atomic force microscope is assembled on a CF200 flange with four tension springs. Copper fins and magnets serve as an

Fabrication of hybrid graphene oxide/polyelectrolyte capsules by means of layer-by-layer assembly on erythrocyte cell templates

• Joseba Irigoyen,
• Nikolaos Politakos,
• Eleftheria Diamanti,
• Elena Rojas,
• Marco Marradi,
• Raquel Ledezma,
• Layza Arizmendi,
• J. Alberto Rodríguez,
• Ronald F. Ziolo and
• Sergio E. Moya

Beilstein J. Nanotechnol. 2015, 6, 2310–2318, doi:10.3762/bjnano.6.237

• Si wafer with the selected area to be analysed. e) Mapping by intensity of the G band at 1598 cm-1 of the area selected in d. Atomic force microscope images of dried hybrid PE/GO capsules. a) Height image of a 50 × 50 µm scan, with a profile corresponding to the line drawn in the image. b) Deflection

Nanoscale rippling on polymer surfaces induced by AFM manipulation

• Mario D’Acunto,
• Franco Dinelli and
• Pasqualantonio Pingue

Beilstein J. Nanotechnol. 2015, 6, 2278–2289, doi:10.3762/bjnano.6.234

• , Italy Laboratorio NEST, Scuola Normale Superiore and Istituto Nanoscienze-CNR, Piazza San Silvestro 12, 56127 Pisa, Italy 10.3762/bjnano.6.234 Abstract Nanoscale rippling induced by an atomic force microscope (AFM) tip can be observed after performing one or many scans over the same area on a range of

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

• Tino Wagner,
• Hannes Beyer,
• Patrick Reissner,
• Philipp Mensch,
• Heike Riel,
• Bernd Gotsmann and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

• established technique that allows for the mapping of local electrostatic potentials with an atomic force microscope (AFM) [1][2][3]. In contrast to electrostatic force microscopy (EFM), which measures merely the effect of electrostatic forces on the oscillation of the tip, a feedback loop nullifies the

Virtual reality visual feedback for hand-controlled scanning probe microscopy manipulation of single molecules

• Philipp Leinen,
• Matthew F. B. Green,
• Taner Esat,
• Christian Wagner,
• F. Stefan Tautz and
• Ruslan Temirov

Beilstein J. Nanotechnol. 2015, 6, 2148–2153, doi:10.3762/bjnano.6.220

• position of the SPM tip during manipulation in real time, while simultaneously plotting the experimentally measured frequency shift (Δf) of the non-contact atomic force microscope (NC-AFM) tuning fork sensor as well as the magnitude of the electric current (I) flowing between the tip and the surface. The

Electrospray deposition of organic molecules on bulk insulator surfaces

• Antoine Hinaut,
• Rémy Pawlak,
• Ernst Meyer and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2015, 6, 1927–1934, doi:10.3762/bjnano.6.195

• resolution at room temperature. Experimental All experiments were performed under UHV conditions (p < 10−10 bar) with our home-built non-contact atomic force microscope (nc-AFM), operating at room temperature (RT) [48]. Bulk insulator KBr(001) crystals surfaces (from MaTeck GmbH) were prepared in situ by

Improved atomic force microscopy cantilever performance by partial reflective coating

• Zeno Schumacher,
• Yoichi Miyahara,
• Laure Aeschimann and
• Peter Grütter

Beilstein J. Nanotechnol. 2015, 6, 1450–1456, doi:10.3762/bjnano.6.150

• coated cantilevers compared to fully coated ones while maintaining the same reflectivity, therefore making it possible to combine the best of both worlds. Keywords: cantilever; force noise; partial coating; Q-factor; Introduction For cantilever based beam deflection atomic force microscope (AFM

Nanomechanical humidity detection through porous alumina cantilevers

• Olga Boytsova,
• Alexey Klimenko,
• Vasiliy Lebedev,
• Alexey Lukashin and
• Andrey Eliseev

Beilstein J. Nanotechnol. 2015, 6, 1332–1337, doi:10.3762/bjnano.6.137

• 22%. Red line: approximation of the linear part as f = 118.9972·(1 + 0.00198H)−1/2. Inaccuracy of frequency detection is below the size of the symbols. Photomask (1); cantilever arrays as formed on Al-foil (2); free-standing anodic alumina cantilevers (3). Scheme of measurement cell in atomic force

• microscope with an integrated optical read-out. Spectrum of lateral (in-plane) modes corresponding to an alumina cantilever 2 μm thick, 800 μm long and 100 μm wide. Shifts of resonance frequency and quality factors Q for Si and AAO cantilevers under different pressure (vacuum and air, humidity 22

Probing fibronectin–antibody interactions using AFM force spectroscopy and lateral force microscopy

• Andrzej J. Kulik,
• Małgorzata Lekka,
• Kyumin Lee,
• Grazyna Pyka-Fościak and
• Wieslaw Nowak

Beilstein J. Nanotechnol. 2015, 6, 1164–1175, doi:10.3762/bjnano.6.118

• cantilevers were immediately used in the measurements. Atomic force microscope All measurements were carried out using commercially available devices (PSIA XE100 and XE120, Park Systems, Korea) equipped with a “liquid cell” setup, in 10 mM PBS buffer. The surface topography of a fibronectin-coated mica

Optimization of phase contrast in bimodal amplitude modulation AFM

• Mehrnoosh Damircheli,
• Amir F. Payam and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2015, 6, 1072–1081, doi:10.3762/bjnano.6.108

• phase contrast improves by decreasing the energy of second mode relative to those of the first and third modes. Keywords: bimodal AFM; dynamic AFM; tapping mode; Introduction The atomic force microscope is a versatile and powerful tool for imaging, compositional mapping and modification of surfaces

Fabrication of high-resolution nanostructures of complex geometry by the single-spot nanolithography method

• Alexander Samardak,
• Margarita Anisimova,
• Aleksei Samardak and
• Alexey Ognev

Beilstein J. Nanotechnol. 2015, 6, 976–986, doi:10.3762/bjnano.6.101

• gas. Characterization The thickness and surface morphology of the PMMA and Au films were measured with an Ntegra Aura (NT-MDT, Russia) atomic force microscope. The evolution of the resist before and after development was studied with a Supra (Carl Zeiss, Germany) scanning electron microscope at an