Advanced atomic force microscopy techniques V

• Philipp Rahe,
• Ilko Bald,
• Nadine Hauptmann,
• Regina Hoffmann-Vogel,
• Harry Mönig and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6

• not involving any tip–surface interaction. The measurement of electrostatic properties at the nanoscale emerged as a most relevant subfield of atomic force microscopy, especially driven by electrostatic force microscopy (EFM), Kelvin probe force microscopy (KPFM), and closely related techniques

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

• Jason I. Kilpatrick,
• Emrullah Kargin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

• paper, including pump-probe KPFM [13][20][43], time-resolved KPFM [11][12][44][45][46][47], fast free force recovery KPFM (G-Mode) [14][48][49][50], intermodulation electrostatic force microscopy (EFM) [42][51], and PeakForce tapping KPFM [52]. The fundamental detection sensitivity to electrostatic

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

• Gheorghe Stan and
• Pradeep Namboodiri

Beilstein J. Nanotechnol. 2021, 12, 1115–1126, doi:10.3762/bjnano.12.83

• -excitation OL BE-KPFM [37][38][39], intermodulation electrostatic force microscopy [40], and dual-harmonic KPFM (DH-KPFM) [34][41][42]. In DH-KPFM, the CPD is obtained from the ratio of the amplitudes of the first two harmonics of the cantilever response to an AC bias modulation and requires a prior

• data is limited. Moreover, the finite response time of the CL feedback (of the order of milliseconds in some cases) prevents the use of CL KPFM from observing fast electrodynamic processes. Some of these impediments are addressed in OL implementations such as time-resolved electrostatic force

• microscopy [29][30], pump–probe KPFM [31][32], or fast free force recovery KPFM [33] that are capable of observing the dynamics of the optoelectronic response of materials and electric field-induced charge migration at time scales of the order of tens of microseconds. Various OL KPFM implementations with

Mapping the local dielectric constant of a biological nanostructured system

• Wescley Walison Valeriano,
• Rodrigo Ribeiro Andrade,
• Juan Pablo Vasco,
• Angelo Malachias,
• Bernardo Ruegger Almeida Neves,
• Paulo Sergio Soares Guimarães and
• Wagner Nunes Rodrigues

Beilstein J. Nanotechnol. 2021, 12, 139–150, doi:10.3762/bjnano.12.11

• work is to determine the varying dielectric constant of a biological nanostructured system via electrostatic force microscopy (EFM) and to show how this method is useful to study natural photonic crystals. We mapped the dielectric constant of the cross section of the posterior wing of the damselfly

• ; electrostatic force microscopy (EFM); natural photonic crystals; relative permittivity; structural colors; Introduction The dielectric constant, or relative permittivity, is a fundamental physical property that is crucial for describing various biological, chemical, or physical phenomena. It is a material

• Riedel et al. [16] developed several techniques of electrostatic force microscopy (EFM) to extract the relative permittivity at the nanoscale, allowing for new fields to be explored. Here we use EFM to map the relative permittivity of nanostructures within the wings of the Chalcopteryx rutilans damselfly

Implementation of data-cube pump–probe KPFM on organic solar cells

• Benjamin Grévin,
• Olivier Bardagot and
• Renaud Demadrille

Beilstein J. Nanotechnol. 2020, 11, 323–337, doi:10.3762/bjnano.11.24

• the development of new time-resolved extensions of electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM). Time-resolved EFM (trEFM) has been used to map photoinduced charging rates (i.e., the time needed to reach an electrostatic equilibrium after illumination) in organic donor

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

• Alexander Krivcov,
• Jasmin Ehrler,
• Marc Fuhrmann,
• Tanja Junkers and
• Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

• electrostatic interactions. Origin of these artifacts is the work-function difference between tip and sample material. Yu et al. [10] demonstrated that topographic features can be avoided by combining MFM with electrostatic force microscopy (EFM) compensating the contact potential difference by an appropriate

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

• Aaron Mascaro,
• Yoichi Miyahara,
• Tyler Enright,
• Omur E. Dagdeviren and
• Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

• Aaron Mascaro Yoichi Miyahara Tyler Enright Omur E. Dagdeviren Peter Grutter Department of Physics, McGill University, 3600 rue University, Montreal, Québec H3A2T8, Canada 10.3762/bjnano.10.62 Abstract Recently, there have been a number of variations of electrostatic force microscopy (EFM) that

• period of the cantilever and compare and contrast it with those previously established. Keywords: atomic force microscopy; electrostatic force microscopy; ionic transport; lithium ion batteries; nanotechnology; Introduction Since the inception of the atomic force microscope (AFM) a variety of

• techniques have sought to avoid this by directly capturing the deflection signal using high-speed data acquisition systems and performing offline analysis to reconstruct the sample response. One such technique is fast free time-resolved electrostatic force microscopy (FF-trEFM), first proposed by

Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites

• Diana El Khoury,
• Richard Arinero,
• Jean-Charles Laurentie,
• Mikhaël Bechelany,
• Michel Ramonda and
• Jérôme Castellon

Beilstein J. Nanotechnol. 2018, 9, 2999–3012, doi:10.3762/bjnano.9.279

• high resolution experimental methods have not been reliably adapted to this purpose. Electrostatic force microscopy (EFM) represents a promising technique to fulfill this objective, although no complete and accurate interphase study has been published to date and EFM signal interpretation is not

• deduced by comparison of experimental data and numerical simulations, as well as the interface state of silicone dioxide layers. Keywords: atomic force microscopy; building-block materials; dielectric permittivity; electrostatic force microscopy; finite element simulation; interphases; nanocomposites

• conditions are fulfilled by electrostatic force microscopy (EFM) [18][19]. EFM is an atomic force microscopy (AFM)-based electrostatic method in which a conductive tip and a metallic sample holder are used. The probe-to-stage system is electrically polarized for the detection of electrostatic forces or force

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

• Amelie Axt,
• Ilka M. Hermes,
• Victor W. Bergmann,
• Niklas Tausendpfund and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2018, 9, 1809–1819, doi:10.3762/bjnano.9.172

• nanometer scale [31]. To quantify the potential difference between the tip and a sample, the electrostatic field is enhanced by additionally applying a voltage between tip and sample. In electrostatic force microscopy [32], an alternating voltage UAC is applied and the response tracked by means of a lock-in

Artifacts in time-resolved Kelvin probe force microscopy

• Sascha Sadewasser,
• Nicoleta Nicoara and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2018, 9, 1272–1281, doi:10.3762/bjnano.9.119

• electrostatic force microscopy (EFM) on organic photovoltaic blends [14][15][16]. By applying a bias pulse to the atomic force microscopy (AFM) tip, Schirmeisen et al. studied the ion transport in solid electrolytes [17]. By applying bias pulses across organic field-effect transistors (OFETs) electronic

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

• Yue Shen,
• Ying Wang,
• Yuan Zhou,
• Chunxi Hai,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

• Province, Xining 810008, China Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China 10.3762/bjnano.9.106 Abstract Electrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy

• ; electrostatic force microscopy; electrostatic force spectroscopy; graphene oxide; Introduction Graphene is a two dimensional (2D) crystal with superior mechanical [1], thermal [2], electrical [3][4] and optical [5] properties. It can be produced using graphene oxide (GO) as a precursor through cost-effective

• sheets [23], carbon nanotubes (CNTs) [24] and so on. SPFM [25] and electrostatic force microscopy (EFM) [26] have revealed a step-by-step reduction process in GO sheets. However, when the reduction reactions are completed, it is hard for these methods to identify the small difference between GO sheets

Electro-optical interfacial effects on a graphene/π-conjugated organic semiconductor hybrid system

• Karolline A. S. Araujo,
• Luiz A. Cury,
• Matheus J. S. Matos,
• Thales F. D. Fernandes,
• Luiz G. Cançado and
• Bernardo R. A. Neves

Beilstein J. Nanotechnol. 2018, 9, 963–974, doi:10.3762/bjnano.9.90

• electrostatic force microscopy (EFM) [65][66] and scanning Kelvin probe microscopy (SKPM) [67] experiments were carried out using a white light emitting diode (LED) source. ScanAsyst – Air (bare Si tip), HQ:NSC18/Cr-Au (Au-coated tip) and HQ:CSC37-CrAu (Au-coated tip) cantilevers from Bruker and MikroMasch were

Nanoscale mapping of dielectric properties based on surface adhesion force measurements

• Ying Wang,
• Yue Shen,
• Xingya Wang,
• Zhiwei Shen,
• Bin Li,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

• dielectric properties of nanomaterials, such as electrostatic force microscopy [16][17][18][19], scanning polarization force microscopy (SPFM) [20][21][22][23], local dielectric spectroscopy [24][25][26], and nanoscale capacitance microscopy [27][28][29]. Most of the proposed techniques are based on long

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

• Urs Gysin,
• Thilo Glatzel,
• Thomas Schmölzer,
• Adolf Schöner,
• Sergey Reshanov,
• Holger Bartolf and
• Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

• , Electrum 207, SE-16440 Kista, Sweden 10.3762/bjnano.6.258 Abstract Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices. However, the

• measurements, such as Kelvin probe force microscopy, scanning capacitance force microscopy, scanning spreading resistance microscopy, and also electrostatic force microscopy at higher harmonics. The instrument incorporates beside a standard beam deflection detection system a closed loop scanner with a scan

• the benefit of surface photo voltage measurements, we analysed the contact potential difference of a silicon carbide p/n-junction under illumination. Keywords: copper alloy; electrostatic force microscopy; high-voltage device; Kelvin probe force microscopy; silicon carbide (SiC); surface photo

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

• Tino Wagner,
• Hannes Beyer,
• Patrick Reissner,
• Philipp Mensch,
• Heike Riel,
• Bernd Gotsmann and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

• established technique that allows for the mapping of local electrostatic potentials with an atomic force microscope (AFM) [1][2][3]. In contrast to electrostatic force microscopy (EFM), which measures merely the effect of electrostatic forces on the oscillation of the tip, a feedback loop nullifies the

Kelvin probe force microscopy in liquid using electrochemical force microscopy

• Liam Collins,
• Stephen Jesse,
• Jason I. Kilpatrick,
• Alexander Tselev,
• M. Baris Okatan,
• Sergei V. Kalinin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2015, 6, 201–214, doi:10.3762/bjnano.6.19

• microelectromechanical systems [59] and electrostatic force microscopy (EFM) [50] in liquid, analysis of which was performed analytically and verified experimentally to establish the critical actuation frequency such that the timescale is shorter than required for double layer screening. The associated RC timescale can

Scanning probe microscopy and related methods

• Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

• Microscopy, FMM: Force Modulation Microscopy, ic-AFM: intermittent contact AFM, TMAFM: tapping mode AFM, nc-AFM: non-contact AFM, KPFM: Kelvin probe force microscopy, EFM: Electrostatic force microscopy, MFM: Magnetic force microscopy, MRFM: Magnetic resonance force microscopy, NSOM: Near-field scanning